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Quickcmc1: Test Module

The document describes the results of 8 tests performed on an OMICRON QuickCMC device. Each test simulated a fault at a different location (L1-E, L2-E, L3-E) and impedance. The tests measured voltage, current, fault calculation parameters, and binary input states like trip and start signals. The tests helped evaluate the QuickCMC's performance under different fault scenarios.

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Oemar Jie
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60 views5 pages

Quickcmc1: Test Module

The document describes the results of 8 tests performed on an OMICRON QuickCMC device. Each test simulated a fault at a different location (L1-E, L2-E, L3-E) and impedance. The tests measured voltage, current, fault calculation parameters, and binary input states like trip and start signals. The tests helped evaluate the QuickCMC's performance under different fault scenarios.

Uploaded by

Oemar Jie
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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QuickCMC1

Test Module
Name: OMICRON QuickCMC Version: 3.00
Test Start: 20-Jan-2019 10:36:43 Test End: 20-Jan-2019 10:43:58
User Name: Manager:
Company:

Test Results

Title: Test 1

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L3-E 50,000 Hz
ZFault 200,0 mΩ 64,00 °
ZFault (R-X) 87,67 mΩ 179,8 mΩ
ITest 2,000 A

Generator Settings
V L1-E 63,509V 0,00° +90°
V L2-E 63,509V -120,00° I L3
V L3-E 0,800V 120,00°
I L1 0,000A 0,00°
V L1-E
I L2 0,000A 0,00° 180° V L3-E 0°
I L3 2,000A 56,00°
V L2-E

80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0->1 1->0 1->0
0,021s n/a n/a

Title: Test 2

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L3-E 50,000 Hz
ZFault 200,0 mΩ 64,00 °
ZFault (R-X) 87,67 mΩ 179,8 mΩ
ITest 2,000 A

Generator Settings
V L1-E 63,509V 0,00° +90°
V L2-E 63,509V -120,00° I L3
V L3-E 0,800V 120,00°
I L1 0,000A 0,00°
V L1-E
I L2 0,000A 0,00° 180° V L3-E 0°
I L3 2,000A 56,00°
V L2-E

80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0->1 1->0 1->0
0,024s n/a n/a
Title: Test 3

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L3-E 50,000 Hz
ZFault 400,0 mΩ 64,00 °
ZFault (R-X) 175,3 mΩ 359,5 mΩ
ITest 2,000 A

Generator Settings
V L1-E 63,509V 0,00° +90°
V L2-E 63,509V -120,00° I L3
V L3-E 1,600V 120,00°
I L1 0,000A 0,00°
V L1-E
I L2 0,000A 0,00° 180° V L3-E 0°
I L3 2,000A 56,00°
V L2-E

80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0->1 1->0 1->0
0,022s n/a n/a

Title: Test 4

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L3-E 50,000 Hz
ZFault 600,0 mΩ 64,00 °
ZFault (R-X) 263,0 mΩ 539,3 mΩ
ITest 2,000 A

Generator Settings
V L1-E 63,509V 0,00° +90°
V L2-E 63,509V -120,00° I L3
V L3-E 2,400V 120,00°
I L1 0,000A 0,00°
V L1-E
I L2 0,000A 0,00° 180° V L3-E 0°
I L3 2,000A 56,00°
V L2-E

80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0->1 1->0 1->0
0,020s n/a n/a

Title: Test 5

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L3-E 50,000 Hz
ZFault 1,000 Ω 64,00 °
ZFault (R-X) 438,4 mΩ 898,8 mΩ
ITest 2,000 A

Generator Settings
V L1-E 63,509V 0,00° +90°
V L2-E 63,509V -120,00° I L3
V L3-E 4,000V 120,00°
I L1 0,000A 0,00°
V L1-E
I L2 0,000A 0,00° 180° V L3-E 0°
I L3 2,000A 56,00°
V L2-E

80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0->1 1->0 1->0
0,023s n/a n/a

Title: Test 6

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L3-E 50,000 Hz
ZFault 1,600 Ω 64,00 °
ZFault (R-X) 701,4 mΩ 1,438 Ω
ITest 2,000 A

Generator Settings
V L1-E 63,509V 0,00° +90°
V L2-E 63,509V -120,00° I L3
V L3-E 6,400V 120,00°
I L1 0,000A 0,00°
V L1-E
I L2 0,000A 0,00° 180° V L3-E 0°
I L3 2,000A 56,00°
V L2-E

80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0->1 1->0 1->0
0,819s n/a n/a

Title: Test 7

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L1-E 50,000 Hz
ZFault 2,200 Ω 64,00 °
ZFault (R-X) 964,4 mΩ 1,977 Ω
ITest 2,000 A
Generator Settings
V L1-E 8,800V 120,00° +90°
V L2-E 63,509V 0,00° I L1
V L3-E 63,509V -120,00°
I L1 2,000A 56,00°
V L2-E
I L2 0,000A 0,00° 180° V L1-E 0°
I L3 0,000A 0,00°
V L3-E

80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0 0 0

Title: Test 8

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L1-E 50,000 Hz
ZFault 2,800 Ω 64,00 °
ZFault (R-X) 1,227 Ω 2,517 Ω
ITest 2,000 A

Generator Settings
V L1-E 11,200V 0,00° +90°
V L2-E 63,509V -120,00°
V L3-E
V L3-E 63,509V 120,00°
I L1 2,000A -64,00°
V L1-E
I L2 0,000A 0,00° 180° 0°
I L3 0,000A 0,00°
V L2-E
I L1
80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0 0 0

Title: Test 9

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L1-E 50,000 Hz
ZFault 3,500 Ω 64,00 °
ZFault (R-X) 1,534 Ω 3,146 Ω
ITest 2,000 A

Generator Settings
V L1-E 14,000V 0,00° +90°
V L2-E 63,509V -120,00°
V L3-E
V L3-E 63,509V 120,00°
I L1 2,000A -64,00°
V L1-E
I L2 0,000A 0,00° 180° 0°
I L3 0,000A 0,00°
V L2-E
I L1
80,0 V -90° 2,0 A
Binary Inputs
Trip Start Overload
0 0 0

Title: Test 10

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L3-E 50,000 Hz
ZFault 3,500 Ω 64,00 °
ZFault (R-X) 1,534 Ω 3,146 Ω
ITest 2,000 A

Generator Settings
V L1-E 63,509V 0,00° +90°
V L2-E 63,509V -120,00° I L3
V L3-E 14,000V 120,00°
I L1 0,000A 0,00°
V L3-E V L1-E
I L2 0,000A 0,00° 180° 0°
I L3 2,000A 56,00°
V L2-E

80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0 0 0

Title: Test 11

Fault Calculator:
Table Inputmode Parameters (All values are secondary)
Z-I const. Fault L3-E 50,000 Hz
ZFault 4,500 Ω 64,00 °
ZFault (R-X) 1,973 Ω 4,045 Ω
ITest 2,000 A

Generator Settings
V L1-E 63,509V -120,00° +90°
V L2-E 63,509V 120,00°
V L2-E
V L3-E 18,000V 0,00°
I L1 0,000A 0,00°
V L3-E
I L2 0,000A 0,00° 180° 0°
I L3 2,000A -64,00°
V L1-E
I L3
80,0 V -90° 2,0 A

Binary Inputs
Trip Start Overload
0 0 0

Summary
11 tests passed, 0 tests failed, 0 tests not assessed 100,00% passed
Test passed

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