Atom 330 Datasheet
Atom 330 Datasheet
Datasheet
2 Datasheet
Contents
1 Introduction ..............................................................................................................6
1.1 Intel® Atom™ Processor 300 Series Features ..........................................................6
1.2 Terminology .......................................................................................................7
1.3 References .........................................................................................................8
2 Low Power Features ..................................................................................................9
2.1 Clock Control and Low-power States ......................................................................9
2.1.1 Thread Low-power State Descriptions........................................................ 10
2.1.1.1 Thread C0 State ....................................................................... 10
2.1.1.2 Thread C1/AutoHALT Powerdown State ........................................ 10
2.1.1.3 Thread C1/MWAIT Powerdown State............................................ 10
2.1.2 Package Low-power State Descriptions...................................................... 11
2.1.2.1 Normal State............................................................................ 11
2.1.3 Front Side Bus ....................................................................................... 11
3 Electrical Specifications ........................................................................................... 12
3.1 FSB and GTLREF ............................................................................................... 12
3.2 Power and Ground Pins ...................................................................................... 12
3.3 Decoupling Guidelines ........................................................................................ 13
3.3.1 VCCP Decoupling .................................................................................... 13
3.3.2 FSB AGTL+ Decoupling ........................................................................... 13
3.4 Voltage Identification and Power Sequencing......................................................... 14
3.5 Catastrophic Thermal Protection .......................................................................... 15
3.6 Reserved and Unused Pins .................................................................................. 15
3.7 FSB Frequency Select Signals (BSEL[2:0]) ........................................................... 16
3.8 FSB Signal Groups ............................................................................................. 16
3.9 CMOS Asynchronous Signals ............................................................................... 18
3.10 Maximum Ratings.............................................................................................. 18
3.11 Processor DC Specifications ................................................................................ 19
3.12 AGTL+ FSB Specifications................................................................................... 23
4 Package Mechanical Specifications and Ball Information ......................................... 24
4.1 Package Mechanical Specifications ....................................................................... 24
4.1.1 Package Mechanical Drawings .................................................................. 25
4.1.2 Package Loading Specifications ................................................................ 25
4.1.3 Processor Mass Specifications................................................................... 25
4.2 Processor Pinout Assignment............................................................................... 25
4.3 Signal Description ............................................................................................. 31
5 Thermal Specifications and Design Considerations .................................................. 39
5.1 Thermal Specifications ....................................................................................... 39
5.1.1 Thermal Diode ....................................................................................... 40
5.1.2 Intel® Thermal Monitor........................................................................... 42
5.1.3 Digital Thermal Sensor ............................................................................ 44
5.1.4 Out of Specification Detection .................................................................. 44
5.1.5 PROCHOT# Signal Pin ............................................................................. 44
6 Debug Tools Specifications ...................................................................................... 46
Datasheet 3
Figures
2-1 Thread Low-power States ......................................................................... 9
4-2 Package Mechanical Drawing ....................................................................25
4-3 Pinout Diagram (Top View, Left Side) ........................................................26
4-4 Pinout Diagram (Top View, Right Side) ......................................................27
Tables
2-1 Coordination of Thread Low-power States at the Package Level.....................10
3-2 Voltage Identification Definition ................................................................14
3-3 Processor VID Pin to VRD11 VID Pin Mapping .............................................15
3-4 BSEL[2:0] Encoding for BCLK Frequency ....................................................16
3-5 FSB Pin Groups ......................................................................................17
3-6 Processor Absolute Maximum Ratings ........................................................18
3-7 Voltage and Current Specifications for the processor....................................19
3-8 FSB Differential BCLK Specifications ..........................................................20
3-9 AGTL+/CMOS Signal Group DC Specifications .............................................21
3-10 Legacy CMOS Signal Group DC Specifications .............................................22
3-11 Open Drain Signal Group DC Specifications ................................................22
4-12 Pinout Arranged By Signal Name...............................................................28
4-13 Signal Description ...................................................................................31
5-14 Power Specifications for the Standard Voltage processor ..............................40
5-15 Thermal Diode Interface ..........................................................................41
5-16 Thermal Diode Parameters using Transistor Model.......................................41
4 Datasheet
Revision History
Revision
Description Date
Number
Datasheet 5
Introduction
1 Introduction
The Intel® Atom™ processor 330 series is built on 45-nanometer Hi-k process
technology. This document contains electrical, mechanical and thermal specifications
for the processor.
Note: In this document, the Intel Atom processor 330 series will be referred to as the
processor. Intel chipsets shall be referred as GMCH and ICH respectively.
