WO2003021239A1 - Apparatus for measuring information on particular component - Google Patents

Apparatus for measuring information on particular component Download PDF

Info

Publication number
WO2003021239A1
WO2003021239A1 PCT/JP2002/008551 JP0208551W WO03021239A1 WO 2003021239 A1 WO2003021239 A1 WO 2003021239A1 JP 0208551 W JP0208551 W JP 0208551W WO 03021239 A1 WO03021239 A1 WO 03021239A1
Authority
WO
WIPO (PCT)
Prior art keywords
particular component
sample
light
measuring information
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2002/008551
Other languages
English (en)
French (fr)
Inventor
Shinji Uchida
Kiyoko Ooshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2003525272A priority Critical patent/JPWO2003021239A1/ja
Priority to EP02760738A priority patent/EP1422512A1/en
Priority to US10/415,180 priority patent/US20040024541A1/en
Publication of WO2003021239A1 publication Critical patent/WO2003021239A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
PCT/JP2002/008551 2001-08-28 2002-08-26 Apparatus for measuring information on particular component Ceased WO2003021239A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003525272A JPWO2003021239A1 (ja) 2001-08-28 2002-08-26 特定成分の情報測定装置
EP02760738A EP1422512A1 (en) 2001-08-28 2002-08-26 Apparatus for measuring information on particular component
US10/415,180 US20040024541A1 (en) 2001-08-28 2002-08-26 Apparatus for measuring information on particular component

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001257350 2001-08-28
JP2001-257350 2001-08-28

Publications (1)

Publication Number Publication Date
WO2003021239A1 true WO2003021239A1 (en) 2003-03-13

Family

ID=19085027

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/008551 Ceased WO2003021239A1 (en) 2001-08-28 2002-08-26 Apparatus for measuring information on particular component

Country Status (5)

Country Link
US (1) US20040024541A1 (ja)
EP (1) EP1422512A1 (ja)
JP (1) JPWO2003021239A1 (ja)
CN (1) CN1479864A (ja)
WO (1) WO2003021239A1 (ja)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003074993A1 (en) * 2002-03-06 2003-09-12 Matsushita Electric Industrial Co., Ltd. Concentration measurement device
WO2003078981A1 (en) * 2002-03-19 2003-09-25 Matsushita Electric Industrial Co., Ltd. Concentration measuring instrument
JP2005087613A (ja) * 2003-09-19 2005-04-07 Fujikura Ltd センサ内蔵針、検体採取用器具、及び検体検査システム
JP2005249674A (ja) * 2004-03-05 2005-09-15 Jasco Corp 高感度反射測定装置
JP2006090902A (ja) * 2004-09-24 2006-04-06 Toshiba Corp 濃度測定装置
WO2006051778A1 (ja) * 2004-11-12 2006-05-18 Matsushita Electric Industrial Co., Ltd. 生体情報測定用光学素子およびそれを用いた生体情報測定装置
JP2012176225A (ja) * 2010-09-21 2012-09-13 Nippon Telegr & Teleph Corp <Ntt> 生体情報検出装置
WO2017098872A1 (ja) * 2015-12-07 2017-06-15 ソニー株式会社 脈拍計測素子、脈拍計測装置、および電子機器
WO2018105455A1 (ja) * 2016-12-07 2018-06-14 パナソニックＩｐマネジメント株式会社 成分センサ
JP2018194423A (ja) * 2017-05-17 2018-12-06 住友電気工業株式会社 光モジュール、検知装置

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4638153B2 (ja) * 2002-04-03 2011-02-23 ヨハン ヴォルフガング ゲーテ−ウニヴェルジテート フランクフルト アム マイン 特に水性系、好ましくは多成分系の分光測定法のための赤外線測定装置
EP2133478A3 (en) * 2008-02-27 2011-10-05 Jsm Healthcare Inc Apparatus for analyzing components of urine by using atr and method thereof
KR100943095B1 (ko) 2008-02-27 2010-02-18 제이에스엠헬스케어 주식회사 변기용 소형 뇨성분 분석장치 및 이를 이용한 실시간 뇨성분 분석방법
CN102323218A (zh) * 2011-05-26 2012-01-18 浙江大学 基于光谱技术的物料实时检测监控装置
AT512375B1 (de) * 2011-12-23 2013-11-15 Anton Paar Gmbh Verfahren und sensor zur messung des co2-gehaltes von fluiden
CN104765414A (zh) * 2014-01-03 2015-07-08 义明科技股份有限公司 可携式电子装置
CN105300910B (zh) * 2014-06-27 2018-08-28 中国科学院苏州纳米技术与纳米仿生研究所 用于红外测试中的承载装置
CN107427266B (zh) 2015-01-21 2021-12-03 国立研究开发法人量子科学技术研究开发机构 血中物质浓度测定装置以及血中物质浓度测定方法
US9500580B1 (en) 2015-06-04 2016-11-22 General Electric Company Gas detector and method of detection

