GaN Battery Charge Controller Guide
GaN Battery Charge Controller Guide
BQ25770G 40V, SMBus, 2- to 5-Cell, Narrow VDC Quasi Dual Phase Buck-Boost
Battery Charge Controller for GaN HEMT With System Power Monitor and Processor
Hot Monitor
– Output current limit up to 3A based on 10mΩ
1 Features sensing resistor
• TI patented quasi dual phase buck-boost narrow • 600kHz/800kHz programmable switching
voltage DC (NVDC) charger for USB-C Extended frequency
Power Range (EPR) interface platform • SMBus host control interface for flexible system
– 3.5V to 40V input range to charge 2- to 5-cell configuration
battery • High accuracy for the regulation and monitor
– Charge current up to 16.3A/30A based on – ±0.5% Charge voltage regulation
5mΩ/2mΩ sensing resistor – ±2% Charge current regulation
– Input current limit up to 8.2A/16.4A based on – ±2% Input current regulation
10mΩ/5mΩ sensing resistor – ±2% Input/charge current monitor
– Support USB 2.0, USB 3.0, USB 3.1, USB-C • Safety
power delivery and extended power range input – Thermal regulation and thermal shutdown
current setting – Input, system, battery overvoltage protection
– Input Current Optimizer (ICO) to extract max – Input, MOSFET, inductor overcurrent protection
input power without overloading the adapter • Package: 36-Pins 4.0mm × 5.0mm WQFN
– Integrated Fast Role Swap (FRS) feature
following USB-PD specification 2 Applications
– Seamless transition between quasi dual phase • Standard notebook PC,Chromebook
buck, buck-boost, and boost operations • Appliances: battery charger,Oxygen concentrator
– Input current and voltage regulation (IINDPM
and VINDPM) against source overload 3 Description
– Battery supplements system when adapter is The BQ25770G is a synchronous NVDC buck-boost
fully loaded battery charge controller to charge a 2- to 5-cell
• TI patented dual ramdom spread spectrum battery from a wide range of input sources including
(DRSS) for meeting IEC-CISPR 32 EMI USB adapter, extended power range (EPR) USB-
specification C Power Delivery (PD) sources, standard power
• TI patented Pass Through Mode (PTM) for >99% range (SPR) USB-C Power Delivery (PD) sources
efficiency and battery fast charging support and traditional adapters. The device offers a low
• IMVP8/IMVP9 compliant system features for Intel component count, high efficiency solution for space
platform constrained, 2- to 5-cell battery charging applications.
– Enhanced Vmin Active Protection (VAP) mode
The NVDC configuration allows the system to be
supplements battery from input capacitors
regulated based on battery voltage, but not drop
during system peak power spike following latest
below system minimum voltage. The system keeps
Intel specification
operating even when the battery is completely
– Comprehensive PROCHOT profile
discharged or removed. When load power exceeds
– Two level discharge current limit PROCHOT
input source rating, the battery goes into supplement
profile to avoid battery wear out
mode and prevents the system from crashing.
– System power monitor (PSYS)
• Input and battery current monitor through Package Information
dedicated pins PART PACKAGE BODY SIZE
PACKAGE(1)
• Integrated 16-bit ADC to monitor voltage, current NUMBER SIZE(2) (NOM)
and power BQ25770G REE (WQFN, 36)
4.00 mm × 4.00 mm ×
• Battery MOSFET ideal diode operation in 5.00 mm 5.00 mm
supplement mode (1) For all available packages, see Section 13.
• Power up USB port from battery (USB OTG) (2) The package size (length × width) is a nominal value and
– 3V to 5V OTG includes pins, where applicable.
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
BQ25770G
SLUSFK8 – APRIL 2024 www.ti.com
During power up, the charger sets the converter to a buck, boost, or buck-boost configuration based on the
input source and battery conditions. The charger seamlessly transits between the buck, boost, and buck-boost
operation modes without host control. The TI patented quasi dual phase converter can interleave dual phase
under high power buck mode helping thermal distribution and reduce each inductor size. At same time it only
needs two boost side switching MOSFETs to save overall system area and cost due to limited power operation
under boost mode.