This processor series enables a new class of simple and affordable internet-centric
computers called “antelopes” that is best suited for applications focused on internet
usage models—communicate, listen, watch, play, share, and learn.
6 Datasheet
Introduction
1.2 Terminology
Term Definition
# A “#” symbol after a signal name refers to an active low signal, indicating a
signal is in the active state when driven to a low level. For example, when
RESET# is low, a reset has been requested. Conversely, when NMI is high,
a nonmaskable interrupt has occurred. In the case of signals where the
name does not imply an active state but describes part of a binary
sequence (such as address or data), the “#” symbol implies that the signal
is inverted. For example, D[3:0] = “HLHL” refers to a hex ‘A’, and D[3:0]#
= “LHLH” also refers to a hex “A” (H= High logic level, L= Low logic level).
Front Side Bus Refers to the interface between the processor and system core logic (also
(FSB) known as the GMCH chipset components).
AGTL+ Advanced Gunning Transceiver Logic. Used to refer to Assisted GTL+
signaling technology on some Intel processors.
CMOS Complementary metal-Oxide semiconductor.
Storage Refers to a non-operational state. The processor may be installed in a
Conditions platform, in a tray, or loose. Processors may be sealed in packaging or
exposed to free air. Under these conditions, processor landings should not
be connected to any supply voltages, have any I/Os biased or receive any
clocks. Upon exposure to “free air” (i.e., unsealed packaging or a device
removed from packaging material) the processor must be handled in
accordance with moisture sensitivity labeling (MSL) as indicated on the
packaging material.
Processor Core Processor core die with integrated L1 and L2 cache. All AC timing and signal
integrity specifications are at the pads of the processor core.
Intel® 64 64-bit memory extensions to the IA-32 architecture.
Technology
TDP Thermal Design Power
VCC The processor core power supply
VR Voltage Regulator
VSS The processor ground
Datasheet 7
Introduction
1.3 References
Material and concepts available in the following documents may be beneficial when
reading this document:
Document
Document
Number
8 Datasheet
Low Power Features
The processor implements two software interfaces for requesting low power states,
MWAIT instruction extensions with sub-state hints and P_LVLx reads to the ACPI P_BLK
register block mapped in the processor’s I/O address space. The P_LVLx I/O reads are
converted to equivalent MWAIT C-state requests inside the processor and do not
directly result in I/O reads on the processor FSB. The monitor address does not need to
be setup before using the P_LVLx I/O read interface. The sub-state hints used for each
P_LVLx read can be configured in a software programmable MSR.
Figure 2-1 shows the thread low-power states. Table 2-1 provides a mapping of thread
low-power states to package low power states.
C1/ C1/Auto
MWAIT Core state
Halt
HLT instruction
break
C0
halt break = A20M# transition, INIT#, INTR, NMI, PREQ#, RESET#, SMI#, or APIC interrupt
core state break = (halt break OR Monitor event)
Datasheet 9
Low Power Features
Package State2
Thread State
C0 C11
C0 Normal Normal
1
C1 Normal AutoHalt
NOTES:
1. AutoHALT or MWAIT/C1.
2. To enter a package state, both threads must be in a common low power state. If the
threads are not in a common low power state, the package state will resolve to the highest
power C state.
A System Management Interrupt (SMI) handler will return execution to either Normal
state or the AutoHALT Powerdown state. See the Intel® 64 and IA-32 Architectures
Software Developer's Manuals, Volume 3A/3B: System Programmer's Guide for more
information.
While in AutoHALT Powerdown state, the processor threads will process bus snoops and
snoops from the other thread. The processor will enter a snoopable sub-state (not
shown in Figure 2-1) to process the snoop and then return to the AutoHALT Powerdown
state.
C1/MWAIT is a low-power state entered when the processor thread executes the
MWAIT(C1) instruction. Processor behavior in the MWAIT state is identical to the
AutoHALT state except that Monitor events can cause the processor to return to the C0
state. See the Intel® 64 and IA-32 Architectures Software Developer's Manuals,
Volume 2A: Instruction Set Reference, A-M and Volume 2B: Instruction Set Reference,
N-Z, for more information.
10 Datasheet
Low Power Features
This is the normal operating state for the processor. The processor remains in the
Normal state when the threads are in the C0, C1/AutoHALT, or C1/MWAIT state.
Datasheet 11
Electrical Specifications
3 Electrical Specifications
This chapter contains signal group descriptions, absolute maximum ratings, voltage
identification and power sequencing. The chapter also includes DC and AC
specifications, including timing diagrams.
The termination voltage level for the processor CMOS and AGTL+ signals is VTT = 1.10
V (nominal). Due to speed improvements to data and address bus, signal integrity and
platform design methods have become more critical than with previous processor
families.
The AGTL+ inputs, including the sideband signals listed in Table 3-5, require a
reference voltage (GTLREF_MA, GTLREF_EA) that is used by the receivers to determine
if a signal is a logical 0 or a logical 1. GTLREF_* must be generated on the system
board. Termination resistors are provided on the processor silicon and are terminated
to its I/O voltage (VTT). The appropriate chipset will also provide on-die termination,
thus eliminating the need to terminate the bus on the system board for most AGTL+
signals.
The AGTL+ bus depends on incident wave switching. Timing calculations for AGTL+
signals are based on flight time as opposed to capacitive deratings. Analog signal
simulation of the FSB, including trace lengths, is highly recommended when designing
a system.
12 Datasheet
Electrical Specifications
Datasheet 13
Electrical Specifications
The VID specification for the processor is defined by the RS - Voltage Regulator-Down
(VRD) 11.0 Processor Power Delivery Design Guidelines.
VRD11 has 8 VID pins (VID[7:0]) compared to 7 VID pins for processor. VRD11 VID[n]
should be connected to processor VID[n-1]. VRD11 VID[0] should be tied to Vss.
14 Datasheet
Electrical Specifications
6 7
5 6
4 5
3 4
2 3
1 2
0 1
0 (tie to VSS)
Power source characteristics must be stable whenever the supply to the voltage
regulator is stable.
Datasheet 15
Electrical Specifications
L L H 133 MHz
With the implementation of a source synchronous data bus comes the need to specify
two sets of timing parameters. One set is for common clock signals which are
dependent upon the rising edge of BCLK0 (ADS#, HIT#, HITM#, etc.) and the second
set is for the source synchronous signals which are relative to their respective strobe
lines (data and address) as well as the rising edge of BCLK0. Asychronous signals are
still present (A20M#, IGNNE#, etc.) and can become active at any time during the
clock cycle. Table 3-5 identifies which signals are common clock, source synchronous,
and asynchronous.
16 Datasheet
Electrical Specifications
NOTES:
1. Refer to Chapter 4 for signal descriptions and termination requirements.
2. In processor systems where there is no debug port implemented on the system board,
these signals are used to support a debug port interposer. In systems with the debug port
implemented on the system board, these signals are no connects.
3. PROCHOT# signal type is open drain output and CMOS input.
4. On die termination differs from other AGTL+ signals, refer to your Platform Design
Guidelines for up to day recommendations.
Datasheet 17
Electrical Specifications
Although the processor contains protective circuitry to resist damage from static
electric discharge, precautions should always be taken to avoid high static voltages or
electric fields.
NOTES:
1. For functional operation, all processor electrical, signal quality, mechanical and thermal specifications must
be satisfied.
2. Storage temperature is applicable to storage conditions only. In this scenario, the processor must not
receive a clock, and no lands can be connected to a voltage bias. Storage within these limits will not affect
the long term reliability of the device. For functional operation, refer to the processor case temperature
specifications.
3. This rating applies to the processor and does not include any tray or packaging.
4. Failure to adhere to this specification can affect the long term reliability of the processor.
5. The VCC max supported by the process is 1.2 V but the parameter can change (burnin voltage is higher).
18 Datasheet
Electrical Specifications
Table 3-9 through Table 3-11 list the DC specifications for the processor and are valid
only while meeting specifications for junction temperature, clock frequency, and input
voltages. Unless specified otherwise, all specifications for the processor are at TJ =
90°C. Care should be taken to read all notes associated with each parameter.
Processor
Core Frequency/Voltage
Number
330 1.6 GHz @ VCC (AVID controlled) 8 A 1, 2
IAH, ICC Auto-Halt 4 A 1, 2
ICCA ICC for VCCA Supply 260 mA
NOTES:
1. Specified at 90°C TJ.
2. Specified at the nominal VCC.
3. Refer to the RS - Voltage Regulator-Down (VRD) 11.0 - Processor Power Delivery Design Guidelines for
design target capability.
4. Unless otherwise noted, all specifications in this table are based on estimates and simulations or empirical
data. These specifications will be updated with characterized data from silicon measurements at a later
date.
5. This is the Vcc range, not the absolute Vcc for the core. The Vccp tolerance should be +/- 50mV, inclusive
of ripple, VR tolerance and transient (droop and overshoot).
