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Ads 9811

The ADS9813 is an 18-bit, 2MSPS, 8-channel ADC with an integrated analog front-end, featuring simultaneous sampling and a constant 1MΩ input impedance. It supports various programmable input ranges and has excellent AC and DC performance, making it suitable for applications like semiconductor testing and programmable DC power supplies. The device operates within a temperature range of -40°C to +125°C and includes a digital interface compatible with low voltage levels.

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0% found this document useful (0 votes)
22 views66 pages

Ads 9811

The ADS9813 is an 18-bit, 2MSPS, 8-channel ADC with an integrated analog front-end, featuring simultaneous sampling and a constant 1MΩ input impedance. It supports various programmable input ranges and has excellent AC and DC performance, making it suitable for applications like semiconductor testing and programmable DC power supplies. The device operates within a temperature range of -40°C to +125°C and includes a digital interface compatible with low voltage levels.

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ADS9813, ADS9811, ADS9810

SBASAQ6A – JULY 2024 – REVISED NOVEMBER 2024

ADS9813 18-Bit, 2MSPS, 8-Channel, Simultaneous-Sampling ADC With Integrated


Analog Front-End
1 Features 3 Description
• 8-channel, 18-bit ADC with analog front-end: The ADS9813 is an eight-channel data acquisition
– Simultaneous sampling (DAQ) system based on a simultaneous sampling, 18-
– Constant 1MΩ input impedance front-end bit successive approximation register (SAR) analog-
• Programmable analog input ranges: to-digital converter (ADC). The ADS9813 features a
– ±12V, ±10V, ±7V, ±5V, ±3.5V, and ±2.5V complete analog front-end (AFE) for each channel
– Single-ended and differential inputs with an input clamp. The device also features a 1MΩ
– Common-mode voltage range: ±12V input impedance and a programmable gain amplifier
– Input overvoltage protection: Up to ±18V (PGA) with user-selectable bandwidth options. The
• User-selectable analog input bandwidth: high input impedance allows direct connection with
– 22.7kHz and 700kHz sensors and transformers, thus eliminating the need
• Integrated low-drift precision references: for external driver circuits. Configure the ADS9813
to accept ±12V, ±10V, ±7V, ±5V, ±3.5V, and ±2.5V
– ADC reference: 4.096V
bipolar inputs with up to ±12V input common-mode
– 2.5V reference output for external circuits
voltage.
• Excellent AC and DC performance at full-
throughput: A digital interface supporting 1.2V to 1.8V operation
– DNL: ±0.35LSB, INL: ±0.8LSB enables the ADS9813 to be used without external
– SNR: 90.3dBFS, THD: –113dB voltage level translators.
• Power supply: Package Information
– Analog and digital: 5V and 1.8V PART NUMBER PACKAGE(1) PACKAGE SIZE(2)
– Digital interface: 1.2V to 1.8V
ADS9813, ADS9811,
• Temperature range: –40°C to +125°C ADS9810
RSH (VQFN, 56) 7mm × 7mm

2 Applications (1) For more information, see the Mechanical, Packaging, and
Orderable Information.
• Semiconductor test (2) The package size (length × width) is a nominal value and
• Programmable DC power supplies includes pins, where applicable.
• Parametric measurement units (PMU) Device Information
PART NUMBER SPEED TOTAL POWER
ADS9813 2MSPS/channel 244mW
ADS9811, ADS9810 1MSPS/channel 177mW

Dynamic Input
Signal Support
AINxP and AINxM
Differential with AVDD_5V = 4.75 V to 5.25 V VDD_1V8 = 1.75 V to 1.85 V REFIO IOVDD = 1.15 V to 1.85 V
Bipolar Differential Unipolar wide input
common-mode
voltage ADC Reference
4.096 V

AIN8P
8 CHANNELS
DCLKOUT
1 M FCLKOUT
AIN1P Clamp User- D0
Data
+12V PGA selectable ADC Interface D1
+10V Multiple analog input Clamp LPF D2
AIN1M
ranges D3
+7V 1M
+5V
+3.5V
+2.5V AIN8M
Optimum
SNR for
PGA CS
multiple
User SCLK
ranges
2.5 V Registers SDI / EXTREF
–2.5V SDO
–3.5V
–5V
–7V
–10V
REFOUT_2V5
–12V

Device Block Diagram

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ADS9813, ADS9811, ADS9810
SBASAQ6A – JULY 2024 – REVISED NOVEMBER 2024 www.ti.com

Table of Contents
1 Features............................................................................1 6.5 Programming............................................................ 33
2 Applications..................................................................... 1 7 Register Map.................................................................. 37
3 Description.......................................................................1 7.1 Register Bank 0 ....................................................... 37
4 Pin Configuration and Functions...................................3 7.2 Register Bank 1 ....................................................... 40
5 Specifications.................................................................. 5 7.3 Register Bank 2 ....................................................... 51
5.1 Absolute Maximum Ratings........................................ 5 8 Application and Implementation.................................. 52
5.2 ESD Ratings............................................................... 5 8.1 Application Information............................................. 52
5.3 Recommended Operating Conditions.........................6 8.2 Typical Application.................................................... 52
5.4 Thermal Information....................................................6 8.3 Power Supply Recommendations.............................55
5.5 Electrical Characteristics.............................................7 8.4 Layout....................................................................... 56
5.6 Timing Requirements................................................ 10 9 Device and Documentation Support............................57
5.7 Switching Characteristics.......................................... 11 9.1 Receiving Notification of Documentation Updates....57
5.8 Timing Diagrams....................................................... 11 9.2 Support Resources................................................... 57
5.9 Typical Characteristics.............................................. 14 9.3 Trademarks............................................................... 57
6 Detailed Description......................................................20 9.4 Electrostatic Discharge Caution................................57
6.1 Overview................................................................... 20 9.5 Glossary....................................................................57
6.2 Functional Block Diagram......................................... 20 10 Revision History.......................................................... 57
6.3 Feature Description...................................................21 11 Mechanical, Packaging, and Orderable
6.4 Device Functional Modes..........................................31 Information.................................................................... 57

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4 Pin Configuration and Functions

SMPL_SYNC

SMPL_CLKM
SMPL_CLKP
AVDD_5V

VDD_1V8

VDD_1V8
VDD_1V8
AIN1M

REFIO
REFM
AIN1P

GND
NC

NC
53
56

51

50

49

48

47

46

45

44

43
55

54

52
AIN2P 1 42 GND

AIN2M 2 41 IOVDD

AIN3P 3 40 FCLKOUT

AIN3M 4 39 NC

AIN4P 5 38 NC

AIN4M 6 37 D3

GND 7 36 D2
Thermal
REFM 8 35 D1
Pad
AIN5P 9 34 D0

AIN5M 10 33 DCLKOUT

AIN6P 11 32 PWDN

AIN6M 12 31 RESET

AIN7P 13 30 IOVDD

AIN7M 14 29 GND
23

24

25

26

27

28
21

22
15

16

17

18

19

20

CS

SDI / EXTREF
VDD_1V8

VDD_1V8

GND

SDO
REFOUT_2V5
AIN8P

AIN8M

REFM

NC

SPI_EN

SCLK
AVDD_5V

Not to scale

Figure 4-1. RSH Package, 56-Pin VQFN (Top View)

Table 4-1. Pin Functions


PIN
TYPE(1) DESCRIPTION
NAME NO.
AIN1M 55 AI Analog input channel 1, negative input.
AIN1P 54 AI Analog input channel 1, positive input.
AIN2M 2 AI Analog input channel 2, negative input.
AIN2P 1 AI Analog input channel 2, positive input.
AIN3M 4 AI Analog input channel 3, negative input.
AIN3P 3 AI Analog input channel 3, positive input.
AIN4M 6 AI Analog input channel 4, negative input.
AIN4P 5 AI Analog input channel 4, positive input.
AIN5M 10 AI Analog input channel 5, negative input.
AIN5P 9 AI Analog input channel 5, positive input.
AIN6M 12 AI Analog input channel 6, negative input.
AIN6P 11 AI Analog input channel 6, positive input.
AIN7M 14 AI Analog input channel 7, negative input.
AIN7P 13 AI Analog input channel 7, positive input.

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Table 4-1. Pin Functions (continued)


PIN
TYPE(1) DESCRIPTION
NAME NO.
AIN8M 17 AI Analog input channel 8, negative input.
AIN8P 16 AI Analog input channel 8, positive input.
AVDD_5V 15, 56 P 5V analog supply. Connect 1µF and 0.1µF decoupling capacitors to GND.
Chip-select input for the SPI interface configuration; active low. This pin has an internal
CS 25 DI
100kΩ pullup resistor to IOVDD.
D0 34 DO Serial output data lane 0.
D1 35 DO Serial data output lane 1.
D2 36 DO Serial data output lane 2.
D3 37 DO Serial data output lane 3.
DCLKOUT 33 DO Clock output for the data interface.
FCLKOUT 40 DO Frame synchronization output for the data interface.
7, 23, 29, 42,
GND P Ground.
46
Digital I/O supply for the data interface. Connect 1µF and 0.1µF decoupling capacitors to
IOVDD 30, 41 P
GND.
20, 38, 39, 50,
NC — Not connected. No external connection.
51
Power-down control; active low. PWDN has an internal 100kΩ pullup resistor to the digital
PWDN 32 DI
interface supply.
REFIO acts as an internal reference output when the internal reference is enabled. REFIO
REFIO 52 AI/AO functions as an input pin for the external reference when the internal reference is disabled.
Connect a 10µF decoupling capacitor to the REFM pins.
REFM 8, 18, 53 AI Reference ground potential. Connect to GND.
REFOUT_2V5 19 AO 2.5V reference output. Connect a decoupling 10µF capacitor to the REFM pins.
Reset input for the device; active low. RESET has an internal 100kΩ pullup resistor to the
RESET 31 DI
digital interface supply.
Serial clock input for the configuration interface. SCLK has an internal 100kΩ pulldown
SCLK 26 DI
resistor to the digital interface ground.
SDI is a multifunction logic input. Pin function is determined by the SPI_EN pin. SDI has an
internal 100kΩ pulldown resistor to GND.
SPI_EN = 0b: SDI is the logic input to select between the internal or external reference.
SDI/EXTREF 27 DI
Connect SDI to GND for the external reference. Connect SDI to IOVDD for the internal
reference.
SPI_EN = 1b: Serial data input for the configuration interface.
SDO 28 DO Serial data output for the configuration interface.
Connect SMPL_CLKM to GND for a single-ended ADC sampling clock input. SMPL_CLKM
SMPL_CLKM 43 DI
is the negative input for the differential sampling clock input to the ADC.
Single-ended ADC sampling clock input. SMPL_CLKP is the positive input for the differential
SMPL_CLKP 44 DI
sampling clock input to the ADC.
Synchronization input. See the Synchronizing Multiple ADCs section on how to use the
SMPL_SYNC 45 DI
SMPL_SYNC pin.
Logic input to enable the SPI interface configuration (CS, SCLK, SDI, and SDO). SPI_EN
SPI_EN 24 DI
has an internal 100kΩ pullup resistor to the digital interface supply.
21, 22, 47, 48,
VDD_1V8 P 1.8V power-supply. Connect 1µF and 0.1µF decoupling capacitors to GND.
49
Thermal pad — P Exposed thermal pad; connect to GND.

(1) I = input, O = output, I/O = input or output, G = ground, and P = power.

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5 Specifications
5.1 Absolute Maximum Ratings
over operating ambient temperature range (unless otherwise noted)(1)
MIN MAX UNIT
AVDD_5V to GND –0.3 6 V
VDD_1V8 to GND –0.3 2.1 V
IOVDD to GND –0.3 2.1 V
AINxP and AINxM to GND –18 18 V
REFIO to REFM REFM – 0.3 AVDD_5V + 0.3 V
REFM to GND GND – 0.3 GND + 0.3 V
Digital inputs to GND GND – 0.3 2.1 V
Input current to any pin except supply pins(2) –10 10 mA
Junction temperature, TJ –40 150 °C
Storage temperature, Tstg –60 150 °C

(1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply
functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions.
If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully
functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.
(2) Limit pin current to 10mA or less.

5.2 ESD Ratings


VALUE UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ±2000
V(ESD) Electrostatic discharge Charged device model (CDM), per JEDEC specification ANSI/ESDA/ V
±500
JEDEC JS-002, all pins(2)

(1) JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process.

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5.3 Recommended Operating Conditions


over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
POWER SUPPLY
AVDD_5V Analog power supply AVDD_5V to GND 4.75 5 5.25 V
VDD_1V8 Power supply VDD_1V8 to GND 1.75 1.8 1.85 V
IOVDD Digital interface power supply IOVDD to GND 1.15 1.8 1.85 V
REFERENCE VOLTAGE
VREF Reference voltage to the ADC External reference 4.088 4.096 4.104 V
ANALOG INPUTS
RANGE_CHx = 2 –2.5 2.5
RANGE_CHx = 1 –3.5 3.5
RANGE_CHx = 0 –5 5
VFSR Full-scale input range V
RANGE_CHx = 3 –7 7
RANGE_CHx = 4 –10 10
RANGE_CHx = 5 –12 12
Operating input voltage,
AINxP AINxP to GND –17 17 V
positive input
Operating input voltage,
AINxM AINxM to GND –17 17 V
negative input
TEMPERATURE RANGE
TA Ambient temperature –40 25 125 °C

5.4 Thermal Information


ADS981x
THERMAL METRIC(1) RSH (VQFN) UNIT
56 PINS
RθJA Junction-to-ambient thermal resistance 23.2 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 10.5 °C/W
RθJB Junction-to-board thermal resistance 6.1 °C/W
ΨJT Junction-to-top characterization parameter 0.1 °C/W
ΨJB Junction-to-board characterization parameter 6.0 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance 0.9 °C/W

(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
note.

