Revised February 2000
DM74ALS00A
Quad 2-Input NAND Gate
General Description
Features
This device contains four independent gates, each of which
performs the logic NAND function.
Switching specifications at 50 pF
Switching specifications guaranteed over full temperature and VCC range
Advanced oxide-isolated, ion-implanted Schottky TTL
process
Functionally and pin for pin compatible with Schottky
and low power Schottky TTL counterpart
Improved AC performance over Schottky and low power
Schottky counterparts
Ordering Code:
Order Number
Package Number
Package Description
DM74ALS00AM
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
DM74ALS00ASJ
M14D
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
DM74ALS00AN
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter X to the ordering code.
Connection Diagram
Function Table
Y = AB
Inputs
Output
H = HIGH Logic Level
L = LOW Logic Level
2000 Fairchild Semiconductor Corporation
DS006270
www.fairchildsemi.com
DM74ALS00A Quad 2-Input NAND Gate
September 1986
DM74ALS00A
Absolute Maximum Ratings(Note 1)
Supply Voltage
7V
Input Voltage
7V
0C to +70C
Operating Free Air Temperature Range
Note 1: The Absolute Maximum Ratings are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The Recommended Operating Conditions table will define the conditions
for actual device operation.
65C to +150C
Storage Temperature Range
Typical JA
N Package
86.5C/W
M Package
116.0C/W
Recommended Operating Conditions
Symbol
Parameter
Min
Nom
Max
Units
4.5
5.5
VCC
Supply Voltage
VIH
HIGH Level Input Voltage
VIL
LOW Level Input Voltage
0.8
IOH
HIGH Level Output Current
0.4
mA
IOL
LOW Level Output Current
mA
TA
Free Air Operating Temperature
70
Electrical Characteristics
over recommended operating free air temperature range. All typical values are measured at VCC = 5V, TA = 25C.
Symbol
Parameter
Conditions
VIK
Input Clamp Voltage
VCC = 4.5V, II = 18 mA
VOH
HIGH Level
IOH = 0.4 mA
Output Voltage
VCC = 4.5V to 5.5V
VOL
LOW Level
Min
Units
V
IOL = 8 mA
V
0.35
0.5
VCC = 5.5V, VIH = 7V
0.1
mA
VCC = 5.5V, VIH = 2.7V
20
VCC = 5.5V, VIL = 0.4V
0.1
mA
112
mA
0.85
mA
1.62
mA
Min
Max
Units
11
ns
ns
II
Input Current at Maximum
IIH
HIGH Level Input Current
IIL
LOW Level Input Current
IO
Output Drive Current
VCC = 5.5V
VO = 2.25V
ICC
Supply Current
VCC = 5.5V
Outputs HIGH
0.43
Outputs LOW
Input Voltage
Max
1.5
VCC 2
VCC = 4.5V
Output Voltage
Typ
30
Switching Characteristics
over recommended operating free air temperature range
Symbol
tPLH
tPHL
Parameter
Conditions
Propagation Delay Time
VCC = 4.5V to 5.5V
LOW-to-HIGH Level Output
RL = 500
Propagation Delay Time
CL = 50 pF
HIGH-to-LOW Level Output
www.fairchildsemi.com
DM74ALS00A
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Package Number M14A
www.fairchildsemi.com
DM74ALS00A
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
www.fairchildsemi.com
DM74ALS00A Quad 2-Input NAND Gate
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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