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Vijay Reddy
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2020 – today
- 2022
- [c13]Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy:
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors. IRPS 2022: 10 - 2021
- [c12]Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam:
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique. IRPS 2021: 1-6 - 2020
- [c11]Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam:
A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors. IRPS 2020: 1-6
2010 – 2019
- 2019
- [c10]Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy:
Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process. IRPS 2019: 1-6 - 2018
- [c9]Gyusung Park, Minsu Kim, Chris H. Kim, Bongjin Kim, Vijay Reddy:
All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits. IRPS 2018: 5 - 2016
- [j6]Senthil Arasu, Mehrdad Nourani
, John M. Carulli, Vijay Reddy:
Controlling Aging in Timing-Critical Paths. IEEE Des. Test 33(4): 82-91 (2016) - 2014
- [j5]Haldun Küflüoglu, Cathy Chancellor, Min Chen, Claude Cirba, Vijay Reddy:
Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators. ACM J. Emerg. Technol. Comput. Syst. 10(1): 2:1-2:16 (2014) - [j4]Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli Jr., Gautam Kapila, Min Chen:
Reliability improvement of logic and clock paths in power-efficient designs. ACM J. Emerg. Technol. Comput. Syst. 10(1): 3:1-3:23 (2014) - [c8]Senthil Arasu, Mehrdad Nourani, Frank Cano, John M. Carulli, Vijay Reddy:
Asymmetric aging of clock networks in power efficient designs. ISQED 2014: 484-486 - 2013
- [c7]Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao
ACE: A robust variability and aging sensor for high-k/metal gate SoC. ESSDERC 2013: 182-185 - [c6]Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli:
Performance entitlement by exploiting transistor's BTI recovery. ISQED 2013: 341-346 - [c5]Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy:
A design-for-reliability approach based on grading library cells for aging effects. ITC 2013: 1-7 - 2012
- [j3]Min Chen, Vijay Reddy, Srikanth Krishnan, Venkatesh Srinivasan, Yu Cao
Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors. IEEE Des. Test Comput. 29(5): 18-26 (2012)
2000 – 2009
- 2009
- [c4]Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, Srikanth Krishnan, Yu Cao
Circuit aging prediction for low-power operation. CICC 2009: 427-430 - 2008
- [c3]Wenping Wang, Vijay Reddy, Bo Yang, Varsha Balakrishnan, Srikanth Krishnan, Yu Cao:
Statistical prediction of circuit aging under process variations. CICC 2008: 13-16 - 2007
- [c2]Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao:
An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology. CICC 2007: 511-514 - 2006
- [j2]Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli
Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectron. Reliab. 46(5-6): 656-665 (2006) - 2005
- [j1]Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan:
Impact of negative bias temperature instability on digital circuit reliability. Microelectron. Reliab. 45(1): 31-38 (2005) - 2004
- [c1]Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess:
Impact of Negative Bias Temperature Instability on Product Parametric Drift. ITC 2004: 148-155
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