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"Electrical Resistance/Capacitance Dual-Mode Tomography Based on ..."

Chao Tan et al. (2023)

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DOI: 10.1109/TIM.2023.3300419

access: closed

type: Journal Article

metadata version: 2023-08-31

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Chao Tan, Shiyang Huang, Guanghui Liang, Marco José da Silva, Feng Dong:
Electrical Resistance/Capacitance Dual-Mode Tomography Based on Dual-Frequency Response. IEEE Trans. Instrum. Meas. 72: 1-11 (2023)

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