In the absence of an input source, the BQ25770G supports the USB On-the-Go (OTG) function from a 2- to
5-cell battery to generate an adjustable 3V to 5V output on VBUS with 20mV resolution.
When only a battery powers the system and no external load is connected to the USB OTG port, the BQ25770G
implements the latest Intel Vmin Active Protection (VAP) feature, in which the device charges up the VBUS
voltage from the battery to store some energy in the input decoupling capacitors. During a system peak power
spike, the energy stored in the input capacitors supplements the system, to prevent the system voltage from
dropping below the minimum system voltage and causing a system crash.
The BQ25770G monitors adapter current, battery current, and system power. The flexibly programmable
PROCHOT output goes directly to the CPU for throttling back when needed.
The latest version of the USB-C PD specification includes Fast Role Swap (FRS) to ensure power role swapping
occurs in a timely fashion so that the device(s) connected to the dock can avoid experiencing momentary power
loss or glitching. This device integrates FRS in compliance with the PD specification.
TI patented switching frequency dithering pattern can significantly reduce EMI noise over the whole conductive
EMI frequency range (150kHz to 30MHz). Multiple dithering scale options are available and provide flexibility for
different applications. The ditherring feature greatly simplify EMI noise filter design.
The charger operate in the TI patented Pass Through Mode (PTM) to improve efficiency over the full load range.
In PTM, input power directly pass through the charger to the system. Switching losses of the MOSFETs and
inductor core loss can be saved thus achieving high efficiency operation.
The BQ25770G is available in a 36-pin 4mm × 5mm WQFN package.
VIN VSYS
Q5
Q4
RSR
Q3
VBAT
LODRV1_A
HIDRV1_A
HIDRV1_B
LODRV1_B
ACP_B
ACN_B
HIDRV2
LODRV2
SW1_B
Table of Contents
1 Features............................................................................1 7.6 BQ25770G Registers................................................55
2 Applications..................................................................... 1 8 Application and Implementation................................ 113
3 Description.......................................................................1 8.1 Application Information............................................113
4 Device Comparison Table...............................................4 8.2 Typical Application.................................................. 113
5 Pin Configuration and Functions...................................5 9 Power Supply Recommendations..............................123
6 Specifications.................................................................. 8 10 Layout.........................................................................124
6.1 Absolute Maximum Ratings........................................ 8 10.1 Layout Guidelines................................................. 124
6.2 ESD Ratings .............................................................. 8 10.2 Layout Example.................................................... 125
6.3 Recommended Operating Conditions.........................9 11 Device and Documentation Support........................127
6.4 Thermal Information....................................................9 11.1 Device Support......................................................127
6.5 Electrical Characteristics.............................................9 11.2 Documentation Support........................................ 127
6.6 Timing Requirements................................................ 20 11.3 Receiving Notification of Documentation Updates 127
