27-03-2012
Hardware testing
Dr.ing. Antonius STANCIU
Automated optical inspection
AOI is a type of white box testing.
Used for testing: PCB, LCDs,
transistors, automotive parts.
Detects problems early in the
production process.
Automated optical inspection
Capturing an image: scanner or camera
Type of cameras: Streaming video 2D frame
grabbers, Line Scan Still Image Camera and CCD
camera.
Learning methods for AIO systems:
image matching;
algorithm based.
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27-03-2012
Automated optical inspection
To obtain the necessary data one can use 3D software imaging or LED
light measurements (for accurate measurements, typical systems use
both).
System speed is influenced by the size and complexity of the board
being inspected and the level of inspection.
Type of machines
Stand-alone and inline AOI systems
Closed-and open-top AOI systems
AOI and combined AOI/AXI systems
Automated optical inspection
AOIs can inspect this features:
Area defects;
Component polarity;
Component presence/absence;
Excessive solder joints;
Height defects;
Insufficient paste around Leads;
Insufficient solder joints;
Severely damaged components;
Solder bridges;
Volume defects;
Wrong part.
Boundary scan
Method for testing interconnects.
Test cells are connected to each pin of the device.
Devices that support boundary scan contain a shift-register
(BSR) cell for each signal pin of the device.
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Boundary scan
Joint Test Action Group (JTAG)
The year 1990: IEEE 1149.1 Standard Test Access Port and Boundary-Scan
Architecture.
Intel released, in 1990, the first processor with JTAG: the 80486.
Devised for testing printed circuit boards using boundary scan.
Used for accessing sub-blocks of integrated circuits.
Joint Test Action Group (JTAG)
TDI (Test Data In)
TDO (Test Data Out)
TCK (Test Clock)
TMS (Test Mode Select)
TRST (Test Reset) optional.
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Joint Test Action Group (JTAG)
Joint Test Action Group (JTAG)
Debugging architectures built up using JTAG: ARM CoreSight and Nexus.
JTAG is used by FPGA developers.
By using JTAG and Boundary Scan chain you can test the combinational
logic.
Devices expose one or more test access ports (TAPs).
Bead probe technology
Used to provide electrical access.
Bead probes do not affect the signal
quality.
The bead probe leaves a coating
of flux.
Require the trace being tested to be
located on the surface.
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Burn-in
Components of a system are exercised prior to
being placed in service.
If the burn-in period is made sufficiently
long, the system can then be trusted.
A precondition for a successful burn-in is a
bathtub-like failure rate.