1
EL 302  
Digital Integrated Circuits 
 
Lab3 
Positive Edge Triggered D Flip-Flop 
With Asynchronous Set and Reset  
 
E.Selin Baytok 
8088 
 
 
 
 
 
27.04.2007 
 
 
 
 
 
Purposes: 
 
Designing  a  CMOS  positive  (rising)  edge  triggered  master-slave  type  D  Ilip-Ilop  with  a  low-asserted 
asynchronous  set and reset using AMS 0.35 m CMOS technology according to the Iollowing criteria: 
 
 Clock signal parameters: trise  tIall  100 ps, duty cycle  50  and Iclk(min)  1 GHz. 
 Output load 50 IF. 
 Standard cell layout. 
 
 
 
  2 
 
 
1. Introduction 
 
  Flip Flops are employed as storage elements in synchronous circuits. This element operates according 
to the clock edge, depending on the design its output changes on the rising (positive) or Ialling (negative) edge 
oI the clock signal and keeps the data during the clock cycle. 
 
       
 
                      Fig 1 Transition Table oI D-Flip-Flop                 Fig 2 D-Flip-Flop 
 
2. Schematic Design 
 
2.1. Topology Selection 
 
In  order  to  design  a  positive  edge  triggered  d  Ilip  Ilop  master-slave  conIiguration  was  used.  In  this 
conIiguration  two  latches  composed  oI  two  back-to-back  inverters  were  cascaded  with  opposite  clock  signs. 
When clock makes its transition Irom low to high, d input is passed into the Ilip Ilop. Since the slave latch is 
blocked  by  the  low  clock  signal  data  is  kept  in  the  master  latch.  At  negative  edge  oI  the  clock  slave  latch 
becomes transparent and the stored data is sent to output Q. 
 
      
Fig 3 Synchronous Master-Slave ConIiguration    Fig 4 Transition Through One Clock Cycle 
 
Since asynchronous set and reset Iunctions are required Ior this design back-to-back inverters were turned into 
nand gates in order to be able to change the output instantaneously when an asynchonous set or reset data is 
asserted. Nor gates could also be employed but it was not preIerred because oI its lower speed and assymetric, 
large layout. As asynchronous inputs set and reset signals are to be 'anded, they should be low asserted in 
order to change the output reagardless oI the value kept in Ilip Ilop.  
  3 
 
Fig 5 Asynchronous Master-Slave ConIiguration   
 
 
 
2.2. Design Parameters 
  
According  to the  topology  chosen nand  gates  design in the previous laboratory were implemented and nmos 
transistor size to be used as pass  gates were chosen to be the same with the nand gate nmos  size in order to 
make the design  compatible with the other  elements like inverter in layout  stage.  Final nmos  size  value was 
4.1u and pmos value was 3.7u Ior the overall circuit. 
 
 
Fig 6 Schematic View oI D-Flip Flop 
 
 
3. Layout Design 
 
In this part it was tried to achieve minimum area Ior the layout according to the standard cell procedure. The 
only  problem  here  were  the  cross  connections.  They  were  increasing  the  crosses  oI  metal1  layer  on  poly 
layers thereIore metal2 layer was to be applied Ior the input connections. Final layout dimension was 28u  X 
19.6u 
  4 
 
 
Fig 7 Final Layout Design oI D-Flip Flop 
 
4. Measurements  
 
4.1. Propagation Delay, Rise Time and Fall Time of the Output 
In order to measure the rise and Iall time oI the D-Ilip Ilop circuits in the Figure 6 and  8 were used. Signals 
provided Ior measurement are as Iollows: 
 
  D  Clk  Clk-not  Set  Reset 
Source Type  Vpulse  Vpulse  Vpulse  Vdc  Vdc 
Voltage Range  0:3.3V  0:3.3V  3.3:0V  3.3V  3.3V 
Period  2ns  1ns  1ns  -  - 
 
Table 1 Measurement Inputs 
 
Fig 8 Schematic oI Test Circuit Ior Extracted Version 
  5 
 
 
4.1.1 Schematic Results 
 
 
 
Fig 9 Transient Analysis oI D-Flip Flop, High-to-low and Low-to High delays respectively 
 
4.1.2 Extracted Version Results 
 
 
 
Fig 10 Transient Analysis oI D-Flip Flop, High-to-low and Low-to High delays respectively 
 
4.2. Total power dissipation 
Current was making peaks at the clock transitions. By keeping output toggling throughout measurement with 
the inputs in Table 1, total current driven by the circuit was plotted.With the help oI calculator in Cadence the 
rms value oI the current was calculated as the average current and it was multiplied by 3.3V Vdd  to Iind the 
overall power dissipation. 
 
