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Datasheet IRFP32N50K

This document provides information about an IRFP32N50K MOSFET, including its applications, absolute maximum ratings, thermal characteristics, static and dynamic parameters, diode characteristics, and typical transfer characteristics curves.
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© © All Rights Reserved
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0% found this document useful (0 votes)
143 views8 pages

Datasheet IRFP32N50K

This document provides information about an IRFP32N50K MOSFET, including its applications, absolute maximum ratings, thermal characteristics, static and dynamic parameters, diode characteristics, and typical transfer characteristics curves.
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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PD - 94099B

SMPS MOSFET
IRFP32N50K
Applications HEXFET® Power MOSFET
l Switch Mode Power Supply (SMPS)
l Uninterruptible Power Supply
VDSS RDS(on)typ. ID
l High Speed Power Switching 500V 0.135Ω 32A
l Hard Switched and High Frequency
Circuits
Benefits
l Low Gate Charge Qg results in Simple
Drive Requirement
l Improved Gate, Avalanche and Dynamic
dv/dt Ruggedness
l Fully Characterized Capacitance and
Avalanche Voltage and Current TO-247AC
l Low RDS(on)

Absolute Maximum Ratings


Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 32
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 20 A
IDM Pulsed Drain Current  130
PD @TC = 25°C Power Dissipation 460 W
Linear Derating Factor 3.7 W/°C
VGS Gate-to-Source Voltage ± 30 V
dv/dt Peak Diode Recovery dv/dt ƒ 13 V/ns
TJ Operating Junction and -55 to + 150
TSTG Storage Temperature Range
Soldering Temperature, for 10 seconds 300 °C
(1.6mm from case )
Mounting torque, 6-32 or M3 screw 10lb*in (1.1N*m)

Avalanche Characteristics
Symbol Parameter Typ. Max. Units
EAS Single Pulse Avalanche Energy‚ ––– 450 mJ
IAR Avalanche Current ––– 32 A
EAR Repetitive Avalanche Energy ––– 46 mJ

Thermal Resistance
Symbol Parameter Typ. Max. Units
RθJC Junction-to-Case† ––– 0.26
RθCS Case-to-Sink, Flat, Greased Surface 0.24 ––– °C/W
RθJA Junction-to-Ambient† ––– 40

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10/19/04
IRFP32N50K
Static @ TJ = 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 500 ––– ––– V VGS = 0V, ID = 250µA
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.54 ––– V/°C Reference to 25°C, ID = 1mA†
RDS(on) Static Drain-to-Source On-Resistance ––– 0.135 0.16 Ω VGS = 10V, ID = 32A „
VGS(th) Gate Threshold Voltage 3.0 ––– 5.0 V VDS = V GS, ID = 250µA
––– ––– 50 µA VDS = 500V, VGS = 0V
IDSS Drain-to-Source Leakage Current
––– ––– 250 µA VDS = 400V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 30V
IGSS nA
Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -30V

Dynamic @ TJ = 25°C (unless otherwise specified)


Parameter Min. Typ. Max. Units Conditions
gfs Forward Transconductance 14 ––– ––– S VDS = 50V, ID = 32A
Qg Total Gate Charge ––– ––– 190 ID = 32A
Qgs Gate-to-Source Charge ––– ––– 59 nC VDS = 400V
Qgd Gate-to-Drain ("Miller") Charge ––– ––– 84 VGS = 10V „
td(on) Turn-On Delay Time ––– 28 ––– VDD = 250V
tr Rise Time ––– 120 ––– ns I D = 32A
td(off) Turn-Off Delay Time ––– 48 ––– RG = 4.3Ω
tf Fall Time ––– 54 ––– VGS = 10V „
Ciss Input Capacitance ––– 5280 ––– VGS = 0V
Coss Output Capacitance ––– 550 ––– VDS = 25V
Crss Reverse Transfer Capacitance ––– 45 ––– pF ƒ = 1.0MHz, See Fig. 5
Coss Output Capacitance ––– 5630 ––– VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz
Coss Output Capacitance ––– 155 ––– VGS = 0V, VDS = 400V, ƒ = 1.0MHz
Coss eff. Effective Output Capacitance ––– 265 ––– VGS = 0V, VDS = 0V to 400V …

Diode Characteristics
Symbol Parameter Min. Typ. Max. Units Conditions
D
IS Continuous Source Current MOSFET symbol
––– ––– 32
(Body Diode) showing the
A
ISM Pulsed Source Current integral reverse G

––– ––– 130


(Body Diode)  p-n junction diode. S

VSD Diode Forward Voltage ––– ––– 1.5 V TJ = 25°C, IS = 32A, V GS = 0V „


trr Reverse Recovery Time ––– 530 800 ns TJ = 25°C, IF = 32A
Qrr Reverse RecoveryCharge ––– 9.0 13.5 µC di/dt = 100A/µs „
IRRM Reverse RecoveryCurrent ––– 30 ––– A
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)

Notes:
 Repetitive rating; pulse width limited by „ Pulse width ≤ 400µs; duty cycle ≤ 2%.
max. junction temperature.
… Coss eff. is a fixed capacitance that gives the same charging time
‚ Starting TJ = 25°C, L = 0.87mH, RG = 25Ω,
IAS = 32A, as Coss while VDS is rising from 0 to 80% VDSS .
† Rθ is measured at TJ approximately 90°C
ƒ ISD ≤ 32A, di/dt ≤ 296A/µs, VDD ≤ V(BR)DSS,
TJ ≤ 150°C
2 www.irf.com
IRFP32N50K

1000 100
VGS VGS
TOP 15V TOP 15V
12V 12V
I D, Drain-to-Source Current (A)

