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IEC 61215测试报告

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0% found this document useful (0 votes)
132 views57 pages

IEC 61215测试报告

Uploaded by

继业 王
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 57

Test Report issued under the responsibility of:

NCB TÜV SÜD Product Service GmbH


Ridlerstr. 65
D – 80339 München
Germany

TEST REPORT
IEC 61215-series:2016
Terrestrial photovoltaic (PV) modules – Design qualification and type approval
Report Number. ............................ : 704061604115-74 part 1 of 2
Date of issue ................................. : April 26, 2023
Total number of pages ................. : 57
TÜV SÜD Branch .......................... : TÜV SÜD Certification and Testing (China) Co., Ltd. Shanghai
Branch
Applicant’s name.......................... : Shanghai JA Solar Technology Co., Ltd.
Address......................................... : No. 118, Lane 3111, West Huancheng Road, Fengxian District,
201401 Shanghai, PEOPLE'S REPUBLIC of CHINA
Test specification:
Standard ....................................... : IEC 61215-1:2016
IEC 61215-2:2016
IEC 61215-1-1:2016
IEC 61215-1-2:2016
IEC 61215-1-3:2016
IEC 61215-1-4:2016
Test procedure ............................. : TÜV SÜD Mark
Non-standard test method ........... : MQT 02, 06 were performed considering the contribution from
rear side irradiation.
Test Report Form No. ................... : IEC61215D_SE
Test Report Form(s) Originator.... : TÜV SÜD Product Service GmbH
Master TRF.................................... : 2017-11-30
Copyright © 2017 IEC System of Conformity Assessment Schemes for Electrotechnical
Equipment and Components (IECEE System). All rights reserved.
This publication may be reproduced in whole or in part for non-commercial purposes as long as the IECEE is acknowledged as
copyright owner and source of the material. IECEE takes no responsibility for and will not assume liability for damages resulting
from the reader's interpretation of the reproduced material due to its placement and context.
If this Test Report Form is used by non-IECEE members, the IECEE/IEC logo and the reference to the
CB Scheme procedure shall be removed.
This report is not valid as a CB Test Report unless signed by an approved CB Testing Laboratory
and appended to a CB Test Certificate issued by an NCB in accordance with IECEE 02.
General disclaimer:
The test results presented in this report relate only to the object tested.
This report shall not be reproduced, except in full, without the written approval of the Issuing CB Testing
Laboratory. The authenticity of this Test Report and its contents can be verified by contacting the NCB,
responsible for this Test Report.
Page 2 of 57 Report No. 704061604115-74 part 1 of 2

Test item description...................... : Photovoltaic (PV) Module(s)


Trade Mark ...................................... :

Manufacturer................................... : Shanghai JA Solar Technology Co., Ltd.


No. 118, Lane 3111, West Huancheng Road, Fengxian District,
201401 Shanghai, PEOPLE'S REPUBLIC of CHINA
Model/Type reference ..................... : See page 10~11 of this report

Ratings ............................................ : See page 10~11 of this report

Responsible Testing Laboratory (as applicable), testing procedure and testing location(s):

TÜV SÜD Branch: TÜV SÜD Certification and Testing (China) Co., Ltd.
Shanghai Branch
Testing location/address.............................: No. 151 Heng Tong Road, Shanghai 200070, P. R. China
Associated Testing Laboratory: Yangzhou Opto-Electrical Products Testing Institute
Testing location/address.............................: No. 10 West Kaifa Road, Yangzhou, 225009 Jiangsu, P. R.
China
Tested by (name + signature) .....................: Rongwei Jing

Approved by (name + signature) ................: Guangxia Fu

Testing procedure: TMP/CTF Stage 1:


Testing location/address.............................:
Tested by (name + signature) .....................:
Approved by (name + signature) ................:

Testing procedure: WMT/CTF Stage 2:


Testing location/address.............................:
Tested by (name + signature) .....................:
Witnessed by (name + signature) ...............:
Approved by (name + signature) ................:

Testing procedure:
SMT/CTF Stage 3 or 4:
Testing location/address.............................:
Tested by (name + signature) .....................:
Witnessed by (name + signature) ...............:
Approved by (name + signature) ................:
Supervised by (name + signature) ..............:

TRF No. IEC61215D_SE


Page 3 of 57 Report No. 704061604115-74 part 1 of 2

List of Attachments (including a total number of pages in each attachment):


attachment number / number of pages
Installation manual Version: 4.4 for double glass module
Drawings mechanical Refer to Annex 2 of 704061604115-74
part 2 of 2
Circuit diagram Refer to Annex 2 of 704061604115-74
part 2 of 2
Photographs N/A
Component datasheets / certificates Refer to TÜV SÜD Application forms
Others:
Product Description Sheet (Manufacturers and type references) Annex 1, _3_ pages
Test table for verifying other stabilization procedure Annex 2, _N/A_ pages
Lower and higher output power modules Annex 3, _4_ pages
List of test equipment used Annex 4, _N/A_ pages

Summary of testing:

Tests performed (name of test and test clause): Testing location:


Based on previous project 704061604115-73, Yangzhou Opto-Electrical Products Testing Institute
following modifications were included: No. 10 West Kaifa Road, Yangzhou, 225009
1) Added alternative Cell: JACMLTB-D, 182 * 94 Jiangsu, P. R. China
mm, manufactured by JingAo Solar Co., Ltd.,
2) Included following model types for double glass
modules with 182mm * 94mm cells:
144 half-cells module:
JAM72D40-xxx/LB, xxx= 575 to 600 in steps of 5,
JAM72D40-xxx/LB/1500V, xxx= 575 to 600 in
steps of 5,
108 half-cells module:
JAM54D40-xxx/LB, xxx= 430 to 450 in steps of 5,
JAM54D40-xxx/LB/1500V, xxx= 430 to 450 in
steps of 5,
All models in family bin are identical in structure,
except for different output power,
Models followed with suffix ‘/1500V’ are identical
with basic models except for different module
name,
3) Added alternative manufacturer for Superstrate
& Substrate: Xinyi solar (Suzhou) Ltd. (under the
under the same quality management system with
listed manufacturer,
4) Added alternative manufacturer for Superstrate
& Substrate: SBH Kibing New Materials(M) SDN.
BHD., (under the under the same quality
management system with listed manufacturer,

TRF No. IEC61215D_SE


Page 4 of 57 Report No. 704061604115-74 part 1 of 2

5) Added alternative manufacturer for Encapsulant:


Suqian Sveck New Material Co., Ltd., (under the
under the same quality management system with
listed manufacturer,
6) Added alternative string connector: 0.3(±0.02) ×
5(±0.15) mm (Reflective), manufactured by
Shanghai JA solar technology co., Ltd.,
JAM72D40-575/LB & JAM72D40-600/LB were
selected as the representative model for
qualification of Lower end & Higher end power
class.
No test was considered to be necessary in this
report for above modifications 3~6.

Summary of compliance with National Differences (List of countries addressed):

The text of IEC 61215-1: 2016 was approved by CENELEC as EN 61215-1: 2016 without any
modification.
The text of IEC 61215-1-1: 2016 was approved by CENELEC as EN 61215-1-1: 2016 without any
modification.
The text of IEC 61215-2: 2016 was approved by CENELEC as EN 61215-2: 2017 without any
modification.

The product fulfils the requirements of EN 61215-1: 2016, EN 61215-1-1: 2016 & EN 61215-2:
2017

TRF No. IEC61215D_SE


Page 5 of 57 Report No. 704061604115-74 part 1 of 2

Copy of marking plate:


The artwork below may be only a draft. The use of certification marks on a product must be
authorized by TÜV SÜD Product Service GmbH that own these marks.

(Note: The marking plate represents all models covered by this report except for difference in electrical ratings
and model designation. See “General product information” for electrical ratings for all models. As there will be
other lower wattages to be covered under same report which follows same back label format.)

TRF No. IEC61215D_SE


Page 6 of 57 Report No. 704061604115-74 part 1 of 2

Test item particulars .................................................: N/A


Accessories and detachable parts included in the
evaluation ................................................................:
Mounting system used..............................................: Refer to user manual
Other options included..............................................: N/A
Possible test case verdicts:
- test case does not apply to the test object ............... : N/A
- test object does meet the requirement .................... : P (Pass)
- test object does not meet the requirement ............... : F (Fail)
Abbreviations used in the report:
Pmax – Maximum power HF – Humidity Freeze
Vmp – Maximum power voltage DH – Damp Heat
Imp – Maximum power current TC – Thermal Cycling
Isc – Short circuit current α – Current temperature coefficient
Voc – Open circuit voltage β – Voltage temperature coefficient
FF – Fill factor δ – power temperature coefficient
STC – Standard Test Conditions (25°C, NMOT – Nominal Module Operating Temperature
1 000 W/m²) (20°C, 800 W/m²)
MQT – Module Quality Tests VFMrated – Rated diode(s) forward voltage
VFM – Measured diode(s) forward voltage NP – Nameplate
m1 – the measurement uncertainty in % of laboratory m2 – the measurement uncertainty in % of
for Pmax laboratory for Voc
m3 – the measurement uncertainty in % of laboratory t1 – the manufacturer’s rated lower production
for Isc tolerance in % for Pmax
t2 – the manufacturer’s rated upper production t3 – the manufacturer’s rated upper production
tolerance in % for Voc tolerance in % for Isc
r – Pmax measurement reproducibility
Testing Dates (YYYY-MM-DD)
Date of first test item received................................... : April 18, 2023
Dates of tests (beginning/end) .................................. : April 20, 2023 to April 25, 2023

TRF No. IEC61215D_SE


Page 7 of 57 Report No. 704061604115-74 part 1 of 2

GENERAL REMARKS:
"(See Enclosure #)" refers to additional information appended to the report.
"(See appended table)" refers to a table appended to the report.
This TRF has been created in cooperation with CTL ETF-9 and German National Committee (DKE).
The originator’s responsibility of this TRF in IECEE CB Scheme has been assigned to TÜV SÜD
Product Service GmbH.

