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Duck Young Kim

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2020 – today

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2024
[c6]
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Harry Lim, Hyoung Seok Kang, Duck Young Kim:
Information Modeling for Data-Driven Digital Twin Simulation: Insights from Case Studies of Port Logistics and Urban Traffic Systems. APMS (4) 2024: 307-322
2023
[c5]
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Harry Lim, Minseop Go, Taekyu Lim, Duck Young Kim:
Adaptive Traffic Signal Control for a Mixed Autonomous and Traditional Vehicles by Agent-Based Digital Twin Simulation. APMS (3) 2023: 603-618
2022
[j12]
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J. W. Park, K. H. Min, Duck Young Kim:
Auto-calibration of robot workcells via remote laser scanning. Robotics Comput. Integr. Manuf. 78: 102394 (2022)
[j11]
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Jin Woo Park, Jongil Park, Hansol Kim, Namhun Kim, Duck Young Kim:
Assembly Part Positioning on Transformable Pin Array Fixture by Active Pin Maximization and Joining Point Alignment. IEEE Trans Autom. Sci. Eng. 19(2): 1047-1057 (2022)
[e2]
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Duck Young Kim, Gregor von Cieminski, David Romero:
Advances in Production Management Systems. Smart Manufacturing and Logistics Systems: Turning Ideas into Action - IFIP WG 5.7 International Conference, APMS 2022, Gyeongju, South Korea, September 25-29, 2022, Proceedings, Part I. IFIP Advances in Information and Communication Technology 663, Springer 2022, ISBN 978-3-031-16406-4 [contents]
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Duck Young Kim, Gregor von Cieminski, David Romero:
Advances in Production Management Systems. Smart Manufacturing and Logistics Systems: Turning Ideas into Action - IFIP WG 5.7 International Conference, APMS 2022, Gyeongju, South Korea, September 25-29, 2022, Proceedings, Part II. IFIP Advances in Information and Communication Technology 664, Springer 2022, ISBN 978-3-031-16410-1 [contents]
2021
[j10]
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Woonsang Baek, Duck Young Kim:
In-Process Noise Inspection System for Product Fault Detection in a Loud Shop-Floor Environment. IEEE Trans. Instrum. Meas. 70: 1-11 (2021)
[c4]
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Jeongha Shin, Duck Young Kim:
Software Architecture for an Active Device Driver in Reconfigurable Manufacturing Systems. APMS (1) 2021: 596-603
2020
[j9]
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Duck Young Kim, Jin Woo Park, Sujeong Baek, K.-B. Park, H.-R. Kim, J.-I. Park, H.-S. Kim, B.-B. Kim, H.-Y. Oh, Kichang Namgung, Woonsang Baek:
A modular factory testbed for the rapid reconfiguration of manufacturing systems. J. Intell. Manuf. 31(3): 661-680 (2020)
[j8]
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Woonsang Baek, Duck Young Kim:
An in-Process Inspection System to Detect Noise Originating from within the Interior Trim Panels of Car Doors. Sensors 20(3): 630 (2020)
[j7]
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Kichang Namgung, Hyunsik Yoon, Sujeong Baek, Duck Young Kim:
Estimating System State through Similarity Analysis of Signal Patterns. Sensors 20(23): 6839 (2020)

2010 – 2019

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2019
[j6]
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Sujeong Baek, Duck Young Kim:
Abrupt variance and discernibility analyses of multi-sensor signals for fault pattern extraction. Comput. Ind. Eng. 128: 999-1007 (2019)
[j5]
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Sujeong Baek, Duck Young Kim:
Fault Prediction via Symptom Pattern Extraction Using the Discretized State Vectors of Multisensor Signals. IEEE Trans. Ind. Informatics 15(2): 922-931 (2019)
[j4]
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Jin Woo Park, Moonsoo Shin, Duck Young Kim:
An Extended Agent Communication Framework for Rapid Reconfiguration of Distributed Manufacturing Systems. IEEE Trans. Ind. Informatics 15(7): 3845-3855 (2019)
[c3]
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Woonsang Baek, Duck Young Kim:
In-Process Noise Detection System for Product Inspection by Using Acoustic Data. APMS (2) 2019: 413-420
2018
[j3]
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Woonsang Baek, Sujeong Baek, Duck Young Kim:
Characterization of System Status Signals for Multivariate Time Series Discretization Based on Frequency and Amplitude Variation. Sensors 18(1): 154 (2018)
[j2]
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Jin Woo Park, Duck Young Kim:
Standard Time Estimation of Manual Tasks via Similarity Measure of Unequal Scale Time Series. IEEE Trans. Hum. Mach. Syst. 48(3): 241-251 (2018)
[c2]
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Woonsang Baek, Duck Young Kim:
An In-Process BSR-Noise Detection System for Car Door Trims. APMS (2) 2018: 35-38
[c1]
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Minseok Kim, Kyeong-Beom Park, Sung Ho Choi, Jae Yeol Lee, Duck Young Kim:
AR/VR-Based Live Manual for User-Centric Smart Factory Services. APMS (2) 2018: 417-421
2017
[j1]
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Sujeong Baek, Duck Young Kim:
Empirical Sensitivity Analysis of Discretization Parameters for Fault Pattern Extraction From Multivariate Time Series Data. IEEE Trans. Cybern. 47(5): 1198-1209 (2017)

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