6.7 Typical Characteristics BQ25770G........................... 21 11.4 Support Resources............................................... 127
7 Detailed Description......................................................24 11.5 Trademarks........................................................... 127
7.1 Overview................................................................... 24 11.6 Electrostatic Discharge Caution............................ 127
7.2 Functional Block Diagram......................................... 25 11.7 Glossary................................................................ 127
7.3 Feature Description...................................................26 12 Revision History........................................................ 127
7.4 Device Functional Modes..........................................50 13 Mechanical, Packaging, and Orderable
7.5 Programming............................................................ 51 Information.................................................................. 128
LODRV1_B
HIDRV1_B
BTST1_B
REGN_B
LODRV2
HIDRV2
SW1_B
BTST2
36
35
34
33
32
31
30
29
LODRV1_A 1 28 SW2
REGN_A 2 27 VSYS
BTST1_A 3 26 BATDRV
HIDRV1_A 4 25 SRP
SW1_A 5 24 SRN
Bottom Pad
VBUS 6 23 CELL_BATPRES
ACN_B 7 22 CMPIN_TR
PGND
ACP_B 8 21 CMPOUT
ACN_A 9 20 SCL
ACP_A 10 19 SDA
18
17
12
13
14
15
16
11
CHRG_OK
EN_OTG
ILIM_HIZ
IADPT
MODE
IBAT
PROCHOT
PSYS
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
MIN MAX UNIT
ACN_A, ACP_A,ACN_B,ACP_B,VBUS, VSYS –0.3 45
SW1_A, SW1_B, SW2 –2 45
SRN, SRP –0.3 30
BATDRV –0.3 35
BTST1_A, BTST1_B, HIDRV1_A, HIDRV1_B –0.3 50
BTST2, HIDRV2 –0.3 50
LODRV1_A,LODRV1_B, LODRV2 (25nS) –4 5.5
Voltage HIDRV1_A,HIDRV1_B (25nS) –4 50 V
HIDRV2 (25nS) –4 50
SW1_A,SW1_B (25nS) –4 45
SW2 (25nS) –4 45
SDA, SCL, REGN_A,REGN_B, CHRG_OK, CELL_BATPRES, ILIM_HIZ,
–0.3 5.5
LODRV1_A, LODRV1_B, LODRV2, CMPIN_TR, CMPOUT, MODE, EN_OTG
/PROCHOT –0.3 5.5
IADPT, IBAT, PSYS –0.3 3.6
BTST1_A-SW1_A, BTST1_B-SW1_B, BTST2-SW2, HIDRV1_A-
–0.3 5.5
Differential Voltage SW1_A,HIDRV1_B-SW1_B, HIDRV2-SW2, BATDRV-SRP V
SRP-SRN, ACP_A-ACN_A,ACP_B-ACN_B –0.3 0.3
Temperature Junction temperature range, TJ –40 150
°C
Temperature Storage temperature, Tstg –55 150
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated
under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
Input current regulation accuracy with IIN_HOST() = 0x074H 2800 2900 3000 mA
IIIN_DPM_REG_ACC
10-mΩ ACP/ACN series resistor IIN_HOST() = 0x024H 800 900 1000 mA
IIN_HOST() = 0x010H 300 400 510 mA
VIREG_DPM_RNG_ILI Voltage range for input current
1.15 4.0 V
M regulation (ILIM_HIZ Pin)
VILIM_HIZ = 3.0 V 4800 5000 5200 mA
Input Current Regulation Accuracy on
IIIN_DPM_REG_ACC_I ILIM_HIZ pin VILIM_HIZ = 1 V + 40 × VILIM_HIZ = 2.2 V 2800 3000 3200 mA
LIM IIIN_DPM × RAC, with 10-mΩ ACP/ACN VILIM_HIZ = 1.4 V 800 1000 1200 mA
series resistor
VILIM_HIZ = 1.2 V 300 500 700 mA
ILEAK_ILIM ILIM_HIZ pin leakage current –1 1 µA
INPUT VOLTAGE REGULATION
OTG CURRENT REGULATION
OTG output current regulation range VIOTG_REG = VACP_A – VACN_A +VACP_B
VIOTG_REG_RNG 100 3000 mA
with 10-mΩ ACP/ACN series resistor - VACN_B
VCELL_BATPRES_FAL
Battery is removed CELL_BATPRES falling 14.7%
L
96 100
95 99
94
93 98
92 97
91 96
Efficiency(%)
Efficiency(%)
90
89 95
88 94
87 93
86
85 92
84 VOUT=7.4V 91
83 VOUT=11.1V 90 VOUT=7.4V
82 VOUT=14.8V VOUT=11.1V
81 89 VOUT=14.8V
VOUT=18.5V
80 88
0 1 2 3 4 5 6 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Output Current(A) Output Current(A)
VIN = 5 V CCM 600 kHz VOUT = System voltage VIN = 15V CCM 600 kHz VOUT = System voltage
