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Marc Legros
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2020 – today
- 2024
- [j8]Kishan Govind
, Daniela Oliveros, Antonin Dlouhy, Marc Legros
Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data'. Mach. Learn. Sci. Technol. 5(1): 15006 (2024) - 2023
- [i2]Kishan Govind, Daniela Oliveros, Antonin Dlouhy, Marc Legros, Stefan Sandfeld:
Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data". CoRR abs/2307.06322 (2023) - [i1]Karina Ruzaeva, Kishan Govind, Marc Legros, Stefan Sandfeld:
Instance Segmentation of Dislocations in TEM Images. CoRR abs/2309.03499 (2023)
2010 – 2019
- 2017
- [j7]R. Ruffilli, Mounira Berkani
Mechanisms of power module source metal degradation during electro-thermal aging. Microelectron. Reliab. 76-77: 507-511 (2017) - 2015
- [j6]R. Ruffilli, Mounira Berkani
In-depth investigation of metallization aging in power MOSFETs. Microelectron. Reliab. 55(9-10): 1966-1970 (2015) - 2014
- [j5]Donatien Martineau
Universal mechanisms of Al metallization ageing in power MOSFET devices. Microelectron. Reliab. 54(11): 2432-2439 (2014) - 2010
- [j4]Donatien Martineau
Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. Microelectron. Reliab. 50(9-11): 1768-1772 (2010)
2000 – 2009
- 2009
- [j3]Donatien Martineau
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. Microelectron. Reliab. 49(9-11): 1330-1333 (2009) - 2007
- [j2]B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid:
Characterization and modelling of ageing failures on power MOSFET devices. Microelectron. Reliab. 47(9-11): 1735-1740 (2007) - 2005
- [j1]B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin:
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectron. Reliab. 45(9-11): 1717-1722 (2005)
Coauthor Index
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