Datasheet 2N7000
Datasheet 2N7000
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N-Channel Enhancement D
2N7000, 2N7002, S
NDS7002A
Description
These N−channel enhancement mode field effect transistors are
produced using onsemi’s proprietary, high cell density, DMOS 1 − Source
technology. These products have been designed to minimize on−state 2 − Gate
resistance while providing rugged, reliable, and fast switching 3 − Drain
performance. They can be used in most applications requiring up to 12 1
2
400 mAdc and can deliver pulsed currents up to 2 A. These products 3 3
are particularly suited for low−voltage, low−current applications, such TO−92 TO−92
as small servo motor control, power MOSFET gate drivers, and other CASE 135AN CASE 135AR
switching applications.
MARKING DIAGRAM
Features
• High Density Cell Design for Low RDS(on) $Y&Z&3
• Voltage Controlled Small Signal Switch 2N
7000
• Rugged and Reliable
• High Saturation Current Capability
• This Device is Pb−Free and Halogen Free
$Y = Logo
&Z = Assembly Plant Code
&3 = Date Code
2N7000 = Specific Device Code
3
1 − Gate
1 2 − Source
2 3 − Drain
SOT−23
CASE 318−08
MARKING DIAGRAM
&E&Y
7x2&E&G
ORDERING INFORMATION
See detailed ordering and shipping information on page 7 of
this data sheet.
ELECTRICAL CHARACTERISTICS
Values are at TC = 25°C unless otherwise noted.
ON CHARACTERISTICS
VGS(th) Gate Threshold Voltage VDS = VGS, ID = 1 mA 2N7000 0.8 2.1 3 V
VDS = VGS, ID = 250 mA 2N7002 1 2.1 2.5
NDS7002A
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2
2N7000, 2N7002, NDS7002A
VGS = 5 V, ID = 50 mA − 1.7 3
VGS = 5 V, ID = 50 mA, − 2.8 5
TC = 125°C
VDS(on) Drain−Source On−Voltage VGS = 10 V, ID = 500 mA 2N7000 − 0.6 2.5 V
VGS = 4.5 V, ID = 75 mA − 0.14 0.4
VGS = 10 V, ID = 500 mA 2N7002 − 0.6 3.75
VGS = 5.0 V, ID = 50 mA − 0.09 1.5
VGS = 10 V, ID = 500 mA NDS7002A − 0.6 1
VGS = 5.0 V, ID = 50 mA − 0.09 0.15
ID(on) On−State Drain Current VGS = 4.5 V, VDS = 10 V 2N7000 75 600 − mA
VGS = 10 V, VDS ≥ 2 VDS(on) 2N7002 500 2700 −
VGS = 10 V, VDS ≥ 2 VDS(on) NDS7002A 500 2700 −
gFS Forward Transconductance VDS = 10 V, ID = 200 mA 2N7000 100 320 − mS
VDS ≥ 2 VDS(on), ID = 200 mA 2N7002 80 320 −
VDS ≥ 2 VDS(on), ID = 200 mA NDS7002A 80 320 −
DYNAMIC CHARACTERISTICS
Ciss Input Capacitance VDS = 25 V, VGS = 0 V, All − 20 50 pF
f = 1.0 MHz
Coss Output Capacitance All − 11 25
Crss Reverse Transfer All − 4 5
Capacitance
ton Turn−On Time VDD = 15 V, RL = 25 W, 2N7000 − − ns
ID = 500 mA, VGS = 10 V, 10
RGEN = 25 W
VDD = 30 V, RL = 150 W, 2N7002 − −
ID = 200 mA, VGS = 10 V, NDS7002A 20
RGEN = 25 W
toff Turn−Off Time VDD = 15 V, RL = 25 W, 2N7000 − − ns
ID = 500 mA, VGS = 10 V, 10
RGEN = 25 W
VDD = 30 V, RL = 150 W, 2N7002 − −
ID = 200 mA, VGS = 10 V, NDS7002A 20
RGEN = 25 W
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3
2N7000, 2N7002, NDS7002A
Drain−Source On−Resistance
ID, Drain−Source Current (A)
2.5
1.5 5.0
RDS(on), Normalized
6.0 6.0
7.0
2
1 8.0
5.0
1.5
9.0
4.0 10
0.5
1
3.0
0 0.5
0 1 2 3 4 5 0 0.4 0.8 1.2 1.6 2
VDS, Drain−Source Voltage (V) ID, Drain Current (A)
2 3
VGS = 10 V VGS
Drain−Source On−Resistance