Throughout this report a comma / point is used as the decimal separator.

Manufacturer’s Declaration per sub-clause 4.2.5 of IECEE 02:


The application for obtaining a TÜV SÜD Test Yes
Certificate includes more than one factory location Not applicable
and a declaration from the Manufacturer stating that
the sample(s) submitted for evaluation is (are)
representative of the products from each factory has
been provided .......................................................... :

When differences exist; they shall be identified in the General product information section.

Name and address of factory (factories)................... : 1. Shanghai JA Solar Technology Co., Ltd.
No. 118, Lane 3111, West Huancheng Road,
Fengxian District, 201401 Shanghai, PEOPLE'S
REPUBLIC of CHINA
Factory No.: 72092

2. Hefei JA Solar Technology Co., Ltd


No. 999, Changning Road, Hi-tech Zone, 230088
Hefei City, Anhui Province, PEOPLE'S REPUBLIC of
CHINA
Factory No.: 79395

3. Vina Solar Technology Co., Ltd


E12 factory, lot CN-03, Van Trung Industrial park,
21000 Bac Giang Province, Vietnam
Factory No.: 90968

4. JA Solar (Xingtai) Co., Ltd


No. 1688, Chang An Road, Xingtai Economic
Development Area, 054000 Xingtai City, Hebei
Province, PEOPLE'S REPUBLIC OF CHINA
Factory No.: 95903

5. JA Solar New Energy Yangzhou Co., Ltd.


No.1, Jianhua Road, Economic Development Zone,
225000 Yangzhou City, Jiangsu Province, PEOPLE'S
REPUBLIC OF CHINA
Factory No.: 108746

6. Yiwu JA Solar Technology Co., Ltd.


165 Tongze Road, Yiting Town, 322000 Yiwu City,
Zhejiang Province, PEOPLE'S REPUBLIC OF CHINA

TRF No. IEC61215D_SE


Page 8 of 57 Report No. 704061604115-74 part 1 of 2

Factory No.: 109998

7. JA SOLAR VIET NAM COMPANY LIMITED


Lot G, Quang Chau Industrial Zone, Quang Chau
Commune, Viet Yen Dist, 236110 Bac Giang Province,
VIETNAM
Factory No.: 112017

8. HSA ENERJI A.S.


OSB III. Kisim Keciliköy OSB Mah., Mustafa Kemal
Bulvari No:15/1., 45030 Yunusemre – Manisa,
TURKEY
Factory No.: 113943

9. JA Solar New Energy Yangzhou Co., Ltd.


(Jingshan Park)
No. 123, Jinshan Road, Economic Development
Zone, 225127 Yangzhou City, Jiangsu Province,
PEOPLE'S REPUBLIC OF CHINA
Factory No.: 114922

10. Dongying Dahai Kelin Solar Power Co., Ltd


Yankou Village, Daozhuang Town, Guangrao County
257336 Dongying City, Shan-dong Province,
PEOPLE'S REPUBLIC OF CHINA
Factory No.: 001783

11. Jiangsu Focus Solar Energy Technology Co., Ltd.


No.66, Lifa Avenue Development Zone, Hai'an
County 226600 Nantong City, Jiangsu Province
PEOPLE'S REPUBLIC OF CHINA
Factory No.: 004170

12. Anhui Chaolong Solar Technology Co., Ltd


Tiancha Road (near Jingshiyi Road) of Economic
Development Zone, 239300 Tianchang City, Anhui
Province, EOPLE'S REPUBLIC OF CHINA
Factory No.: 113691

13. YuanTech Solar Co., Ltd.


No. 99, Jiuzi Road, Dingcheng Town Economic
Development Zone, Dingyuan County, 233200
Chuzhou City, Anhui Province, PEOPLE'S
REPUBLIC OF CHINA
Factory No.: 117043

14. VIET NAM EMPIRE SOLAR ENERGY


COMPANY LIMITED
GiaLe Industrial Zone, DongXuan Commune,
DongHung District, 410000 Thái Bình, VIETNAM
Factory No.: 119123

15. Anhui Tianda New Energy Co., Ltd.

TRF No. IEC61215D_SE


Page 9 of 57 Report No. 704061604115-74 part 1 of 2

No. 988, Qianqiu Road, Tianchang City, 239300


Chuzhou City, Anhui Province, PEOPLE'S
REPUBLIC OF CHINA
Factory No.: 120210

16. Jiangsu Reesun Solar Technology Co., Ltd


No.1 Nanjing Road, Jianhu Economic Development
Zone, 224799 Yancheng City, Jiangsu, PEOPLE'S
REPUBLIC OF CHINA
Factory No.: 117684

17. Sunova Solar Technology Co., Ltd.


Building H and Building E (production), Phase II of
Standard Plant, Runzhou Road, Huishan Industrial
Transformation Cluster, 214000 Wuxi, Jiangsu
Province, PEOPLE'S REPUBLIC OF CHINA
Factory No.: 114994

18. Baoding Yingchen New Energy Development Co.,


Ltd.
Changgucheng Industrial Park, Tang County, 072350
Baoding City, Hebei Province, PEOPLE'S REPUBLIC
OF CHINA
Factory No.: 120736

TRF No. IEC61215D_SE


Page 10 of 57 Report No. 704061604115-74 part 1 of 2

PRODUCT ELECTRICAL RATINGS:


Module type JAM72D40- JAM72D40- JAM72D40-
JAM72D40-590/LB
575/LB 580/LB 585/LB
JAM72D40- JAM72D40- JAM72D40- JAM72D40-
575/LB/1500V 580/LB/1500V 585/LB/1500V 590/LB/1500V
Voc [V] /Tolerance 51.40(±3%) 51.60(±3%) 51.80(±3%) 52.00(±3%)
Isc [Adc] /Tolerance 14.16(±4%) 14.23(±4%) 14.29(±4%) 14.35(±4%)
Vmp [V] 42.88 43.06 43.24 43.41
Imax [Adc] 13.41 13.47 13.53 13.59
Pmp [W] /Tolerance 575(±3%) 580(±3%) 585(±3%) 590(±3%)
Maximum system
1500 1500 1500 1500
voltage [V]
Maximum Over-
Current Protection 30 30 30 30
Rating [A]

Module type JAM72D40- JAM72D40- JAM54D40-


JAM54D40-435/LB
595/LB 600/LB 430/LB
JAM72D40- JAM72D40- JAM54D40- JAM54D40-
595/LB/1500V 600/LB/1500V 430/LB/1500V 435/LB/1500V
Voc [V] /Tolerance 52.20(±3%) 52.40(±3%) 38.50(±3%) 38.70(±3%)
Isc [Adc] /Tolerance 14.42(±4%) 14.48(±4%) 14.14(±4%) 14.23(±4%)
Vmp [V] 43.59 43.76 32.12 32.29
Imax [Adc] 13.65 13.71 13.39 13.47
Pmp [W] /Tolerance 595(±3%) 600(±3%) 430(±3%) 435(±3%)
Maximum system
1500 1500 1500 1500
voltage [V]
Maximum Over-
Current Protection 30 30 30 30
Rating [A]

Module type JAM54D40- JAM54D40- JAM54D40-


440/LB 445/LB 450/LB
JAM54D40- JAM54D40- JAM54D40-
440/LB/1500V 445/LB/1500V 450/LB/1500V
Voc [V] /Tolerance 38.90(±3%) 39.10(±3%) 39.30(±3%)
Isc [Adc] /Tolerance 14.31(±4%) 14.40(±4%) 14.48(±4%)
Vmp [V] 32.47 32.65 32.82
Imax [Adc] 13.55 13.63 13.71
Pmp [W] /Tolerance 440(±3%) 445(±3%) 450(±3%)
Maximum system
1500 1500 1500
voltage [V]

TRF No. IEC61215D_SE


Page 11 of 57 Report No. 704061604115-74 part 1 of 2

Maximum Over-
Current Protection 30 30 30
Rating [A]
Note: Further qualification for higher and/or lower output power see annex 4

TRF No. IEC61215D_SE


Page 12 of 57 Report No. 704061604115-74 part 1 of 2

GENERAL PRODUCT INFORMATION AND OTHER REMARKS:


Modifications:
Initial module design qualification
Extension of module design qualification
Original test report ref. No. ................................. : 704061604115-73
Model differences and modification:
Test programs for crystalline silicon PV modules Test programs for thin-film PV modules
4.2.1 Modification to frontsheet 4.3.1 Modification to frontsheet
4.2.2 Modification to encapsulation system 4.3.2 Modification to encapsulation system
4.2.3 Modification to cell technology 4.3.3 Modification to front contact (e. g.
TCO)
4.2.4 Modification to cell and string 4.3.4 Modification to cell technology
interconnect material or technique
4.2.5 Modification to backsheet 4.3.5 Modification to cell layout
4.2.6 Modification to electrical termination 4.3.6 Modification to back contact
4.2.7 Modification to bypass diode 4.3.7 Modification to edge deletion
4.2.8 Modification to electrical circuitry 4.3.8 Modification to interconnect material or
technique
4.2.9 Modification to edge sealing 4.3.9 Modification to backsheet
4.2.10 Modification to frame and/or mounting 4.3.10 Modification to electrical termination
structure
4.2.11 Change in PV module size 4.3.11 Modification to bypass diode
4.2.12 Higher or lower output power (by 4.3.12 Modification to edge sealing
10 % or more) with the identical design and
size and using the identical cell process
4.2.13 Increase of over-current protection 4.3.13 Modification to frame and/or mounting
rating structure
4.2.14 Increase of system voltage 4.3.14 Change in PV module size
4.2.15 Change in cell fixing tape 4.3.15 Higher or lower output power (by
Others 10 % or more) with the identical design and
size
4.3.16 Increase of over-current protection
rating
4.3.17 Increase of system voltage

