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Lecture 4 Characterization

The document provides an introduction to VLSI design, focusing on the physical structure and operating modes of nMOS transistors, including cutoff, linear, and saturation regions. It discusses I-V characteristics, non-ideal effects such as mobility degradation and velocity saturation, and the impact of temperature on transistor performance. Additionally, it covers DC transfer characteristics and the effects of beta ratio on inverter design.

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0% found this document useful (0 votes)
15 views27 pages

Lecture 4 Characterization

The document provides an introduction to VLSI design, focusing on the physical structure and operating modes of nMOS transistors, including cutoff, linear, and saturation regions. It discusses I-V characteristics, non-ideal effects such as mobility degradation and velocity saturation, and the impact of temperature on transistor performance. Additionally, it covers DC transfer characteristics and the effects of beta ratio on inverter design.

Uploaded by

josetorresuptp
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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Introduction to VLSI Design 113-2

Introduction to VLSI Design


113-2

Devices and the Characterizations

Chung-An Shen(沈中安)
Universidad Politécnica Taiwán Paraguay
National Taiwan University of Science and Technology

1
Introduction to VLSI Design 113-2

Introduction
 The physical structure of an nMOS transistor.

 Gate, source, drain, substrate, channel.

2
Introduction to VLSI Design 113-2

Introduction
 MOS junction operating modes.
 Accumulation mode
• A negative voltage is applied

3
Introduction to VLSI Design 113-2

Introduction
 MOS junction operating modes.
 Depletion mode
• A small positive voltage is applied

4
Introduction to VLSI Design 113-2

Introduction
 MOS junction operating modes.
 Inversion mode
• A higher positive potential exceeding a threshold value Vt

5
Introduction to VLSI Design 113-2

Introduction
Vg
 Mode of operation depends on Vg, Vd, Vs + +
Vgs Vgd
• Vgs = Vg – Vs
- -
• Vgd = Vg – Vd Vs Vd
- +
• Vds = Vd – Vs = Vgs - Vgd Vds

 Source and drain are symmetric diffusion terminals


• By convention, source is terminal at lower voltage
• Hence Vds  0
 nMOS body is grounded. First assume source is 0 too.
 Three regions of operation
• Cutoff
• Linear
• Saturation
6
Introduction to VLSI Design 113-2

Introduction
 MOS operating regions
 Cutoff region
• Vgs < 𝑉𝑡
• Ids = 0
• No channel

7
Introduction to VLSI Design 113-2

Introduction
 MOS operating regions
 Linear region
• Channel formed, current flows by drift of electrons (majority carriers)
• Ids increases with Vds
• Similar to linear resistors

8
Introduction to VLSI Design 113-2

Introduction
 MOS operating regions
 Saturation region
• Channel pinches off
• Ids is independent of Vds
• Similar to current source

9
Introduction to VLSI Design 113-2

I-V Characteristics
 In linear region, MOS transistor has channel inversion and
majority carriers conduct current in the form of drifting by
electric field.
 In linear region, the current Ids depends on
• How much charge is in the channel?
• How fast is the charge moving?
 Speed of carriers depends on
• Electric field
• Effective mass

10
Introduction to VLSI Design 113-2

I-V Characteristics
 Channel charge.
 MOS structure looks like parallel plate capacitor while operating in
inversions

13
Introduction to VLSI Design 113-2

I-V Characteristics
 nMOS I-V summary.

 Cutoff region, 𝑉 𝑉

 Linear region, 𝑉 𝑉

 Saturation region, 𝑉 𝑉

β is a coefficient related to the device characteristics. 16


Introduction to VLSI Design 113-2

I-V Characteristics
 An example. 2.5
Vgs = 5

 assume a 0.6 m process 2


 tox = 100 Å 1.5 Vgs = 4

Ids (mA)
 μ = 350 cm2/V*s
1
 Vt = 0.7 V Vgs = 3
 Plot Ids vs. Vds 0.5
Vgs = 2
 Vgs = 0, 1, 2, 3, 4, 5 0
Vgs = 1
0 1 2 3 4 5
 Use W/L = 4/2 
Vds

