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Parallel Algorithms for Testing Length Four Permutations | IEEE Conference Publication | IEEE Xplore

Parallel Algorithms for Testing Length Four Permutations


Abstract:

We present new parallel algorithms for testing pattern involvement for all length 4 permutations. Our algorithmshave the complexity of O(log n) time with n/log nprocessor...Show More

Abstract:

We present new parallel algorithms for testing pattern involvement for all length 4 permutations. Our algorithmshave the complexity of O(log n) time with n/log nprocessors on the CREW PRAM model, O(logloglog n) timewith n/logloglog n processors or constant time and nlog3 nprocessors on a CRCW PRAM model. Parallel algorithms werenot designed before for some of these patterns and for otherpatters the previous best algorithms require O(log n) time and n processors on the CREW PRAM model.
Date of Conference: 13-15 July 2014
Date Added to IEEE Xplore: 07 October 2014
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Conference Location: Beijing, China

References

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