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William Q. Meeker
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2020 – today
- 2023
- [i3]Jie Min, Yili Hong, William Q. Meeker, George Ostrouchov:
A Spatially Correlated Competing Risks Time-to-Event Model for Supercomputer GPU Failure Data. CoRR abs/2303.16369 (2023) - 2022
- [j38]Colin Lewis-Beck, Qinglong Tian
, William Q. Meeker
Prediction of Future Failures for Heterogeneous Reliability Field Data. Technometrics 64(1): 125-138 (2022) - 2021
- [j37]Brian P. Weaver, William Q. Meeker
Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests. Technometrics 63(1): 90-99 (2021) - [i2]Yili Hong, Jie Min, Caleb B. King, William Q. Meeker:
Reliability Analysis of Artificial Intelligence Systems Using Recurrent Events Data from Autonomous Vehicles. CoRR abs/2102.01740 (2021) - [i1]Bishoy Dawood, Carlos Llosa-Vite, Geoffrey Z. Thompson, Barbara K. Lograsso, Lauren K. Claytor, John Vanderkolk, William Q. Meeker, Ranjan Maitra, Ashraf Bastawros:
Quantitative Matching of Forensic Evidence Fragments Utilizing 3D Microscopy Analysis of Fracture Surface Replicas. CoRR abs/2109.11972 (2021)
2010 – 2019
- 2019
- [j36]Eric Mittman, Colin Lewis-Beck, William Q. Meeker:
A Hierarchical Model for Heterogenous Reliability Field Data. Technometrics 61(3): 354-368 (2019) - 2018
- [c3]Xiaosong Du, Praveen Gurrala, Leifur Leifsson, Jiming Song, William Q. Meeker, Ronald A. Roberts, Slawomir Koziel, Yonatan A. Tesfahunegn:
Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem. ICCS (2) 2018: 593-603 - 2017
- [j35]Caleb B. King, Yili Hong, William Q. Meeker:
Product Component Genealogy Modeling and Field-failure Prediction. Qual. Reliab. Eng. Int. 33(1): 135-148 (2017) - [j34]Wei Zhang, Ye Tian, Luis A. Escobar, William Q. Meeker:
Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes. Technometrics 59(2): 202-214 (2017) - [j33]Zhibing Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, Kati Illouz:
A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data. Technometrics 59(2): 225-236 (2017) - [j32]Ye Tian, Ranjan Maitra
A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. Technometrics 59(2): 247-261 (2017) - 2015
- [j31]ShiYao Liu, William Q. Meeker:
Statistical Methods for Estimating the Minimum Thickness Along a Pipeline. Technometrics 57(2): 164-179 (2015) - [j30]Yili Hong, Yuanyuan Duan, William Q. Meeker, Deborah L. Stanley, Xiaohong Gu:
Statistical Methods for Degradation Data With Dynamic Covariates Information and an Application to Outdoor Weathering Data. Technometrics 57(2): 180-193 (2015) - [j29]Zhibing Xu, Yili Hong, William Q. Meeker:
Assessing Risk of a Serious Failure Mode Based on Limited Field Data. IEEE Trans. Reliab. 64(1): 51-62 (2015) - 2014
- [j28]Chunwang Gao, William Q. Meeker, Donna Mayton:
Detecting cracks in aircraft engine fan blades using vibrothermography nondestructive evaluation. Reliab. Eng. Syst. Saf. 131: 229-235 (2014) - [j27]Ming Li, William Q. Meeker, R. Bruce Thompson:
Physical Model-Assisted Probability of Detection of Flaws in Titanium Forgings Using Ultrasonic Nondestructive Evaluation. Technometrics 56(1): 78-91 (2014) - [j26]Zhengcheng Zhang
The Residual Lifetime of Surviving Components From Failed Coherent Systems. IEEE Trans. Reliab. 63(2): 534-542 (2014) - 2013
- [j25]Brian P. Weaver, William Q. Meeker, Luis A. Escobar, Joanne Wendelberger
Methods for Planning Repeated Measures Degradation Studies. Technometrics 55(2): 122-134 (2013) - [j24]Yili Hong, William Q. Meeker:
Field-Failure Predictions Based on Failure-Time Data With Dynamic Covariate Information. Technometrics 55(2): 135-149 (2013) - 2012
- [j23]Ying Shi, William Q. Meeker:
Bayesian Methods for Accelerated Destructive Degradation Test Planning. IEEE Trans. Reliab. 61(1): 245-253 (2012) - 2011
- [j22]Shuen-Lin Jeng, Bei-Ying Huang, William Q. Meeker:
Accelerated Destructive Degradation Tests Robust to Distribution Misspecification. IEEE Trans. Reliab. 60(4): 701-711 (2011) - 2010
- [j21]Yili Hong, William Q. Meeker:
Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information. Technometrics 52(2): 148-159 (2010) - [j20]Haiming Ma, William Q. Meeker:
Strategy for Planning Accelerated Life Tests With Small Sample Sizes. IEEE Trans. Reliab. 59(4): 610-619 (2010) - [j19]Yili Hong, Haiming Ma, William Q. Meeker:
A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans With Log-Location-Scale Distributions. IEEE Trans. Reliab. 59(4): 620-627 (2010)
2000 – 2009
- 2009
- [j18]Ying Shi, Luis A. Escobar, William Q. Meeker:
Accelerated Destructive Degradation Test Planning. Technometrics 51(1): 1-13 (2009) - [j17]William Q. Meeker, Luis A. Escobar, Yili Hong:
Using Accelerated Life Tests Results to Predict Product Field Reliability. Technometrics 51(2): 146-161 (2009) - 2008
- [j16]Yili Hong, William Q. Meeker, Luis A. Escobar:
Avoiding Problems With Normal Approximation Confidence Intervals for Probabilities. Technometrics 50(1): 64-68 (2008) - [j15]David M. Steinberg, Søren Bisgaard, Necip Doganaksoy
The Future of Industrial Statistics: A Panel Discussion. Technometrics 50(2): 103-127 (2008) - [j14]Jianying Zuo, William Q. Meeker, Huaiqing Wu:
Analysis of Window-Observation Recurrence Data. Technometrics 50(2): 128-143 (2008) - [j13]Yili Hong, William Q. Meeker, Luis A. Escobar:
The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles. IEEE Trans. Reliab. 57(2): 260-266 (2008) - 2007
- [c2]James D. McCalley, Vasant G. Honavar
Integrated Decision Algorithms for Auto-steered Electric Transmission System Asset Management. International Conference on Computational Science (1) 2007: 1066-1073 - 2006
- [j12]Yao Zhang, William Q. Meeker:
Bayesian Methods for Planning Accelerated Life Tests. Technometrics 48(1): 49-60 (2006) - [c1]James D. McCalley, Vasant G. Honavar
Auto-steered Information-Decision Processes for Electric System Asset Management. International Conference on Computational Science (3) 2006: 440-447 - 2005
- [j11]Scott W. McKane, Luis A. Escobar, William Q. Meeker:
Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring. Technometrics 47(2): 182-190 (2005) - 2004
- [j10]William Q. Meeker, Luis A. Escobar:
Discussion. Technometrics 46(1): 15-16 (2004) - [j9]Victor Chan, Soumendra Nath Lahiri, William Q. Meeker:
Block Bootstrap Estimation of the Distribution of Cumulative Outdoor Degradation. Technometrics 46(2): 215-224 (2004) - 2003
- [j8]William Q. Meeker:
Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications. Technometrics 45(3): 262-264 (2003) - 2002
- [j7]Daniel J. Nordman, William Q. Meeker:
Weibull Prediction Intervals for a Future Number of Failures. Technometrics 44(1): 15-23 (2002) - [j6]Huaiqing Wu, William Q. Meeker:
Early Detection of Reliability Problems Using Information From Warranty Databases. Technometrics 44(2): 120-133 (2002) - 2001
- [j5]Shuen-Lin Jeng, William Q. Meeker:
Parametric Simultaneous Confidence Bands for Cumulative Distributions From Censored Data. Technometrics 43(4): 450-461 (2001) - 2000
- [j4]Shuen-Lin Jeng, William Q. Meeker:
Comparisons of Approximate Confidence Interval Procedures for Type I Censored Data. Technometrics 42(2): 135-148 (2000)
1990 – 1999
- 1999
- [j3]Luis A. Escobar, William Q. Meeker:
Statistical Prediction Based on Censored Life Data. Technometrics 41(2): 113-124 (1999) - [j2]Francis G. Pascual, William Q. Meeker:
Estimating Fatigue Curves With the Random Fatigue-Limit Model. Technometrics 41(4): 277-289 (1999) - 1996
- [j1]William Q. Meeker:
System Reliability Theory: Models and Statistics Methods (Arnljot Høyland and Marvin Rausand). SIAM Rev. 38(1): 175-177 (1996)
Coauthor Index
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