 
 
  6 
4.2.1 Schematic Results 
 
 
 
Fig 11 Current,D, Clock Signals oI Schematic   
 
4.2.2 Extracted Version Results 
 
 
        Fig 12 Clock, D, CurrentSignals oI Extracted Version 
 
4.3. Set Function and Set-to-Output Time 
 
Unlike the previous case set option was made Iunctional by eliminating input. ThereIore it was 
directly observed at the output.In order to test whether set Iunction is asynchronous it was asserted 
during the clock cycle.It was cheked that the output was rising to logic 1 when set is asserted. 
Set-to-Output time was measured Irom 50 oI set signal to the 50 oI the response. 
Signals provided Ior measurement are as Iollows: 
 
  7 
  D  Clk  Clk-not  Set  Reset 
Source Type  Vdc  Vpulse  Vpulse  Vpulse  Vdc 
Voltage Range  0V  0:3.3V  3.3:0V  3.3:0V  3.3V 
Period  -  1ns  1ns  10ns  - 
 
Table 2 Measurement Inputs 
 
4.3.1 Schematic Results 
 
 
 
Fig 13 Clock, D, Q and Set Signals oI Schematic 
 
4.3.2 Extracted Version Results 
 
 
 
Fig 14 Clock, D, Q and Set Signals oI Extracted Version 
  8 
4.4. Reset Function and Reset-to-Output Time 
 
Similar to set Iunction input was eliminated and the reset option is tested by applying the Iollowing signals: 
  D  Clk  Clk-not  Set  Reset 
Source Type  Vdc  Vpulse  Vpulse  Vdc  Vpulse 
Voltage Range  3.3V  0:3.3V  3.3:0V  3.3V  3.3:0V 
Period  -  1ns  1ns  -  10ns 
Table 3 Measurement Inputs 
 
It was observed that the output was lower down to logic 0 anytime reset signal is asserted. Reset-to-Output time 
was measured Irom 50 oI reset signal to the 50 oI the response. 
 
4.4.1. Schematic Result 
 
 
Fig 15 Clock, D, Q and Reset Signals oI Schematic 
 
4.4.2. Extracted Version Result 
 
 
Fig 16 Clock, D, Q and Reset Signals oI Extracted Version 
  9 
4.5. Setup Time 
 
  In order to measure setup time in extraceted version, a delay is given to the input signal when the other 
signal are as in table1. The minimum time period Ior the input signal to be asserted beIore the positive edge oI  
the clock was measured such that iI the signal is given 1ps later  the output would be altered as in Figure 17.  
 
 
Fig 17 Clock, D, Q and Q-not Signals oI Extracted Version 
 
4.6. Hold Time 
 
By adjusting the delay, the input to the system is pushed beyond the clock signal`s positive edge. A time  
interval which will the input should be kept the same aIter the positive clock edge is searched. But no matter  
how close the input signal to the clock signal is no Ialse output is generated.It is concluded as zero hold time  
Ior the extracted version oI D-Ilip Ilop. 
 
 
Fig 18 Clock , D , Q and Q-not Signals oI Extracted Version 
  10 
 
5. Tests for Compatibility 
 
5.1. Consecutive Flip Flops 
 
Since this Ilip Iop is to be used in more than one amount in more complex circuits also with other elements.  
It was required to test the element whether it is going to be Iunctioning at 1 GHz when it is combined 
consecutively. The test schematic is included as Figure 19. 
 
Fig 19 Two Consecutive D- Flip Flop Test Circuit 
 
 
 
Fig 20 Transient Analysis oI Consecutive D-Flip Flops, High-to-low and Low-to High 
Delays respectively 
 
5.2. Combined Layouts 
 
It is veriIied that Ilip Ilops can be placed back to bak and upside down together in a layout as in Fig 21. 
 
  11 
 
 
Fig 21 Compatibility Test  Ior D-Flip Flop Layout 
 
6. Discussion   
 
  Schematic  Extracted  Consecutive 
Trise  233.7ps          257.4ps          230.9ps         
Tfall  265.4ps  293 ps   269ps 
Tpropagation    249.55ps       275.2ps        - 
Power  Dissipation  1.366 mW            1.821mW    - 
Set-To-Output Time  214.3ps  207ps  - 
Reset-To-Output Time  477.5ps  491.9ps  - 
Tsetup  -  193.8ps  - 
Thold  -  0  - 
   
Table 4 Data measured Irom Schematic and Extracted version 
 
As  the  propagation  time  values  are  observed  it  is  seen  that  extracted  version  is  slower  than  the  schematic 
version. It should have been because the parasitic eIIects rooted Irom layout design dominated the time gained 
by nand gates.  
Increase in power dissipation in extracted version should be because oI the long junction layers and parasitic 
eIIects in the layout design. 
As it was expected set-to-output time was measured smaller than that oI reset-to-output time since reset signal 
has to propagate through two nand and one pass gate to aIIect the output while set signal only passes through 
one nand gate to the output. 
When two Ilip Ilops were placed consecutively the output signal seemed to be quicker that may be because oI 
the  output oI the Iirst  Ilip Ilop and the input oI the  second Ilip Ilop  was  becoming narrower  on  propagation 
thereIore  the  second  Ilip  Ilop  will  be  introduced  logic  1  Ior  a  shorter  period  oI  time,  leading  to  a  quicker 
transition.