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"Low Cost MIMO Testing for RF Integrated Circuits."

Erkan Acar, Sule Ozev (2010)

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DOI: 10.1109/TVLSI.2009.2024018

access: closed

type: Journal Article

metadata version: 2020-03-11

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Erkan Acar, Sule Ozev:
Low Cost MIMO Testing for RF Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 18(9): 1348-1356 (2010)

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