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5.5 Electrical Characteristics


at AVDD_5V = 4.75V to 5.25V, VDD_1V8 = 1.75V to 1.85V, IOVDD = 1.15V to 1.85V, VREF = 4.096V (external), and
maximum throughput (unless otherwise noted); minimum and maximum values at TA = –40°C to +125°C; typical values at TA
= 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ANALOG INPUTS
RIN Input impedance All input ranges 0.8 1 1.2 MΩ
Input impedance thermal drift All input ranges 10 30 ppm/°C
Input capacitance 10 pF
ANALOG INPUT FILTER
Low-bandwidth filter, all input ranges 22.7
Wide-bandwidth filter, input range = ±2.5V 221
Wide-bandwidth filter, input range = ±3.5V 325
Analog input LPF bandwidth
BW(-3 dB) Wide-bandwidth filter, input range = ±5V 500 kHz
–3 dB
Wide-bandwidth filter, input range = ±7V 700
Wide-bandwidth filter, input range = ±10V 691
Wide-bandwidth filter, input range = ±12V 664
DC PERFORMANCE(3) (4)
Resolution No missing codes 18 Bits
DNL Differential nonlinearity Wide CM enabled and disabled, all ranges –0.99 ±0.35 0.99 LSB
RANGE = ±5V and ±10V, TA = 20℃ to 60℃,
AVDD_5V = 4.9V to 5.1V –2 ±0.8 2
INL Integral nonlinearity ADS9813 and ADS9811 LSB

All ranges –4 ±0.8 4


RANGE = ±5V, ±10V, and ±12V –75 ±15 75
RANGE = ±3.5V and ±7V –100 ±25 100
Offset error LSB
RANGE = ±2.5V –175 ±25 175
All other conditions ±50
All ranges, TA = 0°C to 70°C 0.6 2
Offset error thermal drift ppm/°C
All ranges 0.6
Gain error All ranges –0.038 ±0.008 0.038 %FSR
All ranges, TA = 0°C to 70°C 0.6 3
Gain error thermal drift ppm/°C
All ranges 0.6

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5.5 Electrical Characteristics (continued)


at AVDD_5V = 4.75V to 5.25V, VDD_1V8 = 1.75V to 1.85V, IOVDD = 1.15V to 1.85V, VREF = 4.096V (external), and
maximum throughput (unless otherwise noted); minimum and maximum values at TA = –40°C to +125°C; typical values at TA
= 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
AC PERFORMANCE(3) (4)
Low-noise filter, fIN = 2kHz, range = ±2.5V 85.3 87.4
Low-noise filter, fIN = 2kHz, range = ±3.5V 86.3 88.4
Low-noise filter, fIN = 2kHz, range = ±5V 87 89.1
Low-noise filter, fIN = 2kHz, range = ±7V 87.5 89.8
Low-noise filter, fIN = 2kHz, range = ±10V 88 90.2
Low-noise filter, fIN = 2kHz, range = ±12V 88.1 90.3
Wide-bandwidth filter, fIN = 2kHz,
77.1 79.1
range = ±2.5V
SNR Signal-to-noise ratio Wide-bandwidth filter, fIN = 2kHz, dBFS
77.4 79.4
range = ±3.5V
Wide-bandwidth filter, fIN = 2kHz,
77.5 79.7
range = ±5V
Wide-bandwidth filter, fIN = 2kHz,
77.7 79.9
range = ±7V
Wide-bandwidth filter, fIN = 2kHz,
79.5 81.6
range = ±10V
Wide-bandwidth filter, fIN = 2 kHz,
80.2 82.4
range = ±12V
Low-noise filter, fIN = 2kHz, range = ±2.5V 85.2 87.3
Low-noise filter, fIN = 2kHz, range = ±3.5V 86.2 88.3
Low-noise filter, fIN = 2kHz, range = ±5V 86.9 89
Low-noise filter, fIN = 2kHz, range = ±7V 87.4 89.7
Low-noise filter, fIN = 2kHz, range = ±10V 87.9 90.1
Low-noise filter, fIN = 2kHz, range = ±12V 88 90.2
Wide-bandwidth filter, fIN = 2kHz,
77 79
range = ±2.5V
SINAD Signal-to-noise + distortion ratio Wide-bandwidth filter, fIN = 2kHz, dB
77.3 79.3
range = ±3.5V
Wide-bandwidth filter, fIN = 2kHz,
77.4 79.6
range = ±5V
Wide-bandwidth filter, fIN = 2kHz,
77.6 79.8
range = ±7V
Wide-bandwidth filter, fIN = 2kHz,
79.4 81.5
range = ±10V
Wide-bandwidth filter, fIN = 2 kHz,
80.1 82.3
range = ±12V
Low-noise filter, fIN = 2kHz, all ranges –113
THD Total harmonic distortion dB
Wide-bandwidth filter, fIN = 2kHz, all ranges –113
fIN = 2kHz 102
SFDR Spurious-free dynamic range dB
fIN = 2kHz, data averaging enabled 113
CMRR At dc –70 dB
Isolation crosstalk At dc –100 dB
INTERNAL REFERENCE
Voltage on REFIO pin
VREF (1) 1µF capacitor on REFIO pin, TA = 25°C 4.092 4.096 4.1 V
(configured as output)
Reference temperature drift 7 20 ppm/°C

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5.5 Electrical Characteristics (continued)


at AVDD_5V = 4.75V to 5.25V, VDD_1V8 = 1.75V to 1.85V, IOVDD = 1.15V to 1.85V, VREF = 4.096V (external), and
maximum throughput (unless otherwise noted); minimum and maximum values at TA = –40°C to +125°C; typical values at TA
= 25°C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
DIGITAL INPUTS
VIL Input low logic level –0.3 0.3 IOVDD V
VIH Input high logic level 0.7 IOVDD IOVDD V
Input capacitance 6 pF
LVDS SAMPLING CLOCK INPUT
AC coupled 100
VTH High-level input voltage (P – M) mV
DC coupled 300
AC coupled –100
VTL Low-level input voltage (P – M) mV
DC coupled –300
VICM Input common-mode voltage 0.5 1.2 1.4 V
DIGITAL OUTPUTS
VOL Output low logic level IOL = 200µA sink 0 0.2 IOVDD V
VOH Output high logic level IOH = 200µA source 0.8 IOVDD IOVDD V
POWER SUPPLY - ADS9813
Total power dissipation Maximum throughput 244 304 mW
Maximum throughput, internal reference 28.3 32
IAVDD_5V Supply current from AVDD_5V mA
Power-down 0.2 2
Maximum throughput, internal reference 52 70
IVDD_1V8 Supply current from VDD_1V8 mA
Power-down 0.2 8
Maximum throughput, CL = 10pF 5 10
IIOVDD Supply current from IOVDD mA
Power-down 0.1 2
POWER SUPPLY - ADS9811 and ADS9810
Total power dissipation Maximum throughput 177 215 mW
Supply current from AVDD_5V Maximum throughput, internal reference 21.3 25
IAVDD_5V mA
Supply current from AVDD_5V Power-down 0.2 2
Supply current from VDD_1V8 Maximum throughput, internal reference 35 43
IVDD_1V8 mA
Supply current from VDD_1V8 Power-down 0.2 8
Supply current from IOVDD Maximum throughput, CL = 10pF 4 7
IIOVDD mA
Supply current from IOVDD Power-down 0.1 2

(1) Does not include the variation in voltage resulting from solder shift effects.
(2) Measured with analog input common-mode voltage range ≤ ±RANGE/2 as described in Wide Common-Mode Configuration for
Differential Inputs
(3) Minimum and maximum specifications are applicable for low-bandwidth filter setting.

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5.6 Timing Requirements


at AVDD_5V = 4.75V to 5.25V, VDD_1V8 = 1.75V to 1.85V, IOVDD = 1.15V to 1.85V, VREF = 4.096V (internal or external),
and maximum throughput (unless otherwise noted); minimum and maximum values at TA = –40°C to +125°C; typical values
at TA = 25°C
MIN MAX UNIT
CONVERSION CYCLE
fSMPL_CLK Sampling frequency ADS9813 3.9 8.1 MHz
fSMPL_CLK Sampling frequency ADS9811 and ADS9810 3.9 4.1 MHz
tSMPL_CLK Sampling time interval 1 / fSMPL_CLK ns
tPL_SMPL_CLK SMPL_CLK low time 0.45 tSMPL_CLK 0.55 tSMPL_CLK ns
tPH_SMPL_CLK SMPL_CLK high time 0.45 tSMPL_CLK 0.55 tSMPL_CLK ns
SPI INTERFACE TIMINGS (CONFIGURATION INTERFACE)
fSCLK Maximum SCLK frequency 20 MHz
tPH_CK SCLK high time 0.48 0.52 tCLK
tPL_CK SCLK low time 0.48 0.52 tCLK
thi_CS Pulse duration: CS high 220 ns
td_CSCK Delay time: CS falling to the first SCLK capture edge 20 ns
tsu_CKDI Setup time: SDI data valid to the SCLK rising edge 10 ns
tht_CKDI Hold time: SCLK rising edge to data valid on SDI 5 ns
tD_CKCS Delay time: last SCLK falling to CS rising 5 ns
CMOS DATA INTERFACE
Setup time: SMPL_SYNC rising edge to SMPL_CLK falling
tsu_SS 10 ns
edge
tht_SS Hold time: SMPL_CLK falling edge to SMPL_SYNC high 10 ns

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5.7 Switching Characteristics


at AVDD_5V = 4.75V to 5.25V, VDD_1V8 = 1.75V to 1.85V, IOVDD = 1.15V to 1.85V, VREF = 4.096V (internal or external),
and maximum throughput (unless otherwise noted); minimum and maximum values at TA = –40°C to +125°C; typical values
at TA = 25°C
PARAMETER TEST CONDITIONS MIN MAX UNIT
RESET
tPU Power-up time for device 30 ms
SPI INTERFACE TIMINGS (Configuration Interface)
Delay time: 8th SCLK rising edge to data
tden_CKDO 22 ns
enable
Delay time: 24th SCLK rising edge to SDO
tdz_CKDO 50 ns
going Hi-Z
Delay time: SCLK falling edge to
td_CKDO 16 ns
corresponding data valid on SDO
Delay time: SCLK falling edge to previous
tht_CKDO 2 ns
data valid on SDO
CMOS DATA INTERFACE
DDR mode 10
tDCLK Data clock output ns
SDR mode 20
Clock duty cycle 45 55 %
Time offset: DCLK rising to corresponding
toff_DCLKDO_r DDR mode tDCLK / 4 – 1.5 tDCLK / 4 + 1.5 ns
data valid
Time offset: DCLK falling to corresponding
toff_DCLKDO_f DDR mode tDCLK / 4 – 1.5 tDCLK / 4 + 1.5 ns
data valid
Time delay: DCLK rising to corresponding
td_DCLKDO SDR mode –1 1 ns
data valid
Time delay: SMPL_CLK falling edge with
td_SYNC_FCLK SYNC signal to corresponding FCLKOUT 3 4 tSMPL_CLK
rising edge

5.8 Timing Diagrams


thi_CS

CS

td_CSCK td_CKCS

SCLK 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24

tsu_CKDI tht_CKDI

A A A A A A A A D D D D D D D D D D D D D D D D
SDI 7 6 5 4 3 2 1 0 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0

tden_CKDO td_CKDO tht_SDO tdz_CKDO

Hi-Z DO DO DO DO DO DO DO DO DO DO DO DO DO DO DO DO
SDO 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
SDO is active only when reading registers; Hi-Z otherwise

Figure 5-1. SPI Configuration Interface

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Simultaneously sample all analog input channels
Simultaneously sample all analog input channels

SMPL_SYNC

tht_SS
tsu_SS 2 SMPL_CLK 4 SMPL_CLK

SMPL_CLK

td_SYNC_FCLK 24 DCLKs

DCLKOUT

td_SMPL_DATA tFCLK
D[23:6] = 18-bit conversion result
FCLKOUT D[5:0] = 0

toff_DCLKDO_f 6 DCLK toff_DCLKDO_r

D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D
D3 23 21 19 13 11 9 1 23 21 19 13 11 9 1 23 21 19 13 11 9 1 23 21 19 13 11 9 1 23 21 19 13 11 9

Channel 1 Channel 2 Channel 3 Channel 4 Channel 1

D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D
D2 22 20 18 12 10 8 0 22 20 18 12 10 8 0 22 20 18 12 10 8 0 22 20 18 12 10 8 0 22 20 18 12 10 8

D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D
D1 23 21 19 13 11 9 1 23 21 19 13 11 9 1 23 21 19 13 11 9 1 23 21 19 13 11 9 1 23 21 19 13 11 9

Channel 8 Channel 7 Channel 6 Channel 5 Channel 8

D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D
D0 22 20 18 12 10 8 0 22 20 18 12 10 8 0 22 20 18 12 10 8 0 22 20 18 12 10 8 0 22 20 18 12 10 8

Figure 5-2. 4-SDO DDR CMOS Data Interface


Simultaneously sample all analog input channels Simultaneously sample all analog input channels

SMPL_SYNC

tht_SS
tsu_SS 2 SMPL_CLK 4 SMPL_CLK

SMPL_CLK

td_SYNC_FCLK 48 DCLKs

DCLKOUT

td_SMPL_DATA tFCLK
D[23:6] = 18-bit conversion result
FCLKOUT D[5:0] = 0

toff_DCLKDO_r 12 DCLK toff_DCLKDO_f

D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D
D3 23 22 21 12 11 10 0 23 22 21 12 11 10 0 23 22 21 12 11 10 0 23 22 21 12 11 10 0 23 22 21 12 11 10

Channel 1 Channel 2 Channel 3 Channel 4 Channel 1

D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D D
D1 23 22 21 12 11 10 0 23 22 21 12 11 10 0 23 22 21 12 11 10 0 23 22 21 12 11 10 0 23 22 21 12 11 10

Channel 8 Channel 7 Channel 6 Channel 5 Channel 8

Figure 5-3. 2-SDO DDR CMOS Data Interface

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Simultaneously sample all analog input channels Simultaneously sample all analog input channels

SMPL_SYNC

tht_SS

tsu_SS 2 SMPL_CLK 4 SMPL_CLK

SMPL_CLK

td_SYNC_FCLK

48 DCLKs

DCLKOUT

td_SMPL_DATA tFCLK
D[23:6] = 18-bit conversion result
D[5:0] = 0
FCLKOUT

td_DCLKDO

D3 D D D D D D D D D D D D D D D D
23 21 11 1 23 21 11 1 23 21 11 1 23 21 11 1

Channel 1 Channel 2 Channel 3 Channel 4

D D D D D D D D D D D D D D D D
D2 22 20 10 0 22 20 10 0 22 20 10 0 22 20 10 0

D1 D D D D D D D D D D D D D D D D
23 21 11 1 23 21 11 1 23 21 11 1 23 21 11 1

Channel 8 Channel 7 Channel 6 Channel 5

D D D D D D D D D D D D D D D D
D0 22 20 10 0 22 20 10 0 22 20 10 0 22 20 10 0

Figure 5-4. 4-SDO SDR CMOS Data Interface


Simultaneously sample all analog input channels Simultaneously sample all analog input channels

SMPL_SYNC

tht_SS
tsu_SS 4 SMPL_CLK
2 SMPL_CLK

SMPL_CLK

td_SYNC_FCLK

96 DCLKs

DCLKOUT

td_SMPL_DATA tFCLK
D[23:6] = 18-bit conversion result
D[5:0] = 0
FCLKOUT

td_DCLKDO

D3 D D D D
23 22 11 0

Channel 1 Channel 2 Channel 3 Channel 4

D1 D D D D
23 22 11 0

Channel 8 Channel 7 Channel 6 Channel 5

Figure 5-5. 2-SDO SDR CMOS Data Interface

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5.9 Typical Characteristics


at TA = 25°C, AVDD_5V = 5V, AVDD_1V8 = 1.8V, DVDD_1V8 = 1.8V, internal VREF = 4.096V, and maximum throughput
(unless otherwise noted)

2.5 0.8
Low-Bandwidth, RANGE = ±5V Low-Bandwidth, RANGE = ±5V
2 Low-Bandwidth, RANGE = ±10V 0.6 Low-Bandwidth, RANGE = ±10V
Wide-Bandwidth, RANGE = ±5V Wide-Bandwidth, RANGE = ±5V

Differential Nonlinearity (LSB)


1.5
Integral Nonlinearity (LSB)

Wide-Bandwidth, RANGE = ±10V 0.4 Wide-Bandwidth, RANGE = ±10V


1
0.5 0.2

0 0
-0.5 -0.2
-1
-0.4
-1.5
-2 -0.6

-2.5 -0.8
0 65536 131072 196608 262144 0 65536 131072 196608 262144
ADC Output Code (LSB) Output Code
Figure 5-6. Typical INL Figure 5-7. Typical DNL With Low-Noise LPF
0 0

-50 -50
Amplitude (dBFS)

Amplitude (dBFS)

-100 -100

-150 -150

-200 -200
0.1 0.2 0.5 1 2 3 4 5 7 10 20 30 50 100 200 500 1000 0.1 0.2 0.5 1 2 3 4 5 7 10 20 30 50 100 200 500 1000
Frequency (kHz) Frequency (kHz)

SNR = 89.1dBFS, THD = –116dB at fIN = 2kHz SNR = 79.7dBFS, THD = –117.3dB at fIN = 2kHz
Figure 5-8. Typical FFT With Low-Bandwidth LPF, Figure 5-9. Typical FFT With Wide-Bandwidth LPF,
RANGE = ±5V RANGE = ±5V

SNR = 90.2dBFS, THD = –114dB at fIN = 2kHz SNR = 81.6dBFS, THD = –116dB at fIN = 2kHz
Figure 5-10. Typical FFT With Low-Bandwidth LPF, Figure 5-11. Typical FFT With Wide-Bandwidth LPF,
RANGE = ±10V RANGE = ±10V

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5.9 Typical Characteristics (continued)


at TA = 25°C, AVDD_5V = 5V, AVDD_1V8 = 1.8V, DVDD_1V8 = 1.8V, internal VREF = 4.096V, and maximum throughput
(unless otherwise noted)

0 0
All input ranges
-6
-3
-12

Amplitude (dB)
Amplitude (dB)

-18 -6
-24
-9
-30 RANGE = ±2.5V
RANGE = ±3.5V
-36 RANGE = ±5V
-12 RANGE = ±7V
-42 RANGE = ±10V
RANGE = ±12V
-48 -15
1 2 3 4 5 67 10 20 30 50 70100 200 500 1000 0.2 0.5 1 2 3 4 5 7 10 20 30 50 100 200 500 1000
Frequency (kHz) Frequency (kHz)

Typical bandwidth (–3dB) = 22.7kHz


Figure 5-12. Low-Noise LPF Frequency Response Across Input Figure 5-13. Wide-Bandwidth LPF Frequency Response Across
Ranges Input Ranges
90 -90 91 -85
SNR SINAD THD SNR SINAD THD
90.75 -90
89.7 -95
SNR (dBFS), SINAD (dB)

SNR (dBFS), SINAD (dB)

90.5 -95
89.4 -100
90.25 -100
THD (dB)

THD (dB)
89.1 -105 90 -105

89.75 -110
88.8 -110
89.5 -115
88.5 -115
89.25 -120

88.2 -120 89 -125


50 70100 200 500 1000 2000 5000 10000 50000 50 70100 200 500 1000 2000 5000 10000 50000
Input Frequency (Hz) Input Frequency (Hz)

Low-Bandwidth LPF and RANGE = ±5V Low-Bandwidth LPF and RANGE = ±10V
Figure 5-14. SNR, SINAD, and THD vs Input Signal Frequency Figure 5-15. SNR, SINAD, and THD vs Input Signal Frequency
80 -88 81.45 -95
SNR SINAD THD SNR SINAD THD
79.75 -92
81.4 -100
SNR (dBFS), SINAD (dB)

SNR (dBFS), SINAD (dB)

79.5 -96

79.25 -100 81.35 -105


THD (dB)

79 -104 THD (dB)

78.75 -108 81.3 -110

78.5 -112
81.25 -115
78.25 -116

78 -120 81.2 -120


50 70100 200 500 1000 2000 5000 10000 50000 50 70100 200 500 1000 2000 5000 10000 50000
Input Frequency (Hz) Input Frequency (Hz)

Wide-Bandwidth LPF and RANGE = ±5V Wide-Bandwidth LPF and RANGE = ±10V
Figure 5-16. SNR, SINAD, and THD vs Input Signal Frequency Figure 5-17. SNR, SINAD, and THD vs Input Signal Frequency

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5.9 Typical Characteristics (continued)


at TA = 25°C, AVDD_5V = 5V, AVDD_1V8 = 1.8V, DVDD_1V8 = 1.8V, internal VREF = 4.096V, and maximum throughput
(unless otherwise noted)

-70
RSOURCE = 0 RSOURCE = 10k
-75 RSOURCE = 50 RSOURCE = 50k
-80 RSOURCE = 1k

-85
-90

THD (dB)
-95
-100
-105
-110
-115
-120
50 70 100 200 300 500 1000 2000 5000 10000 20000
Input Frequency (Hz)

Low-Bandwidth LPF and RANGE = ±5V Low-Bandwidth LPF and RANGE = ±10V
Figure 5-18. THD vs Input Signal Frequency Across External Figure 5-19. THD vs Input Signal Frequency Across External
Source Impedance Source Impedance
-70
RSOURCE = 0 RSOURCE = 10k
-75 RSOURCE = 50 RSOURCE = 50k
-80 RSOURCE = 1k

-85
-90
THD (dB)

-95
-100
-105
-110
-115
-120
50 70 100 200 300 500 1000 2000 5000 10000 20000
Input Frequency (Hz)

Wide-Bandwidth LPF and RANGE = ±5V Wide-Bandwidth LPF and RANGE = ±10V
Figure 5-20. THD vs Input Signal Frequency Across External Figure 5-21. THD vs Input Signal Frequency Across External
Source Impedance Source Impedance
48 48
CH1 CH3 CH5 CH7 CH1 CH3 CH5 CH7
40 CH2 CH4 CH6 CH8 40 CH2 CH4 CH6 CH8
32 32
Offset Error (LSB)

Offset Error (LSB)

24 24

16 16

8 8

0 0

-8 -8

-16 -16

-24 -24
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Te mperature (°C) Te mperature (°C)

Low-bandwidth and wide-bandwidth Low-bandwidth and wide-bandwidth


Figure 5-22. Offset Error vs Temperature, RANGE = ±5V Figure 5-23. Offset Error vs Temperature, RANGE = ±10V

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5.9 Typical Characteristics (continued)


at TA = 25°C, AVDD_5V = 5V, AVDD_1V8 = 1.8V, DVDD_1V8 = 1.8V, internal VREF = 4.096V, and maximum throughput
(unless otherwise noted)

0.012 0.012

0.009
0.009
0.006
0.006
Gain Error (%FSR)

Gain Error (%FSR)


0.003

0 0.003

-0.003 0
-0.006
-0.003
-0.009

CH1 CH3 CH5 CH7 -0.006 CH1 CH3 CH5 CH7


-0.012
CH2 CH4 CH6 CH8 CH2 CH4 CH6 CH8
-0.015 -0.009
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Te mperature (°C) Te mperature (°C)

Low-bandwidth and wide-bandwidth Low-bandwidth and wide-bandwidth


Figure 5-24. Gain Error vs Temperature, RANGE = ±5V Figure 5-25. Gain Error vs Temperature, RANGE = ±10V
-112.5 -115
Low-Bandwidth, f IN = 2kHz Low-Bandwidth, f IN = 2kHz
Low-Bandwidth, f IN = 10kHz Low-Bandwidth, f IN = 10kHz
-115 Wide-Bandwidth, f IN = 2kHz -117.5 Wide-Bandwidth, f IN = 2kHz
Wide-Bandwidth, f IN = 10kHz Wide-Bandwidth, f IN = 10kHz
THD (dBFS)

THD (dBFS)

-117.5 -120

-120 -122.5

-122.5 -125

-125 -127.5
0 -2.5 -5 -7.5 -10 -12.5 -15 -17.5 -20 -22.5 -25 -25 -22.5 -20 -17.5 -15 -12.5 -10 -7.5 -5 -2.5 0
Input Signal Amplitude (dB) Input Signal Amplitude (dB)

Figure 5-26. THD vs Input Signal Amplitude Across Input Signal Figure 5-27. THD vs Input Signal Amplitude Across Input Signal
Frequency, RANGE = ±5V Frequency, RANGE = ±10V
2.5 0.4
2
Differential Nonlinearity (LSB)

1.5
Integral Nonlinearity (LSB)

0.2
1
Maximum, Low-BW mode
0.5 Minimum, Low-BW mode
Maximum, High-BW mode
0 0
Minimum, High-BW mode
-0.5
-1
-0.2
-1.5
-2 Low-BW, INL Min Wide-BW, INL Min
Low-BW, INL Max Wide-BW, INL Max
-2.5 -0.4
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Te mperature (°C) Te mperature (°C)

Figure 5-28. INL vs Temperature Figure 5-29. DNL vs Temperature

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5.9 Typical Characteristics (continued)


at TA = 25°C, AVDD_5V = 5V, AVDD_1V8 = 1.8V, DVDD_1V8 = 1.8V, internal VREF = 4.096V, and maximum throughput
(unless otherwise noted)

4.101 2.504

Reference Voltage on REFOUT_2V5 (V)


Reference Voltage on REFIO (V)

4.098 2.502

4.095 2.5

4.092 2.498

4.089 2.496

4.086 2.494
-40 -20 0 20 40 60 80 100 120 -40 -20 0 20 40 60 80 100 120
Te mperature (°C) Te mperature (°C)

Figure 5-30. REFIO vs Temperature Figure 5-31. REFOUT_2V5 vs Temperature


600 600
CH1 CH1
540 CH2 540 CH2
480 CH3 480 CH3
CH4 CH4
420 CH5 420 CH5
Number of Hits