Figure 6-1. System Efficiency Figure 6-2. System Efficiency
100 100
99 99
98 98
97 97
96
96
Efficiency(%)
Efficiency(%)
95
95
94
94
93
93
92
91 92
VOUT=7.4V VOUT=7.4V
90 VOUT=11.1V 91 VOUT=11.1V
VOUT=14.8V VOUT=14.8V
89 90
VOUT=18.5V VOUT=18.5V
88 89
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
Output Current(A) Output Current(A)
VIN = 20 V CCM 600 kHz VOUT = System voltage VIN = 28 V CCM 600 kHz VOUT = System voltage
Figure 6-3. System Efficiency Figure 6-4. System Efficiency
100 95
99
90
98
85
97
96 80
Efficiency(%)
Efficiency(%)
95
75
94
93 70
92 65
91 VOUT=7.4V VOUT=7.4V
60
90 VOUT=11.1V VOUT=11.1V
VOUT=14.8V 55 VOUT=14.8V
89 VOUT=18.5V VOUT=18.5V
88 50
0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Output Current(A) Output Current(A)
VIN = 36 V CCM 600 kHz VOUT = System voltage VIN = 5 V EN_OOA = 0b VOUT = System voltage
Figure 6-5. System Efficiency Figure 6-6. Light Load System Efficiency
90 90
85 85
80 80
Efficiency(%)
Efficiency(%)
75 75
70 70
65 65
60 VOUT=7.4V 60 VOUT=7.4V
VOUT=11.1V VOUT=11.1V
55 VOUT=14.8V 55 VOUT=14.8V
VOUT=18.5V VOUT=18.5V
50 50
0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2 0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Output Current(A) Output Current(A)
VIN = 15 V EN_OOA = 0b VOUT = System voltage VIN = 20 V EN_OOA = 0b VOUT = System voltage
Figure 6-7. Light Load System Efficiency Figure 6-8. Light Load System Efficiency
95 95
90 90
85 85
80 80
Efficiency(%)
Efficiency(%)
75 75
70 70
65 65
60 VOUT=7.4V 60 VOUT=7.4V
VOUT=11.1V VOUT=11.1V
55 VOUT=14.8V 55 VOUT=14.8V
VOUT=18.5V VOUT=18.5V
50 50
0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2 0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Output Current(A) Output Current(A)
VIN = 28 V EN_OOA = 0b VOUT = System voltage VIN = 36 V EN_OOA = 0b VOUT = System voltage
Figure 6-9. Light Load System Efficiency Figure 6-10. Light Load System Efficiency
100
95 VBAT=8V
VBAT=12V 98
93
VBAT=16V
91 VBAT=20V 96
89 94
Efficiency(%)
Efficiency(%)
87 92
85 90
83 88
81 86
79 84
77 82 VIN=15V
VIN=20V
75 80
0 1 2 3 0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Output Current(A) Output Current(A)
VOTG= 5 V CCM 600 kHz VOUT = VIN EN_PTM=1b
Figure 6-11. OTG Efficiency Figure 6-12. PTM Mode Ligh Load System Efficiency
96 0.1
Error (%)
95 0
94 -0.1
93 -0.2 VIN=5V
VIN=15V
92 -0.3 VIN=20V
91 VIN=15V -0.4 VIN=28V
VIN=20V VIN=36V
90 -0.5
0 2 4 6 8 10 12 14 16 5 7 9 11 13 15 17 19 21 23
Output Current(A) Charge Voltage setting(V)
VOUT = VIN EN_PTM=1b ICHG = 1024 mA CCM 600 kHz
Figure 6-13. PTM Mode Heavy Load System Efficiency Figure 6-14. Battery Voltage Regulation Accuracy
50 50
VIN=5V 40 VIN=5V
40 VIN=15V VIN=15V
30
30 VIN=20V 20 VIN=20V
VIN=28V VIN=28V
10
20 VIN=36V VIN=36V
ICHG Error (mA)
0
10
Error (mA)
-10
-20
0
-30
-10 -40
-50
-20
-60
-30 -70
-80
-40
-90
-50 -100
0 2 4 6 8 10 12 14 16 18 0 1 2 3 4 5 6 7 8 9
ICHG setting(A) IINDPM setting(A)
VBAT = 14.8 V CCM 600 kHz VBAT = 14.8 V CCM 600 kHz IINDPM set
Figure 6-15. Battery Charge Current Regulation Accuracy =0.4~8.2 A
Figure 6-16. Input Current Regulation Accuracy (IIN_DPM)
1
0.8
0.6
0.4
0.2
Error (%)
0
-0.2
-0.4 VIN=5V
VIN=15V
-0.6 VIN=20V
-0.8 VIN=28V
VIN=36V
-1
3 5 7 9 11 13 15 17 19 21
VSYS_MIN setting(V)
VBAT = 0.5 V CCM 600 kHz EN_OOA = 0b
Figure 6-17. Minimum System Voltage Regulation Accuracy
7 Detailed Description
7.1 Overview
The BQ25770G is a Narrow VDC buck-boost charger controller for portable electronics such as notebook,
detachable, ultrabook, tablet, and other mobile devices with rechargeable batteries. It provides seamless
transition between different converter operation modes (buck, boost, or buck-boost), fast transient response,
and high light load efficiency.