ID, Drain-to-Source Current (A)


10V 10V
100 8.0V 8.0V
7.0V 7.0V
6.0V 6.0V
5.5V 10 5.5V
10 BOTTOM 5.0V BOTTOM 5.0V

5.0V

1
1

0.1 5.0V

20µs PULSE WIDTH 20µs PULSE WIDTH


Tj = 25°C Tj = 150°C
0.1
0.01
0.1 1 10 100
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
VDS, Drain-to-Source Voltage (V)

Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics

1000 3.0
ID = 32A
RDS(on) , Drain-to-Source On Resistance
I D , Drain-to-Source Current (A)

2.5
100 TJ = 150° C
2.0
(Normalized)

10 1.5

TJ = 25 ° C
1.0
1
0.5
V DS = 50V
20µs PULSE WIDTH VGS = 10V
0.1 0.0
4 5 7 8 9 11 12 -60 -40 -20 0 20 40 60 80 100 120 140 160
VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature ( ° C)

Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance


Vs. Temperature
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IRFP32N50K

100000 20
V GS = 0V, f = 1 MHZ ID = 32A
Ciss = Cgs + Cgd, Cds SHORTED V DS= 400V

VGS , Gate-to-Source Voltage (V)


Crss = Cgd V DS= 250V
Coss = Cds + Cgd
16 V DS= 100V
10000
C, Capacitance(pF)

Ciss
12

1000

Coss 8

100
4

Crss
10 0
1 10 100 1000 0 40 80 120 160 200
QG , Total Gate Charge (nC)
VDS, Drain-to-Source Voltage (V)

Fig 5. Typical Capacitance Vs. Fig 6. Typical Gate Charge Vs.


Drain-to-Source Voltage Gate-to-Source Voltage

1000 1000
OPERATION IN THIS AREA LIMITED
BY RDS(on)
ISD , Reverse Drain Current (A)

100
ID , Drain Current (A)

TJ = 150° C
100
10us

10

100us
TJ = 25 ° C 10
1
1ms
TC = 25 °C
TJ = 150 °C
V GS = 0 V Single Pulse 10ms
0.1 1
0.2 0.6 0.9 1.3 1.6 10 100 1000 10000
VSD ,Source-to-Drain Voltage (V) VDS , Drain-to-Source Voltage (V)

Fig 7. Typical Source-Drain Diode Fig 8. Maximum Safe Operating Area


Forward Voltage

4 www.irf.com
IRFP32N50K

35 RD
VDS

30 VGS
D.U.T.
RG
ID , Drain Current (A)

+
25 -VDD

20 10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
15

Fig 10a. Switching Time Test Circuit


10

VDS
5
90%

0
25 50 75 100 125 150
TC , Case Temperature ( °C)
10%
VGS
Fig 9. Maximum Drain Current Vs. td(on) tr t d(off) tf
Case Temperature
Fig 10b. Switching Time Waveforms

1
Thermal Response(Z thJC )

D = 0.50
0.1
0.20

0.10
0.05
PDM
0.02 SINGLE PULSE
0.01 0.01 (THERMAL RESPONSE) t1
t2

Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.001
0.00001 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)

Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case

www.irf.com 5
IRFP32N50K
800
EAS , Single Pulse Avalanche Energy (mJ)

ID
TOP 14A
20A
640 BOTTOM 32A 15V

480 DRIVER
VDS L

320 RG D.U.T +
V
- DD
IAS A
20V
160 tp 0.01Ω

Fig 12c. Unclamped Inductive Test Circuit


0
25 50 75 100 125 150
Starting T J, Junction Temperature ( ° C)

Fig 12a. Maximum Avalanche Energy


Vs. Drain Current V(BR)DSS
tp

I AS

Fig 12d. Unclamped Inductive Waveforms

Current Regulator
Same Type as D.U.T.

QG
50KΩ

12V .2µF
.3µF
VGS
+ QGS QGD
V
D.U.T. - DS

VGS VG
3mA

IG ID
Current Sampling Resistors
Charge
Fig 13a. Gate Charge Test Circuit Fig 13b. Basic Gate Charge Waveform

6 www.irf.com
IRFP32N50K
Peak Diode Recovery dv/dt Test Circuit

+ Circuit Layout Considerations


D.U.T
• Low Stray Inductance
• Ground Plane
ƒ
• Low Leakage Inductance
Current Transformer
-

+
‚
„
- +
-


RG • dv/dt controlled by RG +
• Driver same type as D.U.T. VDD
-
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test

Driver Gate Drive


P.W.
Period D=
P.W. Period

VGS=10V *

D.U.T. ISD Waveform

Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
VDD

Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent

Ripple ≤ 5% ISD

* VGS = 5V for Logic Level Devices

Fig 14. For N-Channel HEXFET® Power MOSFETs

www.irf.com 7
IRFP32N50K
TO-247AC Package Outline Dimensions are shown in millimeters (inches)

TO-247AC Part Marking Information


EXAMPLE: T HIS IS AN IRFPE30
WIT H ASSEMBLY PART NUMBER
LOT CODE 5657 INT ERNATIONAL
ASSEMBLED ON WW 35, 2000 RECTIFIER IRFPE30

IN T HE ASSEMBLY LINE "H" LOGO 035H


56 57
Note: "P" in assembly line DATE CODE
position indicates "Lead-Free" ASS EMBLY YEAR 0 = 2000
LOT CODE WEEK 35
LINE H

This product has been designed and qualified for the industrial market.
Qualification Standards can be found on IR’s Web site.

IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.
Data and specifications subject to change without notice. 10/04
8 www.irf.com

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