W  3.9  8.85 1014   W  W


  Cox   350   8    120 μA/V 2

L  100  10  L  L

17
Introduction to VLSI Design 113-2

I-V Characteristics
 All dopings and voltages are inverted for pMOS
• Source is the more positive terminal
 Mobility p is determined by holes
 Typically 2-3x lower than that of electrons mn
 Provide less current than nMOS transistors
 2-3 times larger (W/L) needed for pMOS to achieve the same level of current
 Thus pMOS must be wider to provide same current
0
V g s = -1
V g s = -2

-0 .2
V g s = -3
Ids (mA)

-0 .4
V g s = -4

-0 .6

V g s = -5
-0 .8
-5 -4 -3 -2 -1 0
V ds

18
Introduction to VLSI Design 113-2

CMOS circuit example

 Determine 𝑉 and 𝑉 for the E-MOSFET circuit in figure.


Assume this particular MOSFET has β = 100 and 𝑉 2𝑉.

 𝑉 𝑉 24𝑉 3.13𝑉
.

 β/2 50

 𝐼 𝑉 𝑉 50 3.13 2 63.8𝑚𝐴

 𝑉 𝑉 𝐼 𝑅 24𝑉 63.8𝑚𝐴 200Ω 11.2𝑉

19
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Ideal vs. Simulated nMOS I-V Curves

21
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Electric Fields Effects

 Vertical electric field:


• Attracts carriers into channel

• Long channel:

 Lateral electric field:


• Accelerates carriers from drain to source

• Long channel:

23
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Mobility Degradation

 High Evert effectively reduces mobility

 Mobility decreases as 𝑣 𝜇𝐸
• Temperature or doping concentration increases

• The vertical electric field increases (Collision with oxide interface)

24
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Velocity Saturation

 At high lateral electric field, carrier velocity will cease to scale linearly
• Carriers scatter off atoms in silicon lattice
• Velocity reaches vsat
• Electrons: 107 cm/s
• Holes: 8 x 106 cm/s
• Better model

25
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Velocity Saturation

 As the technology advances and the channel gets shorter, velocity


saturates at even smaller 𝑉
 Revision on the 𝐼 formula (𝛼-power law model)
• 𝛼: velocity saturation index

• 𝛼 2 is the non-saturation case

26
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Channel Length Modulation

 Reverse-biased p-n junctions form a depletion region


 Region between n and p with no carriers
 Width of depletion 𝐿 region grows with reverse bias
 Higher 𝑉 shortens the length of the channel
 𝐿 𝐿 𝐿
 Shorter Leff gives more current
 Ids increases with Vds
 Even in saturation

28
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 In the saturation region, as 𝑉 ↑
 𝐿 ↓
 𝐸↑
 𝐼 ↑
 The drain current is thus affected

29
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Threshold Voltage Effects

 Ideal models assume 𝑉 is constant

 In fact, 𝑉 weakly depends on


• Body voltage: body effect

• Drain voltage (drain-induced barrier lowering, DIBL)


 𝑉 decreases with 𝑉
 𝐼 increases with 𝑉
• Channel length (short channel effect)
 𝑉 increases with the channel length

30
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Leakage

 Even when transistors are nominally OFF, they leak small amount of
current
 Subthreshold conduction
• Conduction between source and drain
 Gate leakage
• Leakage from the gate to body
 Junction leakage
• Leakage from source/drain to body

32
Introduction to VLSI Design 113-2

Non-ideal I-V Effects


 Temperature Dependence
 As 𝑇 ↑
 Mobility ↓
 Threshold voltage ↓
 Junction leakage ↑
 Subthreshold leakage ↑
 OFF current ↑
 ON current ↓

38
Introduction to VLSI Design 113-2

DC Transfer Characteristics
 Beta Ratio Effects
 Inverter with different beta ratio 𝑟 is known as the skewed inverter.
 The gate threshold voltage (input threshold) 𝑉 𝑉 𝑉 is
controlled by the ratio

 1: unskewed, the inverter has the same current sourcing and sinking capability,
i.e., the nMOS is as strong as the pMOS
 1: HI-skewed, stronger
pMOS, higher switching threshold
 1: LO-skewed, weaker
pMOS, lower switching threshold

46
Introduction to VLSI Design 113-2

54

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