6. Since processor is soldered down with no loadline and no dynamic VID, there is no “socket load line slope
(SKT_LL)”; no “socket load line tolerance band” but only “Tolerance Band (TOB)” of 50mV; no “maximum
overshoot above VID (OS_AMP)”; no “maximum overshoot time duration above VID (OS_TIME)”; no “peak
to peak ripple amplitude (RIPPLE)”; no “thermal compensation voltage drift (THERMAL_DRIFT)”; no
“Maximum DC test (Current I_DC_MAX)”; no “minimum DC test *(Current I_DC_MIN)”; “Voltage
Regulator Thermal Design Current (VR_TDC) of 3.64A; “current step rise time (I_RISE) of 5A/us”
7. ±50 mV tolerance
Datasheet 19
Electrical Specifications
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. Crossing Voltage is defined as absolute voltage where rising edge of BCLK0 is equal to the falling edge of
BCLK1.
3. For Vin between 0 V and VIH.
4. Cpad includes die capacitance only. No package parasitics are included.
5. ΔVCROSS is defined as the total variation of all crossing voltages as defined in note 2.
6. Measurement taken from differential waveform.
7. Measurement taken from single-ended waveform.
8. “Steady state” voltage, not including Overshoots or Undershoots.
9. Only applies to the differential rising edge (clock rising and clock# falling).
20 Datasheet
Electrical Specifications
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. VIL is defined as the maximum voltage level at a receiving agent that will be interpreted as a logical low
value.
3. VIH is defined as the minimum voltage level at a receiving agent that will be interpreted as a logical high
value.
4. VIH and VOH may experience excursions above VTT. However, input signal drivers must comply with the
signal quality specifications.
5. GTLREF should be generated from VTT with a 1% tolerance resistor divider. The VTT referred to in these
specifications is the instantaneous VTT.
6. RTT is the on-die termination resistance measured at VOL of the AGTL+ output driver. Measured at
0.31*VCCP. RTT is connected to VCCP on die. Refer to processor I/O buffer models for I/V characteristics.
7. Specified with on die RTT and RON are turned off. Vin between 0 and VTT.
8. Cpad includes die capacitance only. No package parasitics are included.
9. This is the external resistor on the comp pins.
10. On die termination resistance, measured at 0.33*VTT.
11. RCOMP resistance must be provided on the system board with 1% resistors.
12. GTLREF_EA & GTLREF_MA resistor divider needs to be separate. This is for better FSB margin.
Datasheet 21
Electrical Specifications
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. The VTT referred to in these specifications refers to instantaneous VTT.
3. Measured at 0.1*VTT.
4. Measured at 0.9*VTT.
5. For Vin between 0V and VTT. Measured when the driver is tri-stated.
6. Cpad1 includes die capacitance only for DPRSTP#, DPSLP#, PWRGOOD. No package parasitics are
included.
7. Cpad2 includes die capacitance for all other CMOS input signals. No package parasitics are included.
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. Measured at 0.2 V.
3. VOH is determined by value of the external pull-up resistor to VTT. Refer to platform design guide for
details.
4. For Vin between 0 V and VOH.
5. Cpad includes die capacitance only. No package parasitics are included.
22 Datasheet
Electrical Specifications
Valid high and low levels are determined by the input buffers which compare a signal’s
voltage with a reference voltage called GTLREF (known as VREF in previous
documentation).
Table 3-9 lists the GTLREF specifications. The AGTL+ reference voltage (GTLREF)
should be generated on the system board using high precision voltage divider circuits.
It is important that the system board impedance is held to the specified tolerance, and
that the intrinsic trace capacitance for the AGTL+ signal group traces is known and
well- controlled. For more details on platform design, see the appropriate platform
design guides.
Datasheet 23
Package Mechanical Specifications and Ball Information
4 Package Mechanical
Specifications and Ball
Information
This chapter provides the package specifications, pinout assignments, and signal
description.
