2SC5886A
TOSHIBA Transistor Silicon NPN Epitaxial Type
2SC5886A
High-Speed Switching Applications
DC/DC Converter Applications
Unit: mm
High DC current gain: hFE = 400 to 1000 (IC = 0.5 A)
Low collector-emitter saturation: VCE (sat) = 0.22 V (max)
High-speed switching: tf = 95 ns (typ.)
Maximum Ratings (Ta = 25C)
Characteristic
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current
Rating
Unit
VCBO
120
VCEX
100
VCEO
50
VEBO
DC
IC
Pulse
ICP
10
IB
0.5
Base current
Ta = 25C
Collector power
dissipation
Symbol
Tc = 25C
Junction temperature
Storage temperature range
V
V
A
A
Pc
20
JEDEC
JEITA
Tj
150
TOSHIBA
Tstg
55 to 150
Weight: 0.36 g (typ.)
2-7J1A
Electrical Characteristics (Ta = 25C)
Characteristic
Symbol
Test Condition
Min
Typ.
Max
Unit
Collector cutoff current
ICBO
VCB = 120 V, IE = 0
100
nA
Emitter cutoff current
IEBO
VEB = 9 V, IC = 0
100
nA
V (BR) CEO
IC = 10 mA, IB = 0
50
hFE (1)
VCE = 2 V, IC = 0.5 A
400
1000
hFE (2)
VCE = 2 V, IC = 1.6 A
200
Collector-emitter saturation voltage
VCE (sat)
IC = 1.6 A, IB = 32 mA
0.22
Base-emitter saturation voltage
VBE (sat)
IC = 1.6 A, IB = 32 mA
1.10
60
500
95
Collector-emitter breakdown voltage
DC current gain
Rise time
Switching time
Storage time
Fall time
tr
tstg
tf
See Figure 1.
VCC
24 V, RL = 15
IB1 = 32 mA, IB2 = 53 mA
ns
2005-02-28
2SC5886A
VCC
IB1
IB1
Input
RL
20 s
Output
IB2
IB2
Duty cycle < 1%
Figure 1 Switching Time Test Circuit & Timing Chart
Marking
C5886A
Part No. (or abbreviation code)
Lot No.
A line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
2005-02-28
2SC5886A
IC VCE
hFE IC
6
40
30
20
10
Common emitter
VCE = 2 V
Pulse test
hFE
50
DC current gain
Collector current IC (A)
70
10000
Common emitter
Tc = 25C
Pulse test
2
2
Tc = 100C
1000
25
55
100
IB = 1 mA
0
0
Collectoremitter voltage
10
0.001
10
0.01
0.1
VCE (V)
VCE (sat) IC
IC/IB = 50
Pulse test
Tc = 100C
0.1
55
25
0.01
0.001
0.01
0.1
Collector current
Common emitter
IC/IB = 50
Pulse test
55
Tc = 100C
0.1
0.001
10
25
0.01
VCE IB
10
VCE
55
Tc = 100C
25
1
0
0
0.4
Common emitter
Tc = 25C
Pulse test
(V)
Common emitter
VCE = 2 V
Pulse test
0.8
Baseemitter voltage
10
Collector current IC (A)
IC (A)
Collectoremitter voltage
Collector current IC (A)
0.1
IC VBE
5
10
VBE (sat) IC
10
Common emitter
Baseemitter saturation voltage
VBE (sat) (V)
Collectoremitter saturation voltage
VCE (sat) (V)
10
Collector current IC (A)
1.2
1
3
2
1.6
0.1
IC = 1 A
0.01
0.001
1.6
VBE (V)
0.01
0.1
Base current IB
10
(A)
2005-02-28
Transient thermal resistance
(junctioncase)
rth (jc) (C/W)
2SC5886A
rth(jc) tw
10
Tc = 25C Infinite heat sink
Curves apply only to limited areas of thermal resistance
(single nonrepetitive pulse).
1
0.001
0.01
0.1
Pulse width
tw
10
(s)
Safe operating area
100
IC max (pulse)*
Collector current IC (A)
10
100 s*
10 s*
1 ms*
IC max (continuous)*
10 ms*
1
100 ms*
DC operation
Tc = 25C
0.1
*: Single pulse Tc = 25C
Curves must be derated
linearly with increase in
temperature
0.01
0.1
Collectoremitter voltage
VCEO max
10
100
VCE (V)
2005-02-28
2SC5886A
RESTRICTIONS ON PRODUCT USE
030619EAA
The information contained herein is subject to change without notice.
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others.
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the Handling Guide for Semiconductor Devices, or TOSHIBA Semiconductor Reliability
Handbook etc..
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (Unintended Usage). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customers own risk.
TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced
and sold, under any law and regulations.
2005-02-28