The BQ25570G supports a wide range of power sources, including USB-C PD EPR ports, legacy USB ports,
traditional AC-DC adapters, and so forth. It takes input voltage from 3.5 V to 40 V and charges a battery of 2 to
5-cell in series. In the absence of an input source, the BQ25770G supports the USB On-the-Go (OTG) function
from a cell battery to generate an adjustable 3 V to 5 V at the USB port with 20-mV resolution.
The BQ25770G features Dynamic Power Management (DPM) to limit input power and avoid AC adapter
overloading. During battery charging, as system power increases, charging current is reduced to maintain total
input current below adapter rating. If system power demand temporarily exceeds adapter rating, the BQ25770G
supports the NVDC architecture to allow battery discharge energy to supplement system power.
The BQ25770G monitors adapter current, battery current, and system power. The flexibility of the programmable
PROCHOT output goes directly to the CPU for throttling back when needed.
The latest version of the USB-C PD specification includes Fast Role Swap (FRS) to ensure power role swapping
occurs in a timely fashion so that the device(s) connected to the dock never experience momentary power loss
or glitching. The device integrates FRS with compliance to the USB-C PD specification.
The TI patented switching frequency dithering pattern can significantly reduce EMI noise over the entire
conductive EMI frequency range (150 kHz to 30 Mhz). Multiple dithering scale options are available to provide
flexibility for different applications to simplify EMI noise filter design.
In order to be compliant with Intel IMVP8 / IMVP9, the BQ25770G includes a PSYS function to monitor the total
platform power from the adapter and battery. Besides PSYS, it provides both an independent input current buffer
(IADPT) and a battery current buffer (IBAT) with highly accurate current sense amplifiers. If the platform power
exceeds the available power from the adapter and battery, a PROCHOT signal is asserted to the CPU so that
the CPU optimizes its performance to the power available to the system.
The host controls input current, charge current, and charge voltage registers with high resolution, high accuracy
regulation limits. It also sets the PROCHOT timing and threshold profile to meet system requirements.
ACOV VTR_SNS =1
41V 1.2V
CMPIN_TR_SELECT CMPIN_TR
CMP_DEG
=0
VREF_VINDPM or VREF_VOTG
CMPOUT
VSNS_VINDPM or VSYS_VOTG CMPIN_TR_SELECT
ILIM_HIZ EN_HIZ PP_THERMAL
Decoder VREF_ILIM SRN EN_TREG
ChargeBump
VSNS_VBAT LODRV1_A
VSYS VREF_VSYS PGND
VSNS_VSYS COMP1() REGN_A
COMP2()
LODRV2
VSNS_VSYS
ACN VSNS_VBAT
PSYS
(ACP_A-ACN_A)+(ACP_B-ACN_B) VSNS_ICHG Over Current BTST2
SRN
VSNS_IDCHG Over Voltage
(SRN-SRP) VSNS_IIN_DPM Detect HIDRV2
VSNS_VINDPM
EN_HIZ
SW2
Communicaon EN_LEARN
BATPRES
SDA Interface EN_LDO
ChargeOp on0() EN_CHRG CELL_CONFIG Decoder CELL_BATPRES
ChargeOpon1() EN_OTG
ChargeOpon2() VREF_VSYS
SCL CHARGE_CURRENT() IADPT
VREF_VBAT Processor
IBAT
CHARGE_VOLTAGE() VREF_ICHG PROCHOT
Loop VSYS Hot
IIN_HOST() VREF_IIN_DPM
EN_OTG Regulaon CHRG_OK
VINDPM() VREF_VINDPM
Reference
VSYS_MIN() VREF_IOTG
OTG_VOLTAGE() VREF_VOTG Dual /Single Phase PIN
OTG_CURRENT() CMPIN/TREG Program MODE
Fsw Decoder
pin. Host should configure REGN_EXT=1b to reduce internal REGN LDO regulation output voltage to be
VREGN_REG_EXT(4.5V), then external 5V regulator can over drive to internal LDO automatically.
