default search action
"Low Power Testing of VLSI Circuits: Problems and Solutions."
Patrick Girard (2000)
- Patrick Girard:
Low Power Testing of VLSI Circuits: Problems and Solutions. ISQED 2000: 173-180
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.