Source mask optimization for extreme-ultraviolet lithography based on thick mask model and social learning particle swarm optimization algorithm
Z Zhang, S Li, X Wang, W Cheng, Y Qi - Optics Express, 2021 - opg.optica.org
Extreme ultraviolet (EUV) lithography plays a vital role in the advanced technology nodes of
integrated circuits manufacturing. Source mask optimization (SMO) is a critical resolution …
integrated circuits manufacturing. Source mask optimization (SMO) is a critical resolution …
A CNN-based vortex identification method
L Deng, Y Wang, Y Liu, F Wang, S Li, J Liu - Journal of Visualization, 2019 - Springer
Vortex identification and visualization are important for understanding the underlying
physical mechanism of the flow field and have been intensively studied recently. Local vortex …
physical mechanism of the flow field and have been intensively studied recently. Local vortex …
Source mask optimization using the covariance matrix adaptation evolution strategy
G Chen, S Li, X Wang - Optics Express, 2020 - opg.optica.org
Source mask optimization (SMO) is one of the indispensable resolution enhancement techniques
to guarantee the image fidelity and process robustness for the 2Xnm technology node …
to guarantee the image fidelity and process robustness for the 2Xnm technology node …
An incremental extremely random forest classifier for online learning and tracking
A Wang, G Wan, Z Cheng, S Li - 2009 16th ieee international …, 2009 - ieeexplore.ieee.org
Decision trees have been widely used for online learning classification. Many approaches
usually need large data stream to finish decision trees induction, as show notable limitations (…
usually need large data stream to finish decision trees induction, as show notable limitations (…
Fast heuristic-based source mask optimization for EUV lithography using dual edge evolution and partial sampling
Z Zhang, S Li, X Wang, W Cheng - Optics Express, 2021 - opg.optica.org
Extreme ultraviolet (EUV) lithography is essential in the advanced technology nodes. Source
mask optimization (SMO) for EUV lithography, especially the heuristic-based SMO, is one …
mask optimization (SMO) for EUV lithography, especially the heuristic-based SMO, is one …
Universal calculation formula and calibration method in Fourier transform profilometry
Y Wen, S Li, H Cheng, X Su, Q Zhang - Applied optics, 2010 - opg.optica.org
We propose a universal calculation formula of Fourier transform profilometry and give a
strict theoretical analysis about the phase–height mapping relation. As the request on the …
strict theoretical analysis about the phase–height mapping relation. As the request on the …
A novel in situ compression method for CFD data based on generative adversarial network
Y Liu, Y Wang, L Deng, F Wang, F Liu, Y Lu, S Li - Journal of Visualization, 2019 - Springer
As one of the main technologies of in situ visualization, data compression plays a key role in
solving I/O bottleneck and has been intensively studied. However, existing methods take too …
solving I/O bottleneck and has been intensively studied. However, existing methods take too …
Eliminating the zero spectrum in Fourier transform profilometry using empirical mode decomposition
S Li, X Su, W Chen, L Xiang - Journal of the Optical Society of …, 2009 - opg.optica.org
Empirical mode decomposition is introduced into Fourier transform profilometry to extract
the zero spectrum included in the deformed fringe pattern without the need for capturing two …
the zero spectrum included in the deformed fringe pattern without the need for capturing two …
Robust pixel-based source and mask optimization for inverse lithography
S Li, X Wang, Y Bu - Optics & Laser Technology, 2013 - Elsevier
A robust pixel-based simultaneous source and mask optimization (SMO) method is proposed.
A three dimensional (3D) partially coherent imaging model is used in this method. The …
A three dimensional (3D) partially coherent imaging model is used in this method. The …
Reliability-guided phase unwrapping in wavelet-transform profilometry
S Li, W Chen, X Su - Applied optics, 2008 - opg.optica.org
The phase unwrapping algorithm plays a very important role in many noncontact optical
profilometries based on triangular measurement theory. Here we focus on discussing how to …
profilometries based on triangular measurement theory. Here we focus on discussing how to …