Number of Hits

CH6 CH6
360 CH7 360 CH7
300 CH8 300 CH8

240 240
180 180
120 120
60 60
0 0
-20 -15 -10 -5 0 5 10 15 12 16 20 24 28 32 36 40
ADC Output Code (LSB) ADC Output Code (LSB)

Standard deviation = 3.25LSB, number of hits = 4096 Standard deviation = 3.25LSB, number of hits = 4096
Figure 5-32. DC Histogram of Codes for AINxP = AINxM = GND, Figure 5-33. DC Histogram of Codes for VIN = 1mV, Low-
Low-Bandwidth, RANGE = ±5V Bandwidth, RANGE = ±5V
1000 1000
CH1 CH1
900 CH2 900 CH2
800 CH3 800 CH3
CH4 CH4
700 CH5 700 CH5
Number of Hits

Number of Hits

CH6 CH6
600 CH7 600 CH7
500 CH8 500 CH8

400 400
300 300
200 200
100 100
0 0
-60 -40 -20 0 20 40 60 80 -40 -20 0 20 40 60 80 100
ADC Output Code (LSB) ADC Output Code (LSB)

Standard deviation = 9.76LSB, number of hits = 4096 Standard deviation = 9.76LSB, number of hits = 4096
Figure 5-34. DC Histogram of Codes for AINxP = AINxM = GND, Figure 5-35. DC Histogram of Codes for VIN = 1mV, Wide-
Wide-Bandwidth, RANGE = ±5V Bandwidth, RANGE = ±5V

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5.9 Typical Characteristics (continued)


at TA = 25°C, AVDD_5V = 5V, AVDD_1V8 = 1.8V, DVDD_1V8 = 1.8V, internal VREF = 4.096V, and maximum throughput
(unless otherwise noted)

60 268
54 264
48 260

Power Dissipation (mW)


42 IAVDD_5V (mA) IIOVDD (mA) 256
IVDD_1V8 (mA) Power Dissipation (mW)
Current (mA)
36 252
30 248
24 244
18 240
12 236
6 232
0 228
-40 -20 0 20 40 60 80 100 120
Te mperature (°C)

Figure 5-36. Supply Currents and Total Power Dissipation vs Temperature

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6 Detailed Description
6.1 Overview
The ADS9813 is an 18-bit data acquisition (DAQ) system with eight analog input channels configurable as
either single-ended or differential. Each analog input channel consists of an input clamp protection circuit and a
programmable gain amplifier (PGA) with user-selectable bandwidth options. The input signals are digitized with
an 18-bit analog-to-digital converter (ADC), based on the successive approximation register (SAR) architecture.
This overall system achieves a maximum throughput of 2MSPS per channel for all channels. The device has
a 4.096V internal reference with several features that provide communication with a wide variety of digital
hosts. These features include a fast-settling buffer, a programmable digital averaging filter to improve noise
performance, and a high-speed data interface.
The device operates from 5V and 1.8V analog supplies and accommodates true bipolar input signals. The
input clamp protection circuitry tolerates voltages up to ±18V. The device offers a constant 1MΩ resistive input
impedance irrespective of the sampling frequency or the selected input range. The ADS9813 offers a simplified
end solution without requiring external high-voltage bipolar supplies and complicated driver circuits.
6.2 Functional Block Diagram
AVDD_5V VDD_1V8

1M
2.5 V REFOUT_2V5
AIN1P Clamp
SAR
1M 
PGA Prog. LPF
ADC
AIN1M Clamp

4.096 V
REFIO
VREF
1M 
AIN2P Clamp
REFM
SAR
1M 
PGA Prog. LPF
ADC
AIN2M Clamp ADC REF

1M 
AIN3P Clamp
SAR
1M 
PGA Prog. LPF
ADC IOVDD
AIN3M Clamp

RESET
1M 
AIN4P Clamp PWDN
SAR
PGA Prog. LPF SMPL_CLK
1M ADC
AIN4M Clamp
SMPL_SYNC

Digital logic DCLKOUT


and
1M Data Interface FCLKOUT
AIN5P Clamp
SAR D0
PGA Prog. LPF
1M ADC
AIN5M Clamp D1

D2

D3
1M
AIN6P Clamp
SAR
PGA Prog. LPF
1M ADC
AIN6M Clamp

1M 
AIN7P Clamp
SAR
1M 
PGA Prog. LPF
ADC
AIN7M Clamp

SPI_EN

1M  CS
AIN8P Clamp
SAR Conguraon
SCLK
1M 
PGA Prog. LPF Registers
ADC
AIN8M Clamp SDI / EXTREF

SDO

GND

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6.3 Feature Description


6.3.1 Analog Inputs
The ADS9813 incorporates eight, simultaneous sampling, 18-bit successive approximation register (SAR)
analog-to-digital converters (ADCs). The device has a total of eight analog input pairs. The ADC digitizes
the voltage difference between the analog input pairs AINxP – AINxM. Figure 6-1 shows the simplified
circuit schematic for each analog input channel. This figure also shows the input clamp protection circuit,
programmable gain amplifier (PGA), low-pass filter, high-speed ADC driver, and a precision 18-bit SAR ADC.
Typical SNR for analog input ranges vs input common-mode ranges are shown in Table 6-5 for low-bandwidth
mode and Table 6-6 for wide-bandwidth mode.

1M 
AINxP Clamp
SAR
PGA Prog. LPF
1M ADC
AINxM Clamp

Figure 6-1. Front-End Circuit Schematic for the Selected Analog Input Channel

6.3.1.1 Input Clamp Protection Circuit


The ADS9813 features an internal clamp protection circuit (Figure 6-1) on each of the eight analog input
channels. The input clamp protection circuit allows each analog input to swing up to a maximum voltage of ±18V.
Beyond an input voltage of ±18V, the input clamp circuit turns on and still operates from the single 5V supply.
Figure 6-2 shows a typical current versus voltage characteristic curve for the input clamp.
For input voltages above the clamp threshold, make sure that the input current never exceeds ±10mA. A resistor
placed in series with the analog inputs is an effective way to limit the input current. In addition to limiting the input
current, the series resistor also provides an antialiasing, low-pass filter (LPF) when coupled with a capacitor.
Matching the external source impedance on the AINxP and AINxM pins cancels any additional offset error.
0.1
0.08
0.06
Input Clamp Current (mA)

0.04
0.02
0
-0.02
-0.04
-0.06
-0.08
-0.1
-30 -25 -20 -15 -10 -5 0 5 10 15 20 25 30
Input Voltage (V)

Figure 6-2. Input Protection Clamp Profile, Input Clamp Current vs Source Voltage

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6.3.1.2 Programmable Gain Amplifier (PGA)


The ADS9813 features a PGA at every analog input channel. The PGA supports single-ended and differential
inputs with a bipolar signal swing. Table 6-1 lists the supported analog input ranges. Configure the analog input
range independently for each channel with the RANGE_CHx register fields in address 0xC2 and address 0xC3.
Table 6-1. Analog Input Ranges
DIFFERENTIAL INPUTS SINGLE-ENDED INPUTS RANGE_CHx CONFIGURATION
±12V ±12V 5
±10V ±10V 4
±7V ±7V 3
±5V ±5V 0
±3.5V ±3.5V 1
±2.5V ±2.5V 2

Each analog input channel features an antialiasing, low-pass filter (LPF) at the output of the PGA. Table 6-2
lists the various programmable LPF options available in the ADS9813 corresponding to the analog input range.
Figure 5-12 and Figure 5-13 illustrate the frequency responses for low-bandwidth and wide-bandwidth LPF
configurations. Select the analog input bandwidth for the eight analog input channels with the ANA_BW[7:0] bits
in address 0xC0 of register bank 1.
Table 6-2. Low-Pass Filter Corner Frequency
LPF ANALOG INPUT RANGE CORNER FREQUENCY (–3dB)
Low-bandwidth All input ranges 22.7kHz
±12V 664kHz
±10V 691kHz
±7V 700kHz
Wide-bandwidth
±5V 500kHz
±3.5V 325kHz
±2.5V 221kHz

6.3.1.3 Wide-Common-Mode Voltage Rejection Circuit


The ADS9813 features a common-mode (CM) rejection circuit at the analog inputs that supports CM voltages
up to ±12V. The CM voltage for differential inputs is given by Equation 1. On power-up or after reset, the
common-mode voltage range for the analog input channels is ±12V (CM_CTRL_EN = 0b). In all cases, make
sure the voltage at the analog inputs is within the Absolute Maximum Ratings.

Voltage on AINP + Voltage on AINM


Common mode voltage = 2 (1)

As described in Table 6-3, optimize the CM voltage rejection circuit for various CM voltages for differential inputs.
Table 6-3. Wide Common-Mode Configuration for Differential Inputs
COMMON-MODE ANALOG INPUT CHANNELS 1–4 ANALOG INPUT CHANNELS 5–8
CM_CTRL_EN
(CM) RANGE CM_EN_CH[4:1] CM_RNG_CH[4:1] CM_EN_CH[8:5] CM_RNG_CH[8:5]
CM ≤ ±1V 0 Don't care 0 Don't care
CM ≤ ±RANGE / 2 0 0
1
CM ≤ ±6V 1 1 1 1
CM ≤ ±12V 2 2

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The CM voltage rejection circuit is configured depending on the analog input range of the PGA when using
single-ended inputs. Table 6-4 lists the recommended configuration for single-ended inputs for various analog
input voltage ranges.
Table 6-4. Wide Common-Mode Configuration for Single-Ended Inputs
PGA ANALOG ANALOG INPUT CHANNELS 1–4 ANALOG INPUT CHANNELS 5–8
CM_CTRL_EN
INPUT RANGE CM_EN_CH[4:1] CM_RNG_CH[4:1] CM_EN_CH[8:5] CM_RNG_CH[8:5]
±2.5V, ±3.5V, and
0 Don't care 0 Don't care
±5V 1
±7V, ±10V, and ±12V 1 0 1 0

Typical SNR for analog input ranges vs input common-mode ranges are shown in Table 6-5 for low-bandwidth
mode and Table 6-6 for wide-bandwidth mode.
Table 6-5. Typical SNR (dBFS) for Analog Input Range vs Common-Mode Range in Low-Bandwidth Mode
RANGE CM ≤ ±1V CM ≤ ±RANGE / 2 CM ≤ ±6V CM ≤ ±12V
±2.5V 88.3 87.4 85.2 83.4
±3.5V 88.3 88.4 87.0 85.4
±5V 90.1 89.1 88.4 87.2
±7V – 89.8 89.4 88.5
±10V – 90.2 90.2 89.5
±12V – 90.3 90.3 89.9

Table 6-6. Typical SNR (dBFS) for Analog Input Range vs Common-Mode Range in Wide-Bandwidth
Mode
RANGE CM ≤ ±1V CM ≤ ±RANGE / 2 CM ≤ ±6V CM ≤ ±12V
±2.5V 80.5 79.1 76.7 74.7
±3.5V 81.1 79.4 77.6 75.8
±5V 81.6 79.7 78.4 76.7
±7V – 80.0 79.2 77.5
±10V – 81.6 81.2 79.7
±12V – 82.4 82.4 80.9

6.3.2 ADC Transfer Function


The ADS9813 outputs 18 bits of conversion data in either straight-binary or binary two's-complement formats.
The format for the output codes is the same across all analog channels. Select the format for the output
codes with the DATA_FORMAT register bits. Figure 6-3 and Table 6-7 show the transfer characteristics for the
ADS9813. The LSB size depends on the analog input range selected.

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Straight Twos
Binary Complement

0x3FFFF 0x1FFFF

0x3FFFE 0x1FFFE
ADC OUTPUT CODE

0x20001 0x00001

0x20000 0x00000

0x1FFFF 0x3FFFF

0x00002 0x20002

0x00001 0x20001

0x00000 0x20000

–FS+(0.5)LSB 0V–(0.5)LSB +FS–(1.5)LSB


ANALOG INPUT

Figure 6-3. Transfer Characteristics

Table 6-7. ADC Full-Scale Range and LSB Size


RANGE +FS MIDSCALE –FS LSB
±2.5V 2.5V 0V –2.5V 19.07µV
±3.5V 3.5V 0V –3.5V 26.70µV
±5V 5V 0V –5V 38.15µV
±7V 7V 0V –7V 53.41µV
±10V 10V 0V –10V 76.29µV
±12V 12V 0V –12V 91.55µV

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6.3.3 ADC Sampling Clock Input


Operate the ADS9813 with a differential or a single-ended clock input where the single-ended clock consumes
less power consumption. Make sure the sampling clock is a free-running continuous clock. After a free-
running sampling clock is applied, the ADC generates valid output data, the data clock, and the frame clock
tPU_SMPL_CLK. These parameters are specified in the Switching Characteristics section. The ADC output data,
data clock, and frame clock are invalid when the sampling clock is stopped.
Figure 6-4 and Figure 6-5 show that the sampling clock is either differential or single-ended, respectively.

