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Alfred L. Crouch
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2020 – today
- 2022
- [c33]Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo:
IEEE P1687.1: Extending the Network Boundaries for Test. ITC 2022: 382-390 - 2021
- [j13]Soha Alhelaly
, Jennifer Dworak, Kundan Nepal
3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations. IEEE Trans. Emerg. Top. Comput. 9(2): 774-786 (2021) - 2020
- [j12]Alfred L. Crouch, Adam W. Ley:
A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats. IEEE Instrum. Meas. Mag. 23(5): 27-32 (2020) - [c32]Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick:
Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC 2020: 1-10
2010 – 2019
- 2019
- [c31]Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song:
Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. VTS 2019: 1 - [c30]Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt:
Innovative Practices on IEEE 1687.xyz. VTS 2019: 1 - 2018
- [c29]Kareem Madkour, Zhaobo Zhang, Alfred L. Crouch, Peter L. Levin, Eve Hunter, Yu Huang:
Innovative practices on machine learning for emerging applications. VTS 2018: 1 - 2017
- [j11]Al Crouch, Michael Laisne, Martin Keim:
Generalizing Access to Instrumentation Embedded in a Semiconductor Device. Computer 50(7): 92-95 (2017) - [c28]Saurabh Gupta, Al Crouch, Jennifer Dworak, Daniel Engels:
Increasing IJTAG bandwidth and managing security through parallel locking-SIBs. ITC 2017: 1-10 - [c27]Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas
Detecting a trojan die in 3D stacked integrated circuits. NATW 2017: 1-6 - [c26]Saurabh Gupta, Jennifer Dworak, Daniel Engels, Al Crouch:
Mitigating simple power analysis attacks on LSIB key logic. NATW 2017: 1-6 - 2016
- [c25]Alfred L. Crouch, John C. Potter:
Invited - A box of dots: using scan-based path delay test for timing verification. DAC 2016: 174:1-174:6 - [c24]Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas
Using Existing Reconfigurable Logic in 3D Die Stacks for Test. NATW 2016: 46-52 - 2015
- [c23]Jennifer Dworak, Al Crouch:
A call to action: Securing IEEE 1687 and the need for an IEEE test Security Standard. VTS 2015: 1-4 - 2014
- [c22]Adam Zygmontowicz, Jennifer Dworak, Al Crouch, John C. Potter:
Making it harder to unlock an LSIB: Honeytraps and misdirection in a P1687 network. DATE 2014: 1-6 - [c21]Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter:
Board security enhancement using new locking SIB-based architectures. ITC 2014: 1-10 - 2013
- [j10]Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak:
FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. IEEE Des. Test 30(5): 6-14 (2013) - [c20]Zoe Conroy, Alfred L. Crouch:
BA-BIST: Board test from inside the IC out. ITC 2013: 1 - [c19]Jennifer Dworak, Al Crouch, John C. Potter, Adam Zygmontowicz, Micah Thornton:
Don't forget to lock your SIB: Hiding instruments using P16871. ITC 2013: 1-10 - 2012
- [c18]Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers:
Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. ITC 2012: 1-10
2000 – 2009
- 2009
- [j9]Miron Abramovici, Al Crouch:
We need more standards like IEEE 1500. IEEE Des. Test Comput. 26(1): 104 (2009) - [c17]Ken Posse, Al Crouch, Jeff Rearick:
IEEE P1687 IJTAG a presentation of current technology. ITC 2009: 1 - 2008
- [c16]Jason Doege, Alfred L. Crouch:
The Advantages of Limiting P1687 to a Restricted Subset. ITC 2008: 1-8 - 2007
- [j8]Zahi S. Abuhamdeh, Bob Hannagan, Jeff Remmers, Alfred L. Crouch:
A Production IR-Drop Screen on a Chip. IEEE Des. Test Comput. 24(3): 216-224 (2007) - [c15]Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas:
Processing High Volume Scan Test Results for Yield Learning. ISQED 2007: 293-298 - [c14]Zahi S. Abuhamdeh, Vincent D'Alassandro, Richard Pico, Dale Montrone, Alfred L. Crouch, Andrew Tracy:
Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. ITC 2007: 1-10 - [c13]Alfred L. Crouch:
IJTAG: The path to organized instrument connectivity. ITC 2007: 1-10 - 2006
- [c12]Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan:
Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. ITC 2006: 1-8 - [c11]Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote:
IEEE P1687: Toward Standardized Access of Embedded Instrumentation. ITC 2006: 1-8 - 2005
- [c10]Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts:
IJTAG (internal JTAG): a step toward a DFT standard. ITC 2005: 8 - 2004
- [c9]Alfred L. Crouch:
Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. ITC 2004: 698-703 - 2003
- [j7]Alfred L. Crouch, John C. Potter, Jason Doege:
AC Scan Path Selection for Physical Debugging. IEEE Des. Test Comput. 20(5): 34-40 (2003) - 2002
- [c8]Alfred L. Crouch:
Testing the Tester: What Broke? Where? When? Why? ITC 2002: 28 - 2001
- [j6]Jay Bedsole, Rajesh Raina, Al Crouch, Magdy S. Abadir:
Very Low Cost Testers: Opportunities and Challenges. IEEE Des. Test Comput. 18(5): 60-69 (2001) - 2000
- [j5]Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
Test Development for a Third-Version ColdFire Microprocessor. IEEE Des. Test Comput. 17(4): 29-37 (2000) - [c7]Bahram Pouya, Alfred L. Crouch:
Optimization trade-offs for vector volume and test power. ITC 2000: 873-881
1990 – 1999
- 1999
- [j4]Al Crouch:
The DFT Psychic Network. IEEE Des. Test Comput. 16(1): 96- (1999) - [c6]Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
The testability features of the 3rd generation ColdFire family of microprocessors. ITC 1999: 913-922 - 1998
- [j3]Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja:
Test Development for Second-Generation ColdFire Microprocessors. IEEE Des. Test Comput. 15(3): 70-76 (1998) - [c5]Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh:
Best Methods for At-Speed Testing? VTS 1998: 460-461 - 1997
- [j2]Al Crouch, Jeff Freeman:
Designing and Verifying Embedded Microprocessors. IEEE Des. Test Comput. 14(4): 87-94 (1997) - [c4]Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason:
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. ITC 1997: 424-432 - 1995
- [j1]Joe Circello, Greg Edgington, Dan McCarthy, James Gay, David Schimke, Steven Sullivan, Richard Duerden, Chris Hinds, Danny Marquette, Lal Sood, Al Crouch, Daniel Chow:
The superscalar architecture of the MC68060. IEEE Micro 15(2): 10-21 (1995) - 1994
- [c3]Alfred L. Crouch, Matthew Pressly, Joe Circello:
Testabilty Features of the MC 68060 Microprocessor. ITC 1994: 60-69 - [c2]Alfred L. Crouch, Rick Ramus, Colin M. Maunder:
Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. ITC 1994: 660-669
1980 – 1989
- 1989
- [c1]Andy Halliday, Greg Young, Alfred L. Crouch:
Prototype Testing Simplified by Scannable Buffers and Latches. ITC 1989: 174-181
Coauthor Index
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