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Vincent Beroulle
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2020 – today
- 2024
- [j21]Ihab Alshaer
, Gijs Burghoorn, Brice Colombier, Christophe Deleuze, Vincent Beroulle, Paolo Maistri:
Cross-layer analysis of clock glitch fault injection while fetching variable-length instructions. J. Cryptogr. Eng. 14(2): 325-342 (2024) - [j20]Souhir Gabsi
Proposal of a lightweight differential power analysis countermeasure method on elliptic curves for low-cost devices. Multim. Tools Appl. 83(30): 74657-74683 (2024) - [c88]Quentin Jayet, Christine Hennebert, Yann Kieffer, Vincent Beroulle:
Embedded Elapsed Time Techniques in Trusted Execution Environment for Lightweight Blockchain. Blockchain 2024: 81-88 - [c87]Ihab Alshaer, Ahmed Al-Kaf, Valentin Egloff, Vincent Beroulle:
Inferred Fault Models for RISC-V and Arm: A Comparative Study. DFT 2024: 1-6 - [c86]Quentin Jayet, Christine Hennebert, Yann Kieffer, Vincent Beroulle:
Securing Elapsed Time for Blockchain: Proof of Hardware Time and Some of its Physical Threats. DSD 2024: 137-144 - [c85]Aghiles Douadi, Elena-Ioana Vatajelu, Paolo Maistri, David Hély, Vincent Beroulle, Giorgio Di Natale:
Modeling Thermal Effects For Biasing PUFs. ETS 2024: 1-4 - [c84]Nasr-Eddine Ouldei Tebina, Aghiles Douadi, Luc Salvo, Vincent Beroulle, Nacer-Eddine Zergainoh, Guillaume Hubert, Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Maistri:
Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation. HOST 2024: 1-11 - [c83]Ihab Alshaer, Ahmed Al-Kaf, Valentin Egloff, Vincent Beroulle:
Modeling Clock Glitch Fault Injection Effects on a RISC-V Microcontroller. IOLTS 2024: 1-3 - 2023
- [c82]Ihab Alshaer
Microarchitectural Insights into Unexplained Behaviors Under Clock Glitch Fault Injection. CARDIS 2023: 3-22 - [c81]Nikolaos Foivos Polychronou, Pierre-Henri Thevenon, Maxime Puys, Vincent Beroulle:
A Hybrid Solution for Constrained Devices to Detect Microarchitectural Attacks. EuroS&P Workshops 2023: 259-269 - [c80]Aghiles Douadi, Giorgio Di Natale, Paolo Maistri, Elena-Ioana Vatajelu, Vincent Beroulle:
A Study of High Temperature Effects on Ring Oscillator Based Physical Unclonable Functions. IOLTS 2023: 1-7 - [c79]Maryam Esmaeilian, Aghiles Douadi, Zahra Kazemi, Vincent Beroulle, Amir-Pasha Mirbaha, Mahdi Fazeli, Elena-Ioana Vatajelu, Paolo Maistri, Giorgio Di Natale:
Experimental Evaluation of Delayed-Based Detectors Against Power-off Attack. IOLTS 2023: 1-3 - [c78]Hiep Manh Dao, Vincent Beroulle, Yann Kieffer, Xuan-Tu Tran, Duy-Hieu Bui:
Low-cost Low-Power Implementation of Binary Edwards Curve for Secure Passive RFID Tags. MCSoC 2023: 494-500 - 2022
- [j19]Amir Ali Pour
Helper Data Masking for Physically Unclonable Function-Based Key Generation Algorithms. IEEE Access 10: 40150-40164 (2022) - [j18]Nikolaos Foivos Polychronou, Pierre-Henri Thevenon, Maxime Puys
A Comprehensive Survey of Attacks without Physical Access Targeting Hardware Vulnerabilities in IoT/IIoT Devices, and Their Detection Mechanisms. ACM Trans. Design Autom. Electr. Syst. 27(1): 1:1-1:35 (2022) - [c77]Amir Ali Pour, David Hély, Vincent Beroulle, Giorgio Di Natale:
Elaborating on Sub-Space Modeling as an Enrollment Solution for Strong PUF. DCOSS 2022: 394-399 - [c76]Konstantinos Nomikos, Athanasios Papadimitriou, Mihalis Psarakis, Aggelos Pikrakis, Vincent Beroulle:
Evaluation of Hiding-based Countermeasures against Deep Learning Side Channel Attacks with Pre-trained Networks. DFT 2022: 1-6 - [c75]Ihab Alshaer, Brice Colombier, Christophe Deleuze, Vincent Beroulle, Paolo Maistri:
Variable-Length Instruction Set: Feature or Bug? DSD 2022: 464-471 - [c74]Zahra Kazemi, Amin Norollah, Mahdi Fazeli, David Hély, Vincent Beroulle:
An Offline Hardware Security Assessment Approach using Symbol Assertion and Code Shredding. ISQED 2022: 1 - [c73]Amir Ali Pour, David Hély, Vincent Beroulle, Giorgio Di Natale:
Sub-Space Modeling: An Enrollment Solution for XOR Arbiter PUF using Machine Learning. ISQED 2022: 1 - [c72]Amir Ali Pour, David Hély, Vincent Beroulle, Giorgio Di Natale:
An Efficient Approach to Model Strong PUF with Multi-Layer Perceptron using Transfer Learning. ISQED 2022: 1-6 - [c71]Amir Ali Pour, Fatemeh Afghah, David Hély, Vincent Beroulle, Giorgio Di Natale:
Secure PUF-based Authentication and Key Exchange Protocol using Machine Learning. ISVLSI 2022: 386-389 - 2021
- [j17]Souhir Gabsi
Novel ECC-Based RFID Mutual Authentication Protocol for Emerging IoT Applications. IEEE Access 9: 130895-130913 (2021) - [j16]Johan Laurent, Christophe Deleuze, Florian Pebay-Peyroula, Vincent Beroulle:
Bridging the Gap between RTL and Software Fault Injection. ACM J. Emerg. Technol. Comput. Syst. 17(3): 38:1-38:24 (2021) - [j15]Souhir Gabsi
Survey: Vulnerability Analysis of Low-Cost ECC-Based RFID Protocols against Wireless and Side-Channel Attacks. Sensors 21(17): 5824 (2021) - [c70]Zahra Kazemi, Amin Norollah, Afef Kchaou, Mahdi Fazeli, David Hély, Vincent Beroulle:
An In-Depth Vulnerability Analysis of RISC-V Micro-Architecture Against Fault Injection Attack. DFT 2021: 1-6 - [c69]Nikolaos Foivos Polychronou, Pierre-Henri Thevenon, Maxime Puys
MaDMAN: Detection of Software Attacks Targeting Hardware Vulnerabilities. DSD 2021: 355-362 - [c68]Ihab Alshaer
Microarchitecture-aware Fault Models: Experimental Evidence and Cross-Layer Inference Methodology. DTIS 2021: 1-6 - [c67]Nikolaos Foivos Polychronou, Pierre-Henri Thevenon, Maxime Puys
Securing IoT/IIoT from Software Attacks Targeting Hardware Vulnerabilities. NEWCAS 2021: 1-4 - [c66]Julie Roux, Katell Morin-Allory, Vincent Beroulle, Régis Leveugle, Lilian Bossuet, Frédéric Cézilly, Frédéric Berthoz, Gilles Genévrier, François Cerisier:
Cross-layer Approach to Assess FMEA on Critical Systems and Evaluate High-Level Model Realism. VLSI-SoC 2021: 1-6 - [c65]Julie Roux, Katell Morin-Allory, Vincent Beroulle, Lilian Bossuet, Frédéric Cézilly, Frédéric Berthoz, Gilles Genévrier, François Cerisier, Régis Leveugle:
FMEA on Critical Systems: A Cross-Layer Approach Based on High-Level Models. VLSI-SoC (Selected Papers) 2021: 113-133 - 2020
- [c64]Amir Alipour, Athanasios Papadimitriou
On the Performance of Non-Profiled Differential Deep Learning Attacks against an AES Encryption Algorithm Protected using a Correlated Noise Generation based Hiding Countermeasure. DATE 2020: 614-617 - [c63]Julie Roux, Vincent Beroulle, Katell Morin-Allory, Régis Leveugle, Lilian Bossuet, Frédéric Cézilly, Frédéric Berthoz, Gilles Genévrier, François Cerisier:
Cross Layer Fault Simulations for Analyzing the Robustness of RTL Designs in Airborne Systems. DDECS 2020: 1-4 - [c62]Amir Alipour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, David Hély, Sylvain Guilley, Naghmeh Karimi:
PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. ETS 2020: 1-10 - [c61]Francesco Regazzoni
Machine Learning and Hardware security: Challenges and Opportunities -Invited Talk-. ICCAD 2020: 141:1-141:6 - [c60]Julie Roux, Vincent Beroulle, Katell Morin-Allory, Régis Leveugle, Lilian Bossuet, Frédéric Cézilly, Frédéric Berthoz, Gilles Genévrier, François Cerisier:
High Level Fault Injection Method for Evaluating Critical System Parameter Ranges. ICECS 2020: 1-4 - [c59]Zahra Kazemi, Mahdi Fazeli, David Hély, Vincent Beroulle:
Hardware Security Vulnerability Assessment to Identify the Potential Risks in A Critical Embedded Application. IOLTS 2020: 1-6 - [c58]Baptiste Pestourie, Vincent Beroulle, Nicolas Fourty:
Clock skew-based physical authentication protocol for 802.15.4 IR-UWB indoor positioning. IOT 2020: 8:1-8:8
2010 – 2019
- 2019
- [j14]Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb:
An Optimized NS2 Module for UHF Passive RFID Systems. J. Electron. Test. 35(1): 45-58 (2019) - [j13]Johan Laurent, Vincent Beroulle, Christophe Deleuze, Florian Pebay-Peyroula, Athanasios Papadimitriou
Cross-layer analysis of software fault models and countermeasures against hardware fault attacks in a RISC-V processor. Microprocess. Microsystems 71 (2019) - [c57]Johan Laurent, Vincent Beroulle, Christophe Deleuze, Florian Pebay-Peyroula:
Fault Injection on Hidden Registers in a RISC-V Rocket Processor and Software Countermeasures. DATE 2019: 252-255 - [c56]Johan Laurent, Christophe Deleuze, Vincent Beroulle, Florian Pebay-Peyroula:
Analyzing Software Security Against Complex Fault Models with Frama-C Value Analysis. FDTC 2019: 33-40 - [c55]Zahra Kazemi, Athanasios Papadimitriou
On a Low Cost Fault Injection Framework for Security Assessment of Cyber-Physical Systems: Clock Glitch Attacks. IVSW 2019: 7-12 - [c54]Arash Nejat, Zahra Kazemi, Vincent Beroulle, David Hély, Mahdi Fazeli
Restricting Switching Activity Using Logic Locking to Improve Power Analysis-Based Trojan Detection. IVSW 2019: 49-54 - [c53]Baptiste Pestourie, Vincent Beroulle, Nicolas Fourty:
Security Evaluation with an Indoor UWB Localization Open Platform: Acknowledgment Attack Case Study. PIMRC 2019: 1-7 - 2018
- [j12]Yassine Naija
Security Enhancements of a Mutual Authentication Protocol Used in a HF Full-Fledged RFID Tag. J. Electron. Test. 34(3): 291-304 (2018) - [j11]Arash Nejat
ESCALATION: Leveraging Logic Masking to Facilitate Path-Delay-Based Hardware Trojan Detection Methods. J. Hardw. Syst. Secur. 2(1): 83-96 (2018) - [c52]Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb:
Time Modeling with NS2 in UHF RFID Anti-Collision Protocols. AINA 2018: 17-23 - [c51]Johan Laurent, Vincent Beroulle, Christophe Deleuze, Florian Pebay-Peyroula, Athanasios Papadimitriou
On the Importance of Analysing Microarchitecture for Accurate Software Fault Models. DSD 2018: 561-564 - [c50]Yassine Naija, Vincent Beroulle, Mohsen Machhout
ElectroMagnetic Attack Test Platform for Validating RFID Tag Architectures. EURFID 2018: 1-7 - [c49]Jean-Max Dutertre
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. FDTC 2018: 1-6 - [c48]Jean-Max Dutertre
The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks. IOLTS 2018: 214-219 - [c47]Zahra Kazemi
Hardware Security Evaluation Platform for MCU-Based Connected Devices: Application to Healthcare IoT. IVSW 2018: 87-92 - [c46]Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb:
An Evaluation of UHF RFID Anti-Collision Protocols with NS2. NTMS 2018: 1-6 - [c45]Baptiste Pestourie, Vincent Beroulle, Nicolas Fourty:
Guidelines for the Choice of a Wireless Secure Positioning and Communication System. SIoT 2018: 1-7 - 2017
- [c44]Jeremy Dubeuf, David Hély
Enhanced Elliptic Curve Scalar Multiplication Secure Against Side Channel Attacks and Safe Errors. COSADE 2017: 65-82 - [c43]Rahma Ben Fraj, Vincent Beroulle, Nicolas Fourty, Aref Meddeb:
A global approach for the improvement of UHF RFID safety and security. DTIS 2017: 1-2 - 2016
- [j10]Noemie Beringuier-Boher, Vincent Beroulle, David Hély
Clock generator behavioral modeling for supply voltage glitch attack effects analysis. Microprocess. Microsystems 47: 37-43 (2016) - [j9]Athanasios Papadimitriou
Analysis of laser-induced errors: RTL fault models versus layout locality characteristics. Microprocess. Microsystems 47: 64-73 (2016) - [j8]Jeremy Dubeuf, David Hély
