IEC 61215测试报告
IEC 61215测试报告
TEST REPORT
IEC 61215-series:2016
Terrestrial photovoltaic (PV) modules – Design qualification and type approval
Report Number. ............................ : 704061604115-74 part 1 of 2
Date of issue ................................. : April 26, 2023
Total number of pages ................. : 57
TÜV SÜD Branch .......................... : TÜV SÜD Certification and Testing (China) Co., Ltd. Shanghai
Branch
Applicant’s name.......................... : Shanghai JA Solar Technology Co., Ltd.
Address......................................... : No. 118, Lane 3111, West Huancheng Road, Fengxian District,
201401 Shanghai, PEOPLE'S REPUBLIC of CHINA
Test specification:
Standard ....................................... : IEC 61215-1:2016
IEC 61215-2:2016
IEC 61215-1-1:2016
IEC 61215-1-2:2016
IEC 61215-1-3:2016
IEC 61215-1-4:2016
Test procedure ............................. : TÜV SÜD Mark
Non-standard test method ........... : MQT 02, 06 were performed considering the contribution from
rear side irradiation.
Test Report Form No. ................... : IEC61215D_SE
Test Report Form(s) Originator.... : TÜV SÜD Product Service GmbH
Master TRF.................................... : 2017-11-30
Copyright © 2017 IEC System of Conformity Assessment Schemes for Electrotechnical
Equipment and Components (IECEE System). All rights reserved.
This publication may be reproduced in whole or in part for non-commercial purposes as long as the IECEE is acknowledged as
copyright owner and source of the material. IECEE takes no responsibility for and will not assume liability for damages resulting
from the reader's interpretation of the reproduced material due to its placement and context.
If this Test Report Form is used by non-IECEE members, the IECEE/IEC logo and the reference to the
CB Scheme procedure shall be removed.
This report is not valid as a CB Test Report unless signed by an approved CB Testing Laboratory
and appended to a CB Test Certificate issued by an NCB in accordance with IECEE 02.
General disclaimer:
The test results presented in this report relate only to the object tested.
This report shall not be reproduced, except in full, without the written approval of the Issuing CB Testing
Laboratory. The authenticity of this Test Report and its contents can be verified by contacting the NCB,
responsible for this Test Report.
Page 2 of 57 Report No. 704061604115-74 part 1 of 2
Responsible Testing Laboratory (as applicable), testing procedure and testing location(s):
TÜV SÜD Branch: TÜV SÜD Certification and Testing (China) Co., Ltd.
Shanghai Branch
Testing location/address.............................: No. 151 Heng Tong Road, Shanghai 200070, P. R. China
Associated Testing Laboratory: Yangzhou Opto-Electrical Products Testing Institute
Testing location/address.............................: No. 10 West Kaifa Road, Yangzhou, 225009 Jiangsu, P. R.
China
Tested by (name + signature) .....................: Rongwei Jing
Testing procedure:
SMT/CTF Stage 3 or 4:
Testing location/address.............................:
Tested by (name + signature) .....................:
Witnessed by (name + signature) ...............:
Approved by (name + signature) ................:
Supervised by (name + signature) ..............:
Summary of testing:
The text of IEC 61215-1: 2016 was approved by CENELEC as EN 61215-1: 2016 without any
modification.
The text of IEC 61215-1-1: 2016 was approved by CENELEC as EN 61215-1-1: 2016 without any
modification.
The text of IEC 61215-2: 2016 was approved by CENELEC as EN 61215-2: 2017 without any
modification.
The product fulfils the requirements of EN 61215-1: 2016, EN 61215-1-1: 2016 & EN 61215-2:
2017
(Note: The marking plate represents all models covered by this report except for difference in electrical ratings
and model designation. See “General product information” for electrical ratings for all models. As there will be
other lower wattages to be covered under same report which follows same back label format.)
GENERAL REMARKS:
"(See Enclosure #)" refers to additional information appended to the report.
"(See appended table)" refers to a table appended to the report.
This TRF has been created in cooperation with CTL ETF-9 and German National Committee (DKE).
The originator’s responsibility of this TRF in IECEE CB Scheme has been assigned to TÜV SÜD
Product Service GmbH.
When differences exist; they shall be identified in the General product information section.
Name and address of factory (factories)................... : 1. Shanghai JA Solar Technology Co., Ltd.