• When external 5V source is above VREGN_OV_RISE, the charger should stop switching, pull down CHRG_OK
pin and trigger FAULT_REGN status bit referring to Section 7.3.26.11.
VSYS VBUS
BTST2
BTST1_B
BTST1_A
VSYS VBUS
RG=500k
PG
500mA REGN_A
External Current Current Power
Buck 5V V5V LDO limiter1 VSYS
limit Selector
QBLK 4.5V
REGN_B LS Gate Drive &
Loads on internal bias
5V Rail
BTST1_B
BTST1_A
BTST2
Figure 7-2. External 5-V Source with Load Over Drive REGN
The power dissipation for driving the gates via the REGN LDO is: PREGN = (VAC - VREGN) QG(TOT)*fSW , where
QG(TOT) is the sum of the total gate charge for all practical switching FETs (1A,1B,2A,2B,3 and 4) and fSW is the
programmed switching frequency.
Under battery only condition, it is flexible to configure REGN on and off through below method:
VDD
CMPIN_TR
–
RCMP1
1.2V
RCMP2
+
CMP_POL=1b comparator hysteresis:
5V* RCMP1/RCMP2
Example: RCMP1=10k;RCMP2=1M
CMPOUT Comparator Hysteresis is 50mV
The comparator has a dedicated force converter off protection feature which can be triggered through external
system circuit. To enable this feature, set FRC_CONV_OFF=1b. Then, when the comparator output is low, the
converter will be turned off, FAULT_FRC_CONV_OFF will be set to 1b, and the CHRG_OK pin will be pulled
low to inform the host EC. When the comparator output returns to high, the FAULT_FRC_OFF bit is cleared and
the converter resumes switching automatically. Upon adapter removal, force converter off fault should be cleared
one time, if the comparator is still triggered low then the fault should be re-triggered again to keep converter
disabled.
No matter CMPIN_TR pin function selection, it always has dedicated ADC channel which can be enabled though
setting EN_ADC_CMPIN=1b.
Under battery only low power mode (EN_LWPWR=1b), there is a dedicated user register bit EN_LWPWR_CMP
to enable independent comparator with minimum quiescent current consumption. When EN_LWPWR_CMP=1b
the independent comparator is enabled.
7.3.5 Battery Charging Management
The device charges 2-cell up-to 5-cell Li-Ion batteries. The charge cycle can be fully controlled by host, or it can
be autonomous (requiring no host interaction).
7.3.5.1 Autonomous Charging Cycle
When autonomous battery charging is enabled (EN_AUTO_CHG=1b, CHRG_INHIBIT=0b and
CHARGE_CURRENT() register is not 0 mA), the device autonomously completes a charging cycle without
host involvement. The battery charging parameters can be programmed by CHARGE_VOLTAGE() and
CHARGE_CURRENT(). The host can always control the charging operation and optimize the charging
parameters by writing to the corresponding registers.
An autonomous charge cycle starts when the following conditions are valid:
• Converter starts up
• Battery autonomous charge is enabled (EN_AUTO_CHG = 1b)
• CHARGE_CURRENT() register is not 0 mA
• CHRG_INHIBIT bit is not 1b
• No SYSOVP/VSYS_UVP/ACOC/TSHUT/BATOVP/BATDOC/SC_VBUSACP/Force converter off faults
• No safety timer fault
The device automatically terminates the charging cycle when the charging current is below termination
threshold, charge voltage is above recharge threshold, and device is not in DPM mode. When a full battery
voltage is discharged below recharge threshold (threshold selectable via VRECHG[3:0] bits), the device
automatically starts a new charging cycle. After the charge is terminated automatically, changing CHRG_INHIBIT
bit from 1b to 0b or CHARGE_CURRENT() from 0A to non zero value can initiate a new charging cycle.