SMPL_CLKP

5.4 k
Differential +

100
sampling clock  Bias

5.4 k
SMPL_CLKM

Figure 6-4. AC-Coupled Differential Sampling Clock


IOVDD

SMPL_CLKP
0V

SMPL_CLKM

GND

Figure 6-5. Single-Ended Sampling Clock

6.3.4 Synchronizing Multiple ADCs


Use the SMPL_SYNC signal to simultaneously sample all analog input channels of multiple ADS9813 devices.
All ADS9813 devices share the same SMPL_CLK and SMPL_SYNC signals with identical delays external to
the ADC. A positive pulse on the SMPL_SYNC pin centered around the falling edge of the SMPL_CLK signal
synchronizes all ADCs; see Figure 5-2. The synchronization signal is only required one time after power-up
with the sampling clock free-running, or after restarting sampling clock, or after a device reset. As illustrated
in Figure 5-2, Figure 5-3, Figure 5-4, and Figure 5-5, the SYNC signal resets the internal analog channel
selection logic and aligns the FCLKOUT signal to the data frame. If no SYNC signal is given, the internal analog
channel selection logic and FCLKOUT are not synchronized, which can lead to a different alignment between the
sequence of channel output data and FCLKOUT. When using multiple ADCs with the same sampling clock, the
SYNC signal makes sure all ADCs sample the same respective analog input channel at the same time.

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6.3.5 Reference Voltage


The ADS9813 has a precision, low-drift voltage reference internal to the device. For best performance, the
internal reference noise is filtered (as shown in Figure 6-6) by connecting a 10µF ceramic bypass capacitor to
the REFIO pin. As shown in Figure 6-7, an external reference is also connected at the REFIO pin. When using
an external reference, disable the internal reference voltage by either of the following two options:
• Configure the SPI (SPI_EN pin = logic 1). Write PD_REF = 1b in address 0xC1 of register bank 1.
• Use the SDI/EXTREF pin (SPI_EN pin = logic 0). Set the SDI/EXTREF pin to logic 0 using a pulldown
resistor.
AVDD_5V

REFIO
ADC REF
External capacitor
10 μF for reference
1 k REFM noise reduction

PD_REF = 0
GND
User register bit
4.096 V GND

Figure 6-6. Internal Reference Voltage


5V

VIN EN
OUTF
AVDD_5V
REF7040

OUTS

GND
REFIO
ADC REF

10 μF
1 k
REFM

PD_REF = 1
GND
User register bit
4.096 V GND

Figure 6-7. External Reference Voltage

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6.3.6 Data Interface


The ADS9813 supports 2-lane and 4-lane mode with single-data-rate (SDR) and double-data-rate (DDR)
interface modes. The data interface can be selected using the configuration SPI as described in Table 6-8.
The ADC generates the data (D[3:0]), data clock (DCLKOUT), and frame clock (FCLKOUT) in response to the
sampling clock signal on the SMPL_CLK input pin. The 18-bit ADC conversion result is output MSB first in a
24-bit data packet and the last six bits are zeroes.
The data interface signals can be described as:
• D[3:0]: Data output from the ADC. In 4-lane mode all four lanes are used, whereas in 2-lane mode D3 and D1
are used to output ADC data.
• DCLKOUT: Data clock output from the ADC.
• FCLKOUT: Frame clock output from the ADC delimiting each set of 8-channel data. A SYNC pulse is required
on power-up or after device reset to align the rising edge of FCLKOUT with channel 1 data output, as
described in the Synchronizing Multiple ADCs section.
Use the registers in Table 6-8 to configure the data interface.
Table 6-8. Register Configurations For Interface Modes
DATA_RATE DATA_LANES
INTERFACE MODE FIGURE
(Address = 0xC1) (Address = 0xC1)
4-lane, DDR Figure 5-2 0 0
2-lane, DDR Figure 5-3 0 1
4-lane, SDR Figure 5-4 1 0
2-lane, SDR Figure 5-5 1 1

6.3.6.1 Data Clock Output


The ADS9813 features a source-synchronous data interface where the ADC provides the output data and the
clock to capture the data. The clock to capture the data is output on the DCLKOUT pin. The clock frequency
depends on the sampling clock speed, data rate (SDR or DDR), and number of output lanes (four lanes or two
lanes) and is given by Equation 2. The frame clock frequency is given by Equation 3.

24 bits/channel × 8 channels
Data clock frequency = × Frame clock frequency (2)
Number of data lanes × Data rate SDR = 1, DDR = 2

Sampling clock frequency


Frame clock frequency = 4 (3)

Table 6-9 shows the data clock frequency for the maximum sampling rates for the ADS9817 and ADS9815 for
various interface modes.
Table 6-9. Data Clock Frequency for Interface Modes
ADS9815 ADS9817
INTERFACE MODE
(fSMPL_CLK = 4MHz) (fSMPL_CLK = 8MHz)
4-lane, DDR 24MHz 48MHz
2-lane, DDR 48MHz 96MHz
4-lane, SDR 48MHz 96MHz
2-lane, SDR 96MHz Not supported

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6.3.6.2 ADC Output Data Randomizer


The ADS9813 features a data output randomizer. When enabled, the ADC conversion result is bit-wise
exclusive-ORed (XOR) with either the LSB of the conversion result (Figure 6-9) or XOR_PRBS bit that can
be appended to the ADC data output (Figure 6-8). The LSB of the ADC conversion result and XOR_PRBS have
equal probability of being either 1 or 0. As a result of the XOR operation, the data output from the ADS9813 is
randomized. The ground bounce created by the transmission of this randomized result over the data interface is
uncorrelated with the analog input voltage. This uncorrelated transmission helps minimize interference between
data transmission and analog performance of the ADC when the PCB layout does not minimize ground bounce.

ADC Conversion Bit-wise Randomized ADC Conversion Bit-wise Randomized


Result XOR Result Result XOR Result

MSB MSB MSB MSB

MSB - 1 MSB - 1 MSB - 1 MSB - 1

MSB - 2 MSB - 2 MSB - 2 MSB - 2

LSB + 1 LSB + 1 LSB + 1 LSB + 1

LSB LSB LSB LSB

PRBS bit PRBS bit LSB of conversion result is used for XOR operation
Register XOR_PRBS = 1b
PRBS bit is appended after LSB of conversion result
Register XOR_PRBS = 0b
Figure 6-9. Bit-Wise XOR Operation with ADC LSB
Figure 6-8. Bit-Wise XOR Operation with PRBS Bit

6.3.6.3 Data Averaging


The ADS9813 features two modes of data averaging to improve SNR - simple average and moving average.
Simple averaging reduces the output data rate by a factor of 2 whereas moving average does not affect the
output data rate. Table 6-10 and Table 6-11 show the register operations to enable and disable the simple
average and moving average respectively.
Table 6-10. Register Operations for Simple Average
STEP # REGISTER FIELD ENABLE SIMPLE AVERAGE DISABLE SIMPLE AVERAGE
1 REG_BANK_SEL 2 2
2 EN_AVG 1 0
3 AVG_CFG3 1 0
4 AVG_CFG2 3 0
5 AVG_CFG1 1 0
6 AVG_CFG4 3 0

Table 6-11. Register Operations for Moving Average


STEP # REGISTER FIELD ENABLE SIMPLE AVERAGE DISABLE SIMPLE AVERAGE
1 REG_BANK_SEL 2 2
2 EN_AVG 1 0
3 EN_MVG_AVG 1 0

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6.3.6.4 Test Patterns for Data Interface


The ADS9813 features test patterns used by the host for debugging and verifying the data interface. The test
patterns replace the ADC output data with predefined digital data. Enable the test patterns by configuring the
corresponding register addresses 0x13 through 0x1B in bank 1.
Table 6-12 lists the test patterns supported by the ADS9813.
Register Bit 15 Bit 8 Bit 7 Bit 0
Address

0x13 CH[4:1] Test Pattern Control Register


Test Patterns for
0x14 TP0_A LSB CH[4:1]
Fixed Pattern {TP0}
0x15 TP1_A LSB MSB TP0_A Digital ramp
Alternating {TP0, TP1}
0x16 MSB TP1_A

0x18 CH[8:5] Test Pattern Control Register


Test Patterns for
0x19 TP0_B LSB CH[8:5]
Fixed Pattern {TP0}
0x1A TP1_B LSB MSB TP0_B Digital ramp
Alternating {TP0, TP1}
0x1B MSB TP1_B

Figure 6-10. Register Bank for Test Patterns

Table 6-12. Test Pattern Configurations


ADC OUTPUT TP_EN_CH[4:1] TP_MODE_CH[4:1] SECTION RESULT1
TP_EN_CH[8:5] TP_MODE_CH[8:5]
ADC conversion result 0
Fixed pattern 1 0 or 1 Fixed Pattern CH[4:1] = TP0_A
CH[8:5] = TP0_B
Digital ramp 1 2 Digital Ramp CH[4:1] = Digital ramp
CH[8:5] = Digital ramp
Alternating test patterns 1 3 Alternating Test Pattern CH[4:1] = TP0_A, TP1_A
CH[8:5] = TP0_B, TP1_B

Note
1. Configure the test patterns for two separate channel groups CH[4:1] and CH[8:5].

6.3.6.4.1 Fixed Pattern


The ADC outputs fixed patterns defined in the TP0_A and TP0_B registers in place of the CH[4:1] and CH[8:5]
data, respectively.
• Configure the test patterns in TP0_A and TP0_B
• Set TP_EN_CH[4:1] = 1, TP_MODE_CH[4:1] = 0 (address = 0x13), TP_EN_CH[8:5] = 1, and
TP_MODE_CH[8:5] = 0 (address = 0x18)
6.3.6.4.2 Digital Ramp
The ADC outputs digital ramp values with increments specified in the RAMP_INC_A and RAMP_INC_B registers
in place of the CH[4:1] and CH[8:5] data, respectively.
• Configure the increment value between two successive steps of the digital ramp in the RAMP_INC_A
(address = 0x13) and RAMP_INC_B (address = 0x18) registers, respectively. The digital ramp increments by
N + 1, where N is the value configured in these registers.
• Set TP_EN_CH[4:1] = 1, TP_MODE_CH[4:1] = 2 (address = 0x13), TP_EN_CH[8:5] = 1, and
TP_MODE_CH[8:5] = 2 (address = 0x18)

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6.3.6.4.3 Alternating Test Pattern


The ADC outputs alternating test patterns defined in the TP0_A, TP1_A and TP0_B, TP1_B registers in place of
the CH[4:1] and CH[8:5] data, respectively.
• Configure the test patterns in TP0_A, TP1_A, TP0_B, and TP1_B
• Set TP_EN_CH[4:1] = 1, TP_MODE_CH[4:1] = 3 (address = 0x13), TP_EN_CH[8:5] = 1, and
TP_MODE_CH[8:5] = 3 (address = 0x18)

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6.4 Device Functional Modes


6.4.1 Reset
Power down the ADS9813 with a logic 0 on the RESET pin or write 1b to the RESET field of address 0x00 in
register bank 0. The device registers are initialized to the default values after reset and the device is initialized
with a sequence of register write operations. See the Initialization Sequence section for further information.
6.4.2 Power-Down
Power down the ADS9813 with a logic 0 on the PWDN pin or write 11b to the PD_CH field in address 0xC0
in register bank 1. The device registers are initialized to the default values after power-up and the device
is initialized with a sequence of register write operations. See the Initialization Sequence section for further
information.
6.4.3 Initialization Sequence
As shown in Table 6-13, initialize the ADS9813 with a sequence of register writes after device power-up or reset.
Connect a free-running sampling clock to the ADC before executing the initialization sequence. The ADS9813
registers are initialized with the default value after the initialization sequence is complete.
Table 6-13. ADS9813 Initialization Sequence
REGISTER
STEP COMMENT
BANK ADDRESS VALUE[15:0]
1 0 0x04 0x000B INIT_1 configured
2 0 0x03 0x0010 Select register bank 2
3 2 0x92 0x0002 INIT_2 configured
3 2 0xC5 0x0604 Initialize PGA and conifgure INIT_3

As shown in Table 6-14, change the default settings of the ADS9813 for the user-defined configuration. Changes
to the analog inputs changes the analog input range, bandwidth, and common-mode voltage range. Changes to
the data interface change the number of output lanes (either single or double data rate).
Table 6-14. ADS9813 User-Configuration
REGISTER
STEP COMMENT
BANK ADDRESS VALUE[15:0]
Configure data interface and select internal
1 1 0xC1 User defined
or external reference
2 1 0xC2 and 0xC3 User defined Select analog input ranges, see Table 6-1
3 1 0xC0 User defined Select analog input bandwidth, see Table 6-2
Select common-mode range for analog
4 1 0xC4 and 0xC5 User defined
inputs, see Table 6-3 and Table 6-4

6.4.4 Normal Operation


After the ADS9813 is initialized (see the Initialization Sequence section), the ADS9813 converts analog input
voltages to digital output voltages. A free-running sampling clock is required for normal device operation; see the
ADC Sampling Clock Input section.

