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"All-digital PLL frequency and phase noise degradation measurements using ..."

Gyusung Park et al. (2018)

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DOI: 10.1109/IRPS.2018.8353613

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  dblp key:
  - conf/irps/ParkKKKR18
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Gyusung Park, Minsu Kim, Chris H. Kim, Bongjin Kim, Vijay Reddy:
All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits. IRPS 2018: 5

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