Note: The clause references modifications extracted from IEC 62915

TRF No. IEC61215D_SE


Page 13 of 57 Report No. 704061604115-74 part 1 of 2

MODULE GROUP ASSIGNMENT:


Sample
Sample # Type/model Sample S/N Remark
Group ID
Lower end
GDP230565-24 Low 1 JAM72D40-575/LB 2340108530308066
power class
Lower end
GDP230565-25 Low 2 JAM72D40-575/LB 2340108530307893
power class
Higher end
GDP230565-26 High 1 JAM72D40-600/LB 2340108530307799
power class
Higher end
GDP230565-27 High 2 JAM72D40-600/LB 2340108530307783
power class
Supplementary information: Further qualification for higher and/or lower output power see annex 3
Note (1) Use the “General product information” field to give any information on model differences
within a product type family covered by the test report and to describe the range of electrical
and safety ratings, if the TRF covers a type family of modules.
Note (3) Use Annex 1 to list the used materials and components of the module (manufacturer/supplier
and type reference).
Note (4) The module numbers/identifiers are set in accordance to IEC 62915 Photovoltaic (PV)
modules – Retesting for type approval, design and safety qualification, Annex A3

TRF No. IEC61215D_SE


Page 14 of 57 Report No. 704061604115-74 part 1 of 2

11 TEST FLOW (if it is not a full test, strikethrough non-performed test)


Note: Deviations from test sequence are possible but must be documented.

MQT 01
Visual inspection

MQT 19.1
Initial Stabilization

MQT 06.1
Performance at STC

MQT 03
Insulation test

MQT 15
Wet leakage current
M10; M11; M13 M4; M5 M8; M9 M6; M7
M12
A B C1 C2 D1 D2 E1 E2
MQT 06.2 MQT 05 MQT 10 MQT 11 MQT 13
Performance Measurement of UV precondition Thermal cycling test Damp heat test
at NMOT NMOT test 200 cycles 1 000 h
MQT 08 Outdoor 15 kWh/m2 –40 °C to 85 °C 85 °C / 85 % RH
Exposure Test
60 kWh/m2 1 module 1 module

MQT 07 MQT 18.1 MQT 11 MQT 16 MQT 17


Performance Bypass diode Thermal cycling Static Hail test
at low thermal test test mechanical
irradiance 50 cycles load test
–40 °C to 85 °C

MQT 04 MQT 19.2 MQT 12


Measurement Final Stabilization Humidity freeze
of test
temperature 10 cycles
coefficients –40 °C to 85 °C
85 % RH
1 module
1 module
MQT 06.1 MQT 14.1
Performance at Retention of
STC junction box test

MQT 09 MQT 14.2


Hot-spot Test of cord
endurance test anchorage

MQT 18.2 MQT 19.2


Bypass diode Final stabilization
functionality test

1 Module MQT 06.1


measured together with modules
from sequences B-E as control and Performance at
to determine reproducibility r STC

2 modules MQT 03 MQT 15


Wet leakage current
Insulation test test

TRF No. IEC61215D_SE


Page 15 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

5. MARKING AND DOCUMENTATION P


5.1 Name Plate
All electrical data is shown as relative to standard Marked on label
test conditions (1 000 W/m², 25 °C, AM 1,5 P
according to IEC TS 61836).
International symbols are used where applicable. Marked on label P
The module includes clear and indelible markings: —
a. Name, registered trade name or registered
JA Solar (logo) P
trade mark of manufacturer
b. Type or model number designation Marked on label P
c. Serial number (unless marked on other part of Provided under superstrate
P
product) near the top rail of frame
d. Date and place of manufacture, alternatively serial number allowing to
serial number allowing to trace the date and trace the date and place of P
place of manufacture; manufacture
e. Maximum system voltage 1500V DC P
f. Class of protection against electrical shock Class II P
g. Voltage at open-circuit or Voc including Marked on label
P
tolerances.
h. Current at short-circuit or Isc including Marked on label
P
tolerances
i. Module maximum power or Pmax including Marked on label
P
tolerances
5.2 Documentation
5.2.1 Minimum requirements
Modules are supplied with documentation describing
the methods of electrical and mechanical installation P
as well as the electrical ratings of the module
The documentation states the class of protection
against electrical shock under which the module has
P
been qualified and any specific limitations required
for that class.
The documentation assures that installers and
operators receive appropriate and sufficient
P
documentation for safe installation, use, and
maintenance of the PV modules.
5.2.2 Information given in the documentation P
a. All information required under 5.1 e) to i) Refer to manual document P
b. Overcurrent protection device type and rating Refer to manual document
P
are e.g. given in IEC 60269-6

TRF No. IEC61215D_SE


Page 16 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

Maximum series/parallel module configuration is


P
recommended
c. Manufacturer’s stated tolerance for Voc, Isc and
maximum power output under standard test P
conditions
d. Temperature coefficient for voltage at open-
P
circuit
e. Temperature coefficient for maximum power P
f. Temperature coefficient for short-circuit current P
All electrical data mentioned above shown as
relative to standard test conditions (1 000 W/m2, P
25 °C, AM 1,5 according to IEC TS 61836)
g. Nominal module operating temperature (NMOT)
N/A
is specified
h. Performance at NMOT (MQT 06.2) is specified N/A
i. Performance at low irradiance (MQT 07) is
P
specified
International symbols used where applicable P
Compliance checked by inspection and MQT 04
P
through MQT 07
The electrical documentation includes a detailed description of the electrical

installation wiring method to be used
j. The minimum cable diameters for modules
P
intended for field wiring
k. Any limitations on wiring methods and wire
management that apply to the wiring P
compartment or box;
l. The size, type, material and temperature rating
P
of the conductors to be used
m. Type of terminals for field wiring N/A
n. Specific PV connector model/types and
manufacturer to which the module connectors P
are mated
o. The bonding method(s) to be used (if Refer to manual document
applicable); all provided or specified hardware P
is identified in the documentation
p. The type and ratings of bypass diode to be Refer to manual document
P
used (if applicable)
q. limitations to the mounting situation (e.g., slope, Refer to manual document
P
orientation, mounting means, cooling)

TRF No. IEC61215D_SE


Page 17 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

r. A statement indicating the fire rating(s) and the


applied standard and the limitations to that
P
rating (e.g., installation slope, sub-structure or
other applicable installation information)
s. A statement indicating the design load per each
mechanical means for securing the module as
evaluated during the static mechanical load test
P
according to MQT 16. At discretion of the
manufacturer the test load and/or the safety
factor γm may be noted, too
The installation instructions include relevant
parameters specified by manufacturer or the
following statement or the equivalent:
"Under normal conditions, a photovoltaic module is
likely to experience conditions that produce more
current and/or voltage than reported at standard test P
conditions. Accordingly, the values of ISC and VOC
marked on this module should be multiplied by a
factor of 1,25 when determining component voltage
ratings, conductor current ratings, and size of
controls connected to the PV output."
5.2.3 Assembly instructions P
Provided with a product shipped in subassemblies,
detailed and adequate to the degree required to P
facilitate complete and safe assembly of the product
Supplementary information: N/A

7. PASS CRITERIA P
7.2 Power output and electric circuitry P
7.2.1 Verification of rated label values (Gate No. 1) P
Manufacturer’s tolerances and Laboratory uncertainties P
t1 t2 t3
manufacturer’s rated lower/upper 3 3 4
production tolerance in %
m1 m2 m3 —
measurement uncertainty in % of 2.24 1.10 1.84
laboratory
Laboratory reproducibility r ................. : 0.22
After stabilization, each individual module meets the requirements P
Pmax………………………………………………..……: See Table 03 P
Voc………………………………………………………: See Table 03 P
Isc: ………………………………………………………: See Table 03 P

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After stabilization the arithmetic average P max of See Table 03


P
all modules meet the requirements.
7.2.2 Maximum power degradation during type approval testing (Gate #2) P
At the end of each test sequence or for sequence B
after bypass diode test, each test sample meets the P
requirements for Pmax
7.2.3 Electrical circuitry P
Samples do not exhibit an open-circuit during the
P
tests
7.3 Visual defects P
There is no visual evidence of a major defect. P
7.4 Electrical safety P
The insulation test (MQT 03) requirements are met
P
after the tests
The wet leakage current test (MQT 15)
requirements met at the beginning and at the end of P
each sequence
Specific requirements of the individual tests are met P
Supplementary information: N/A

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4. TESTING OVERVIEW
Initial examination All modules N/A
4.1 Visual inspection (MQT 01)) ............................... : See Table 01 N/A

4.19.5 Initial stabilization (MQT 19.1)............................. : See Table 02 N/A


4.6 Performance at STC (MQT 06.1) See Table 03 N/A
4.3 Insulation test (MQT 03) ..................................... : See Table 04 N/A
4.15 Wet leakage current test (MQT 15) .................... : See Table 05 N/A

Sequence 3 Modules Samples M10; M11; M12 N/A


A
4.6 Performance at NMOT (MQT 06.2) ..................... : See Table 06 N/A
4.7 Performance at low irradiance (MQT 07)............. : See Table 07 N/A
4.4 Measurement of temperature coefficients (MQT See Table 08 N/A
04) .................................................................... :