No. 118, Lane 3111, West Huancheng Road,
Fengxian District, 201401 Shanghai, PEOPLE'S
REPUBLIC of CHINA
Factory No.: 72092
Maximum Over-
Current Protection 30 30 30
Rating [A]
Note: Further qualification for higher and/or lower output power see annex 4
MQT 01
Visual inspection
MQT 19.1
Initial Stabilization
MQT 06.1
Performance at STC
MQT 03
Insulation test
MQT 15
Wet leakage current
M10; M11; M13 M4; M5 M8; M9 M6; M7
M12
A B C1 C2 D1 D2 E1 E2
MQT 06.2 MQT 05 MQT 10 MQT 11 MQT 13
Performance Measurement of UV precondition Thermal cycling test Damp heat test
at NMOT NMOT test 200 cycles 1 000 h
MQT 08 Outdoor 15 kWh/m2 –40 °C to 85 °C 85 °C / 85 % RH
Exposure Test
60 kWh/m2 1 module 1 module
7. PASS CRITERIA P
7.2 Power output and electric circuitry P
7.2.1 Verification of rated label values (Gate No. 1) P
Manufacturer’s tolerances and Laboratory uncertainties P
t1 t2 t3
manufacturer’s rated lower/upper 3 3 4
production tolerance in %
m1 m2 m3 —
measurement uncertainty in % of 2.24 1.10 1.84
laboratory
Laboratory reproducibility r ................. : 0.22
After stabilization, each individual module meets the requirements P
Pmax………………………………………………..……: See Table 03 P
Voc………………………………………………………: See Table 03 P
Isc: ………………………………………………………: See Table 03 P
4. TESTING OVERVIEW
Initial examination All modules N/A
4.1 Visual inspection (MQT 01)) ............................... : See Table 01 N/A
—
—
—
—
—
—
—
—
Supplementary information: N/A
TABLE 03: MQT 06.1 ini: Performance at STC after initial stabilization (single-side front) N/A
Test Date [YYYY-MM-DD] ..................... : —
Pmax(lab) lower limit (W) ...................... : See table below: Pmax [W] – Min calc. —
𝑃̅𝑚𝑎𝑥 (𝐿𝑎𝑏) lower limit (W) ...................... : —
Voc(lab) upper limit (V) ......................... : See table below: Voc [V] Max. calc. —
Isc (lab) upper limit (A) .......................... : See table below: Isc [A] Max. calc. —
Test method ......................................... : Simulator Natural sunlight —
Isc [A] Voc [V] Pmax [W]
Sample # Meas. Max. Meas. Max. Imp [A] Vmp [V] Meas. Min. calc. FF [%] Result
calc. calc.
—
—
Average — — —
Supplementary information: The limit values are calculated considering manufacturer’s tolerances t of rated
nameplate values and laboratory measurement uncertainties m.
TABLE 05: MQT 15 ini: Initial Wet leakage current test N/A
Test Date [YYYY-MM-DD] ............................... : —
Test Voltage applied [V] .................................. : —
Solution temperature [°C]................................... : —
Size of module [m²] ............................................ : —
Sample # Required Resistance [MΩ] Measured [MΩ] Result
—
—
—
—
—
—
—
Supplementary information: Solution resistivity [Ω∙cm]
Supplementary information:
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]
—
—
—
Supplementary information: N/A
TABLE 09: MQT 05 - Measurement of Nominal Module Operating Temperature (NMOT, °C) N/A
Test Date [YYYY-MM-DD] ............ :
Electrical load: Restive load
MPPT
All details for the measurements are kept on file and are available on request.