The status register (CHRG_STAT) indicates the different charging phases as:
• 000 – Not Charging
• 001 – Trickle Charge (VBAT < VBAT_SHORT)
• 010 – Pre-charge (VBAT_SHORT < VBAT < VSYS_MIN() setting)
• 011 – Fast-charge (CC mode)
• 100 – Taper Charge (CV mode)
• 101 – Reserved
• 110 – Reserved
• 111 – Charge Termination Done
7.3.5.2 Battery Charging Profile
The device charges the battery in four phases: trickle charge, pre-charge, constant current, constant voltage.
At the beginning of a charging cycle, the device checks the battery voltage and regulates current/voltage
accordingly. If autonomous charging is enabled, automatic termination can be achieved and automatic recharge
will begin when VBAT drops below certain value of CHARGE_VOLTAGE(), user registers VRECHG bits are used
to configure battery re-charge threshold.
When charger is in trickle charge status (VBAT<VBAT_SHORT) and EN_LDO=1b, charge current is upper limited
by IBAT_SHORT to prevent battery from overcurrent charge and wake up battery pack. The practical charge current
should be the lower value of CHARGE_CURRENT() and IBAT_SHORT to provide EC flexibility to program trickle
charge current following battery package request. Note when EN_LDO=0b, IBAT_SHORT current clamp is not
effective and provide EC flexibility to program charge current through CHARGE_CURRENT() register.
When charger is in pre-charge status (VBAT_SHORT<VBAT<VSYS_MIN()) and EN_LDO=1b, charge current is
the lower value of IPRECHG() and CHARGE_CURRENT() setting; and the maximum charge current is limited
by maximum setting of IPRECHG() which is 2048mA to prevent overheat generated on BATFET. Under this
condition larger VSYS_MIN() minus VBAT delta and larger charge current should generate more thermal
dissipation at BATFET which should be properly limited to ensure safe operation. Therefore the device has
additional two levels current clamp to ensure the maximum BATFET dissipation loss below 2W based on
the relationship between VBAT and VSYS_MIN() setting referring to Table 7-9. Note when EN_LDO=0b, pre-
charge current limit (IPRECHG()) is not effective and provide EC flexibility to program charge current through
CHARGE_CURRENT() register.
Table 7-3. Default Charging Current Setting
VBAT CONDITION CHARGING CURRENT DEFAULT SETTING CHRG_STAT
VBAT< VBAT_SHORT IBAT_SHORT 128mA 001
VBAT_SHORT<VBAT< VSYS_MIN() IPRECHG 384mA 010
VSYS_MIN()<VBAT<CHARGE_V CHARGE_CURRENT() 0A (need host to configure based 011
OLTAGE() on battery request)
If the charger device is in DPM regulation during charging, the actual charging current will be less than the
programmed value. In this case, termination is temporarily disabled and the charging safety timer is counted at
half the clock rate, as detailed in Charging Safety Timer section.
CHARGE_VOLTAGE()
VRECHG Battery Voltage
CHARGE_CURRENT()
ICHG
Charge Current
VSYS_MIN()
VBAT_SHORT
IPRECHG()
ITERM()
IBAT_SHORT
CHARGE_CURRENT() when re-charge condition is detected to restart charging. The converter keeps running to
power the system and the BATFET can turn on again if the supplement mode is triggered.
When termination is done, the status register CHRG_STAT is set to 111b. The charger can be configured to pull
down CHRG_OK pin for minimum 256 μs to inform host that charging is terminated when CHRG_OK_INT bit is
set to 1b. Termination is temporarily disabled when the charger device is in input current (IINDPM), input voltage
(VINDPM) or TREG thermal regulation. The deglitch times for determining IINDPM active and VINDPM active is
1 ms, and deglitch times for determining TREG active is 10 ms.
7.3.5.4 Charging Safety Timer
The device has a built-in fast charge safety timer to prevent extended charging cycle due to abnormal
battery conditions. The user can program fast charge safety timer through CHG_TMR register bits. When
safety timer expires, charging should stop through setting CHARGE_CURRENT() to 0A. The status register
CHG_TMR_STAT bit is set to 1 and CHRG_STAT bits will be set to 000b(not charging), and CHRG_OK pin
can be configured to be pulled low for minimum 256us to inform host if CHRG_OK_INT=1b. CHG_TMR_STAT
bit will keep its 1b status until safety timer gets reset. The safety timer feature can be disabled by clearing
EN_CHG_TMR bit.