Sequence 3 Modules Sample M13 N/A


B
4.5 Measurement of nominal module operating See Table 09 N/A
temperature (NMOT, °C) (MQT 05)..................... :
4.8 Outdoor exposure test (MQT 08) ........................ : See Table 10 N/A
4.18.1 Bypass diode thermal test (MQT 18.1) N/A
Maximum allowed junction temperature .............. : —
Calculated junction temperature ......................... : See Table 11 —
Final measurements ........................................... : See Table 11 N/A
4.18.2 Bypass diode functionality test (MQT 18.2) ........ : See Table 12 N/A
4.19.6 Final stabilization (MQT 19.2) ............................. : See Table 12.1 – 12.3 N/A
4.9 Hot spot endurance test (MQT 09) ...................... : See Table 13.1 - 13.5 N/A

Sequence 2 Modules Samples M4; M5 N/A


C
4.10 UV preconditioning test (MQT 10) ....................... : See Table 14.1 - 14.4 N/A
4.11 Thermal cycling test 50 cycles (MQT 11) ............ : See Table 15.1 - 15.4 N/A
4.12 Humidity-freeze test (MQT 12) ............................ : See Table 16.1 - 16.4 N/A

Sequence 1 Module Sample M4 N/A


C1

4.14 Robustness of terminations test (MQT 14) N/A


4.14.2 Retention of junction box on mounting surface See Table 17.1 - 17.7 N/A
(MQT 14.1) ........................................................ :

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4.14.3 Test of cord anchorage (MQT 14.2) N/A


4.14.3.1 This test omitted if junction box is qualified to IEC See list of attachments N/A
62790 ................................................................. :
4.14.3.2.1 Junction boxes intended to be used with cables See Table 17.4 N/A
specified by the manufacturer……………………:
4.14.3.2.2 Junction boxes intended to be used with generic See Table 17.4 N/A
cables……………………………………………….:

Sequence 2 Modules Sample M8; M9 N/A


D
4.11 Thermal cycling test 200 cycles (MQT 11) .......... : See Table 18.1 - 18.2 N/A

Sequence 2 Modules Samples M6; M7 N/A


E
4.13 Damp heat test (MQT 13) ................................... : See Table 19.1 - 19.4 N/A

Sequence 1 Module Sample M6 N/A


E1
4.16 Static mechanical load test (MQT 16) ................. : See Table 19.5 - 19.7 N/A

Sequence 1 Module Sample M7 N/A


E2
4.17 Hail test (MQT 17) See Table 19.8 - 19.10 N/A
Final measurement All modules for Sequence C, N/A
D, E; Control module for
Sequence A
4.19.6 Final stabilization (MQT 19.2) ............................. : See Table 20.1 - 20.2 N/A
4.6 Performance at STC (MQT 06.1) ....................... : See Table 20.3 N/A
4.3 Insulation test(MQT 03) ...................................... : See Table 21 N/A
4.15 Wet leakage current test(MQT 15) ..................... : See Table 22 N/A

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TABLE 01: MQT 01 ini: Initial Visual inspection N/A


Test Date [YYYY-MM-DD] ........................ : —
Sample # Nature and position of initial findings – comments or attach photos —








Supplementary information: N/A

TABLE 02: MQT 19.1 ini: Initial stabilization N/A


TABLE 02.1: MQT 06.1 ini: Performance at STC before initial stabilization (single-side front)
Test Date [YYYY-MM-DD] ..................... : —
Test method ........................................ : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result









Supplementary information: N/A

TABLE 02.2: MQT 19.1 ini: Initial Stabilization procedure N/A


Light exposure method ............................................ : Simulator Natural sunlight
Abbreviation: Regarding light source “S” for Solar simulator and “N” for Natural sunlight
Stabilization criterion x per IEC 61215-1-x .............. :

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Sample # Test Date (YYYY-MM-DD) start/end ........... :


Integrated Module Pmax (W) at
Test cycle Irradiance Resistive (Pmax – Pmin) / Stable
irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1 — —
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end ........... :
Integrated Module Pmax (W) at
Test cycle Irradiance Resistive (Pmax – Pmin) / Stable
irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1 — —
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end ........... :
Integrated Module Pmax (W) at
Test cycle Irradiance Resistive (Pmax – Pmin) / Stable
irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1 — —
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end ........... :
Integrated Module Pmax (W) at
Test cycle Irradiance Resistive (Pmax – Pmin) / Stable
irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1 — —
2
3
4 — —
Supplementary information: N/A

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Other stabilization procedures


Sample # Test Date (YYYY-MM-DD) start/end

Test method description:


Supplementary information: see Annex 3 for verification of this alternative stabilization procedure

TABLE 03: MQT 06.1 ini: Performance at STC after initial stabilization (single-side front) N/A
Test Date [YYYY-MM-DD] ..................... : —
Pmax(lab) lower limit (W) ...................... : See table below: Pmax [W] – Min calc. —
𝑃̅𝑚𝑎𝑥 (𝐿𝑎𝑏) lower limit (W) ...................... : —
Voc(lab) upper limit (V) ......................... : See table below: Voc [V] Max. calc. —
Isc (lab) upper limit (A) .......................... : See table below: Isc [A] Max. calc. —
Test method ......................................... : Simulator Natural sunlight —
Isc [A] Voc [V] Pmax [W]
Sample # Meas. Max. Meas. Max. Imp [A] Vmp [V] Meas. Min. calc. FF [%] Result
calc. calc.


Average — — —
Supplementary information: The limit values are calculated considering manufacturer’s tolerances t of rated
nameplate values and laboratory measurement uncertainties m.

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TABLE 04: MQT 03 ini: Initial Insulation test N/A


Test Date [YYYY-MM-DD] ........... : —
Test Voltage applied [V] .............. : —
Size of module [m²] ..................... : —
Required Resistance [MΩ] ........... : —
Sample # Measured Dielectric breakdown
Result
MΩ Yes (description) No







Supplementary information:

TABLE 05: MQT 15 ini: Initial Wet leakage current test N/A
Test Date [YYYY-MM-DD] ............................... : —
Test Voltage applied [V] .................................. : —
Solution temperature [°C]................................... : —
Size of module [m²] ............................................ : —
Sample # Required Resistance [MΩ] Measured [MΩ] Result







Supplementary information: Solution resistivity [Ω∙cm]

TABLE 06: MQT 06.2 - Performance at NMOT N/A


Test Date [YYYY-MM-DD] ..................... : —
Module temperature (°C) ...................... : —

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Test method ........................................ : Simulator Natural sunlight —


Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result

Supplementary information:

TABLE 07: MQT 07 - Performance at low irradiance N/A


Test Date [YYYY-MM-DD] ........................................: —
Test method.. : Outdoor measurement
Ambient air temperature [°C]:
Irradiance [W/m2]: —
Module temperature [°C]:
Data corrected to a 25°C cell temperature and 200 W/m2 irradiance
Directly measured —

Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]



Supplementary information: N/A

TABLE 08: MQT 04 - Measurement of temperature coefficients N/A


Test Date [YYYY-MM-DD] ................................. : —
Ambient air temperature [°C] high/low ................ : —
Irradiance [W/m2] high/low ................................. : —
Module temperature [°C] high/low ...................... : —
Sample # α [%/°C] β [%/°C] δ [%/°C] —



Supplementary information: N/A

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IEC 61215-2
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TABLE 09: MQT 05 - Measurement of Nominal Module Operating Temperature (NMOT, °C) N/A
Test Date [YYYY-MM-DD] ............ :
Electrical load: Restive load
MPPT
All details for the measurements are kept on file and are available on request.
Sample #
Calculated u0 [W/(m2.°C)] —
Calculated u1 [W.s/(m3.°C)] —
Calculated NMOT —
Supplementary information:

TABLE 10: MQT 08 - Outdoor exposure test N/A


Test Date [YYYY-MM-DD] start/end ........... : —
Sample # —
Total irradiation dosage [kWh/m2] ............. : —
Angle of tilt the test module....................... : —
Electrical load: Restive load —
MPPT
Supplementary information: N/A

Table 10.1: MQT 01: Visual inspection after outdoor exposure test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —

Supplementary information: N/A

Table 10.2: MQT 15: Wet leakage current test after outdoor exposure test N/A
Test Date [YYYY-MM-DD] ..........................: —
Test Voltage applied [V] .............................: —
Solution temperature [°C] ...........................: —
Size of module [m²] .....................................: —
Required Resistance [MΩ] ...........................: —
Sample # Measured [MΩ] Limit [MΩ] Result

Supplementary information: N/A

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Table 10.3: MQT 02 - Maximum power determination after outdoor exposure test - Optional N/A
Test Date [YYYY-MM-DD] ......................... : —
Module temperature [°C] ........................... : —
2
Irradiance [W/m ) ...................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]

Supplementary information: N/A

Table 10.4: MQT 03 - Insulation test after outdoor exposure test - Optional N/A
Test Date [YYYY-MM-DD] ...........................: —
Test Voltage applied [V] ..............................: —
Size of module [m²] .....................................: —
Required Resistance [MΩ] ...........................: —
Sample # Measured Required (MΩ) Dielectric breakdown Result
(MΩ) (MΩ) Yes (description) No

Supplementary information: Size of module [m²]

TABLE 11: MQT 18: Bypass diode thermal test N/A


Test Date [YYYY-MM-DD] start/end ............. : —
Sample # —
Module temperature [°C] ............................. : —
Number of diodes in junction box ................. : —
Diode manufacturer..................................... : —
Diode type designation ................................ : —
Max. permissible junction temperature Tjmax [°C] —
(according to diode datasheet)..................... :
Detailed description of sample preparation Standard production module —
procedure .................................................. :
Step 1, Determination of VD versus TJ characteristic —
30 ± 2 °C 50 ± 2 °C 70 ± 2 °C 90 ± 2 °C
Ambient temperature of the junction box ... : —

Pulsed current .......................................... : —

Voltage drop [V] ....................................... : —

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IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

VD versus TJ characteristic ....................... : —


Max. permissible junction temperature Tjmax [°C] —
(according to diode datasheet)................... :
Step 2, Bypass diode thermal test —
Diode 1 Diode 2 Diode 3 Result
Current flow applied [A] ....................................... : —
Max. diode surface temperature allowed Tjmax —
[°C] :
Voltage drop [V] after 1h ....................................... : —
Calculated max. junction temperature Tjcalc [°C] .... : —
Tjcalc < Tjmax (test passed)? yes/no ........................ : —
Current flow (1.25 * Isc) [A] .................................. : —
Bypass diode remain(s) functional (yes/no) .......... : —
Remarks: See Table 12 for the test details of bypass diode functionality test.
3 Diodes are considered as representative number. These diodes have to be selected as worst case. In case
that additional bypass diodes tests are performed the results shall be listed in an attachment.
For bifacial modules, the applicable current (Isc) was considered at elevated irradiance BSI (as defined in IEC
61215‑1:2021).

