Specification
Specification
: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
Marking:
UL-
Sign 4641-X836
F DC
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
The sensor can be used without UART Interface. In this case a functional test is carried out by a LOW level
signal on terminal RxD-T (acc. timing diagram fig. 3). It is essential to perform a sensor test regularly for
proofability of the sensors function correctly.
Figure 3 explains the timing of the functional test via terminal RxD-T. The sensor generates a suitable internal
test current to test the tripping levels for the output X6-OUT and X20-OUT (acc. timing diagram fig. 3).
The function of the sensor can also be tested using the test winding. Internally, the test winding is connected
to Vcc. With an external switch to pin T-W the test current can be applied, a resistor (RT) in series to the
switch and T-W limits the current to the test winding. If the RT resistor is not installed, a short circuit occurs
across the test winding, which destroys the sensor. To keep the max ratings of 5 mA a 1k Ohm resistor
should be installed. The test current of 125 mA is then obtained through the turns ratio of N = 25.
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
Final Tests: (Measurements after temperature balance of the samples at room temperature, SC=significant characteristic )
Min. Max. Unit
HV HV-test 1500 0 V
Vcc Supply voltage 4.9 5.1 VDC
Status & Calib Calib. Via UART
Icc Supply current 16 28 mA
RxD_Vcc RxD-T voltage 2.8 3.4 V
X6-OUT (normal) X6-OUT voltage 0 0.6 V
X20-OUT (normal) X20-OUT voltage 0 0.6 V
X6-OUT (activated) X6- -up) 4.9 5.1 V
X20-OUT (activated) X20-OUT voltage -up)* 4.9 5.1 V
TC1 (SC) Trip current_1 - X6-OUT +6mA DC / 80A@50Hz 4.5 5.4 mA
TC2 Trip current_2 - X6-OUT -6mA DC -5.4 -4.5 mA
TC3 Trip current_3 - X20-OUT 20mA@60Hz 14 20 mA
TC4 Trip current_4 X20-OUT 130mA@1000Hz 105 149 mA
LV1 Limit values of break time - X6-OUT@6mA DC 0 700 ms
LV2 Limit values of break time X20-OUT@20mA, 60Hz 0 1000 ms
EXT1 Externally winding test X6 act 4.9 5.1 V
EXT2 Externally winding test X20 act. 4.9 5.1 V
Product Tests:
Acc. to VAC sheet M3238 tbd
Air- and contact discharge; ±2.0 kV
ESD
Acc. to Human Body Model JESD22-A114
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
I
I N1
or
I N2
I Rl1
or
I Rl2
Output t
condition
for
X6-OUT High
and Z
X30-OUT
X20-OUT
t
If the trip-level I is reached the outputs X6-OUT and X20-OUT will change it state from
low-level (GND) to high impedance. Depending on the presence of the differential curent I , the
outputs X6-OUT and X20-OUT will remain in this state until I falls below recovery threshold I .
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
Vcc
40ms...1,2s
TEST_IN
Proposed t ime to
check M4: 2200ms
0,74s 0,66s t1 t2 t3
Internal test
current Itest1 Itest 2
X6/30-OUT M1 M4
740ms
1400ms
1800ms
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
Figure 6 explains the typical application for the sensor with additional Master to interface the sensor. In this
system, the interface-signals TxD and RxD are cross connected (Master TxD -> Sensor RxD; Master RxD ->
Sensor TxD). The master addresses a sensor by sending a message acc. to the protocol described in chapter
Serial Data Interface (UART
The sensor monitors and trips via the switching outputs X6-OUT/X20-OUT if the leakage current exceeds the
response value.
A functional test can be started by the master using the test -message (see c Serial Data
Interface (UART)
The master has access to measured values via the -
message according to chapter Serial Data Interface (UART) .
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
Specification Description
Address range 0xFF) Factory setting: 0x64 = 100d
1 startbit
8 data bits
Configuration 10 bit 1 stop bit
No parity
LSB first
Address
Message code Adress:0x01..0xFF, default address: 0X64
Message format Message length
Message data
Checksum: 2 Byte
LOW: Receive data
Data Direction (DE-PIN)
HIGH: transmit data
High-
TxD
Low-signal:
High-
Low-signal:
from the sensor pins to a master or interface
Transmission distance 200mm
driver
TxD Output-Resistance
TxD Short circuit behavior protected
Data transmitting rate 19200 baud
Cycle time T1 1/ 19200 (s)
Falling/rising time T2/T3 < 200ns
Tab. 3: Serial Data Interface (UART)
Data frame
T1 T2 T3
START
START
Data-
D1 D2 D3 D4 D5 D6 D7
STOP
Frame D0 D0
T4
Fig. 7: Data format UART-protocol
Timing
An idle time of more than 2 bytetimes between 2 bytes is interpreted as end of the message.
The slave starts to send an answer (begin of startbit) by no later than 20ms after reception of the stopbit of the last
message byte.
Between 2 requests to a slave, the master shall wait a minimum time of 50ms until the next request. This is to avoid
influence on the residual current measurement because of high traffic loads generated by a master.
Error handling
Each message transmitted has a 16-Bit checksum in the last two bytes transmitted to check the message integrity.
The crc is calculated byte by byte incorporating the complete message and then the two crc bytes are appended on
the end of the message.
The crc-polynom used is 0x18005 (x^16 + x^15 + x^2 + 1).
If a slave detects a crc-error, it does not answer that request. The master shall repeat the message up to 2 times and
if the slave still does not answer, the slave shall be considered to be defective.
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
The sensor address (1 byte) is the slave address in the range of 1..255. Address 0 is the broadcast address.
The message-code (1 byte) contains the coding instruction of the following bytes.
The message-length (1 byte) contains the length of the optionally following message-data field. 0 means no
message-data field follows.
The message-data-field contains the data for the message.
The crc (2 bytes) is calculated from sensor-address up to the last byte of the message-data field.
Numbers larger than 1 byte are transmitted most significant byte first.
Integer numbers are represented in two´s complement.
Messages Overview
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages
Item no.: T60404-N4641-X836
Specification
VACU UM SCH M ELZE
The measurement values of residual current rms and dc are represented in 0.1 mA resolution.
residual current.
Bit meaning
Bit 7 General fault 1 = fault
Bit 6 reserved
1 = functional test active
Bit 5 Testmode
0 = normal measurement
Bit 4 reserved
Bit 3 reserved
1=on, enabled, not tripped
Bit 2 state of X6
0=off, disabled, tripped
1=on, enabled, not tripped
Bit 1 state of X20
0=off, disabled, tripped
1 = no error, enabled
Bit 0 state of internal ERROR
0 = error, disabled
Tab. 8: Statusbyte 1
Bit meaning
Bit 7 reserved
Bit 6 reserved
Bit 5 Asic fault 1 = fault
Bit 4 Asic gain fault 1 = fault
Bit 3 Asic offset fault 1 = fault
Bit 2 Feedback fault 1 = fault
Bit 1 reserved
Bit 0 Configuration fault 1 = fault
Tab. 9: Statusbyte 2
Bit meaning
Bit 7 reserved
Bit 6 reserved
Bit 5 reserved
Bit 4 reserved
Bit 3 reserved
Bit 2 reserved
Bit 1 Unused always 0
Bit 0 reserved
Tab. 10: Statusbyte 3
Copying of this document, disclosing it to third parties or using the contents there for any purposes without express written authorization by use illegally forbidden. Any offenders are liable to pay all
relevant damages