Sample #
Calculated u0 [W/(m2.°C)] —
Calculated u1 [W.s/(m3.°C)] —
Calculated NMOT —
Supplementary information:
Table 10.1: MQT 01: Visual inspection after outdoor exposure test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
—
Supplementary information: N/A
Table 10.2: MQT 15: Wet leakage current test after outdoor exposure test N/A
Test Date [YYYY-MM-DD] ..........................: —
Test Voltage applied [V] .............................: —
Solution temperature [°C] ...........................: —
Size of module [m²] .....................................: —
Required Resistance [MΩ] ...........................: —
Sample # Measured [MΩ] Limit [MΩ] Result
—
Supplementary information: N/A
Table 10.3: MQT 02 - Maximum power determination after outdoor exposure test - Optional N/A
Test Date [YYYY-MM-DD] ......................... : —
Module temperature [°C] ........................... : —
2
Irradiance [W/m ) ...................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]
—
Supplementary information: N/A
Table 10.4: MQT 03 - Insulation test after outdoor exposure test - Optional N/A
Test Date [YYYY-MM-DD] ...........................: —
Test Voltage applied [V] ..............................: —
Size of module [m²] .....................................: —
Required Resistance [MΩ] ...........................: —
Sample # Measured Required (MΩ) Dielectric breakdown Result
(MΩ) (MΩ) Yes (description) No
—
Supplementary information: Size of module [m²]
TABLE 11.1: MQT 01 - Visual inspection after bypass diode thermal test N/A
Test Date [YYYY-MM-DD] .................................... : —
Sample # Nature and position of initial findings – comments or attach photos —
No major visual defects found
Supplementary information: N/A
TABLE 11.2: MQT 15 - Wet leakage current test after bypass diode thermal test N/A
Test Date [YYYY-MM-DD] .................................. : —
Test Voltage applied [V] ...................................... : —
Solution temperature [°C] ................................... : —
Size of module [m²] ............................................. : —
Required Resistance [MΩ] ................................... : —
Sample # Measured [MΩ] Limit [MΩ] Result
—
Supplementary information: Solution resistivity [Ω∙cm]
TABLE 11.3: MQT 02 – Max. power determination after bypass diode thermal test - Optional N/A
Test Date [YYYY-MM-DD] ...................... : —
Module temperature [°C] ........................ : —
Irradiance [W/m2) ................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] —
—
Supplementary information: N/A
TABLE 11.4: MQT 03 - Insulation test after bypass diode thermal test - Optional N/A
Test Date [YYYY-MM-DD] ...................... : —
Test Voltage applied [V] ......................... : —
Size of module [m²] ................................ : —
Required Resistance [MΩ] ...................... : —
Sample Measured Required Dielectric breakdown Result
#
MΩ MΩ Yes (description) No
—
Supplementary information:
TABLE 12: MQT 18.2 - Bypass diode functionality test after bypass diode thermal test N/A
Test Date [YYYY-MM-DD] ............................. : —
Method A —
Ambient temperature [°C] ……………………: —
Current flow applied [A] ……...………………: —
Sample # VFM VFMrated VFM = (N × VFMrated) ± 10 % Result
Yes No —
Supplementary information:
Method B —
IV curve after shading Result
Diode 1 —
Diode 2 —
Diode 3 —
Supplementary information: N/A
—
Supplementary information:
Pulse Simulator —
Type of light source ........................................... : Steady state Simulator
Natural sunlight
Module temperature at thermal equilibrium [°C]. : —
TABLE 13.3: MQT 01 - Visual inspection after hot-spot endurance test N/A
Test Date [YYYY-MM-DD] .................................. : —
Sample # Nature and position of initial findings – comments or attach photos —
—
Supplementary information: N/A
TABLE 13.4: MQT 02 - Maximum power determination after hot-spot endurance test N/A
(single-side front)
Test Date [YYYY-MM-DD] .................................. : —
Module temperature [°C] .................................... : —
Irradiance [W/m2) ............................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] —
—
Supplementary information: N/A
TABLE 13.6: MQT 15 - Wet leakage current test after hot-spot endurance test N/A
Test Date [YYYY-MM-DD] .................................. : —
Test Voltage applied [V] ..................................... : —
Solution temperature [°C]...................................: —
Size of module [m²] ............................................. —
Required Resistance [MΩ] ................................... —
Sample # Measured [MΩ] Required [MΩ] Result
—
Supplementary information: Solution resistivity [Ω∙cm]
TABLE 13.7: MQT 18.2 - Bypass diode functionality test after Hot-spot endurance test N/A
Test Date [YYYY-MM-DD] ............................ : —
Method A —
Ambient temperature [°C] ........................... : —
Current flow applied [A] ............................... : —
Sample # VFM VFMrated VFM = (N × VFMrated) ± 10 % Result
Yes No
Supplementary information:
Method B —
IV curve after shading Result
Diode 1 —
Diode 2 —
Diode 3 —