TABLE 11.1: MQT 01 - Visual inspection after bypass diode thermal test N/A
Test Date [YYYY-MM-DD] .................................... : —
Sample # Nature and position of initial findings – comments or attach photos —
No major visual defects found
Supplementary information: N/A

TABLE 11.2: MQT 15 - Wet leakage current test after bypass diode thermal test N/A
Test Date [YYYY-MM-DD] .................................. : —
Test Voltage applied [V] ...................................... : —
Solution temperature [°C] ................................... : —
Size of module [m²] ............................................. : —
Required Resistance [MΩ] ................................... : —
Sample # Measured [MΩ] Limit [MΩ] Result

Supplementary information: Solution resistivity [Ω∙cm]

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TABLE 11.3: MQT 02 – Max. power determination after bypass diode thermal test - Optional N/A
Test Date [YYYY-MM-DD] ...................... : —
Module temperature [°C] ........................ : —
Irradiance [W/m2) ................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] —

Supplementary information: N/A

TABLE 11.4: MQT 03 - Insulation test after bypass diode thermal test - Optional N/A
Test Date [YYYY-MM-DD] ...................... : —
Test Voltage applied [V] ......................... : —
Size of module [m²] ................................ : —
Required Resistance [MΩ] ...................... : —
Sample Measured Required Dielectric breakdown Result
#
MΩ MΩ Yes (description) No

Supplementary information:

TABLE 12: MQT 18.2 - Bypass diode functionality test after bypass diode thermal test N/A
Test Date [YYYY-MM-DD] ............................. : —
Method A —
Ambient temperature [°C] ……………………: —
Current flow applied [A] ……...………………: —
Sample # VFM VFMrated VFM = (N × VFMrated) ± 10 % Result
Yes No —
Supplementary information:
Method B —
IV curve after shading Result
Diode 1 —
Diode 2 —
Diode 3 —
Supplementary information: N/A

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TABLE 12.1: MQT 19.1 Fin: Final stabilization N/A


TABLE 12.2: MQT 06.1: Performance at STC before final stabilization
Test Date [YYYY-MM-DD] ............................ : —
Test method ................................................ : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] —


Supplementary information:

TABLE 12.3: MQT 19.1 Final Stabilization procedure N/A


Light exposure method ................................ : ☐ Simulator ☐ Natural sunlight —
Stabilization criterion x per IEC 61215-1-x ... : —
Abbreviation: Regarding light source “S” for Solar simulator and “N” for Natural sunlight
Sample # M13 Test Date (YYYY-MM-DD) start/end ......... :
Integrated Module Pmax (W) at
Test cycle Irradiance Resistive Pmax – Pmin) / Stable
irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1 —
2
3
4 — —
Supplementary information:
Other stabilization procedures
Sample # Test Date (YYYY-MM-DD) start/end .......... :
Test method description:
Supplementary information: See Annex 3 for verification of this alternative stabilization procedure

TABLE 13: MQT 09 - Hot-spot endurance test N/A


Test Date [YYYY-MM-DD] start/end ................... : —
Sample # —
Procedure of technology.................................... : wafer-based technologies (WBT) MQT 09.1 —
monolithically integrated (MLI) thin film
technologies MQT 09.2
Cell interconnection circuit ................................. : S SP PS —

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IEC 61215-2
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Pulse Simulator —
Type of light source ........................................... : Steady state Simulator
Natural sunlight
Module temperature at thermal equilibrium [°C]. : —

TABLE 13.1: MQT 09 - Hot-spot endurance test for WBT


LOW LOW LOW HIGH —
Selected hot-spot cells ...................................... :

Shading rate [%] ............................................... : —


Max. measured cell temperature in each cell [°C]: —
Test duration of each shading [h] ..................... : —
Irradiance during shading [W/m²] …………… ..... : —
Supplementary information: N/A

TABLE 13.2: MQT 09 - Hot-spot endurance test for MLI N/A


Selected hot-spot cells ....................................... : —
Number of cells shaded ...................................... : —
Max. measured cell temperature [°C] ................. : —
Test duration during shading [h] ........................ : —
Irradiance during shading [W/m²] …………… ...... : —
Supplementary information:

TABLE 13.3: MQT 01 - Visual inspection after hot-spot endurance test N/A
Test Date [YYYY-MM-DD] .................................. : —
Sample # Nature and position of initial findings – comments or attach photos —

Supplementary information: N/A

TABLE 13.4: MQT 02 - Maximum power determination after hot-spot endurance test N/A
(single-side front)
Test Date [YYYY-MM-DD] .................................. : —
Module temperature [°C] .................................... : —
Irradiance [W/m2) ............................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] —

Supplementary information: N/A

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TABLE 13.5: MQT 03 - Insulation test after hot-spot endurance test P


Test Date [YYYY-MM-DD] .................................. : —
Test Voltage applied [V] ..................................... : —
Size of module [m²] ............................................ : —
Required Resistance [MΩ] .................................. : —
Sample Measured Required Dielectric breakdown Result
#
MΩ MΩ Yes (description) No

Supplementary information:

TABLE 13.6: MQT 15 - Wet leakage current test after hot-spot endurance test N/A
Test Date [YYYY-MM-DD] .................................. : —
Test Voltage applied [V] ..................................... : —
Solution temperature [°C]...................................: —
Size of module [m²] ............................................. —
Required Resistance [MΩ] ................................... —
Sample # Measured [MΩ] Required [MΩ] Result

Supplementary information: Solution resistivity [Ω∙cm]

TABLE 13.7: MQT 18.2 - Bypass diode functionality test after Hot-spot endurance test N/A
Test Date [YYYY-MM-DD] ............................ : —
Method A —
Ambient temperature [°C] ........................... : —
Current flow applied [A] ............................... : —
Sample # VFM VFMrated VFM = (N × VFMrated) ± 10 % Result
Yes No
Supplementary information:
Method B —
IV curve after shading Result
Diode 1 —
Diode 2 —
Diode 3 —

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Supplementary information: N/A

TABLE 14: MQT 10 - UV preconditioning test N/A


Test Date (YYYY-MM-DD) start/end ............ : —
Module temperature [°C] ........................... : —
UV irradiance (280-400nm) [W/m2] ............ : —
Ratio of UV irradiance (280-320nm) (%) ....... : —
UV dose (280-400nm) [kWh/ m²] ................ : —
Module operation condition ........................ .: Short circuited Pmax —
Supplementary information: Light sources not emitting a significant portion of light in the visible spectrum
where the module exhibits a power equal to or larger than 20 % of its STC measured power.
UV preconditioning test was performed on front side of the module.

TABLE 14.1: MQT 01 - Visual inspection after UV preconditioning test N/A


Test Date [YYYY-MM-DD] ............................ : —
Sample # Nature and position of initial findings – comments or attach photos —


Supplementary information: N/A

TABLE 14.2: MQT 15 - Wet leakage current test after UV preconditioning test N/A
Test Date [YYYY-MM-DD] .............................: —
Test Voltage applied [V] ................................: —
Solution temperature [°C]............................. : —
Size of module [m²] .......................................: —
Sample # Measured [MΩ] Required Resistance [MΩ] Result


Supplementary information: Solution resistivity [Ω∙cm]

TABLE 14.3: MQT 02 – Max. power determination after UV preconditioning test - Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Module temperature [°C]............................... : —
Irradiance [W/m2] ......................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result

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Supplementary information: N/A

TABLE 14.4: MQT 03 - Insulation test after UV preconditioning test - Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Size of module [m²] ...................................... —
Required Resistance [MΩ] ............................ : —
Sample # Measured Dielectric breakdown Result
[MΩ] Yes (description) No


Supplementary information:

TABLE 15: MQT 11 - Thermal cycling 50 test N/A


Test Date [YYYY-MM-DD] start/end ......... : —
Total cycles (50) ..................................... : —
During the heat up cycle from —
Applied current (A) ................................. : 40 °C to 80 °C
Other stages —
Sample # Open circuits (yes/no) —


Supplementary information: For bifacial modules, the applicable current (Imp) was considered at elevated
irradiance BSI (as defined in IEC 61215‑1:2021).