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6.4.5 Speed-Boost Mode


ADS9813 supports a speed-boost mode that allows up to 8MSPS sampling rate for a user-selected analog input
channel pair. In the speed-boost mode, only the user-selected channel pair is converted while the remaining 6
analog input channels are idle. The sampling rate is equal to the sampling clock frequency. The user can select
any pair combination of analog inputs from the list below:
• CH1 and CH8
• CH2 and CH7
• CH3 and CH6
• CH4 and CH5
The data output interface specifications remain the same as normal mode of operation. CH[4:1] and CH[8:5]
output data is replaced, respectively, by data corresponding to the channel pair selected.
Table 6-15 shows the register operations to enable or disable the speed-boost mode.
Table 6-15. Register operations for Speed-Boost Mode
STEP # REGISTER FIELD ENABLE SPEED-BOOST DISABLE SPEED-BOOST

1 REG_BANK_SEL 2 2

2 BOOST_CFG1 3 0

3 BOOST_CFG2 1 0

4 EN_BOOST 1 0

5 SEL_CH_BOOST • 0 for CH1 and CH8 0


• 1 for CH2 and CH7
• 2 for CH3 and CH6
• 3 for CH4 and CH5

6 REG_BANK_SEL 16 16

7 BOOST_CFG3 1 0

8 BOOST_CFG4 1 0

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6.5 Programming
6.5.1 Register Write
Register write access is enabled by setting SPI_RD_EN = 0b. The 16-bit configuration registers are grouped in
three register banks and are addressable with an 8-bit register address. Select register bank 1 and register bank
2 for read or write operation by configuring the REG_BANK_SEL bits. Registers in bank 0 are always accessible,
irrespective of the REG_BANK_SEL bits. These register addresses are unique and are therefore not used in
register banks 1 and 2.
As shown in Figure 6-11, steps to write to a register are:
1. Frame 1: Write to register address 0x03 in register bank 0 to select either register bank 1 or bank 2 for a
subsequent register write. This frame has no effect when writing to registers in bank 0.
2. Frame 2: Write to the register in the bank selected in frame 1. Repeat this step for writing to multiple
registers in the same register bank.

Frame 1 Frame 2
CS

24-bits

SCLK

{ addr[23:16] = 0x03, data[15:0] = 0x0002 or


SDI { addr[23:16] = REG_ADDR, data[15:0] = DATA }
0x0010 }

Register Write for Bank Selection (ADDR = 0x03)


Register Write
Not Required for Register Bank 0

Logic 0 (when SPI_MODE = 0b) and Hi-Z (when SPI_MODE = 1b)


SDO

Figure 6-11. Register Write

6.5.2 Register Read


Select the desired register bank by writing to register address 0x03 in register bank 0. Register read access is
enabled by setting SPI_RD_EN = 1b and SPI_MODE = 1b in register bank 0. As illustrated in Figure 6-12, read
registers by using two 24-bit SPI frames after the SPI_RD_EN and SPI_MODE bits are set. The first SPI frame
selects the register bank. The ADC returns the 16-bit register value in the second SPI frame corresponding to
the 8-bit register address.
As illustrated in Figure 6-12, the steps to read a register are:
1. Frame 1: With SPI_RD_EN = 0b, write to register address 0x03 in register bank 0 to select the desired
register bank 0 for reading.
2. Frame 2: Set SPI_RD_EN = 1b and SPI_MODE = 1b in register address 0x00 in register bank 0.
3. Frame 3: Read any register in the selected bank using a 24-bit SPI frame containing the desired register
address. Repeat this step with the address of any register in the selected bank to read the corresponding
register.
4. Frame 4: Set SPI_RD_EN = 0 to disable register read and re-enable register writes.
5. Repeat steps 1 through 4 to read registers in a different bank.

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Frame 1 Frame 2 Frame 3 Frame 4


CS

24-bits

SCLK

{ addr[23:16] = 0x03, data[15:0] = 0x0002 or


SDI { addr[23:16] = 0x00, data[15:0] = 0x0006 } { addr[23:16] = REG_ADDR, data[15:0] = 0 } { addr[23:16] = 0x00, data[15:0] = 0x0004 }
0x0010 }

Register Write for Bank Selection (ADDR = 0x03)


Register Write for Read Enable (ADDR = 0x00) Register Read: 8-bit address of register to be read Register Write for Read Disable (ADDR = 0x00)
Not Required for Register Bank 0

Hi-Z (when SPI_MODE = 1b)


SDO Logic 0 (when SPI_MODE = 0b) 16-bit Register Data

Figure 6-12. Register Read

6.5.3 Multiple Devices in a Daisy-Chain Topology for SPI Configuration


Figure 6-13 shows a typical connection diagram with multiple devices in a daisy-chain topology.

SCLK

CS

SCLK CS SCLK CS SCLK CS SCLK CS


ADS98XX ADS98XX ADS98XX ADS98XX
HOST
ADC4 ADC3 ADC2 ADC1
SDO SDI SDO SDI SDO SDI SDO SDI

24-bit 24-bit 24-bit 24-bit PICO

POCI

Figure 6-13. Daisy-Chain Connections for Configuration SPI

The CS and SCLK inputs of all ADCs are connected together and controlled by a single CS and SCLK pin of
the controller, respectively. The SDI input pin of the first ADC in the chain (ADC1) is connected to the peripheral
IN controller OUT (PICO) pin of the controller. Then, the SDO output pin of ADC1 is connected to the SDI input
pin of ADC2, and so on. The SDO output pin of the last ADC in the chain (ADC4) is connected to the peripheral
OUT controller IN (POCI) pin of the controller. The data on the PICO pin passes through ADC1 with a 24-SCLK
delay, as long as CS is active.
Enable daisy-chain after power-up or after the device is reset. Set the daisy-chain length in the
DAISY_CHAIN_LEN register to enable daisy-chain mode. The daisy-chain length is the number of ADCs in
the chain excluding ADC1. In Figure 6-13, the DAISY_CHAIN_LEN is 3.

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6.5.3.1 Register Write With Daisy-Chain


Writing to registers in daisy-chain requires N × 24 SCLKs in one SPI frame. As depicted in Figure 6-13, a
register write operation in a daisy-chain containing four ADCs requires 96 SCLKs.
Daisy-chain mode is enabled on power-up or after device reset. Configure the DAISY_CHAIN_LEN field to
enable daisy-chain mode. Repeat the waveform shown in Figure 6-14 N times, where N is the number of ADCs
in daisy-chain. Figure 6-15 provides the SPI waveform, containing N SPI frames, for enabling daisy-chain mode
for N ADCs.

CS

N x 24 bits

SCLK

PICO DADCN DADC3 DADC2 DADC1

POCI Logic 0 (when SPI_MODE = 0b)

Figure 6-14. Register Write With Daisy-Chain


DADC1[23:0] = DADC2[23:0] = DADC3[23:0] = DADCN[23:0] = { 0000 0001, 0000 0000, N-1, 00}

Frame 1 Frame 2 Frame 3 Frame N


CS

N x 24 bits

SCLK

PICO DADCN DADC3 DADC2 DADC1 DADCN DADC3 DADC2 DADC1 DADCN DADC3 DADC2 DADC1 DADCN DADC3 DADC2 DADC1

DAISY_CHAIN_LEN = 3 {ADC1} DAISY_CHAIN_LEN = 3 {ADC1 and ADC2} DAISY_CHAIN_LEN = 3 {ADC1, ADC2 and ADC3} DAISY_CHAIN_LEN = 3
DAISY_CHAIN_LEN = 0 {ADC2, ADC3, and ADCN} DAISY_CHAIN_LEN= 0 {ADC3, ADCN} DAISY_CHAIN_LEN = 0 {ADCN} {ADC1, ADC2, ADC3 and ADCN}

POCI Logic 0 (when SPI_MODE = 0b)

Figure 6-15. Register Write to Configure the Daisy-Chain Length

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6.5.3.2 Register Read With Daisy-Chain


Figure 6-16 depicts an SPI waveform for reading registers in daisy-chain. Steps for reading registers from N
ADCs connected in daisy-chain are:
1. A register read is enabled by writing to the following registers using the register write with daisy-chain
operation:
a. Write to REG_BANK_SEL to select the desired register bank
b. Enable register reads by writing SPI_RD_EN = 0b (default on power-up)
2. With the register bank selected and SPI_RD_EN = 0b, the controller reads register data in the following two
steps:
a. The N × 24-bit SPI frame containing the 8-bit register address is read: N-times {0xFE, 0x00, 8-bit
register address}
b. The N × 24-bit SPI frame to read out register data is read: N-times {0xFF, 0xFF, 0xFF}
The 0xFE in step 2a configures the ADC for register reads from the specified 8-bit address. At the end of step
2a, the output shift register in the ADC is loaded with register data. The ADC returns the 8-bit register address
and corresponding 16-bit register data in step 2b.

CS

N x 24 bits N x 24 bits

SCLK

24 bits 24 bits

8-bit register
PICO 0xFE 0x00 0xFE 0xFF 0xFF 0xFF 0xFF
address

8-bit 8-bit
POCI 16-bit register data
address address

Figure 6-16. Register Read With Daisy-Chain

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7 Register Map
7.1 Register Bank 0
Figure 7-1. Register Bank 0 Map
ADD D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
RESERVED SPI_MO SPI_RD RESET
00h DE _EN
01h RESERVED DAISY_CHAIN_LEN RESERVED
03h RESERVED REG_BANK_SEL
04h RESERVED INIT_1
06h REG_00H_READBACK

Table 7-1. Register Section/Block Access Type Codes


Access Type Code Description
R R Read
W W Write
R/W R/W Read or write
Reset or Default Value
-n Value after reset or the default value

7.1.1 Register 00h (offset = 0h) [reset = 0h]

Figure 7-2. Register 00h


15 14 13 12 11 10 9 8
RESERVED
W-0h

7 6 5 4 3 2 1 0
RESERVED SPI_MODE SPI_RD_EN RESET
W-0h W-0h W-0h W-0h

Figure 7-3. Register 00h Field Descriptions


Bit Field Type Reset Description
15-3 RESERVED W 0h Reserved. Do not change from the default reset value.
Select between legacy SPI mode and daisy-chain SPI
mode for the configuration interface for register access.
2 SPI_MODE W 0h
0 : Daisy-chain SPI mode
1 : Legacy SPI mode
Enable register read access in legacy SPI mode. This bit
has no effect in daisy-chain SPI mode.
1 SPI_RD_EN W 0h
0 : Register read disabled
1 : Register read enabled
ADC reset control.
0 RESET W 0h 0 : Normal device operation
1 : Reset ADC and all registers

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7.1.2 Register 01h (offset = 1h) [reset = 0h]

Figure 7-4. Register 01h


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
RESERVED DAISY_CHAIN_LEN RESERVED
R/W-0h R/W-0h R/W-0h

Figure 7-5. Register 01h Field Descriptions


Bit Field Type Reset Description
15-7 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Number of ADCs connected in SPI daisy-chain
DAISY_CHAIN_L 0 : 1 ADC
6-2 R/W 0h
EN 1 : 2 ADCs
31 : 32 ADCs
1-0 RESERVED R/W 0h Reserved. Do not change from the default reset value.

7.1.3 Register 03h (offset = 3h) [reset = 2h]

Figure 7-6. Register 03h


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
REG_BANK_SEL
R/W-2h

Figure 7-7. Register 03h Field Descriptions


Bit Field Type Reset Description
15-8 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Register bank selection for read and write operations.
0 : Select register bank 0
7-0 REG_BANK_SEL R/W 2h
2 : Select register bank 1
16 : Select register bank 2

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7.1.4 Register 04h (offset = 4h) [reset = 0h]

Figure 7-8. Register 04h


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
RESERVED INIT_1
R/W-0h R/W-0h

Figure 7-9. Register 04h Field Descriptions


Bit Field Type Reset Description
15-4 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Set to 0011b for normal operation. Refer to section on
3-0 INIT_1 R/W 0h
Initialization Sequence for more details.

7.1.5 Register 06h (offset = 6h) [reset = 2h]

Figure 7-10. Register 06h


15 14 13 12 11 10 9 8
REG_00H_READBACK
R-0h

7 6 5 4 3 2 1 0
REG_00H_READBACK
R-5h

Figure 7-11. Register 06h Field Descriptions


Bit Field Type Reset Description
REG_00H_READ This register is a copy of the register address 0x00 for
15-0 R 2h
BACK readback.

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7.2 Register Bank 1


Figure 7-12. Register Bank 1 Map
ADD D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
DATA_ EN_MV
RESERVED RESERVED EN_AVG RESERVED
0Dh FORMAT G_AVG
XOR_
RESERVED XOR_EN RESERVED
12h PRBS
TP_EN_ RESERV
RESERVED RAMP_INC_A TP_MODE_A
13h A ED
14h TP0_A
15h TP1_A TP0_A
16h TP1_A
TP_EN_ RESERV
RESERVED RAMP_INC_B TP_MODE_B
18h B ED
19h TP0_B
1Ah TP1_B TP0_B
1Bh TP1_B
1Ch RESERVED USER_BITS_CH[8:5] RESERVED USER_BITS_CH[4:1]
EN_
RESERVED BOOST_CH_SEL
37h BOOST
AVG_
RESERVED RESERVED
3Ch CFG3
RESERV
RESERVED INIT_2
92h ED
C0h RESERVED ANA_BW PD_CH
RESERV DATA_ DATA_
RESERVED PD_REF RESERVED
C1h ED LANES RATE
C2h RANGE_CH4 RANGE_CH3 RANGE_CH2 RANGE_CH1
C3h RANGE_CH8 RANGE_CH7 RANGE_CH6 RANGE_CH5
CM_EN_ CM_EN_ AVG_ PD_
RESERVED CM_RNG_CH[8:5] CM_RNG_CH[4:1] AVG_CFG2
C4h CH[8:5] CH[4:1] CFG1 CHIP
PGA_ CM_CT BOOST_ PGA_
BOOST_CFG1 RESERVED INIT_3 RESERVED AVG_CFG4 RESERVED
C5h IN1T2 RL_EN CFG2 IN1T1

Table 7-2. Register Section/Block Access Type Codes


Access Type Code Description
R R Read
W W Write
R/W R/W Read or write
Reset or Default Value
-n Value after reset or the default value

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7.2.1 Register 0Dh (offset = Dh) [reset = 2002h]

Figure 7-13. Register 0Dh


15 14 13 12 11 10 9 8
RESERVED DATA_FORMAT RESERVED
R/W-0h R/W-1h R/W-0h

7 6 5 4 3 2 1 0
RESERVED EN_AVG RESERVED EN_MVG_AVG
R/W-0h R/W-0h R/W-1h R/W-0h

Figure 7-14. Register 0Dh Field Descriptions


Bit Field Type Reset Description
15-14 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Select data format for the ADC conversion result.
13 DATA_FORMAT R/W 1h 0 : Straight binary format
1 : Two's-complement format
12-7 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Set 1b to enable data averaging. See Table 6-10 and Table
6 EN_AVG R/W 0h
6-11 for more details.
5-1 RESERVED R/W 1h Reserved. Do not change from the default reset value.
Set 1b to enable moving data average. See Table 6-11 for
0 EN_MVG_AVG R/W 0h
more details.