24 Datasheet
Package Mechanical Specifications and Ball Information
Datasheet 25
Package Mechanical Specifications and Ball Information
A VSS RSVD VSS D[54]# D[56]# GTLREF_ VSS VCCQ0 VCCP VCCP VCCP RSVD A[35] A
MA #
B VSS VSS D[60]# D[52]# VSS D[59]# CMREF VSS VCCQ0 VCCP VCCP VCCP VSS A[33] B
#
C RSVD D[48]# D[55]# D[61]# DINV[3] D[58]# D[62]# VSS VTT VCCP VCCP VCCP VCCSE A[22] C
NSE #
D VSS D[63]# D[51]# RSVD VSS GTLREF_EA VCCA VSS VTT VCCP VCCP VCCP VSSSE VSS D
NSE
E D[53]# DSTBN[3] VSS THRMDA THRMDC VSS VSS VSS VTT VCCP VCCP VCCP VTT VTT E
F D[50]# D[57]# DSTBP[3] THRMDC_2 VSS VSS VSS VTT VTT VCCP VCCP VCCP VTT VTT F
G VSS D[49]# D[40]# THRMDA_2 BSEL[2] BPM_2[0] VSS VTT VSS VCCP VCCP VCCP VSS VCCQ G
1
H D[46]# D[41]# VSS VSS BSEL[1] BPM2[1] VSS VTT VSS VCCP VCCP VCCP VSS VCCQ H
1
J D[47]# D[45]# D[38]# IGNNE# VSS BSEL[0] VSS VTT VSS VCCP VCCP VCCP VSS VTT J
K VSS DSTBN[2] DSTBP[2] BPM_2[2] BPM_2[3] VSS VSS VTT VSS VCCP VCCP VCCP VSS VTT K
L DINV[2] D[43]# VSS VSS COMP_2[0] VSS VSS VTT VSS VCCP VCCP VCCP VSS VTT L
M VSS D[36]# D[44]# RSVD VSS EXTBGREF VSS VTT VSS VCCP VCCP VCCP VSS VTT M
N D[35]# D[42]# D[39]# COMP_2[2] COMP_2[1] RSVD VSS VTT VSS VCCP VCCP VCCP VSS VTT N
P D[34]# D[37]# VSS COMP_2[3] RSVD VSS VSS VTT VSS VCCP VCCP VCCP VSS VTT P
R VSS D[33]# D[32]# RSVD VSS RSVD VSS VTT VSS VCCP VCCP VCCP VSS VTT R
T COMP[0] COMP[1] D[28]# VSS RSVD RSVD VSS VTT VSS VSS VSS VSS VSS VTT T
U D[19]# D[27]# VSS DPWR# RSVD VSS VSS VTT VTT VTT VTT VTT VTT VTT U
V VSS D[30]# D[26]# VSS RSVD VSS VSS VSS RSVD VTT BCLK[0] BCLK[1] VSS VSS V
W VSS D[25]# D[18]# D[31]# VSS D[21]# D[20]# VSS D[15]# D[1]# VSS D[5]# D[13]# VSS W
Y VSS VSS D24[]# DSTBN[1] DSTBP[1] DINV[1] D[22]# D[17]# D[8]# D[7]# D[0]# D[2]# D[9]# DSTB Y
N[0]
AA VSS VSS VSS D[16]# D[23]# VSS D[29]# D[14]# VSS D[4]# VSS D[11]# D[3]# AA
1 2 3 4 5 6 7 8 9 10 11 12 13 14
26 Datasheet
Package Mechanical Specifications and Ball Information
15 16 17 18 19 20 21
Datasheet 27
Package Mechanical Specifications and Ball Information
28 Datasheet
Package Mechanical Specifications and Ball Information
Datasheet 29
Package Mechanical Specifications and Ball Information
30 Datasheet
Package Mechanical Specifications and Ball Information
PWR GTLREF Middle Agent. Refer to the platform design guide for details
on GTLREF implementation. GTLREF_MA should have separate
voltage divider resistor network to set the right reference voltage
and cannot share the voltage divider resistor network with
GTLREF_MA GTLREF_EA.
PWR GTLREF End Agent. Refer to the platform design guide for details on
GTLREF implementation. GTLREF_EA should have separate voltage
divider resistor network to set the right reference voltage and
GTLREF_EA cannot share the voltage divider resistor network with GTLREF_MA.
HIT# I/O HIT# (Snoop Hit) and HITM# (Hit Modified) convey transaction
HITM# snoop operation results. Either FSB agent may assert both HIT#
and HITM# together to indicate that it requires a snoop stall, which
can be continued by reasserting HIT# and HITM# together.
IERR# O IERR# (Internal Error) is asserted by a processor as the result of an
internal error. Assertion of IERR# is usually accompanied by a
SHUTDOWN transaction on the FSB. This transaction may
optionally be converted to an external error signal (e.g., NMI) by
system core logic. The processor will keep IERR# asserted until the
assertion of RESET#, or INIT#.
For termination requirements, refer to the platform design guide.
34 Datasheet
Package Mechanical Specifications and Ball Information
Datasheet 35
Package Mechanical Specifications and Ball Information
PROCHOT# I/O, O As an output, PROCHOT# (Processor Hot) will go active when the
(DP) processor temperature monitoring sensor detects that the
processor has reached its maximum safe operating temperature.
This indicates that the processor Thermal Control Circuit (TCC) has
been activated, if enabled. As an input, assertion of PROCHOT# by
the system will activate the TCC, if enabled. The TCC will remain
active until the system deasserts PROCHOT#.
For termination requirements, refer to the platform design guide.