TABLE 15.1: MQT 01 - Visual inspection after thermal cycling 50 test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —


Supplementary information: N/A

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TABLE 15.2: MQT 15 - Wet leakage current test after thermal cycling 50 test N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C] …………………….: —
Size of module [m²] ........................................ —
Sample # Measured [MΩ] Required Resistance [MΩ] Result


Supplementary information: Solution resistivity [Ω∙cm]

TABLE 15.3: MQT 03 – Max. power determination after thermal cycling 50 test - Optional N/A
Test Date [YYYY-MM-DD] ......................... : —
Module temperature [°C] ........................... : —
Irradiance [W/m2) ...................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]


Supplementary information: N/A

TABLE 15.4: MQT 03 - Insulation test after thermal cycling 50 test - Optional N/A
Test Date [YYYY-MM-DD] ...........................: —
Test Voltage applied [V] ..............................: —
Size of module [m²] .....................................: —
Required Resistance [MΩ] ...........................: —
Sample Measured Dielectric breakdown Result
#
[MΩ] Yes (description) No


Supplementary information:

TABLE 16: MQT 12 - Humidity freeze 10 test N/A


Test Date [YYYY-MM-DD] start/end .............. : —
Total cycles (10) ......................................... : —
Applied current (A) ...................................... : —
Sample # Open circuits (yes/no) —

TRF No. IEC61215D_SE


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Clause Requirement + Test Result - Remark Verdict



Supplementary information: N/A

TABLE 16.1: MQT 01 - Visual inspection after humidity freeze 10 test N/A
Test Date [YYYY-MM-DD] ............................ : —
Sample # Nature and position of initial findings – comments or attach photos —


Supplementary information: N/A

TABLE 16.2: MQT 15 - Wet leakage current test after humidity freeze 10 test N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Solution temperature [°C]…………………….: —
Size of module [m²] ...................................... : —
Required Resistance [MΩ] ............................ : —
Sample # Measured [MΩ] Limit [MΩ] Result


Supplementary information: Solution resistivity [Ω∙cm]

TABLE 16.3: MQT 02 - Maximum power determination after humidity freeze 10 test -Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Module temperature [°C] .............................. : —
2
Irradiance [W/m ) ......................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%]


Supplementary information: N/A

TABLE 16.4: MQT 03 Insulation test after humidity freeze 10 test) -Optional N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Size of module [m²] ...................................... : —

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Clause Requirement + Test Result - Remark Verdict

Required Resistance [MΩ] ............................ : —


Sample # Measured Required Dielectric breakdown Result
MΩ MΩ Yes (description) No


Supplementary information: Size of module [m²]

TABLE 17: MQT 14 - Robustness of terminations test N/A


Test Date [YYYY-MM-DD] start/end .............. : —

TABLE 17.1: MQT 14.1 Retention of junction box on mounting surface N/A
Sample # —
Supplementary information:

TABLE 17.2: MQT 01 - Visual inspection after retention of junction box on mounting N/A
surface
Test Date [YYYY-MM-DD] ............................... : —
Sample # Nature and position of initial findings – comments or attach photos —

Supplementary information: N/A

TABLE 17.3: MQT 15 - Wet leakage current test after retention of junction box on mounting N/A
surface
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C]..............................: —
Size of module [m²] ........................................ —
Required Resistance [MΩ] ............................. : —
Sample # Measured [MΩ] Limit [MΩ] Result

Supplementary information: Solution resistivity [Ω∙cm]

TRF No. IEC61215D_SE


Page 38 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

TABLE 17.4: MQT 14.2 - Test of cord anchorage N/A


Sample # —
Junction boxes intended to be used with cables specified by the manufacturer —
Measured Result
Cable diameter, Permissible
Tension Force, [N] displacement,
[mm] displacement, [mm]
[mm]
Pull test —
Cable diameter, Torque Force, Measured angle Result
Permissible angle [o]
[mm] [Nm] [o]
Torque test —
Junction boxes intended to be used with generic cables —
Anchorage Permissible Measured Result
Test mandrel Tension
diameter range displacement displacement
[mm] Force, [N]
[mm] [mm] [mm]
Pull test Min —
Anchorage Torque Result
Test mandrel Permissible Measured angle
diameter range Force
[mm] angle [o] [o]
[mm] [Nm]
Torque test Max —
Supplementary information:

TABLE 17.5: MQT 01 - Visual inspection after retention of test of cord anchorage N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —

Supplementary information: N/A

TABLE 17.6: MQT 15 - Wet leakage current test after retention of test of cord anchorage N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Solution temperature [°C]..............................: —
Size of module [m²] ........................................ —
Sample # Measured [MΩ] Required Resistance [MΩ] Result

Supplementary information: Solution resistivity [Ω∙cm]

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Page 39 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

TABLE 17.7: MQT 03 - Insulation test after test of cord anchorage N/A
Test Date [YYYY-MM-DD] ..................... : —
Test Voltage applied [V] ....................... : —
Size of module [m²]............................... : —
Required Resistance [MΩ]..................... : —
Sample # Measured Required Dielectric breakdown Result
MΩ MΩ Yes (description) No

Supplementary information:

TABLE 18: MQT 11 - Thermal cycling 200 test N/A


Test Date [YYYY-MM-DD] start/end .............. : —
Total cycles (200) ........................................ : —
During the heat up cycle from – —
Applied current (A) ...................................... : 40 °C to 80 °C
Other stages —
Sample # Open circuits (yes/no) —


Supplementary information: For bifacial modules, the applicable current (Imp) was considered at elevated
irradiance BSI (as defined in IEC 61215‑1:2021).

TABLE 18.1: MQT 01 - Visual inspection after thermal cycling 200 test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —


Supplementary information: N/A

TABLE 18.2: MQT 15 - Wet leakage current test after thermal cycling 200 test N/A
Test Date [YYYY-MM-DD] ................................. : —
Test Voltage applied [V] .................................... : —
Solution temperature [°C].................................. : —
Size of module [m²] ........................................... : —
Required Resistance [MΩ] ................................. : —

TRF No. IEC61215D_SE


Page 40 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

Sample # Measured [MΩ] Limit [MΩ] Result




Supplementary information: Solution resistivity [Ω∙cm]

TABLE 19: MQT 13 - Damp heat 1000 test N/A


Test Date [YYYY-MM-DD] start/end ............. : —
Total hours (1000h) ................................... : —
Sample # Open circuits (yes/no) —


Supplementary information: N/A

TABLE 19.1: MQT 01 - Visual inspection after damp heat 1000 test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —


Supplementary information: N/A

TABLE 19.2: MQT 15 - Wet leakage current test after damp heat 1000 test N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V] ............................... : —
Solution temperature [°C]............................. : —
Size of module [m²] ...................................... : —
Required Resistance [MΩ] ............................ : —
Sample # Measured [MΩ] Limit [MΩ] Result


Supplementary information: Solution resistivity [Ω∙cm]

TABLE 19.3: MQT 02 - Maximum power determination after damp heat 1000 test - Optional N/A
Test Date [YYYY-MM-DD] ......................... : —
Module temperature [°C] ........................... : —
Irradiance [W/m2) ...................................... : —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result

TRF No. IEC61215D_SE


Page 41 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict



Supplementary information: N/A

TABLE 19.4: MQT 03 - Insulation test after damp heat 1000 test - Optional N/A
Test Date [YYYY-MM-DD] ............................. : —
Test Voltage applied [V] ................................ : —
Size of module [m²] ........................................ —
Sample # Measured Required Dielectric breakdown Result
Resistance
[MΩ] [MΩ] Yes (description) No


Supplementary information:

TABLE 19.5: MQT 16 Static mechanical load test N/A


Sample # : —
Design load(front side/ back side) ................ : —
Safety factors .............................................. : —
Test Date [YYYY-MM-DD] ............................ —
Mounting method ......................................... : —
Load applied to ............................................ : front side back side —
Mechanical load [Pa] ................................... : —
First cycle time (start/end)............................ : —
Intermittent open-circuit (yes/no) .................. : —
Second cycle time (start/end)....................... : —
Intermittent open-circuit (yes/no) .................. : —
Third cycle time (start/end) .......................... : —
Intermittent open-circuit (yes/no) .................. : —
Supplementary information:

TABLE 19.6: MQT 01 - Visual inspection after static mechanical load test N/A
Test Date [YYYY-MM-DD] ......................... : —
Sample # Nature and position of initial findings – comments or attach photos —

TRF No. IEC61215D_SE


Page 42 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

Supplementary information: N/A

TABLE 19.7: MQT 15 - Wet leakage current test after static mechanical load test N/A
Test Date [YYYY-MM-DD] ............................ : —
Test Voltage applied [V]............................... : —
Solution temperature [°C] ............................ : —
Size of module [m²]...................................... : —
Required Resistance [MΩ]............................ : —
Sample # Measured [MΩ] Limit [MΩ] Result

Supplementary information: Solution resistivity [Ω∙cm]

TABLE 19.8: MQT 17 - Hail impact test N/A


Test Date [YYYY-MM-DD] ..................... : —
Sample # —
1 2 3 4 5 6

Ice ball size [mm] .................................. : —


7 8 9 10 11

1 2 3 4 5 6

Ice ball weight [g] .................................. : —


7 8 9 10 11

1 2 3 4 5 6

Ice ball velocity [m/s]............................. : —


7 8 9 10 11

Number of impact locations................... : —


Supplementary information: (impact location descriptions)

TABLE 19.9: MQT 01 - Visual inspection after hail impact test N/A
Test Date [YYYY-MM-DD] ....................... : —
Sample # Nature and position of initial findings – comments or attach photos —

Supplementary information:

TRF No. IEC61215D_SE


Page 43 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

TABLE 19.10: MQT 15 - Wet leakage current test after hail impact test N/A
Test Date [YYYY-MM-DD] ..................... : —
Test Voltage applied [V] ........................ : —
Solution temperature [°C]...................... : —
Size of module [m²] ............................... : —
Sample # Measured [MΩ] Required Resistance [MΩ] Result

Supplementary information: Solution resistivity [Ω∙cm]

TABLE 20: MQT 19.1 Fin: Final stabilization N/A


TABLE 20.1: MQT 06.1: Performance at STC before final stabilization
Test Date [YYYY-MM-DD] ..................... : —
Test method ........................................ : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result

Supplementary information:

TABLE 20.2: MQT 19.1 Final Stabilization procedure N/A


Light exposure method: Simulator Natural sunlight
Stabilization criterion x per IEC 61215-1-x:
Abbreviation: Regarding light source “S” for Solar simulator and “N” for Natural sunlight
Sample # Test Date (YYYY-MM-DD) start/end.. :
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1

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Page 44 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end..:
Integrated Module Pmax (W) at
Irradiance temperature Resistive Pmax – Pmin) / Stable
Test cycle irradiation the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2

TRF No. IEC61215D_SE


Page 45 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end..... :
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Sample # Test Date (YYYY-MM-DD) start/end
Integrated Module Pmax (W) at
Irradiance Resistive Pmax – Pmin) / Stable
Test cycle irradiation temperature the end of
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) cycle
Initial — — — — — —
1
2
3
4 — —
Supplementary information:
Other stabilization procedures
Sample # Test Date (YYYY-MM-DD) start/end

Test method description:


Supplementary information: see Annex 3 for verification of this alternative stabilization procedure

TABLE 20.3: MQT 06.1: Final Performance at STC N/A


Test Date [YYYY-MM-DD] ..................... : Different date —
Test method……………………………….: Simulator Natural sunlight —

TRF No. IEC61215D_SE


Page 46 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

Pmax [W] Power Result


Sample Vmp
Isc [A] Voc [V] Imp [A] Pmax [W] FF [%] (Lab Degradation
# [V]
_GateNo.1) [%]


Supplementary information: Pmax [W] (Lab_GateNo.2) is calculated by considering the reproducibility r of
control module.

TABLE 21: MQT 03 fin: Final Insulation test N/A


Test Date [YYYY-MM-DD] ..................... : —
Test Voltage applied [V] ........................ : —
Size of module [m²] ............................... : —
Sample # Required Measured Dielectric breakdown Result
MΩ MΩ Yes (description) No







Supplementary information:

TABLE 22: MQT 15 fin: Final Wet leakage current test N/A
Test Date [YYYY-MM-DD] ............................... : —
Test Voltage applied [V] .................................. : —
Solution temperature [°C]................................ : —
Size of module [m²] ......................................... : —
Required Resistance [MΩ] ............................... : —

TRF No. IEC61215D_SE


Page 47 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2
Clause Requirement + Test Result - Remark Verdict

Sample # Measured [MΩ] Limit [MΩ] Result










Supplementary information:

TRF No. IEC61215D_SE


Page 48 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Annex 1: Product Description Sheet (Manufacturers and type references)

A1.1 MODULE TYPE/S


a) 144 half-cells module:
JAM72D40-xxx/LB, xxx= 575 to 600 in steps of 5
JAM72D40-xxx/LB/1500V, xxx= 575 to 600 in steps of 5
b) 108 half-cells module:
JAM54D40-xxx/LB, xxx= 430 to 450 in steps of 5
JAM54D40-xxx/LB/1500V, xxx= 430 to 450 in steps of 5

A1.2 MODULE DESIGN


Module dimensions (L x W x H) [mm] ................. : a) 2333 x 1134 x 30
b) 1762 x 1134 x 35/30
Weights.............................................................. : a) 32.5 ±3% Kg (approx.)
b) 26.5 or 22 ±3% Kg (approx.)
Front/Rear cover bonding classification .............. : rigid/flexible
rigid/rigid
flexible/flexible

A1.3 SOLAR CELL


Cell type reference ............................................. : JingAo Solar Co., Ltd.
Cell type: JACMLTB-D, N type mono
crystalline silicon, 16 busbars
Cell dimensions L x W x T (± %) [mm] ................ : 182 ±1.5 x 94 ±1.5 x 0.13 ±0.013
Cell thickness [µm] ............................................. : 130 ± 13
Cell area [cm²] ................................................... : 170.92±5

A1.4 IDENTIFICATION OF MATERIALS


Front cover ........................................................ : Changzhou Almaden Co., Ltd.
Type: Heat strengthened AR-coated
glass,
Thickness: 2.0 mm
Rear cover ......................................................... : Changzhou Almaden Co., Ltd.
Type: Heat strengthened glass with white
glaze,
Thickness: 2.0 mm
Encapsulation material front side........................ : Cybrid Technologies Inc.
Type: Cybright T22H, material: POE/EVA,
thickness: 0.6±0.1 mm
Encapsulation material back side ....................... : Cybrid Technologies Inc.
Type: Cybright T22H, material: POE/EVA,
thickness: 0.6±0.1 mm

TRF No. IEC61215D_SE


Page 49 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Frame parts ....................................................... : Shanghai JA Solar Technology Co.,


Ltd.
Anodized aluminum alloy, 6005-T6, silver
colour, assembled by key corners
Mounting parts ................................................... : N/A
Adhesive for frame ............................................ : Shanghai Huitian New Material Co., Ltd.
Type: HT906Z, Rated V-0 at min. 3.0 mm
thick, RTI=105, CTI=0
UL certified, No. E248611
Edge sealing ...................................................... : N/A
Internal wiring .................................................... : N/A
Cell connector .................................................... : Shanghai JA Solar Technology Co.,
Ltd.
Cross section: Φ0.26 ± 0.02 mm, round
wire ribbon,
Material: Base Cu (≥99.97%), coating:
Sn60%Pb40%, coating thickness 0.02 ±
0.005 mm per side
String connector ................................................. : Shanghai JA Solar Technology Co.,
Ltd.
Cross section: 0.4 × 6 & 0.3 × 5 mm
(Reflective),
Material: Base Cu (≥99.97%),
Coating Sn60%Pb40%, coating thickness
0.01- 0.03mm at soldering side, 0.005-
0.015 mm at V-groove bottom of non-
soldering side.
Soldering material .............................................. : Sn60%Pb40%
Fluxing agent ..................................................... : Shenzhen Vital New Material Company
Limited
Type: WTO-PV105A, no clean halogen
free liquid flux.
Junction box....................................................... : Shanghai JA Solar Technology Co.,
Ltd.
Type: PVJB-JA-005, DC 1500 V, 25A, IP
68(1m, 1h), -40 °C to 85 °C,
TÜV SÜD certified, No. B 072092 0287
Rev. 10
Cable ................................................................. : Shanghai JA Solar technology co.,
Ltd.
Type: H1Z2Z2-K 1×4mm2, 1500V DC,
-40 °C to 90 °C,
TÜV SÜD certified, No. B 072092 0283
Rev. 04
Connector .......................................................... : QC Solar (Suzhou) Corporation
Type: QC 4.10-351, Rated DC 1500V,
41A, IP 68(1m, 1h), -40 °C to 85 °C
TÜV Rheinland certified

TRF No. IEC61215D_SE


Page 50 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Bypass diode ..................................................... : Yangzhou Yangjie Electronic


Technology Co., Ltd.
Type: MK4045, Schottky,
Max. peak reverse voltage 45 V,
Max. average forward current 40 A,
Max. junction temperature 200 °C.
Potting material .................................................. : Shanghai Huitian New Material Co., Ltd.
Type: 5299W-S, Rated V-0 at min. 3.0
mm thick, RTI=105, CTI=0
UL certified, No. E248611
Adhesive for junction box .................................. : Shanghai Huitian New Material Co., Ltd.
Type: HT906Z, Rated V-0 at min. 3.0 mm
thick, RTI=105, CTI=0
UL certified, No. E248611
Additional material (e. g. fixing tape, insulation 1) Fixing tape:
tape) .................................................................. : Guangdong Sunrui New Material Co.,
Ltd.
Type: HZ UV-100
2) Marking label:
AVERY (CHINA) CO LTD
Type: 72826T, 50 microns
Matte Silver PET TC/S333(c)(d)

A1.5 MODULE DESIGN - MINIMUM DISTANCES


Between cells..................................................... : a) 0.6 mm
b) 0.5 mm
Between cell and accessible surfaces ................ : a)b) 12 mm
Between any current carrying part and accessible
a)b) 12 mm
surfaces ............................................................. :

A1.6 MODULE DESIGN - ELECTRICAL CONFIGURATION


Total number of cells .......................................... : a) 144
b) 108
Serial-parallel connection of cells ....................... : SPS
Cells per bypass diode ....................................... : a) 48
b) 36
No. of bypass diodes.......................................... : 3

Remark: only listed tested sample

TRF No. IEC61215D_SE


Page 51 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Annex 2: Test table for verifying other alternative stabilization procedure

Step 1: Alternative stabilization N/A


Test Date (YYYY-MM-DD) start/end: —
Test method description: —
Sample M10 Sample M11 Sample M12 —
Power before alternative stabilization (W) —
Power after alternative stabilization (W) —
Supplementary information:
Step 2: Light exposure
Simulator Natural sunlight
Abbreviation: Regarding light source “S” for Solar simulator and “N” for Natural sunlight
Sample M10 Test Date (YYYY-MM-DD) start/end............................... :
Integrated Module Pmax (W) Pmax – Pmin)
Irradiance Resistive Stable
Test cycle Light source irradiation temperature at the end / Paverage
2 (W/m2) load (Yes/No)
(kWh/m ) (°C) of cycle (%)
Initial — — — — — — —
1 — —
2
Supplementary information:
Sample M11 Test Date (YYYY-MM-DD) start/end......................... :
Integrated Module Pmax (W) Pmax – Pmin)
Irradiance Resistive Stable
Test cycle Light source irradiation temperature at the end / Paverage
2 (W/m2) load (Yes/No)
(kWh/m ) (°C) of cycle (%)
Initial — — — — — — —
1 — —
2
Supplementary information:
Sample M12 Test Date (YYYY-MM-DD) start/end.......................... :
Integrated Module Pmax (W) Pmax – Pmin)
Irradiance Resistive Stable
Test cycle Light source irradiation 2 temperature at the end / Paverage
(W/m ) load (Yes/No)
(kWh/m2) (°C) of cycle (%)
Initial — — — — — — —
1 — —
2
Supplementary information:

TRF No. IEC61215D_SE


Page 52 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Step 3: Stabilization determination


Sample M10 Sample M11 Sample M12 Result
Stable power Pmax1 after alternative stabilization (W)
Stable power Pmax2 after light exposure (W)
Power change Pmax2 to Pmax1 (%)
Allowed power change Pmax2 to Pmax1 (%)
Is alternative stabilization method valid? (Yes/No)
Supplementary information:

TRF No. IEC61215D_SE


Page 53 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Annex 3: Lower and higher output power modules

TABLE A.4.1 Performance at STC before initial stabilization (single-side front) P


Test Date [YYYY-MM-DD] ...................... : 2023-04-23 —
Test method .......................................... : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
Low 1 14.171 51.920 13.419 43.524 584.049 79.38 —
Low 2 14.235 51.977 13.284 43.671 580.097 78.40 —
High 1 14.068 51.881 13.186 44.774 590.381 80.89 —
High 2 14.086 52.079 13.392 44.172 591.571 80.64 —
Supplementary information: The limit value is calculated through considering the tolerance of rated label
values and lab measurement uncertainty.

