Abstract:
This column discusses the contents of the issue, including Hot Chips articles, a report on the 2015 Maurice Wilkes Award, and retrospectives from Test of Time Award winne...Show MoreMetadata
Abstract:
This column discusses the contents of the issue, including Hot Chips articles, a report on the 2015 Maurice Wilkes Award, and retrospectives from Test of Time Award winners.
Published in: IEEE Micro ( Volume: 36, Issue: 2, Mar.-Apr. 2016)
DOI: 10.1109/MM.2016.29