TABLE 14.2: MQT 15 - Wet leakage current test after UV preconditioning test N/A
Test Date [YYYY-MM-DD] .............................: —
Test Voltage applied [V] ................................: —
Solution temperature [°C]............................. : —
Size of module [m²] .......................................: —
Sample # Measured [MΩ] Required Resistance [MΩ] Result
—
—
Supplementary information: Solution resistivity [Ω∙cm]
TABLE 14.3: MQT 02 – Max. power determination after UV preconditioning test - Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Module temperature [°C]............................... : —
Irradiance [W/m2] ......................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
—
—
Supplementary information: N/A
TABLE 14.4: MQT 03 - Insulation test after UV preconditioning test - Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Size of module [m²] ...................................... —
Required Resistance [MΩ] ............................ : —
Sample # Measured Dielectric breakdown Result
[MΩ] Yes (description) No
—
—
Supplementary information:
TABLE 15.1: MQT 01 - Visual inspection after thermal cycling 50 test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
—
—
Supplementary information: N/A
TABLE 15.2: MQT 15 - Wet leakage current test after thermal cycling 50 test N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C] …………………….: —
Size of module [m²] ........................................ —
Sample # Measured [MΩ] Required Resistance [MΩ] Result
—
—
Supplementary information: Solution resistivity [Ω∙cm]
TABLE 15.3: MQT 03 – Max. power determination after thermal cycling 50 test - Optional N/A
Test Date [YYYY-MM-DD] ......................... : —
Module temperature [°C] ........................... : —
Irradiance [W/m2) ...................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]
—
—
Supplementary information: N/A
TABLE 15.4: MQT 03 - Insulation test after thermal cycling 50 test - Optional N/A
Test Date [YYYY-MM-DD] ...........................: —
Test Voltage applied [V] ..............................: —
Size of module [m²] .....................................: —
Required Resistance [MΩ] ...........................: —
Sample Measured Dielectric breakdown Result
#
[MΩ] Yes (description) No
—
—
Supplementary information:
—
—
Supplementary information: N/A
TABLE 16.1: MQT 01 - Visual inspection after humidity freeze 10 test N/A
Test Date [YYYY-MM-DD] ............................ : —
Sample # Nature and position of initial findings – comments or attach photos —
—
—
Supplementary information: N/A
TABLE 16.2: MQT 15 - Wet leakage current test after humidity freeze 10 test N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Solution temperature [°C]…………………….: —
Size of module [m²] ...................................... : —
Required Resistance [MΩ] ............................ : —
Sample # Measured [MΩ] Limit [MΩ] Result
—
—
Supplementary information: Solution resistivity [Ω∙cm]
TABLE 16.3: MQT 02 - Maximum power determination after humidity freeze 10 test -Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Module temperature [°C] .............................. : —
2
Irradiance [W/m ) ......................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]
—
—
Supplementary information: N/A
TABLE 16.4: MQT 03 Insulation test after humidity freeze 10 test) -Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Size of module [m²] ...................................... : —
TABLE 17.1: MQT 14.1 Retention of junction box on mounting surface N/A
Sample # —
Supplementary information:
TABLE 17.2: MQT 01 - Visual inspection after retention of junction box on mounting N/A
surface
Test Date [YYYY-MM-DD] ............................... : —
Sample # Nature and position of initial findings – comments or attach photos —
—
Supplementary information: N/A
TABLE 17.3: MQT 15 - Wet leakage current test after retention of junction box on mounting N/A
surface
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C]..............................: —
Size of module [m²] ........................................ —
Required Resistance [MΩ] ............................. : —
Sample # Measured [MΩ] Limit [MΩ] Result
—
Supplementary information: Solution resistivity [Ω∙cm]
TABLE 17.5: MQT 01 - Visual inspection after retention of test of cord anchorage N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
—
Supplementary information: N/A
TABLE 17.6: MQT 15 - Wet leakage current test after retention of test of cord anchorage N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C]..............................: —
Size of module [m²] ........................................ —
Sample # Measured [MΩ] Required Resistance [MΩ] Result
—
Supplementary information: Solution resistivity [Ω∙cm]
TABLE 17.7: MQT 03 - Insulation test after test of cord anchorage N/A
Test Date [YYYY-MM-DD] ..................... : —
Test Voltage applied [V] ....................... : —
Size of module [m²]............................... : —
Required Resistance [MΩ]..................... : —
Sample # Measured Required Dielectric breakdown Result
MΩ MΩ Yes (description) No
—
Supplementary information:
TABLE 18.1: MQT 01 - Visual inspection after thermal cycling 200 test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
—
—
Supplementary information: N/A
TABLE 18.2: MQT 15 - Wet leakage current test after thermal cycling 200 test N/A
Test Date [YYYY-MM-DD] ................................. : —
Test Voltage applied [V] .................................... : —
Solution temperature [°C].................................. : —
Size of module [m²] ........................................... : —
Required Resistance [MΩ] ................................. : —
TABLE 19.1: MQT 01 - Visual inspection after damp heat 1000 test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
—
—
Supplementary information: N/A
TABLE 19.2: MQT 15 - Wet leakage current test after damp heat 1000 test N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Solution temperature [°C]............................. : —
Size of module [m²] ...................................... : —
Required Resistance [MΩ] ............................ : —
Sample # Measured [MΩ] Limit [MΩ] Result
—
—
Supplementary information: Solution resistivity [Ω∙cm]
TABLE 19.3: MQT 02 - Maximum power determination after damp heat 1000 test - Optional N/A
Test Date [YYYY-MM-DD] ......................... : —
Module temperature [°C] ........................... : —
Irradiance [W/m2) ...................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
—
—
Supplementary information: N/A
TABLE 19.4: MQT 03 - Insulation test after damp heat 1000 test - Optional N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Size of module [m²] ........................................ —
Sample # Measured Required Dielectric breakdown Result
Resistance
[MΩ] [MΩ] Yes (description) No
—
—
Supplementary information:
TABLE 19.6: MQT 01 - Visual inspection after static mechanical load test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —
—
TABLE 19.7: MQT 15 - Wet leakage current test after static mechanical load test N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V]............................... : —
Solution temperature [°C] ............................ : —
Size of module [m²]...................................... : —
Required Resistance [MΩ]............................ : —
Sample # Measured [MΩ] Limit [MΩ] Result
—
Supplementary information: Solution resistivity [Ω∙cm]
1 2 3 4 5 6
1 2 3 4 5 6
TABLE 19.9: MQT 01 - Visual inspection after hail impact test N/A
Test Date [YYYY-MM-DD] ....................... : —
Sample # Nature and position of initial findings – comments or attach photos —
—
Supplementary information:
TABLE 19.10: MQT 15 - Wet leakage current test after hail impact test N/A
Test Date [YYYY-MM-DD] ..................... : —
Test Voltage applied [V] ........................ : —
Solution temperature [°C]...................... : —
Size of module [m²] ............................... : —
Sample # Measured [MΩ] Required Resistance [MΩ] Result
—
Supplementary information: Solution resistivity [Ω∙cm]
Supplementary information:
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end..:
Integrated Module Pmax (W) at
Irradiance temperature Resistive Pmax – Pmin) / Stable
Test cycle irradiation the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end..... :
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Supplementary information:
Other stabilization procedures
Sample # Test Date (YYYY-MM-DD) start/end
—
Supplementary information: Pmax [W] (Lab_GateNo.2) is calculated by considering the reproducibility r of
control module.
TABLE 22: MQT 15 fin: Final Wet leakage current test N/A
Test Date [YYYY-MM-DD] ............................... : —
Test Voltage applied [V] .................................. : —
Solution temperature [°C]................................ : —
Size of module [m²] ......................................... : —
Required Resistance [MΩ] ............................... : —
TABLE A.4.3: MQT 6.1 Performance at STC after initial stabilization (single-side front) P
Test Date [YYYY-MM-DD] ..................... : 2023-04-25 —
Lower end power class Higher end power class —
Pmax(lab) (W) ...................................... : ≥ 545.530 , ≥ 569.249 , —
TABLE A.4.3: MQT 6.1 Performance at STC after initial stabilization (single-side Rear) P
Test Date [YYYY-MM-DD] ..................... : 2023-04-25 —
Lower end power class Higher end power class —
(W) ................................... ≥ - , ≥ - , —
TABLE A.4.3: MQT 6.1 Performance at STC after initial stabilization (equivalent irradiance) P
Test Date [YYYY-MM-DD] ..................... : 2023-04-25 —
Lower end power class Higher end power class —
Pmax(lab) (W) ...................................... : ≥ - , ≥ - , —
(W) ................................... ≥ - , ≥ - , —
A completed list of used test equipment shall be provided in the Test Reports when a Manufacturer Testing
Laboratory according to CTF stage 1 or CTF stage 2 procedure has been used.
Note: This page may be removed when CTF stage 1 or CTF stage 2 are not used. See also clause 4.8 in OD
2020 for more details.
Testing / measuring
Measurement / Last Calibration Calibration
Clause equipment / material used, Range used
testing date due date
(Equipment ID)
N/A N/A N/A N/A N/A N/A