This signal may require voltage translation on the motherboard.
Refer to the platform design guide for more details.
PWRGOOD I PWRGOOD (Power Good) is a processor input. The processor
requires this signal to be a clean indication that the clocks and
power supplies are stable and within their specifications. ‘Clean’
implies that the signal will remain low (capable of sinking leakage
current), without glitches, from the time that the power supplies
are turned on until they come within specification. The signal must
then transition monotonically to a high state. PWRGOOD can be
driven inactive at any time, but clocks and power must again be
stable before a subsequent rising edge of PWRGOOD.
The PWRGOOD signal must be supplied to the processor; it is used
to protect internal circuits against voltage sequencing issues. It
should be driven high throughout boundary scan operation.
REQ[4:0]# I/O REQ[4:0]# (Request Command) must connect the appropriate pins
of both FSB agents. They are asserted by the current bus owner to
define the currently active transaction type. These signals are
source synchronous to ADSTB[0]#.
RESET# I Asserting the RESET# signal resets the processor to a known state
and invalidates its internal caches without writing back any of their
contents. For a power-on Reset, RESET# must stay active for at
least two milliseconds after VCC and BCLK have reached their
proper specifications. On observing active RESET#, both FSB
agents will deassert their outputs within two clocks. All processor
straps must be valid within the specified setup time before RESET#
is deasserted.
RS[2:0]# I RS[2:0]# (Response Status) are driven by the response agent (the
agent responsible for completion of the current transaction), and
must connect the appropriate pins of both FSB agents.
RSVD Reserved/ These pins are RESERVED and must be left unconnected on the
No board. However, it is recommended that routing channels to these
Connect pins on the board be kept open for possible future use.
36 Datasheet
Package Mechanical Specifications and Ball Information
Datasheet 37
Package Mechanical Specifications and Ball Information
TRST# I TRST# (Test Reset) resets the Test Access Port (TAP) logic. TRST#
must be driven low during power on Reset. Refer to the platform
design guide for termination requirements and implementation
details.
VCCA PWR VCCA provides isolated power for the internal processor core PLLs.
Refer to the platform design guide for complete implementation
details.
VCC PWR Processor core power supply
VSS GND Processor core ground node.
VID[6:0] O VID[6:0] (Voltage ID) pins are used to support automatic selection
of power supply voltages (VCC) but these pins are not used in the
Entry Level Desktop platform ‘08 as the VID is fixed at 1.1 V.
VTT PWR AGTL+ reference voltage
VCC_SENSE O VCC_SENSE is an isolated low impedance connection to processor
core power (VCCP). It can be used to sense or measure voltage near
the silicon with little noise.
VSS_SENSE O VSS_SENSE is an isolated low impedance connection to processor
core VSS. It can be used to sense or measure ground near the
silicon with little noise. Refer to the platform design guide for
termination recommendations and more details.
VCCQ0,
PWR Connect this to VTT.
VCCQ1
38 Datasheet
Thermal Specifications and Design Considerations
A complete thermal solution includes both component and system level thermal
management features. Component level thermal solutions include active or passive
heatsink attached to the exposed processor die. The solution should make firm contact
to the die while maintaining processor mechanical specifications such as pressure. A
typical system level thermal solution may consist of a system fan used to evacuate or
pull air through the system. For more information on designing a component level
thermal solution, please refer to the appropriate Thermal and Mechanical Design
Guidelines (see Section 1.3). Alternatively, the processor may be in a fan-less system,
but would likely still use a multi-component heat spreader. Note that trading of thermal
solutions also involves trading performance.
The case temperature is defined at the geometric top center of the processor. Analysis
indicates that real applications are unlikely to cause the processor to consume the
theoretical maximum power dissipation for sustained time periods. Intel recommends
that complete thermal solution designs target the TDP indicated in Table 5-14 instead
of the maximum processor power consumption. The Intel Thermal Monitor feature is
designed to help protect the processor in the unlikely event that an application exceeds
the TDP recommendation for a sustained period of time. For more details on the usage
of this feature, refer to Section 5.1.2. In all cases, the Intel Thermal Monitor feature
must be enabled for the processor to remain within specification.
Datasheet 39
Thermal Specifications and Design Considerations
Core Tc Tc
Processor Thermal Design
Symbol Frequency Unit min max Notes
Number Power
and Voltage (°C) (°C)
NOTES:
1. The TDP specification should be used to design the processor thermal solution. The TDP is
not the maximum theoretical power the processor can generate.
2. Not 100% tested. These power specifications are determined by characterization of the
processor currents at higher temperatures and extrapolating the values for the
temperature indicated.