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03215730A (ja) * 1990-01-19 1991-09-20 Sumitomo Electric Ind Ltd 光ファイバを用いたガス検出装置
JPH05322747A (ja) * 1992-03-16 1993-12-07 Nippon Telegr & Teleph Corp <Ntt> 全反射吸収測定装置
JPH0627019A (ja) * 1992-07-13 1994-02-04 Ooita Ika Univ 分子振動アナライザー
JPH0815133A (ja) * 1994-06-29 1996-01-19 Hitachi Ltd 分析素子
JPH0875639A (ja) * 1994-09-09 1996-03-22 Agency Of Ind Science & Technol スラブ光導波路を利用した光吸収スペクトル測定装置
JPH08233728A (ja) * 1995-02-28 1996-09-13 Shimadzu Corp 顕微全反射吸収スペクトル測定装置
JPH0933427A (ja) * 1994-12-16 1997-02-07 Toto Ltd バイオセンサとこれを用いた濃度測定装置
JPH0933724A (ja) * 1995-07-13 1997-02-07 Jasco Corp 反射型偏光子及びそれを用いた分光光度計
JPH09257701A (ja) * 1996-03-21 1997-10-03 Toto Ltd 表面プラズモン共鳴センサ
JPH1164216A (ja) * 1997-08-26 1999-03-05 Matsushita Electric Ind Co Ltd 減衰全反射測定装置およびそれを用いた特定成分の測定方法
JP2000356586A (ja) * 1999-06-16 2000-12-26 Toto Ltd 表面プラズモンセンサ装置
JP2001025465A (ja) * 1999-04-30 2001-01-30 Lilienfeld-Toal Hermann V 物質を検出する装置及び方法
JP2001221689A (ja) * 2000-02-08 2001-08-17 Yokogawa Electric Corp 赤外線光源及び赤外線ガス分析計

