• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 81 matches

• 2008
• 
  Miron Abramovici:
  In-System Silicon Validation and Debug. IEEE Des. Test Comput. 25(3): 216-223 (2008)
• 
  Rob Aitken, Erik Jan Marinissen:
  Guest Editors' Introduction: Addressing the Challenges of Debug and Diagnosis. IEEE Des. Test Comput. 25(3): 206-207 (2008)
• 
  Ajith Amerasekera:
  The Changing Design Landscape. IEEE Des. Test Comput. 25(4): 333 (2008)
• 
  Todd M. Austin, Valeria Bertacco, Scott A. Mahlke, Yu Cao:
  Reliable Systems on Unreliable Fabrics. IEEE Des. Test Comput. 25(4): 322-332 (2008)
• 
  Pouria Bastani, Li-C. Wang, Magdy S. Abadir:
  Linking Statistical Learning to Diagnosis. IEEE Des. Test Comput. 25(3): 232-239 (2008)
• 
  Reinaldo A. Bergamaschi, Luca Benini, Krisztián Flautner, Wido Kruijtzer, Alberto L. Sangiovanni-Vincentelli, Kazutoshi Wakabayashi:
  The State of ESL Design [Roundtable]. IEEE Des. Test Comput. 25(6): 510-519 (2008)
• 
  Victor Berman:
  Standards update from IP 07. IEEE Des. Test Comput. 25(2): 192-193 (2008)
• 
  Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist:
  Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. IEEE Des. Test Comput. 25(3): 250-257 (2008)
• 
  Stephan Bourduas, Jean-Samuel Chenard, Zeljko Zilic:
  A Quality-Driven Design Approach for NoCs. IEEE Des. Test Comput. 25(5): 416-428 (2008)
• 
  Melvin A. Breuer:
  Clarifying the record on testability cost functions. IEEE Des. Test Comput. 25(6): 608-609 (2008)
• 
  Melvin A. Breuer, Haiyang (Henry) Zhu:
  An Illustrated Methodology for Analysis of Error Tolerance. IEEE Des. Test Comput. 25(2): 168-177 (2008)
• 
  Kwang-Ting (Tim) Cheng:
  From the EIC. IEEE Des. Test Comput. 25(1): 4 (2008)
• 
  Kwang-Ting (Tim) Cheng:
  Test compression saves bits, cycles, and money. IEEE Des. Test Comput. 25(2): 105 (2008)
• 
  Kwang-Ting (Tim) Cheng:
  Effective silicon debug is key for time to money. IEEE Des. Test Comput. 25(3): 204 (2008)
• 
  Kwang-Ting (Tim) Cheng:
  Not just research as usual. IEEE Des. Test Comput. 25(4): 292 (2008)
• 
  Kwang-Ting (Tim) Cheng:
  Design and test for reliability and efficiency. IEEE Des. Test Comput. 25(6): 508 (2008)
• 
  Joe Damore:
  DATC Newsletter. IEEE Des. Test Comput. 25(1): 102 (2008)
• 
  Joe Damore:
  DATC Newsletter. IEEE Des. Test Comput. 25(2): 187 (2008)
• 
  Joe Damore:
  DATC Newsletter. IEEE Des. Test Comput. 25(4): 384 (2008)
• 
  Scott Davidson:
  How to make your own processor architecture. IEEE Des. Test Comput. 25(1): 96-98 (2008)
• 
  Scott Davidson:
  The commonality of vector generation techniques. IEEE Des. Test Comput. 25(2): 200 (2008)
• 
  Scott Davidson:
  With pick and shovel through our data. IEEE Des. Test Comput. 25(4): 382-383 (2008)
• 
  Scott Davidson, Nur A. Touba:
  Guest Editors' Introduction: Progress in Test Compression. IEEE Des. Test Comput. 25(2): 112-113 (2008)
• 
  Stefan Valentin Gheorghita, Twan Basten, Henk Corporaal:
  Application Scenarios in Streaming-Oriented Embedded-System Design. IEEE Des. Test Comput. 25(6): 581-589 (2008)
• 
  Rajesh Gupta, Arvind, Gérard Berry, Forrest Brewer:
  Advances in ESL Design. IEEE Des. Test Comput. 25(6): 520-526 (2008)
• 
  Hamidreza Hashempour, Fabrizio Lombardi:
  Device Model for Ballistic CNFETs Using the First Conducting Band. IEEE Des. Test Comput. 25(2): 178-186 (2008)
• 
  Yatin Vasant Hoskote, Radu Marculescu, Li-Shiuan Peh:
  Guest Editors' Introduction: Tackling Key Problems in NoCs. IEEE Des. Test Comput. 25(5): 400-401 (2008)
• 
  Yu Huang, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li:
  Survey of Scan Chain Diagnosis. IEEE Des. Test Comput. 25(3): 240-248 (2008)
• 
  Ted Huffmire, Brett Brotherton, Timothy Sherwood, Ryan Kastner, Timothy E. Levin, Thuy D. Nguyen, Cynthia E. Irvine:
  Managing Security in FPGA-Based Embedded Systems. IEEE Des. Test Comput. 25(6): 590-598 (2008)
• 
  Wen-mei W. Hwu, Kurt Keutzer, Timothy G. Mattson:
  The Concurrency Challenge. IEEE Des. Test Comput. 25(4): 312-320 (2008)

skipping 51 more matches