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"Transit Time Dependent Condition Monitoring of PCBs During Testing for ..."

Vimal Samsingh Ramalingam, Kanagasabai Malathi, Esther Florence Sundarsingh (2018)

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DOI: 10.1109/TIE.2017.2716876

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tie/RamalingamKS18
Vimal Samsingh Ramalingam, Kanagasabai Malathi, Esther Florence Sundarsingh:
Transit Time Dependent Condition Monitoring of PCBs During Testing for Diagnostics in Electronics Industry. IEEE Trans. Ind. Electron. 65(1): 553-560 (2018)

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