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"Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and ..."

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras (2016)

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DOI: 10.1109/TVLSI.2015.2477103

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/ArumiRF16a
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents. IEEE Trans. Very Large Scale Integr. Syst. 24(5): 1739-1748 (2016)

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