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"Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination ..."

Chengmin Li, Jing Sheng, Drazen Dujic (2023)

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DOI: 10.1109/TIE.2022.3224124

access: closed

type: Journal Article

metadata version: 2023-04-29

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Chengmin Li, Jing Sheng, Drazen Dujic:
Reliable Gate Driving of SiC MOSFETs With Crosstalk Voltage Elimination and Two-Step Short-Circuit Protection. IEEE Trans. Ind. Electron. 70(10): 10066-10075 (2023)

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