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3513316A (en) * 1967-12-07 1970-05-19 Block Engineering Atr device having transparent slab on which is deposited an ultra-thin photocathode
US3640626A (en) * 1968-11-12 1972-02-08 American Standard Inc Measuring of the concentration of solid particles suspended in various regions in a fluid using polarized light
US3856408A (en) * 1972-06-05 1974-12-24 Svenska Traeforskningsinst Apparatus for measuring the optically birefringent properties of a liquid sample
US3994586A (en) * 1975-10-30 1976-11-30 Aluminum Company Of America Simultaneous determination of film uniformity and thickness
US4081672A (en) * 1976-10-04 1978-03-28 The United States Of America As Represented By The Secretary Of The Navy Low-loss signal coupler for optical communications and integrated optics
US6384903B1 (en) * 1977-02-28 2002-05-07 Bae Systems Information And Electronic Systems Integration, Inc. Range gated remote measurement utilizing two-photon absorption
US4171916A (en) * 1977-11-18 1979-10-23 Ishikawajima-Harima Heavy Industries Co., Ltd. Apparatus and method for measuring the consistency of a pulp suspension
DE3123518A1 (de) * 1981-06-13 1982-12-30 Teldix Gmbh, 6900 Heidelberg Laser-drehgeschwindigkeitsmesser
US5928222A (en) * 1982-08-06 1999-07-27 Kleinerman; Marcos Y. Fiber optic sensing techniques in laser medicine
US4638163A (en) * 1984-09-20 1987-01-20 Peter F. Braunlich Method and apparatus for reading thermoluminescent phosphors
JPS62145165A (ja) * 1985-12-20 1987-06-29 Toshimitsu Musha 光の位相変調を利用した免疫反応の測定方法および装置
US4906094A (en) * 1987-04-23 1990-03-06 Sumitomo Chemical Co. Ltd. Fine particle measuring method and system and a flow cell for use in the system
US4818881A (en) * 1987-05-04 1989-04-04 The United States Of America As Represented By The Secretary Of The Army High-sensitivity infrared polarimeter
EP0292216B1 (en) * 1987-05-20 1993-11-03 Kowa Co. Ltd. Ophthalmic disease detection apparatus
CA1321488C (en) * 1987-08-22 1993-08-24 Martin Francis Finlan Biological sensors
US4902134A (en) * 1988-02-03 1990-02-20 Rudolph Research Corporation Optical amplifier and method for amplifying optical polarization state change effects
US5412500A (en) * 1988-08-10 1995-05-02 Fergason; James L. System for continuously rotating plane of polarized light and apparatus using the same
US4912059A (en) * 1988-10-21 1990-03-27 The Johns Hopkins University Phase sensitive differential polarimetry technique and apparatus
SE462408B (sv) * 1988-11-10 1990-06-18 Pharmacia Ab Optiskt biosensorsystem utnyttjande ytplasmonresonans foer detektering av en specific biomolekyl, saett att kalibrera sensoranordningen samt saett att korrigera foer baslinjedrift i systemet
US5049727A (en) * 1988-12-28 1991-09-17 Pitney Bowes Inc. Locking device for removable postage meter
US5075551A (en) * 1990-03-12 1991-12-24 Fuji Electric Co., Ltd. Infrared absorption enhanced spectroscopic apparatus
KR0157030B1 (ko) * 1990-08-29 1999-05-01 가스가야 기요히고 치환형 탄소농도 측정방법, 실리콘 웨이퍼 제조방법 및 실리콘 웨이퍼 측정방법
DE4125952C2 (de) * 1991-08-06 1993-10-14 Dornier Gmbh Optischer Leistungsbegrenzer
US5311283A (en) * 1991-09-05 1994-05-10 The Dow Chemical Company Fiber optic probe and method for detecting optically active materials
US5355425A (en) * 1992-09-04 1994-10-11 Braiman Mark S Light coupling device for optical fibers
US6404482B1 (en) * 1992-10-01 2002-06-11 Nikon Corporation Projection exposure method and apparatus
JP3135389B2 (ja) * 1992-10-23 2001-02-13 松下電器産業株式会社 情報再生方法、情報記録再生方法、情報再生装置、記録媒体及び光ヘッド
US5448992A (en) * 1992-12-10 1995-09-12 Sunshine Medical Instruments, Inc. Method and apparatus for non-invasive phase sensitive measurement of blood glucose concentration
US5502560A (en) * 1994-07-22 1996-03-26 University Of Washington Analytical sensor using grating light reflection spectroscopy
US5920393A (en) * 1995-11-22 1999-07-06 Kaplan; Milton R. Methods and apparatus for identifying and quantifying constituent compounds in a specimen using modulated polychromatic partially polarized light
US5738101A (en) * 1996-01-18 1998-04-14 The Regents Of The University Of California Optical imaging through turbid media with a degenerate four-wave mixing correlation time gate
EP1650549A3 (en) * 1996-04-30 2009-11-25 FUJIFILM Corporation Surface plasmon sensor
US6277330B1 (en) * 1996-09-30 2001-08-21 Aventis Research & Technologies Gmbh & Co K.G. Optical sensor for detecting chemical substances dissolved or dispersed in water
US5991488A (en) * 1996-11-08 1999-11-23 The Arizona Board Of Regents On Behalf Of The University Of Arizona Coupled plasmon-waveguide resonance spectroscopic device and method for measuring film properties
US5776785A (en) * 1996-12-30 1998-07-07 Diagnostic Products Corporation Method and apparatus for immunoassay using fluorescent induced surface plasma emission
SE9700384D0 (sv) * 1997-02-04 1997-02-04 Biacore Ab Analytical method and apparatus
EP0863395B1 (en) * 1997-02-07 2005-06-15 Fuji Photo Film Co., Ltd. Surface plasmon sensor
US5956147A (en) * 1997-06-13 1999-09-21 Lockheed Martin Energy Research Corporation Two modulator generalized ellipsometer for complete mueller matrix measurement
US6982431B2 (en) * 1998-08-31 2006-01-03 Molecular Devices Corporation Sample analysis systems
WO2001009388A1 (en) * 1999-07-30 2001-02-08 The Penn State Research Foundation Instruments, methods and reagents for surface plasmon resonance
JP2001066248A (ja) * 1999-08-26 2001-03-16 Fuji Photo Film Co Ltd 表面プラズモンセンサー
DE60132757T2 (de) * 2000-12-27 2009-02-05 Fujifilm Corporation Totalreflexion nutzender Sensor
SE0100889D0 (sv) * 2001-03-14 2001-03-14 Biacore Ab Method and apparatus for attenuated total reflection spectrosopy
US6818894B2 (en) * 2001-04-30 2004-11-16 The Board Of Trustees Of The University Of Illinois Method and apparatus for characterization of ultrathin silicon oxide films using mirror-enhanced polarized reflectance fourier transform infrared spectroscopy

