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Jaume Roig
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2010 – 2019
- 2012
- [j12]Jaume Roig, Julien Lebon, Steven Vandeweghe, Samir Mouhoubi, Filip Bauwens:
Improved current filament control during Zener diode zapping. Microelectron. Reliab. 52(9-10): 2368-2373 (2012) - [j11]Ana Villamor-Baliarda, Piet Vanmeerbeek, Michele Riccio
, Vincenzo d'Alessandro
Influence of charge balance on the robustness of trench-based super junction diodes. Microelectron. Reliab. 52(9-10): 2409-2413 (2012) - 2011
- [j10]Ana Villamor-Baliarda, Piet Vanmeerbeek, Jaume Roig, Peter Moens, David Flores
Electric field unbalance for robust floating ring termination. Microelectron. Reliab. 51(9-11): 1959-1963 (2011) - 2010
- [j9]R. Charavel, Jaume Roig, S. Mouhoubi, P. Gassot, Filip Bauwens, Piet Vanmeerbeek, B. Desoete, Peter Moens, Eddy De Backer:
Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices. Microelectron. Reliab. 50(9-11): 1758-1762 (2010)
2000 – 2009
- 2008
- [j8]L. Théolier
Switching performance of 65 V vertical N-channel FLYMOSFETs. Microelectron. J. 39(6): 914-921 (2008) - [j7]Jaume Roig, B. Desoete, Filip Bauwens, F. Lovadina, Peter Moens:
Thermal resistance assessment in multi-trenched power devices. Microelectron. Reliab. 48(8-9): 1479-1484 (2008) - 2007
- [j6]Yann Weber, Jaume Roig, Jean-Michel Reynes, Frederic Morancho, Evgueniy N. Stefanov, Monique Dilhan, Gérard Sarrabayrouse:
Characterisation of P floating islands for 150-200 V FLYMOSFETs. IET Circuits Devices Syst. 1(5): 333-340 (2007) - [c1]Benjamín Iñíguez, Antonio Lázaro
Charge-Based Compact Modeling of Multiple-Gate MOSFET. CICC 2007: 49-56 - 2005
- [j5]Ignasi Cortés, Jaume Roig, David Flores
Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectron. Reliab. 45(3-4): 493-498 (2005) - [j4]Jesús Urresti
Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectron. Reliab. 45(7-8): 1181-1186 (2005) - 2004
- [j3]Jaume Roig, David Flores
Thin-film silicon-on-sapphire LDMOS structures for RF power amplifier applications. Microelectron. J. 35(3): 291-297 (2004) - 2003
- [j2]Jesús Urresti
Optimisation of very low voltage TVS protection devices. Microelectron. J. 34(9): 809-813 (2003) - 2002
- [j1]Jaume Roig, David Flores
Reduction of self-heating effect on SOIM devices. Microelectron. Reliab. 42(1): 61-66 (2002)
Coauthor Index
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