ECDSA Passive Attacks, Leakage Sources, and Common Design Mistakes. ACM Trans. Design Autom. Electr. Syst. 21(2): 31:1-31:24 (2016) - [c42]Charalampos Ananiadis, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Paolo Maistri, Régis Leveugle:
On the development of a new countermeasure based on a laser attack RTL fault model. DATE 2016: 445-450 - [c41]Yassine Naija, Vincent Beroulle, David Hély
Implementation of a secured digital ultralight 14443-type A RFID tag with an FPGA platform. DTIS 2016: 1-3 - [c40]Seyyed Mohammad Saleh Samimi, Ehsan Aerabi, Arash Nejat, Mahdi Fazeli
High output hamming-distance achievement by a greedy logic masking approach. EWDTS 2016: 1-4 - [c39]Arash Nejat, David Hély
How logic masking can improve path delay analysis for Hardware Trojan detection. ICCD 2016: 424-427 - [c38]Romain Champon, Vincent Beroulle, Athanasios Papadimitriou
Comparison of RTL fault models for the robustness evaluation of aerospace FPGA devices. IOLTS 2016: 23-24 - [c37]Arash Nejat, David Hély
Reusing logic masking to facilitate path-delay-based hardware Trojan detection. IOLTS 2016: 191-192 - [c36]Régis Leveugle, A. Chahed, Paolo Maistri, Athanasios Papadimitriou
On fault injections for early security evaluation vs. laser-based attacks. IVSW 2016: 1-6 - 2015
- [c35]Athanasios Papadimitriou
Validation of RTL laser fault injection model with respect to layout information. HOST 2015: 78-81 - [c34]Arash Nejat, David Hély
Facilitating side channel analysis by obfuscation for Hardware Trojan detection. IDT 2015: 129-134 - 2014
- [c33]Athanasios Papadimitriou, David Hély, Vincent Beroulle, Paolo Maistri, Régis Leveugle:
A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks. DATE 2014: 1-4 - [c32]Omar Abdelmalek, David Hély
Emulation based fault injection on UHF RFID transponder. DDECS 2014: 254-257 - [c31]Noemie Beringuier-Boher, Kamil Gomina, David Hély
Voltage Glitch Attacks on Mixed-Signal Systems. DSD 2014: 379-386 - [c30]Pierre Vanhauwaert, Paolo Maistri, Régis Leveugle, Athanasios Papadimitriou
On error models for RTL security evaluations. DTIS 2014: 1-6 - [c29]Omar Abdelmalek, David Hély
Fault tolerance evaluation of RFID tags. LATW 2014: 1-6 - [c28]Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou
Laser-induced fault effects in security-dedicated circuits. VLSI-SoC 2014: 1-6 - [c27]Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre
Laser-Induced Fault Effects in Security-Dedicated Circuits. VLSI-SoC (Selected Papers) 2014: 220-240 - 2013
- [c26]Omar Abdelmalek, David Hély
EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement. DTIS 2013: 20-24 - [c25]Omar Abdelmalek, David Hély
An UHF RFID emulation platform with fault injection and real time monitoring capabilities. IDT 2013: 1-2 - [c24]Ibrahim Mezzah
Assertion based on-line fault detection applied on UHF RFID tag. IDT 2013: 1-5 - [c23]Noemie Beringuier-Boher, David Hély
Increasing the security level of analog IPs by using a dedicated vulnerability analysis methodology. ISQED 2013: 531-537 - 2012
- [c22]Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hély:
Evaluation of a new RFID system performance monitoring approach. DATE 2012: 1439-1442 - 2011
- [j7]Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, Minh Duc Nguyen, David Hély
RFID System On-line Testing Based on the Evaluation of the Tags Read-Error-Rate. J. Electron. Test. 27(3): 267-276 (2011) - [c21]David Hély
Towards an unified IP verification and robustness analysis platform. DDECS 2011: 53-58 - [c20]Minh-Duc Nguyen, Gilles Fritz, Oum-El-Kheir Aktouf, Vincent Beroulle, David Hély
