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Carsten Wegener
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2010 – 2019
- 2016
- [j9]Gildas Léger
, Carsten Wegener:
Guest Editorial: Analog, Mixed-Signal and RF Testing. J. Electron. Test. 32(4): 405-406 (2016) - 2013
- [c8]Carsten Wegener:
Method of modeling analog circuits in verilog for mixed-signal design simulations. ECCTD 2013: 1-5 - 2010
- [j8]Esa Korhonen, Carsten Wegener, Juha Kostamovaara:
Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A/D Converter INL Testing With a Low-Quality Sine Wave Stimulus. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(6): 1166-1174 (2010)
2000 – 2009
- 2009
- [j7]Carsten Wegener, Heinz Mattes, Stéphane Kirmser, Frank Demmerle, Sebastian Sattler:
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores. J. Electron. Test. 25(6): 301-308 (2009) - [c7]Reik Müller, Carsten Wegener, Hans-Joachim Jentschel, Sebastian Sattler, Heinz Mattes:
An approach to linear model-based testing for nonlinear cascaded mixed-signal systems. DATE 2009: 1662-1667 - 2007
- [j6]Carsten Wegener, Michael Peter Kennedy
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing. J. Electron. Test. 23(6): 513-525 (2007) - 2006
- [j5]Carsten Wegener, Michael Peter Kennedy
Test Development Through Defect and Test Escape Level Estimation for Data Converters. J. Electron. Test. 22(4-6): 313-324 (2006) - 2005
- [j4]Carsten Wegener, Michael Peter Kennedy
Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. J. Electron. Test. 21(3): 299-310 (2005) - [c6]Carsten Wegener, Michael Peter Kennedy:
Innovation to overcome limitations of test equipment. ECCTD 2005: 309-314 - 2004
- [j3]Carsten Wegener, Michael Peter Kennedy
Testing ADCs for static and dynamic INL - killing two birds with one stone. Comput. Stand. Interfaces 26(1): 15-20 (2004) - [j2]Carsten Wegener, Michael Peter Kennedy
Linear model-based testing of ADC nonlinearities. IEEE Trans. Circuits Syst. I Regul. Pap. 51-I(1): 213-217 (2004) - 2003
- [c5]Carsten Wegener, Michael Peter Kennedy:
Linear Model-Based Error Identification and Calibration for Data Converters. DATE 2003: 10630-10635 - [c4]Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy:
Method of reducing contactor effect when testing high-precision ADCs. ITC 2003: 210-217 - 2002
- [c3]Carsten Wegener, Michael Peter Kennedy:
Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. ITC 2002: 851-860 - 2001
- [j1]Carsten Wegener, Michael Peter Kennedy
Process Deviations and Spot Defects: Two Aspects of Test and Test Development for Mixed-Signal Circuits. J. Electron. Test. 17(5): 409-416 (2001) - 2000
- [c2]Carsten Wegener, Michael Peter Kennedy:
Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. DATE 2000: 765 - [c1]Carsten Wegener, Michael Peter Kennedy:
Model-based testing of high-resolution ADCs. ISCAS 2000: 335-338
Coauthor Index
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