MAGNETO-RESISTIVE
ACCESS MEMORY 
(MRAM) 
Presented By: 
J. Shravani  
CSE-4/4, 
Regd.No.:06521A0536 
 
Guided  By 
Asst.Proff Mr.V.V.S.N.Sastry 
Computer Science Dept. 
 
 It is a Non-Volatile Random Access Memory. 
 This technology is designed to initially replace 
flash memory and, potentially, DRAM 
memory.  
 MRAM uses magnetic, thin film elements on a 
silicon substrate that can be built on the same 
chip with the logic circuits.  
   The MRAM product, called MR2A16A . 
 
The main weakness of flash memory is the 
number of times that data can be written to it.  
Data can be read from flash as many times as 
desired, but after a certain number of "write" 
operations, it will fail.  
The erase command takes much longer than 
the write process. 
Flash Memory Chips are not made with the 
ability to erase individual bits or bytes. Only 
large sections of memory (usually 512 bytes or 
more) can be erased at a time. 
Information 
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Input 
Output 
Information 
transmission 
Information 
Processing 
Information 
storage 
DRAM, MRAM 
 
Magnetic (HDD) 
Optical (CD, DVD) 
 
Fast 
Unlimited Cycles 
Nonvolatile 
Viable 
 MRAM requires less memory refreshes 
 More storage in the mobile devices 
 Retains data after a power supply is turned off  
 
 
 1989 - IBM scientists made a string of key discoveries about 
the giant magneto-resistive effect" in thin-film structures. 
 
 2000 - IBM and Infineon established a joint MRAM 
development program. 
 
 2003 - A 128 kbit MRAM chip was introduced 
 
 2004 -Renesas Technology Develops High-Speed, High-
Reliability MRAM Technology. 
 
 2005 - Renesas Technology and Grandis to Collaborate on 
Development of 65 nm MRAM Employing Spin Torque Transfer. 
  Magnetic Random Access Memory  
Cross point 
architecture 
Magnetic 
memory 
element 
High resistance  
 
Low resistance 
topping 
crust 
integration 
Si 
circuitry 
  Integration of MRAM (pizza style) 
  Writing a bit in MRAM 
 
This creates a local 
magnetic field to 
switch a memory cell at 
the cross point 
Send current 
through metal word 
and bit lines. 
  Reading a bit in MRAM 
- Send current through element 
- Measure its resistance (high or low) 
But many parallel current paths 
  diode or transistor needed 
 Information is stored as magnetic polarization, not charge 
 
 The state of the bit is detected as a change in resistance 
Magnetic layer 1 (free layer) 
Magnetic layer 2 (fixed layer) 
Tunnel barrier 
Magnetic vectors are parallel   
low resistance.  0 
Magnetic vectors are anti-parallel  
high resistance.  1 
S 
S  N 
N 
N 
S  N 
S 
Target Application  Battery 
Backed SRAM Replacement 
Primary Usage 
Data Logging 
Parameter 
Storage 
System Status 
Storage Buffers 
Battery Contact Failure 
Out-of-Tolerance Voltage 
Spikes 
Limited Life 
Manufacturing 
Complexity 
More Parts & Labor & 
Board Space & Weight 
System Design 
Complexity 
MRAM Applications 
Aerospace and military systems 
 Digital Cameras 
 Notebooks 
 Smart Cards 
 Mobile Telephones 
 Cellular Based Stations 
 Personal Computers 
 Battery Backed SRAM Replacement 
 Media Players 
 Book Readers 
MRAM array 
Biomolecule labeled by magnetic markers  
4  Motorola tunnel 
MRAM demos 
Honeywell GMR-MRAM 
limited performance 
0.256 
 Non Volatile 
 No need to refresh 
 (potentially) High density 
 Non destructive read 
 Read speed = write speed; < 50ns  
 Unlimited R/W endurance 
 Soft error immunity