Register 12h (offset = 12h) [reset = 2h]

Figure 7-15. Register 12h


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
RESERVED XOR_PRBS XOR_EN RESERVED
R/W-0h R/W-0h R/W-0h R/W-2h

Figure 7-16. Register 12h Field Descriptions


Bit Field Type Reset Description
15-5 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Select bit for XOR operation when XOR_EN = 1b.
0 : PRBS is appended after the LSB of the ADC conversion
result. The ADC conversion result is bit-wise XOR with the
4 XOR_PRBS R/W 0h
PRBS bit.
1 : The ADC conversion result is bit-wise XOR with the LSB
of the ADC conversion result.
Enables XOR operation on the ADC conversion result.
0 : XOR operation is disabled
3 XOR_EN R/W 0h
1 : Bit-wise XOR operation on ADC conversion result is
enabled
2-0 RESERVED R/W 2h Reserved. Do not change from the default reset value.

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7.2.2 Register 13h (offset = 13h) [reset = 0h]

Figure 7-17. Register 13h


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
RAMP_INC_A TP_MODE_A TP_EN_A RESERVED
R/W-0h R/W-0h R/W-0h R/W-0h

Figure 7-18. Register 13h Field Descriptions


Bit Field Type Reset Description
15-8 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Increment value for the ramp pattern output. The output
7-4 RAMP_INC_A R/W 0h ramp increments by N+1, where N is the value configured
in this register.
Select digital test pattern for analog input channels 1, 2, 3,
and 4.
0 : Fixed pattern from the TP0_A register
3-2 TP_MODE_A R/W 0h 1 : Fixed pattern from the TP0_A register
2 : Digital ramp output
3 : Alternate fixed pattern output from the TP0_A and
TP1_A registers
Enable digital test pattern for data corresponding to
channels 1, 2, 3, and 4.
1 TP_EN_A R/W 0h 0 : Data output is the ADC conversion result
1 : Data output is the digital test pattern for channels 1, 2, 3,
and 4
0 RESERVED R/W 0h Reserved. Do not change from the default reset value.

7.2.3 Register 14h (offset = 14h) [reset = 0h]

Figure 7-19. Register 14h


15 14 13 12 11 10 9 8
TP0_A[15:0]
R/W-0h

7 6 5 4 3 2 1 0
TP0_A[15:0]
R/W-0h

Figure 7-20. Register 14h Field Descriptions


Bit Field Type Reset Description
15-0 TP0_A[15:0] R/W 0h Lower 16 bits of test pattern 0

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7.2.4 Register 15h (offset = 15h) [reset = 0h]

Figure 7-21. Register 15h


15 14 13 12 11 10 9 8
TP1_A[7:0]
R/W-0h

7 6 5 4 3 2 1 0
TP0_A[23:16]
R/W-0h

Figure 7-22. Register 15h Field Descriptions


Bit Field Type Reset Description
15-8 TP1_A[7:0] R/W 0h Lower eight bits of test pattern 1
7-0 TP0_A[23:16] R/W 0h Upper eight bits of test pattern 0

7.2.5 Register 16h (offset = 16h) [reset = 0h]

Figure 7-23. Register 16h


15 14 13 12 11 10 9 8
TP1_A[23:8]
R/W-0h

7 6 5 4 3 2 1 0
TP1_A[23:8]
R/W-0h

Figure 7-24. Register 16h Field Descriptions


Bit Field Type Reset Description
15-0 TP1_A[23:8] R/W 0h Upper 16 bits of test pattern 1

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7.2.6 Register 18h (offset = 18h) [reset = 0h]

Figure 7-25. Register 18h


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
RAMP_INC_B TP_MODE_B TP_EN_B RESERVED
R/W-0h R/W-0h R/W-0h R/W-0h

Figure 7-26. Register 18h Field Descriptions


Bit Field Type Reset Description
15-8 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Increment value for the ramp pattern output. The output
7-4 RAMP_INC_B R/W 0h ramp increments by N+1, where N is the value configured
in this register.
Select digital test pattern for analog input channels 5, 6, 7,
and 8.
0 : Fixed pattern from the TP0_B register
3-2 TP_MODE_B R/W 0h 1 : Fixed pattern from the TP0_B register
2 : Digital ramp output
3 : Alternate fixed pattern output from the TP0_B and
TP1_B registers
Enable digital test pattern for data corresponding to
channels 5, 6, 7, and 8.
1 TP_EN_B R/W 0h
0 : Data output is the ADC conversion result
1 : Data output is the digital test pattern
0 RESERVED R/W 0h Reserved. Do not change from the default reset value.

7.2.7 Register 19h (offset = 19h) [reset = 0h]

Figure 7-27. Register 19h


15 14 13 12 11 10 9 8
TP0_B[15:0]
R/W-0h

7 6 5 4 3 2 1 0
TP0_B[15:0]
R/W-0h

Figure 7-28. Register 19h Field Descriptions


Bit Field Type Reset Description
15-0 TP0_B[15:0] R/W 0h Lower 16 bits of test pattern 0

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7.2.8 Register 1Ah (offset = 1Ah) [reset = 0h]

Figure 7-29. Register 1Ah


15 14 13 12 11 10 9 8
TP1_B[7:0]
R/W-0h

7 6 5 4 3 2 1 0
TP0_B[23:16]
R/W-0h

Figure 7-30. Register 1Ah Field Descriptions


Bit Field Type Reset Description
15-8 TP1_B[7:0] R/W 0h Lower eight bits of test pattern 1
7-0 TP0_B[23:16] R/W 0h Upper eight bits of test pattern 0

7.2.9 Register 1Bh (offset = 1Bh) [reset = 0h]

Figure 7-31. Register 1Bh


15 14 13 12 11 10 9 8
TP1_B[23:8]
R/W-0h

7 6 5 4 3 2 1 0
TP1_B[23:8]
R/W-0h

Figure 7-32. Register 1Bh Field Descriptions


Bit Field Type Reset Description
15-0 TP1_B[23:8] R/W 0h Upper 16 bits of test pattern 1

Register 1Ch (offset = 1Ch) [reset = 0h]

Figure 7-33. Register 1Ch


15 14 13 12 11 10 9 8
RESERVED USER_BITS_CH[8:5]
R/W-0h R/W-0h

7 6 5 4 3 2 1 0
RESERVED USER_BITS_CH[4:1]
R/W-0h R/W-0h

Figure 7-34. Register 1Ch Field Descriptions


Bit Field Type Reset Description
15-14 RESERVED R/W 0h Reserved. Do not change from the default reset value.
USER_BITS_CH[ User-defined bits appended to the ADC conversion result
13-8 R/W 0h
8:5] from channels 5, 6, 7, and 8.
7-6 RESERVED R/W 0h Reserved. Do not change from the default reset value.
USER_BITS_CH[ User-defined bits appended to the ADC conversion result
5-0 R/W 0h
4:1] from channels 1, 2, 3, and 4.

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7.2.10 Register 37h (offset = 37h) [reset = 0h]

Figure 7-35. Register 37h


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
RESERVED BOOST_CH_SEL EN_BOOST
R/W-0h R/W-0h R/W-0h

Figure 7-36. Register 37h Field Descriptions


Bit Field Type Reset Description
15-3 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Select analog input channel pair for speed-boost mode.
0: CH1 and CH8
2-1 BOOST_CH_SEL R/W 0h 1: CH2 and CH7
2: CH3 and CH6
3: CH4 and CH5
Enable speed-boost mode. See section on Speed-Boost
0 EN_BOOST R/W 0h
Mode for more details.

7.2.11 Register 3Ch (offset = 3Ch) [reset = 0h]

Figure 7-37. Register 3Ch


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
AVG_CFG3 RESERVED
R/W-0h R/W-0h

Figure 7-38. Register 3Ch Field Descriptions


Bit Field Type Reset Description
15-8 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Configuration for simple averaging. See Table 6-10 for
7 AVG_CFG3 R/W 0h
more details.
6-0 RESERVED R/W 0h Reserved. Do not change from the default reset value.

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7.2.12 Register 92h (offset = 92h) [reset = 0h]

Figure 7-39. Register 92h


15 14 13 12 11 10 9 8
RESERVED
R/W-0h

7 6 5 4 3 2 1 0
RESERVED INIT_2 RESERVED
R/W-0h R/W-0h R/W-0h

Figure 7-40. Register 92h Field Descriptions


Bit Field Type Reset Description
15-2 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Set to 1b for normal operation. Refer to section on
1 INIT_2 R/W 0h
Initialization Sequence for more details.
0 RESERVED R/W 0h Reserved. Do not change from the default reset value.

7.2.13 Register C0h (offset = C0h) [reset = 0h]

Figure 7-41. Register C0h


15 14 13 12 11 10 9 8
RESERVED ANA_BW
R/W-0h R/W-0h

7 6 5 4 3 2 1 0
ANA_BW PD_CH
R/W-0h R/W-0h

Figure 7-42. Register C0h Field Descriptions


Bit Field Type Reset Description
15-10 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Select analog input bandwidth for the respective analog
input channels.
MSB = BW control for channel 8
9-2 ANA_BW R/W 0h
LSB = BW control for channel 1
0 : Low-noise mode
1 : Wide-bandwidth mode
Power-down control for the analog input channels.
0 : Normal operation
1-0 PD_CH R/W 0h 1 : Channels 5, 6, 7, and 8 powered down
2 : Channels 1, 2, 3, and 4 powered down
3 : All channels powered down

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7.2.14 Register C1h (offset = C1h) [reset = 0h]

Figure 7-43. Register C1h


15 14 13 12 11 10 9 8
RESERVED PD_REF RESERVED DATA_LANES DATA_RATE
R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h

7 6 5 4 3 2 1 0
RESERVED
R/W-0h

Figure 7-44. Register C1h Field Descriptions


Bit Field Type Reset Description
15-12 RESERVED R/W 0h Reserved. Do not change from the default reset value.
ADC reference voltage source selection.
0 : Internal reference enabled.
11 PD_REF R/W 0h
1 : Internal reference disabled. Connect the external
reference voltage to the REFIO pin.
10 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Select number of output data lanes per ADC channel.
0 : 4-lane mode. CH[4:1] data are output on pins D3 and
9 DATA_LANES R/W 0h D2. CH[8:5] data are output on pins D1 and D0.
1 : 2-lane mode. CH[4:1] data are output on pin D3. CH[8:5]
data are output on pin D1.
Select data rate for the data interface.
8 DATA_RATE R/W 0h 0 : Double data rate (DDR)
1 : Single data rate (SDR)
7-0 RESERVED R/W 0h Reserved. Do not change from the default reset value.

