Abstract:
We present new parallel algorithms for testing pattern involvement for all length 4 permutations. Our algorithmshave the complexity of O(log n) time with n/log nprocessor...Show MoreMetadata
Abstract:
We present new parallel algorithms for testing pattern involvement for all length 4 permutations. Our algorithmshave the complexity of O(log n) time with n/log nprocessors on the CREW PRAM model, O(logloglog n) timewith n/logloglog n processors or constant time and nlog3 nprocessors on a CRCW PRAM model. Parallel algorithms werenot designed before for some of these patterns and for otherpatters the previous best algorithms require O(log n) time and n processors on the CREW PRAM model.
Published in: 2014 Sixth International Symposium on Parallel Architectures, Algorithms and Programming
Date of Conference: 13-15 July 2014
Date Added to IEEE Xplore: 07 October 2014
ISBN Information: