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"Methodology for extracting the characteristic capacitances of a power ..."

Christoph Kerner et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343373

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Christoph Kerner, Ivan Ciofi, Thomas Chiarella, Stefaan Van Huylenbroeck:
Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques. ESSDERC 2012: 221-225

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