7.2.15 Register C2h (offset = C2h) [reset = 0h]

Figure 7-45. Register C2h


15 14 13 12 11 10 9 8
RANGE_CH4 RANGE_CH3
R/W-0h R/W-0h

7 6 5 4 3 2 1 0
RANGE_CH2 RANGE_CH1
R/W-0h R/W-0h

Figure 7-46. Register C2h Field Descriptions


Bit Field Type Reset Description
15-12 RANGE_CH4 R/W 0h Select the analog input voltage range.
0 : ±5V
11-8 RANGE_CH3 R/W 0h
1 : ±3.5V
7-4 RANGE_CH2 R/W 0h 2 : ±2.5V
3 : ±7V
3-0 RANGE_CH1 R/W 0h 4 : ±10V
5 : ±12V

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7.2.16 Register C3h (offset = C3h) [reset = 0h]

Figure 7-47. Register C3h


15 14 13 12 11 10 9 8
RANGE_CH8 RANGE_CH7
R/W-0h R/W-0h

7 6 5 4 3 2 1 0
RANGE_CH6 RANGE_CH5
R/W-0h R/W-0h

Figure 7-48. Register C3h Field Descriptions


Bit Field Type Reset Description
15-12 RANGE_CH8 R/W 0h Select the analog input voltage range.
0 : ±5V
11-8 RANGE_CH7 R/W 0h
1 : ±3.5V
7-4 RANGE_CH6 R/W 0h 2 : ±2.5V
3 : ±7V
3-0 RANGE_CH5 R/W 0h 4 : ±10V
5 : ±12V

Register C4h (offset = C4h) [reset = 0h]

Figure 7-49. Register C4h


15 14 13 12 11 10 9 8
RESERVED CM_RNG_CH[8:5]
R/W-0h R/W-0h

7 6 5 4 3 2 1 0
CM_EN_ CM_EN_
CM_RNG_CH[4:1] AVG_CFG2 AVG_CFG1 PD_CHIP
CH[8:5] CH[4:1]
R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h

Figure 7-50. Register C4h Field Descriptions


Bit Field Type Reset Description
15-10 RESERVED R/W 0h Reserved. Do not change from the default reset value.
9-8 CM_RNG_CH[8:5] R/W 0h CM_RNG_CH[4:1] sets the common-mode range for
channels 1, 2, 3, and 4.
CM_RNG_CH[8:5] sets the common-mode range for
channels 5, 6, 7, and 8.
7-6 CM_RNG_CH[4:1] R/W 0h 0 : CM range is equal to ±RANGE / 2
1 : CM range is equal to ±6V
2 : CM range is equal to ±12V
Configuration for simple averaging. See Table 6-10 for
5-4 AVG_CFG2 R/W 0h
more details.
3 CM_EN_CH[8:5] R/W 0h CM_EN_CH[4:1] enables wide common-mode range
control for channels 1 to 4.
CM_EN_CH[8:5] enables the wide common-mode range
2 CM_EN_CH[4:1] R/W 0h control for channels 5 to 8.
0 : Wide common-mode range control disabled
1 : Wide common-mode range control enabled
Configuration for simple averaging. See Table 6-10 for
1 AVG_CFG1 R/W 0h
more details.
Full chip power-down control.
0 PD_CHIP R/W 0h 0 : Normal device operation
1 : Full device powered-down

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7.2.17 Register C5h (offset = C5h) [reset = 0h]

Figure 7-51. Register C5h


15 14 13 12 11 10 9 8
BOOST_CFG1 RESERVED INIT_3 PGA_INIT2 RESERVED
R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h

7 6 5 4 3 2 1 0
RESERVED AVG_CFG4 CM_CTRL_EN BOOST_CFG2 PGA_INIT2 RESERVED
R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h

Figure 7-52. Register C5h Field Descriptions


Bit Field Type Reset Description
Configuration for speed-boost mode. See Table 6-15 for
15-14 BOOST_CFG1 R/W 0h
more details.
13-11 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Set to 1 for normal operation. Refer to Initialization
10 INIT_3 R/W 0h
Sequence for more details.
Conifguration for PGA initialization. Set to 1 for normal
9 PGA_INIT2 R/W 0h
operation. Refer to Initialization Sequence for more details.
8-7 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Configuration for simple averaging. See Table 6-10 for
6-5 AVG_CFG4 R/W 0h
more details.
Enable the wide common-mode range control for all analog
input channels.
0 : CM range for all analog input channels is ±12V
4 CM_CTRL_EN R/W 0h
1 : CM range is user-defined in the
CM_EN_CH[4:1], CM_EN_CH[8:5], CM_RNG_CH[4:1],
and CM_RNG_CH[8:5] registers
Configuration for speed-boost mode. See Table 6-15 for
3 BOOST_CFG2 R/W 0h
more details.
Conifguration for PGA initialization. Set to 1 for normal
2 PGA_INIT1 R/W 0h
operation. Refer to Initialization Sequence for more details.
1-0 RESERVED R/W 0h Reserved. Do not change from the default reset value.

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7.3 Register Bank 2


Figure 7-53. Register Bank 2 Map
ADD D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
BOOST_ RESERV BOOST_
RESERVED RESERVED
25h CFG4 ED CFG3

Table 7-3. Register Section/Block Access Type Codes


Access Type Code Description
R R Read
W W Write
R/W R/W Read or write
Reset or Default Value
-n Value after reset or the default value

7.3.1 Register 25h (offset = 25h) [reset = 0h]

Figure 7-54. Register 25h


15 14 13 12 11 10 9 8
RESERVED BOOST_CFG4 RESERVED BOOST_CFG3 RESERVED
R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h

7 6 5 4 3 2 1 0
RESERVED
R/W-0h

Figure 7-55. Register 25h Field Descriptions


Bit Field Type Reset Description
15-12 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Configuration for speed-boost mode. See Table 6-15 for
11 BOOST_CFG4 R/W 0h
more details.
10 RESERVED R/W 0h Reserved. Do not change from the default reset value.
Configuration for speed-boost mode. See Table 6-15 for
9 BOOST_CFG3 R/W 0h
more details.
8-0 RESERVED R/W 0h Reserved. Do not change from the default reset value.

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8 Application and Implementation


Note
Information in the following applications sections is not part of the TI component specification,
and TI does not warrant its accuracy or completeness. TI’s customers are responsible for
determining suitability of components for their purposes, as well as validating and testing their design
implementation to confirm system functionality.

8.1 Application Information


The ADS9813 enables high-precision measurement of up to eight analog signals. The following section gives
an example application circuit and recommendations for using the ADS9813 in automated test equipment (ATE)
systems.
8.2 Typical Application
8.2.1 Parametric Measurement Unit (PMU)
Parametric Measurement Unit (PMU)

Force voltage and current Device Under Test


(DUT)
Shunt resistor
DAC

Reference
PMU VREF
Ratiometric setup

MVI1 channel
Current
VREF

MUX1
Voltage
AIN1P
AIN1M
FPGA ADC
AIN2P
AIN2M
MVI2 channel

AIN3P MVI3 channel


AIN3M

AIN4P MVI4 channel


AIN4M

AIN5P MVI5 channel


AIN5M

AIN6P MVI6 channel


AIN6M

AIN7P MVI7 channel


AIN7M

AIN8P
MVI8 channel GND
GND AIN8M

GND

Figure 8-1. Typical PMU

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PMU1
From FPGA Force voltage and current
To DUT
PMU VREF

Reference
To PMU VREF
Ratiometric setup MVI1 channel
MVI2 channel
MVI3 channel
8:1 MVI4 channel
MUX MVI5 channel
MVI6 channel
MVI7 channel
VREF MVI8 channel

AIN1P
AIN1M
ADC
AIN2P PMU2 8:1 MUX
FPGA AIN2M

AIN3P PMU3 8:1 MUX


AIN3M

AIN4P PMU4 8:1 MUX


AIN4M

PMU8
AIN5P PMU5 8:1 MUX
AIN5M From FPGA Force voltage and current
To DUT
PMU VREF
AIN6P PMU6 8:1 MUX
AIN6M

AIN7P PMU7 8:1 MUX MVI1 channel


AIN7M MVI2 channel
MVI3 channel
AIN8P 8:1 MVI4 channel
MUX MVI5 channel
GND AIN8M MVI6 channel
MVI7 channel
MVI8 channel
PMU and DUT GND

GND

Figure 8-2. PMU With a Multiplexer

8.2.2 Design Requirements


The goal of this application is to select an ADC for ATE applications. Table 8-1 shows the parameters for this
design example.
Table 8-1. Design Parameters
PARAMETER VALUE
Sampling rate Up to 2MSPS/channel
Total unadjusted error (TUE) over 25°C ±5°C <0.01% with calibration
Supports external switches or multiplexer Full-scale step settling to 99.95% of full-scale in <10μs

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8.2.3 Detailed Design Procedure


The ADS9813 is an eight-channel, 18-bit, 2MSPS data acquisition (DAQ) system. The device has a built-in
analog front-end that makes the ATE signal chain easier to design and more accurate.
The ADC accuracy is based on the total-unadjusted-error (TUE), which combines INL, offset, and gain errors.
Calibrate the external system for offset and gain errors at a specified temperature and supply voltage. When
calibrated (as described in Table 8-2), only the INL, thermal offset drifts, and gain contribute to TUE. The
ADS9813 has a TUE of 0.0015% at 25°C ±5°C post-calibration, meeting the design error requirement.
Table 8-2. TUE at TA = 25°C Calculation for RANGE = ±5V
CALIBRATION INL (ppm) OFFSET ERROR (ppm) GAIN ERROR (ppm) TUE (ppm) ERROR (%)
No calibration ±3.2 ±60 ±80 ±100.05 ±0.0100
Post-calibration ±3.2 0 0 ±3.2 ±0.0003
Post-calibration ±5°C ±3.2 ±7.5 ±12.5 ±14.92 ±0.0015

The pin-electronics subsystem manages the PMU outputs. The subsystem connects each PMU output to
separate ADC channels (Figure 8-1) or uses a multiplexer to link multiple PMU outputs to one ADC channel
(Figure 8-2). This subsystem allows more pin-electronics channels on the card. The ADC requires more
bandwidth with multiplexers (Table 8-3) for fast settling when switching PMU channels. The ADS9813 has two
bandwidth modes: Low-noise (up to 22.7kHz) and wide-bandwidth (up to 700kHz). As described in Figure 8-3
the wide-bandwidth mode samples multiplexed PMU signals and settles to 99.95% FS in 7.5µs.
Table 8-3. Step-Settling Performance for RANGE = ±5V
ANALOG INPUT BANDWIDTH SETTLING TIME (99.95% of FS) SNR (Typical)
Low BW (22.7kHz) 55μs 89.1dB
Wide BW (500kHz) 7.5μs 79.7dB

8.2.4 Application Curve


294912

262144

229376
ADC Output Code (LSB)

196608

163840

131072

98304

65536

32768 Low-BW
Wide-BW
0
0 8 16 24 32 40 48 56 64 72 80
Time (µs)

Figure 8-3. Step-Settling Performance

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8.3 Power Supply Recommendations


The ADS9813 has three separate power supplies: AVDD_5V, VDD_1V8, and IOVDD. There is no requirement
for a specific power-up sequence. The data and configuration digital interfaces are powered by IOVDD. A
common 1.8V supply powers the VDD_1V8 and IOVDD pins. Figure 8-4 illustrates the decoupling capacitor
connections for the respective power supplies. Make sure each power-supply pin has separate decoupling
capacitors.
Analog supply
(5V)
AVDD_5V GND

0.1 F 1 F

Analog supply
(1.8V)
VDD_1V8
(pins 47, 48, 49)

0.1 F 1 F

Digital supply
(1.8V)
VDD_1V8
(pins 21, 22)

0.1 F 1 F

IO supply
(1.2V to 1.8V)
IOVDD

0.1 F 1 F

Figure 8-4. Power-Supply Decoupling

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8.4 Layout
8.4.1 Layout Guidelines
Figure 8-5 illustrates a board layout example for the ADS9813. Avoid crossing digital lines with the analog signal
path and keep the analog input signals and the reference signals away from noise sources.
Use 0.1μF ceramic bypass capacitors in close proximity to the AVDD_5V, VDD_1V8, and IOVDD power-supply
pins. Avoid placing vias between the power-supply pins and the bypass capacitors.
Place the reference decoupling capacitor close to the device REFIO and REFM pins. Avoid placing vias between
the REFIO pin and the bypass capacitors. Connect the GND and REFM pins to a ground plane using short,
low-impedance paths.
8.4.2 Layout Example

Figure 8-5. Example Layout

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9 Device and Documentation Support


TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device,
generate code, and develop solutions are listed below.
9.1 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Notifications to register and receive a weekly digest of any product information that has changed. For change
details, review the revision history included in any revised document.
9.2 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
9.3 Trademarks
TI E2E™ is a trademark of Texas Instruments.
All trademarks are the property of their respective owners.
9.4 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.

9.5 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.

10 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.

Changes from Revision * (April 2024) to Revision A (November 2024) Page


• Changed the document from Advanced information to Production data............................................................ 1

11 Mechanical, Packaging, and Orderable Information


The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

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PACKAGE OPTION ADDENDUM

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PACKAGING INFORMATION

Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)

ADS9811RSHR ACTIVE VQFN RSH 56 4000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ADS9811 Samples

ADS9813RSHR ACTIVE VQFN RSH 56 4000 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 ADS9813 Samples

(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.

(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.

(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.

(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

Addendum-Page 1
PACKAGE OPTION ADDENDUM

www.ti.com 1-Jan-2025

Addendum-Page 2
PACKAGE MATERIALS INFORMATION

www.ti.com 2-Jan-2025

TAPE AND REEL INFORMATION

REEL DIMENSIONS TAPE DIMENSIONS


K0 P1

B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers

Reel Width (W1)


QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE

Sprocket Holes

Q1 Q2 Q1 Q2

Q3 Q4 Q3 Q4 User Direction of Feed

Pocket Quadrants

*All dimensions are nominal


Device Package Package Pins SPQ Reel Reel A0 B0 K0 P1 W Pin1
Type Drawing Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
ADS9811RSHR VQFN RSH 56 4000 330.0 16.4 7.3 7.3 1.1 12.0 16.0 Q2
ADS9813RSHR VQFN RSH 56 4000 330.0 16.4 7.3 7.3 1.1 12.0 16.0 Q2

Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION

www.ti.com 2-Jan-2025

TAPE AND REEL BOX DIMENSIONS

Width (mm)
H
W

*All dimensions are nominal


Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
ADS9811RSHR VQFN RSH 56 4000 367.0 367.0 35.0
ADS9813RSHR VQFN RSH 56 4000 367.0 367.0 35.0

Pack Materials-Page 2
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IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD
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TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable
standards, and any other safety, security, regulatory or other requirements.
These resources are subject to change without notice. TI grants you permission to use these resources only for development of an
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