default search action
IEEE Design & Test, Volume 30
Volume 30, Number 1, February 2013
- John F. Croix, Sunil P. Khatri, Kanupriya Gulati:
Using GPUs to Accelerate CAD Algorithms. 8-16 - Steven Hirsch, Ulrich Finkler:
To Thread or Not to Thread. 17-25 - Wei Wu, Fang Gong, Rahul Krishnan, Lei He, Hao Yu
:
Exploiting Parallelism by Data Dependency Elimination: A Case Study of Circuit Simulation Algorithms. 26-35 - Scott W. Wedge, Robert Daniels, Harald von Sosen:
Multicore Algorithms for Transient-Noise Simulation. 36-44 - Weiwei Chen, Xu Han, Che-Wei Chang, Rainer Dömer:
Advances in Parallel Discrete Event Simulation for Electronic System-Level Design. 45-54 - Patrick H. Madden:
Dispelling the Myths of Parallel Computing. 58-64 - Leon Stok:
Developing Parallel EDA Tools [The Last Byte]. 65-66 - Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Deploying Scan Chains for Data Storage in Test Compression Environment. 68-76
Volume 30, Number 2, April 2013
- Adam Waksman, Simha Sethumadhavan, Julianna Eum:
Practical, Lightweight Secure Inclusion of Third-Party Intellectual Property. 8-16 - Jim Aarestad, Philip Ortiz, Dhruva Acharyya, Jim Plusquellic:
HELP: A Hardware-Embedded Delay PUF. 17-25 - Kan Xiao, Xuehui Zhang, Mohammad Tehranipoor:
A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay. 26-34 - Jeyavijayan Rajendran, Arun K. Kanuparthi, Mohamed Zahran
Securing Processors Against Insider Attacks: A Circuit-Microarchitecture Co-Design Approach. 35-44 - Rajat Subhra Chakraborty, Indrasish Saha, Ayan Palchaudhuri
Hardware Trojan Insertion by Direct Modification of FPGA Configuration Bitstream. 45-54 - Jason Oberg, Timothy Sherwood
Eliminating Timing Information Flows in a Mix-Trusted System-on-Chip. 55-62 - Teresa L. McLaurin:
Creating Structural Patterns for At-Speed Testing: A Case Study. 66-76 - Hsuan-Ming Huang, Charles H.-P. Wen
Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection. 77-86 - Pedro Reviriego
Diverse Double Modular Redundancy: A New Direction for Soft-Error Detection and Correction. 87-95
Volume 30, Number 3, June 2013
- Swarup Bhunia
Protection Against Hardware Trojan Attacks: Towards a Comprehensive Solution. 6-17 - Shaji Krishnan, Hans G. Kerkhoff:
Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses. 18-24 - Samah Mohamed Saeed, Ozgur Sinanoglu
Expedited-compact architecture for average scan power reduction. 25-33 - Abdelhakim Latoui
An Optical BILBO for Online Testing of Embedded Systems. 34-48 - Weihua Sheng, Stefan Schürmans, Maximilian Odendahl, Rainer Leupers, Gerd Ascheid:
Automatic Calibration of Streaming Applications for Software Mapping Exploration. 49-58 - Susann Wolf, Andy Heinig, Uwe Knöchel:
XML-Based Hierarchical Description of 3D Systems and SIP. 59-69 - Lars Liebmann, J. Andres Torres:
A Designer's Guide to Subresolution Lithography: Enabling the Impossible to Get to the 14-nm Node [Tutorial]. 70-92
Volume 30, Number 4, August 2013
- Eddie Hung, Bradley R. Quinton, Steven J. E. Wilton:
Linking the Verification and Validation of Complex Integrated Circuits Through Shared Coverage Metrics. 8-15 - Arie Margulis, David Akselrod, Eric Rentschler, Mike Ricchetti:
Evolution of Graphics Northbridge Test and Debug Architectures Across Four Generations of AMD ASICs. 16-25 - Shobhit Malik, Thomas Herrmann, Sriram Madhavan
Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. 26-34 - Sehun Kook, Aritra Banerjee, Abhijit Chatterjee:
Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs. 36-48 - Mohammad Mirzaei
A New Approach for Automatic Test Pattern Generation in Register Transfer Level Circuits. 49-59 - Yuta Yamato, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, Michael A. Kochte:
LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing. 60-70 - Vincenzo Rana
Design Methods for Parallel Hardware Implementation of Multimedia Iterative Algorithms. 71-80 - Matthias Sauer, Alexander Czutro, Tobias Schubert, Stefan Hillebrecht, Ilia Polian, Bernd Becker
SAT-Based Analysis of Sensitizable Paths. 81-88
Volume 30, Number 5, October 2013
- Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak:
FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. 6-14 - Michele Portolan
Executing IJTAG: Are Vectors Enough? 15-25 - Artur Jutman
Effective Scalable IEEE 1687 Instrumentation Network for Fault Management. 26-35 - Martin Keim:
Thinking About Adopting IEEE P1687? 36-43 - Melanie Po-Leen Ooi
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. 44-53 - Zhenglin Liu, Qingchun Zhu, Dongfang Li, Xuecheng Zou:
Off-Chip Memory Encryption and Integrity Protection Based on AES-GCM in Embedded Systems. 54-62 - Sk Subidh Ali
A Fault Analysis Perspective for Testing of Secured SoC Cores. 63-73 - Azadeh Davoodi, Min Li, Mohammad Tehranipoor:
A Sensor-Assisted Self-Authentication Framework for Hardware Trojan Detection. 74-82
Volume 30, Number 6, December 2013
- Keith A. Bowman
Adaptive and Resilient Circuits for Dynamic Variation Tolerance. 8-17 - Xingsheng Wang
Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology. 18-28 - Sumeet Kumar Gupta, Kaushik Roy:
Device-Circuit Co-Optimization for Robust Design of FinFET-Based SRAMs. 29-39 - Xiaoming Chen, Yu Wang
Assessment of Circuit Optimization Techniques Under NBTI. 40-49 - Edward A. Stott, Zhenyu Guan, Joshua M. Levine, Justin S. J. Wong
Variation and Reliability in FPGAs. 50-59 - Mehdi Dehbashi, Görschwin Fey
Debug Automation for Logic Circuits Under Timing Variations. 60-69 - Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. 70-79 - Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Naudet, Gerard Bret:
Reduced-Code Linearity Testing of Pipeline ADCs. 80-88 - Selahattin Sayil, Sumanth R. Yeddula, Juyu Wang:
Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits. 89-97 - Scott Davidson:
Planned Unobsolescence. 104
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2024-10-31 20:05 CET by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: