Supsub 85
Supsub 85
Vishay Siliconix
TO-220AB
TO-263
G
DRAIN connected to TAB
G D S
Top View S
G D S
SUB85N10-10
Top View N-Channel MOSFET
SUP85N10-10
ORDERING INFORMATION
Package Lead (Pb)-free
TO-220AB SUP85N10-10-E3
TO-263 SUB85N10-10-E3
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
5V
200
150
I D - Drain Current (A)
100
100
4V TC = 125 °C
50
50 - 55 °C
25 °C
3V
0 0
0 2 4 6 8 10 0 1 2 3 4 5 6
250
0.020
TC = - 55 °C
200
g fs - Transconductance (S)
0.005
50
0
0.000
0 20 40 60 80 100
0 20 40 60 80 100 120
10 000 20
VDS = 50 V
VGS - Gate-to-Source Voltage (V)
8000 16 ID = 85 A
C - Capacitance (pF)
Ciss
6000 12
4000 8
2000 4
Crss
Coss
0 0
0 15 30 45 60 75 0 50 100 150 200
1.5
TJ = 150 °C TJ = 25 °C
10
1.0
0.5
0.0 1
- 50 - 25 0 25 50 75 100 125 150 175 0 0.3 0.6 0.9 1.2
TJ - Junction Temperature (°C) VSD - Source-to-Drain Voltage (V)
On-Resistance vs. Junction Temperature Source-Drain Diode Forward Voltage
1000 140
130 ID = 250 µA
100
IAV (A) at T A = 25 °C
120
I Dav (a)
VDS (V)
10
IAV (A) at T A = 150 °C
110
1
100
0.1 90
0.00001 0.0001 0.001 0.01 0.1 1 - 50 - 25 0 25 50 75 100 125 150 175
80 10 µs
100
I D - Drain Current (A)
0 0.1
0 25 50 75 100 125 150 175 0.1 1 10 100 1000
TC - Case Temperature (°C) VDS - Drain-to-Source Voltage (V)
Maximum Avalanche and Drain Current * VGS > minimum VGS at which RDS(on) is specified
vs. Case Temperature Safe Operating Area
1
Duty Cycle = 0.5
Normalized Effective Transient
Thermal Impedance
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10-4 10-3 10-2 10-1 1 10
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Case
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?71141.
D2
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