TABLE A.4.1 Performance at STC before initial stabilization (single-side Rear) P


Test Date [YYYY-MM-DD] ...................... : 2023-04-23 —
Test method .......................................... : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
Low 1 11.225 51.556 10.015 44.927 449.942 77.75 —
Low 2 11.282 51.633 9.839 45.038 443.149 76.07 —
High 1 11.128 51.540 9.518 46.628 443.790 77.38 —
High 2 11.232 51.664 9.766 45.901 448.268 77.25 —
Supplementary information: The limit value is calculated through considering the tolerance of rated label
values and lab measurement uncertainty.

TABLE A.4.1 Performance at STC before initial stabilization (Equivalent irradiance) P


Test Date [YYYY-MM-DD] ...................... : 2023-04-23 —
Test method .......................................... : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
Low 1 15.583 52.084 14.749 43.475 641.208 79.00 —
Low 2 15.668 52.143 14.598 43.572 636.065 77.86 —
High 1 15.481 52.059 14.526 44.734 649.782 80.63 —
High 2 15.498 52.262 14.724 44.212 650.967 80.37 —
Supplementary information: The limit value is calculated through considering the tolerance of rated label
values and lab measurement uncertainty.
1100W/m2 equivalent irradiance is the effective value calculated when backside irradiance is 135W/m2.

TRF No. IEC61215D_SE


Page 54 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

TABLE A.4.2: MQT 19.1 ini: Initial Stabilization procedure P


Light exposure method ............................. : Simulator Natural sunlight —
Abbreviation: Regarding light source “S” for Solar simulator and “N” for Natural sunlight
Stabilization criterion x per IEC 61215-1-x : 1 —
Sample # Low 1 Test Date (YYYY-MM-DD) start/end ......... : 2023-04-23 / 2023-04-25
Integrated Module Pmax (W)
Test cycle Irradiance Resistive Pmax – Pmin) / Stable
irradiation temperature at the end
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) of cycle
Initial (F) — — — — 584.049 — —
1 5 800~1000 50 ± 10 MPPT 582.346 — —
2 5 800~1000 50 ± 10 MPPT 581.290 0.47 Yes
Initial (R) — — — — 449.942 — —
1 5 800~1000 50 ± 10 MPPT 448.285 — —
2 5 800~1000 50 ± 10 MPPT 445.999 0.88 Yes
Sample # Low 2 Test Date (YYYY-MM-DD) start/end ......... : 2023-04-23 / 2023-04-25
Integrated Module Pmax (W)
Test cycle Irradiance Resistive Pmax – Pmin) / Stable
irradiation temperature at the end
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) of cycle
Initial (F) — — — — 580.097 — —
1 5 800~1000 50 ± 10 MPPT 578.967 — —
2 5 800~1000 50 ± 10 MPPT 577.698 0.41 Yes
Initial (R) — — — — 443.149 — —
1 5 800~1000 50 ± 10 MPPT 441.681 — —
2 5 800~1000 50 ± 10 MPPT 439.120 0.91 Yes
Sample # High 1 Test Date (YYYY-MM-DD) start/end ......... : 2023-04-23 / 2023-04-25
Integrated Module Pmax (W)
Test cycle Irradiance Resistive Pmax – Pmin) / Stable
irradiation temperature at the end
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) of cycle
Initial (F) — — — — 590.381 — —
1 5 800~1000 50 ± 10 MPPT 589.864 — —
2 5 800~1000 50 ± 10 MPPT 588.965 0.24 Yes
Initial (R) — — — — 443.790 — —
1 5 800~1000 50 ± 10 MPPT 441.413 — —
2 5 800~1000 50 ± 10 MPPT 441.358 0.55 Yes
Sample # High 2 Test Date (YYYY-MM-DD) start/end ......... : 2023-04-23 / 2023-04-25
Integrated Module Pmax (W)
Test cycle Irradiance Resistive Pmax – Pmin) / Stable
irradiation temperature at the end
(W/m2) load Paverage (%) (Yes/No)
(kWh/m2) (°C) of cycle

TRF No. IEC61215D_SE


Page 55 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Initial (F) — — — — 591.571 — —


1 5 800~1000 50 ± 10 MPPT 589.772 — —
2 5 800~1000 50 ± 10 MPPT 588.139 0.58 Yes
Initial (R) — — — — 448.268 — —
1 5 800~1000 50 ± 10 MPPT 448.065 — —
2 5 800~1000 50 ± 10 MPPT 447.831 0.10 Yes
Supplementary information: N/A
Other stabilization procedures
Sample # Test Date (YYYY-MM-DD) start/end ............ :
Low 1
Low 2
High 1
High 2
Test method description:
Supplementary information: see Annex 3 for verification of this alternative stabilization procedure

TABLE A.4.3: MQT 6.1 Performance at STC after initial stabilization (single-side front) P
Test Date [YYYY-MM-DD] ..................... : 2023-04-25 —
Lower end power class Higher end power class —
Pmax(lab) (W) ...................................... : ≥ 545.530 , ≥ 569.249 , —

(W) ................................... ≥ 562.402 , ≥ 586.854 , —

Voc(lab) (V) .......................................... : ≤ 52.366 , ≤ 53.385 , —


Isc (lab) (A) .......................................... : ≤ 14.460 , ≤ 14.787 , —
Test method ........................................... : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
Low 1 14.164 51.904 13.421 43.312 581.290 79.07 P
Low 2 14.235 51.955 13.296 43.449 577.698 78.11 P
High 1 14.068 51.861 13.212 44.578 588.965 80.73 P
High 2 14.090 52.063 13.368 43.996 588.139 80.18 P
Supplementary information: The limit value is calculated through considering the tolerance of rated label
values and lab measurement uncertainty.

TABLE A.4.3: MQT 6.1 Performance at STC after initial stabilization (single-side Rear) P
Test Date [YYYY-MM-DD] ..................... : 2023-04-25 —
Lower end power class Higher end power class —

TRF No. IEC61215D_SE


Page 56 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Pmax(lab) (W) ...................................... : ≥ - , ≥ - , —

(W) ................................... ≥ - , ≥ - , —

Voc(lab) (V) .......................................... : ≤ - , ≤ - , —


Isc (lab) (A) .......................................... : ≤ - , ≤ - , —
Test method ........................................... : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
Low 1 11.225 51.543 9.962 44.770 445.999 77.09 P
Low 2 11.277 51.616 9.778 44.909 439.120 75.44 P
High 1 11.127 51.520 9.493 46.493 441.358 76.99 P
High 2 11.232 51.653 9.800 45.697 447.831 77.19 P
Supplementary information: The limit value is calculated through considering the tolerance of rated label
values and lab measurement uncertainty.

TABLE A.4.3: MQT 6.1 Performance at STC after initial stabilization (equivalent irradiance) P
Test Date [YYYY-MM-DD] ..................... : 2023-04-25 —
Lower end power class Higher end power class —
Pmax(lab) (W) ...................................... : ≥ - , ≥ - , —

(W) ................................... ≥ - , ≥ - , —

Voc(lab) (V) .......................................... : ≤ - , ≤ - , —


Isc (lab) (A) .......................................... : ≤ - , ≤ - , —
Test method ........................................... : Simulator Natural sunlight —
Sample # Isc [A] Voc [V] Imp [A] Vmp [V] Pmax [W] FF [%] Result
Low 1 15.584 52.052 14.730 43.304 637.868 78.63 P
Low 2 15.671 52.119 14.547 43.463 632.256 77.41 P
High 1 15.469 52.037 14.518 44.562 646.951 80.37 P
High 2 15.496 52.233 14.747 44.029 649.296 80.22 P
Supplementary information: The limit value is calculated through considering the tolerance of rated label
values and lab measurement uncertainty.
1100W/m2 equivalent irradiance is the effective value calculated when backside irradiance is 135W/m2.

TRF No. IEC61215D_SE


Page 57 of 57 Report No. 704061604115-74 part 1 of 2
IEC 61215-2

Annex 4: List of measurement equipment

A completed list of used test equipment shall be provided in the Test Reports when a Manufacturer Testing
Laboratory according to CTF stage 1 or CTF stage 2 procedure has been used.
Note: This page may be removed when CTF stage 1 or CTF stage 2 are not used. See also clause 4.8 in OD
2020 for more details.

Testing / measuring
Measurement / Last Calibration Calibration
Clause equipment / material used, Range used
testing date due date
(Equipment ID)
N/A N/A N/A N/A N/A N/A

TRF No. IEC61215D_SE

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