Production test is a significant driver of semiconductor manufacturing cost. Test cost is
highly influenced by the test concept of a product. This paper gives an overview over the test …

This paper addresses delay test for SOC devices with high frequency clock domains. A logic
design for on-chip high-speed clock generation, implemented to avoid expensive test …

Technology and product ramp-up suffers increasingly from systematic production defects.
Diagnosis of scan-test fail data plays an important role in yield enhancement, as diagnosis of …

This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies
as a means to reduce the cost of manufacturing test without compromising test quality…

This paper addresses delay test for SOC devices on low-cost testers. The case study focuses
on the at-speed testing for a state-of the-art microcontroller device by using an on-chip high-…

Technology and product ramp up suffers increasingly from systematic production defects.
Diagnosis of scan test fail data plays an important role in yield enhancement as diagnosis of …

This paper presents a highly effective compactor architecture for processing test responses
with a high percentage of x-values. The key component is a hierarchical configurable …

Seasonal variations in the strength of flexible pavements are known to influence their
service life, especially in the northern United States and Canada. Less is known regarding …

Mit zunehmender Integration komplexer Systemfunktionen auf einzelnen mikroelektronischen
Bausteinen steigen die Anforderungen an den Produktionstest. Die reinen Testkosten …

This is the first report issued under Research Study 2-8-69-136, Design and Evaluation of
Flexible Pavements, being conducted at the Texas Transportation Institute as part of the …