Drain−Source On−Resistance
1.75 2.5
ID = 500 mA
RDS(on), Normalized
TJ = 125°C
RDS(on), Normalized
1.5 2
1.25 1.5
25°C
1 1
−55°C
0.75 0.5
0.5 0
−50 −25 0 25 50 75 100 125 150 0 0.4 0.8 1.2 1.6 2
TJ, Junction Temperature (5C) ID, Drain Current (A)
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4
2N7000, 2N7002, NDS7002A
2 1.1
25°C
VDS = 10 V VDS = VGS
Threshold Voltage
1
1.2 T = −55°C
0.95
0.8
0.9
0.4
0.85
0 0.8
0 2 4 6 8 10 −50 −25 0 25 50 75 100 125 150
VGS, Gate to Source Voltage (V) TJ, Junction Temperature (5C)
1.100 2
VGS = 0 V
Drain−Source Breakdown Voltage
T = 125°C
0.1 25°C
1.025
0.05
1.000
−55°C
0.975 0.01
0.005
0.950
0.925 0.001
−50 −25 0 25 50 75 100 125 150 0.2 0.4 0.6 0.8 1 1.2 1.4
TJ, Junction Temperature (5C) VSD, Body Diode Forward Voltage (V)
Figure 7. Breakdown Voltage Variation with Figure 8. Body Diode Forward Voltage
Temperature Variation with
60 10
VDS = 25 V
40
VGS, GA E−Source Voltage (V)
Ciss 8
20
Capacitance (pF)
Coss 6
10
I = 500 mA
5 4
Crss
280 mA
2
2
f = 1 MHz 115 mA
V=0V
1 0
1 2 3 5 10 20 30 50 0 0.4 0.8 1.2 1.6 2
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5
2N7000, 2N7002, NDS7002A
RL td(on) tr td(off) tf
VIN
90% 90%
D VOUT
S 50% 50%
Input, Vin
10%
Pulse Width
3 3
2 2
1 1 100 ms
RDS(on) Limit 100 ms
ID, Drain Current (A)
Figure 13. 2N7000 Maximum Safe Operating Area Figure 14. 2N7002 Maximum Safe Operating Area
3
2 RDS(on) Limit 100 ms
1
1 ms
ID, Drain Current (A)
0.5
10 ms
0.1
100 ms
0.05
VGS = 10 V 1s
Single Pulse DC 10 s
0.01 TA = 25°C
0.005
1 2 5 10 20 30 60 80
VDS, Drain−Source Voltage (V)
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6
2N7000, 2N7002, NDS7002A
1
D = 0.5
Transient Thermal Resistance
0.5
r(t), Normalized Effective
0.2
0.2 RqJA(t) = r(t) * RqJA
RqJA = (See Datasheet)
0.1
0.1
0.05 P(pk)
0.05
0.02 t1
t2
0.02 0.01 TJ − TA = P * RqJA(t)
Single Pulse Duty Cycle, D = t1/t2
0.01
0.0001 0.001 0.01 0.1 1 10 100 300
t1, Time (s)
1
0.5
Transient Thermal Resistance
D = 0.5
r(t), Normalized Effective
0.2
0.2
0.1 0.1 RqJA(t) = r(t) * RqJA
RqJA = (See Datasheet)
0.05 0.05
0.02 P(pk)
0.01 0.01 t1
t2
TJ − TA = P * RqJA(t)
0.002 Single Pulse Duty Cycle, D = t1/t2
0.001
0.0001 0.001 0.01 0.1 1 10 100 300
t1, Time (s)
ORDERING INFORMATION
Min Order Qty /
Part Number Marking Package Packing Method† Immediate Pack Qty
2N7000 2N7000 TO−92 3L Bulk 10000 / 1000
(Pb−Free)
2N7000−D74Z Ammo 2000 / 2000
2N7000−D75Z Tape and Reel 2000 / 2000
2N7000−D26Z 2000 / 2000
2N7002 702 SOT−23 3L Tape and Reel 3000 / 3000
(Pb−Free)
NDS7002A 712 3000 / 3000
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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7
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
TO−92 3 4.825x4.76
CASE 135AN
ISSUE O
DATE 31 JUL 2016
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
DOCUMENT NUMBER: 98AON13880G Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
DOCUMENT NUMBER: 98AON13879G Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
SOT−23 (TO−236)
CASE 318−08
ISSUE AS
DATE 30 JAN 2018
SCALE 4:1
D NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD FINISH.