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03215730A (ja) * 1990-01-19 1991-09-20 Sumitomo Electric Ind Ltd 光ファイバを用いたガス検出装置
JPH05322747A (ja) * 1992-03-16 1993-12-07 Nippon Telegr & Teleph Corp <Ntt> 全反射吸収測定装置
JPH0627019A (ja) * 1992-07-13 1994-02-04 Ooita Ika Univ 分子振動アナライザー
JPH0815133A (ja) * 1994-06-29 1996-01-19 Hitachi Ltd 分析素子
JPH0875639A (ja) * 1994-09-09 1996-03-22 Agency Of Ind Science & Technol スラブ光導波路を利用した光吸収スペクトル測定装置
JPH0933427A (ja) * 1994-12-16 1997-02-07 Toto Ltd バイオセンサとこれを用いた濃度測定装置
JPH08233728A (ja) * 1995-02-28 1996-09-13 Shimadzu Corp 顕微全反射吸収スペクトル測定装置
JPH0933724A (ja) * 1995-07-13 1997-02-07 Jasco Corp 反射型偏光子及びそれを用いた分光光度計
JPH09257701A (ja) * 1996-03-21 1997-10-03 Toto Ltd 表面プラズモン共鳴センサ
JPH1164216A (ja) * 1997-08-26 1999-03-05 Matsushita Electric Ind Co Ltd 減衰全反射測定装置およびそれを用いた特定成分の測定方法
JP2001025465A (ja) * 1999-04-30 2001-01-30 Lilienfeld-Toal Hermann V 物質を検出する装置及び方法
JP2000356586A (ja) * 1999-06-16 2000-12-26 Toto Ltd 表面プラズモンセンサ装置
JP2001221689A (ja) * 2000-02-08 2001-08-17 Yokogawa Electric Corp 赤外線光源及び赤外線ガス分析計

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003074993A1 (en) * 2002-03-06 2003-09-12 Matsushita Electric Industrial Co., Ltd. Concentration measurement device
US7110112B2 (en) 2002-03-06 2006-09-19 Matsushita Electric Industrial Co., Ltd. Concentration measuring instrument, concentration measuring contact apparatus, concentration measuring calculating apparatus, and concentration measuring method
US7167735B2 (en) 2002-03-19 2007-01-23 Matsushita Electric Industrial Co., Ltd. Concentration measuring instrument, and method of measuring the concentration of a specific component in a subject of measurement
WO2003078981A1 (en) * 2002-03-19 2003-09-25 Matsushita Electric Industrial Co., Ltd. Concentration measuring instrument
JP2005087613A (ja) * 2003-09-19 2005-04-07 Fujikura Ltd センサ内蔵針、検体採取用器具、及び検体検査システム
JP2005249674A (ja) * 2004-03-05 2005-09-15 Jasco Corp 高感度反射測定装置
JP2006090902A (ja) * 2004-09-24 2006-04-06 Toshiba Corp 濃度測定装置
JPWO2006051778A1 (ja) * 2004-11-12 2008-05-29 松下電器産業株式会社 生体情報測定用光学素子およびそれを用いた生体情報測定装置
WO2006051778A1 (ja) * 2004-11-12 2006-05-18 Matsushita Electric Industrial Co., Ltd. 生体情報測定用光学素子およびそれを用いた生体情報測定装置
JP2012176225A (ja) * 2010-09-21 2012-09-13 Nippon Telegr & Teleph Corp <Ntt> 生体情報検出装置
WO2017098872A1 (ja) * 2015-12-07 2017-06-15 ソニー株式会社 脈拍計測素子、脈拍計測装置、および電子機器
JPWO2017098872A1 (ja) * 2015-12-07 2018-09-20 ソニー株式会社 脈拍計測素子、脈拍計測装置、および電子機器
JP2020192394A (ja) * 2015-12-07 2020-12-03 ソニー株式会社 脈拍計測素子、脈拍計測装置、および電子機器
US10912468B2 (en) 2015-12-07 2021-02-09 Sony Corporation Pulse measuring device, pulse measuring unit, and electronic apparatus
JP6992861B2 (ja) 2015-12-07 2022-01-13 ソニーグループ株式会社 脈拍計測素子、脈拍計測装置、および電子機器
WO2018105455A1 (ja) * 2016-12-07 2018-06-14 パナソニックＩｐマネジメント株式会社 成分センサ
JP2018194423A (ja) * 2017-05-17 2018-12-06 住友電気工業株式会社 光モジュール、検知装置

Also Published As

Publication number Publication date
CN1479864A (zh) 2004-03-03
US20040024541A1 (en) 2004-02-05
JPWO2003021239A1 (ja) 2004-12-16
EP1422512A1 (en) 2004-05-26

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