3. The Intel Thermal Monitor automatic mode must be enabled for the processor to operate
within specifications.
4. VCC is determined by processor VID[6:0].
The reading of the external thermal sensor (on the motherboard) connected to the
processor thermal diode signals will not necessarily reflect the temperature of the
hottest location on the die. This is due to inaccuracies in the external thermal sensor,
on-die temperature gradients between the location of the thermal diode and the hottest
location on the die, and time based variations in the die temperature measurement.
Time based variations can occur when the sampling rate of the thermal diode (by the
thermal sensor) is slower than the rate at which the TJ temperature can change.
Offset between the thermal diode based temperature reading and the Intel Thermal
Monitor reading may be characterized using the Intel Thermal Monitor’s Automatic
mode activation of the thermal control circuit. This temperature offset must be taken
into account when using the processor thermal diode to implement power management
events. This offset is different than the diode Toffset value programmed into the
processor Model Specific Register (MSR).
40 Datasheet
Thermal Specifications and Design Considerations
Table 5-15 and Table 5-16 provide the diode interface and specifications. Transistor
model parameters shown in Table 5-16 providing more accurate temperature
measurements when the diode ideality factor is closer to the maximum or minimum
limits. Contact your external sensor supplier for their recommendation. The thermal
diode is separate from the Thermal Monitor’s thermal sensor and cannot be used to
predict the behavior of the Thermal Monitor.
NOTES:
1. Intel does not support or recommend operation of the thermal diode under reverse bias.
2. Characterized across a temperature range of 50–100°C.
3. Not 100% tested. Specified by design characterization.
4. The ideality factor, nQ, represents the deviation from ideal transistor model behavior as
exemplified by the equation for the collector current:
IC = IS * (e qVBE/nQkT –1)
where IS = saturation current, q = electronic charge, VBE = voltage across the transistor
base emitter junction (same nodes as VD), k = Boltzmann Constant, and T = absolute
temperature (Kelvin).
5. The series resistance, RT, provided in the Diode Model Table (Table 5-16) can be used for
more accurate readings as needed.
Datasheet 41
Thermal Specifications and Design Considerations
Given that most diodes are not perfect, the designers usually select an ntrim value that
more closely matches the behavior of the diodes in the processor. If the processor
diode ideality deviates from that of the ntrim, each calculated temperature will be offset
by a fixed amount. This temperature offset can be calculated with the equation:
where Terror(nf) is the offset in degrees C, Tmeasured is in Kelvin, nactual is the measured
ideality of the diode, and ntrim is the diode ideality assumed by the temperature
sensing device.
With a properly designed and characterized thermal solution, it is anticipated that the
TCC would only be activated for very short periods of time when running the most
power intensive applications. The processor performance impact due to these brief
periods of TCC activation is expected to be minor and hence not detectable. An under-
designed thermal solution that is not able to prevent excessive activation of the TCC in
the anticipated ambient environment may cause a noticeable performance loss and
may affect the long-term reliability of the processor. In addition, a thermal solution that
is significantly under designed may not be capable of cooling the processor even when
the TCC is active continuously.
The Intel Thermal Monitor controls the processor temperature by modulating (starting
and stopping) the processor core clocks when the processor silicon reaches its
maximum operating temperature. The Intel Thermal Monitor uses two modes to
activate the TCC: automatic mode and on-demand mode. If both modes are activated,
automatic mode takes precedence.
There is only one automatic modes called Intel Thermal Monitor 1 (TM1). This mode is
selected by writing values to the MSRs of the processor. After automatic mode is
enabled, the TCC will activate only when the internal die temperature reaches the
maximum allowed value for operation.
The Intel Thermal Monitor automatic mode must be enabled through BIOS for the
processor to be operating within specifications. Intel recommends TM1 be enabled on
the processors.
When TM1 is enabled and a high temperature situation exists, the clocks will be
modulated by alternately turning the clocks off and on at a 50% duty cycle. Cycle times
are processor speed dependent and will decrease linearly as processor core frequencies
increase. Once the temperature has returned to a non-critical level, modulation ceases
and TCC goes inactive. A small amount of hysteresis has been included to prevent rapid
42 Datasheet
Thermal Specifications and Design Considerations
active/inactive transitions of the TCC when the processor temperature is near the trip
point. The duty cycle is factory configured and cannot be modified. Also, automatic
mode does not require any additional hardware, software drivers, or interrupt handling
routines. Processor performance will be decreased by the same amount as the duty
cycle when the TCC is active.
The Intel Thermal Monitor automatic mode must be enabled through BIOS for
the processor to be operating within specifications. Intel recommends TM1 be
enabled on the processors.
