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"Embedded Test Instrument for Intermittent Resistive Fault Detection at ..."

Hassan Ebrahimi, Hans G. Kerkhoff (2021)

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DOI: 10.1109/DDECS52668.2021.9417064

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-04

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Hassan Ebrahimi, Hans G. Kerkhoff:
Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. DDECS 2021: 75-80

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