Towards middleware-based fault-tolerance in RFID systems. EWDC 2011: 49-52 - [c19]Gilles Fritz, Boutheina Maaloul, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hély
Read rate profile monitoring for defect detection in RFID Systems. RFID-TA 2011: 89-94 - [c18]Gilles Fritz, Vincent Beroulle, Oum-El-Kheir Aktouf, David Hély:
SystemC modeling of RFID systems for robustness analysis. SoftCOM 2011: 1-5
2000 – 2009
- 2009
- [j6]Xuan-Tu Tran
Design-for-test approach of an asynchronous network-on-chip architecture and its associated test pattern generation and application. IET Comput. Digit. Tech. 3(5): 487-500 (2009) - 2008
- [j5]Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini
Decreasing Test Qualification Time in AMS and RF Systems. IEEE Des. Test Comput. 25(1): 29-37 (2008) - [j4]Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test. VLSI Design 2008: 596146:1-596146:9 (2008) - [c17]Xuan-Tu Tran, Yvain Thonnart, Jean Durupt, Vincent Beroulle, Chantal Robach:
A Design-for-Test Implementation of an Asynchronous Network-on-Chip Architecture and its Associated Test Pattern Generation and Application. NOCS 2008: 149-158 - 2007
- [c16]Youssef Serrestou, Vincent Beroulle, Chantal Robach:
Functional Verification of RTL Designs driven by Mutation Testing metrics. DSD 2007: 222-227 - [c15]Rami Khouri, Yvan Duroc, Vincent Beroulle, Smail Tedjini, Osman Franscico Oliveira Gomes:
VHDL-AMS Modeling of an UWB Radio Link Including Antennas. ICECS 2007: 570-573 - [c14]Xuan-Tu Tran
Implementation of a Design-for-Test Architecture for Asynchronous Networks-on-Chip. NOCS 2007: 216 - [c13]Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini
Qualification of behavioral level design validation for AMS & RF SoCs. VLSI-SoC 2007: 206-211 - [c12]Youssef Serrestou, Vincent Beroulle, Chantal Robach:
Impact of hardware emulation on the verification quality improvement. VLSI-SoC 2007: 218-223 - [i1]Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre:
Mutation Sampling Technique for the Generation of Structural Test Data. CoRR abs/0710.4802 (2007) - 2006
- [c11]Youssef Serrestou, Vincent Beroulle, Chantal Robach:
How to Improve a Set of Design Validation Data by Using Mutation-based Test. DDECS 2006: 77-78 - [c10]Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini
Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language. DDECS 2006: 113-118 - [c9]Xuan-Tu Tran
Design-for-Test of Asynchronous Networks-on-Chip. DDECS 2006: 163-167 - [c8]Xuan-Tu Tran
A DFT Architecture for Asynchronous Networks-on-Chip. ETS 2006: 219-224 - 2005
- [c7]Mathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre:
Mutation Sampling Technique for the Generation of Structural Test Data. DATE 2005: 1022-1023 - [c6]Smail Tedjini
Antennas for RFID tags. sOc-EUSAI 2005: 19-22 - 2004
- [j3]Laurent Latorre, Vincent Beroulle, Pascal Nouet:
Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(6): 962-967 (2004) - 2002
- [j2]M. Dardalhon, Vincent Beroulle, Laurent Latorre, Pascal Nouet
Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. Microelectron. Reliab. 42(9-11): 1777-1782 (2002) - [c5]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE 2002: 1120 - [c4]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology. LATW 2002: 99-104 - [c3]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS 2002: 439-444 - 2001
- [j1]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electron. Test. 17(5): 439-450 (2001) - [c2]Vincent Beroulle, Laurent Latorre, M. Dardalhon, Coumar Oudéa, Guy Perez, Francis Pressecq, Pascal Nouet:
Impact of Technology Spreading on MEMS design Robustness. VLSI-SOC 2001: 241-251 - [c1]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC 2001: 461-472
Coauthor Index
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