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Dave Reid
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2010 – 2019
- 2015
- [c8]Razaidi Hussin
, Louis Gerrer, Jie Ding, Liping Wang, Salvatore M. Amoroso, Binjie Cheng, Dave Reid, Pieter Weckx, Marko Simicic
Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. ESSDERC 2015: 238-241 - [c7]A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer:
Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. ISCAS 2015: 2449-2452 - 2014
- [j5]Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. Microelectron. Reliab. 54(4): 682-697 (2014) - 2013
- [c6]Jie Ding, Dave Reid, Campbell Millar, Asen Asenov:
Investigation of SRAM using BTI-aware statistical compact models. ESSDERC 2013: 186-189 - [c5]Plamen Asenov, David New, Dave Reid, Campbell Millar, Scott Roy, Asen Asenov:
Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models. ICICDT 2013: 29-32 - [c4]Binjie Cheng, Xingsheng Wang
SRAM device and cell co-design considerations in a 14nm SOI FinFET technology. ISCAS 2013: 2339-2342 - 2012
- [c3]Plamen Asenov, Dave Reid, Scott Roy, Campbell Millar, Asen Asenov:
An advanced statistical compact model strategy for SRAM simulation at reduced VDD. ESSDERC 2012: 205-208 - 2011
- [j4]James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell:
The evolution of standard cell libraries for future technology nodes. Genet. Program. Evolvable Mach. 12(3): 235-256 (2011) - [c2]Michael Merrett, Plamen Asenov, Yangang Wang, Mark Zwolinski
Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis. DATE 2011: 1537-1540
2000 – 2009
- 2009
- [c1]Asen Asenov, Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard O. Sinnott
Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. LSSC 2009: 369-378 - 2008
- [j3]Urban Kovac, Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov:
Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. Microelectron. Reliab. 48(8-9): 1572-1575 (2008)
1990 – 1999
- 1995
- [j2]Asen Asenov, Dave Reid, John R. Barker:
Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers. Parallel Comput. 21(4): 669-682 (1995) - 1994
- [j1]Asen Asenov, Dave Reid, John R. Barker:
Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers. Parallel Comput. 20(3): 375-387 (1994)
Coauthor Index
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