0.25 MINIMUM LEAD THICKNESS IS THE MINIMUM THICKNESS OF
3 THE BASE MATERIAL.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH,
E HE T PROTRUSIONS, OR GATE BURRS.
1 2
MILLIMETERS INCHES
DIM MIN NOM MAX MIN NOM MAX
L A 0.89 1.00 1.11 0.035 0.039 0.044
3X b A1 0.01 0.06 0.10 0.000 0.002 0.004
L1 b 0.37 0.44 0.50 0.015 0.017 0.020
e VIEW C c 0.08 0.14 0.20 0.003 0.006 0.008
TOP VIEW D 2.80 2.90 3.04 0.110 0.114 0.120
E 1.20 1.30 1.40 0.047 0.051 0.055
e 1.78 1.90 2.04 0.070 0.075 0.080
L 0.30 0.43 0.55 0.012 0.017 0.022
L1 0.35 0.54 0.69 0.014 0.021 0.027
A HE 2.10 2.40 2.64 0.083 0.094 0.104
T 0° −−− 10 ° 0° −−− 10°
A1 SIDE VIEW SEE VIEW C c
GENERIC
END VIEW
MARKING DIAGRAM*
RECOMMENDED
SOLDERING FOOTPRINT XXXMG
G
1
3X
2.90 0.90 XXX = Specific Device Code
M = Date Code
G = Pb−Free Package
STYLE 9: STYLE 10: STYLE 11: STYLE 12: STYLE 13: STYLE 14:
PIN 1. ANODE PIN 1. DRAIN PIN 1. ANODE PIN 1. CATHODE PIN 1. SOURCE PIN 1. CATHODE
2. ANODE 2. SOURCE 2. CATHODE 2. CATHODE 2. DRAIN 2. GATE
3. CATHODE 3. GATE 3. CATHODE−ANODE 3. ANODE 3. GATE 3. ANODE
STYLE 15: STYLE 16: STYLE 17: STYLE 18: STYLE 19: STYLE 20:
PIN 1. GATE PIN 1. ANODE PIN 1. NO CONNECTION PIN 1. NO CONNECTION PIN 1. CATHODE PIN 1. CATHODE
2. CATHODE 2. CATHODE 2. ANODE 2. CATHODE 2. ANODE 2. ANODE
3. ANODE 3. CATHODE 3. CATHODE 3. ANODE 3. CATHODE−ANODE 3. GATE
STYLE 21: STYLE 22: STYLE 23: STYLE 24: STYLE 25: STYLE 26:
PIN 1. GATE PIN 1. RETURN PIN 1. ANODE PIN 1. GATE PIN 1. ANODE PIN 1. CATHODE
2. SOURCE 2. OUTPUT 2. ANODE 2. DRAIN 2. CATHODE 2. ANODE
3. DRAIN 3. INPUT 3. CATHODE 3. SOURCE 3. GATE 3. NO CONNECTION
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
DOCUMENT NUMBER: 98ASB42226B Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.