The TCC may also be activated via on-demand mode. If bit 4 of the ACPI Intel Thermal
Monitor control register is written to a 1, the TCC will be activated immediately
independent of the processor temperature. When using on-demand mode to activate
the TCC, the duty cycle of the clock modulation is programmable via bits 3:1 of the
same ACPI Intel Thermal Monitor control register. In automatic mode, the duty cycle is
fixed at 50% on, 50% off, however in on-demand mode, the duty cycle can be
programmed from 12.5% on/ 87.5% off, to 87.5% on/12.5% off in 12.5% increments.
On-demand mode may be used at the same time automatic mode is enabled, however,
if the system tries to enable the TCC via on-demand mode at the same time automatic
mode is enabled and a high temperature condition exists, automatic mode will take
precedence.
An external signal, PROCHOT# (processor hot) is asserted when the processor detects
that its temperature is above the thermal trip point. Bus snooping and interrupt
latching are also active while the TCC is active.
Besides the thermal sensor and thermal control circuit, the Intel Thermal Monitor also
includes one ACPI register, one performance counter register, three MSR, and one I/O
pin (PROCHOT#). All are available to monitor and control the state of the Intel Thermal
Monitor feature. The Intel Thermal Monitor can be configured to generate an interrupt
upon the assertion or deassertion of PROCHOT#.
PROCHOT# will not be asserted when the processor is in the Stop Grant power states;
hence, the thermal diode reading must be used as a safeguard to maintain the
processor junction temperature within maximum specification. If the platform thermal
solution is not able to maintain the processor junction temperature within the
maximum specification, the system must initiate an orderly shutdown to prevent
damage. If the processor enters one of the above power states with PROCHOT#
already asserted, PROCHOT# will remain asserted until the processor exits the Stop
Grant power state and the processor junction temperature drops below the thermal trip
point.
If Intel Thermal Monitor automatic mode is disabled, the processor will be operating out
of specification. Regardless of enabling the automatic or on-demand modes, in the
event of a catastrophic cooling failure, the processor will automatically shut down when
the silicon has reached a temperature of approximately 125°C. At this point the
THERMTRIP# signal will go active. THERMTRIP# activation is independent of processor
activity and does not generate any bus cycles.
Datasheet 43
Thermal Specifications and Design Considerations
Unlike traditional thermal devices, the DTS will output a temperature relative to the
maximum supported operating temperature of the processor (TJ_max). It is the
responsibility of software to convert the relative temperature to an absolute
temperature. The temperature returned by the DTS will always be at or below TJ_max.
Catastrophic temperature conditions are detectable via an Out Of Spec status bit. This
bit is also part of the DTS MSR. When this bit is set, the processor is operating out of
specification and immediate shutdown of the system should occur. The processor
operation and code execution is not ensured once the activation of the Out of Spec
status bit is set.
Changes to the temperature can be detected via two programmable thresholds located
in the processor MSRs. These thresholds have the capability of generating interrupts
via the core's local APIC. Refer to the Intel® 64 and IA-32 Architectures Software
Developer's Manuals for specific register and programming details.
44 Datasheet
Thermal Specifications and Design Considerations
Only a single PROCHOT# pin exists at a package level of the processor. When the core's
thermal sensor trips, PROCHOT# signal will be driven by the processor package. If TM1
is enabled, PROCHOT# will be asserted.It is important to note that Intel recommends
TM1 to be enabled.
When PROCHOT# is driven by an external agent, if TM1 is enabled on the core, then
the processor core will have the clocks modulated.
PROCHOT# may be used for thermal protection of voltage regulators (VR). System
designers can create a circuit to monitor the VR temperature and activate the TCC
when the temperature limit of the VR is reached. By asserting PROCHOT# (pulled-low)
and activating the TCC, the VR will cool down as a result of reduced processor power
consumption. Bi-directional PROCHOT# can allow VR thermal designs to target
maximum sustained current instead of maximum current. Systems should still provide
proper cooling for the VR and rely on bi-directional PROCHOT# only as a backup in case
of system cooling failure. The system thermal design should allow the power delivery
circuitry to operate within its temperature specification even while the processor is
operating at its TDP. With a properly designed and characterized thermal solution, it is
anticipated that bi-directional PROCHOT# would only be asserted for very short periods
of time when running the most power intensive applications. An under-designed
thermal solution that is not able to prevent excessive assertion of PROCHOT# in the
anticipated ambient environment may cause a noticeable performance loss.
Refer to the Voltage Regulation Specification for details on implementing the bi-
directional PROCHOT# feature.
Datasheet 45
Debug Tools Specifications
46 Datasheet