User profiles for Philippe Leray

Philippe LERAY

Professeur, Nantes Université
Verified email at univ-nantes.fr
Cited by 2361

Feature selection with neural networks

P Leray, P Gallinari - Behaviormetrika, 1999 - Springer
The observed features of a given phenomenon are not all equally informative: some may be
noisy, others correlated or irrelevant. The purpose of feature selection is to select a set of …

[PDF][PDF] BNT structure learning package: Documentation and experiments

P Leray, O Francois - Laboratoire PSI, Universitè et INSA de Rouen, Tech …, 2004 - Citeseer
Bayesian networks are a formalism for probabilistic reasonning that is more and more used
for classification task in data-mining. In some situations, the network structure is given by an …

A survey on latent tree models and applications

…, C Sinoquet, NL Zhang, T Liu, P Leray - Journal of Artificial …, 2013 - jair.org
In data analysis, latent variables play a central role because they help provide powerful insights
into a wide variety of phenomena, ranging from biological to human sciences. The latent …

Deep learning-based defect classification and detection in SEM images

…, S Halder, K Khalil, P Leray… - Metrology …, 2022 - spiedigitallibrary.org
Defect inspection in semiconductor processes has become a challenging task due to
continuous shrink of device patterns (pitches less than 32 nm) as we move from node to node. …

28nm pitch single exposure patterning readiness by metal oxide resist on 0.33 NA EUV lithography

…, QT Le, F Schleicher, P Leray… - Extreme Ultraviolet …, 2021 - spiedigitallibrary.org
For many years traditional 193i lithography has been extended to the next technology node
by means of multi-patterning techniques. However recently such a 193i technology became …

Learning causal bayesian networks from observations and experiments: A decision theoretic approach

S Meganck, P Leray, B Manderick - International Conference on Modeling …, 2006 - Springer
We discuss a decision theoretic approach to learn causal Bayesian networks from
observational data and experiments. We use the information of observational data to learn a …

SEM image denoising with unsupervised machine learning for better defect inspection and metrology

…, K Khalil, G Lorusso, J Severi, P Leray… - … Process Control for …, 2021 - spiedigitallibrary.org
CD-SEM images inherently contain a significant level of noise. This is because a limited
number of frames are used for averaging, which is critical to ensure throughput and minimize …

On product overlay metrology challenges in advanced nodes

A Shchegrov, P Leray, Y Paskover… - … Process Control for …, 2020 - spiedigitallibrary.org
On product overlay (OPO) challenges are quickly becoming yield limiters for the latest
technology nodes, requiring new and innovative metrology solutions. In this paper we will cover …

A dynamic Bayesian network to represent discrete duration models

R Donat, P Leray, L Bouillaut, P Aknin - Neurocomputing, 2010 - Elsevier
Originally devoted to specific applications such as biology, medicine and demography, duration
models are now widely used in economy, finance or reliability. Recent works in various …

Metrology of thin resist for high NA EUVL

…, M Ikota, AL Charley, P Leray - Metrology …, 2022 - spiedigitallibrary.org
One of the many constrains of High Numerical Aperture Extreme Ultraviolet Lithography (High
NA EUVL) is related to resist thickness. In fact, one of the consequences of moving from …