During IINDPM and VINDPM regulation, or TREG thermal regulation, the safety timer counts at half clock rate
as the actual charge current is likely to be below the programmed setting. For example, if the charger is in input
current regulation throughout the whole charging cycle, and the safety timer is set to 5 hours, then the timer
will expire in 10 hours. This half clock rate feature can be disabled by setting EN_TMR2X = 0. Changing the
EN_TMR2X bit while the device is running has no effect on the safety timer count, other than forcing the timer to
count at half the rate under the conditions dictated above. The deglitch times for determining IINDPM active and
VINDPM active is 1ms, and deglitch times for determining TREG active is 10ms.
During faults which disable charging, timer is suspended. Since the timer is not counting in this state,
the EN_TMR2X bit has no effect. Once the fault goes away, safety timer resumes. If the charging cycle
is stopped and started again, the timer gets reset (toggle CHRG_INHIBIT bit restarts the timer, change
CHARGE_CURRENT() register from non zero to zero and then non zero, charged battery falls below recharge
threshold after termination).
The safety timer is reset for the following events:
1. Charging cycle stop and restart (toggle CHRG_INHIBIT bit, or charge-terminated battery falls below
recharge threshold after termination, or change CHARGE_CURRENT() register from zero and then non
zero)
2. BAT voltage changes from pre-charge to fast-charge or vice versa
3. Safety Timer (CHG_TMR[1:0]) register bits are changed
4. Toggle EN_CHG_TMR bit, when EN_CHG_TMR becomes 0b, the safety timer should be reset and count
from beginning when re-enable again(EN_CHG_TMR=1b)
The pre-charge safety timer (fixed 2hr counter that runs when VBAT < VSYS_MIN()), follows the same rules as
the fast-charge safety timer in terms of getting suspended, reset, and counting at half-rate when EN_TMR2X is
set. Note pre-charge safety timer applies to both pre-charge and trickle charge phase.
7.3.6 Temperature Regulation (TREG)
In high power application, monitoring and controlling external component temperature can enhance reliability by
limiting the total converter power under certain scenarios. The CMPIN_TR pin can be configured as temperature
regulation feedback sensing pin when CMPIN_TR_SELECT=1b. It is the temperature feedback pin temperature
regulation loop. The external voltage divider circuit is shown in Figure 7-5 consisting of RS and NTC resistor
RTH. External NTC is placed where temperature is regulated (for example charger power stage) and generates
feedback voltage on CMPIN_TR pin based on temperature variation. When temperature is lower than target, the
voltage should be above 1.2 V, temperature regulation is not effective and TREG_STAT=0b ; As temperature
increases, CMPIN_TR pin voltage drops to VTREG=1.2 V or lower , converter begin to reduce converter current
and regulate CMPIN_TR voltage to stay at 1.2 V and set TREG_STAT=1b which is locked until host read or
REG_RESET bit action.
RS
Internal
CMPIN_TR
TREG
Loop
100k
1 F
RTH
CMPIN_TR_SELECT
EN_TREG
PP_THERMAL CMPOUT
The target temperature regulation value can be chosen through configuring RS fixed resistor. A 10k NTC
thermistor(ERTJ0EG103FA) is recommended in this application, corresponding RS fixed value can be calculated
through equation below. The RS corresponding value at 60ºC/80ºC/100ºC TREG refers to Table 7-4. The
corresponding CMPIN_TR pin voltage with swept temperature under 60ºC/80ºC/100ºC TREG configuration can
be found in Figure 7-6. Based on this graph, besides temperature regulation function, the NTC temperature can
also be measured through CMPIN_TR pin voltage. The device has a dedicated CMPIN_TR pin voltage ADC
channel which can be enabled through setting EN_ADC_CMPIN=1b.
There is a dedicated PROCHOT profile in case regulation target gets overheat more than TREG target. The
profile can enabled through setting PP_THERMAL=1b referring to Figure 7-10.
RS = 5V1.2V
− 1.2V
*RNTC @TREG (1)
Table 7-4. CMPIN_TR Pin RC Network Configuration Reference Based on ERTJ0EG103FA NTC
RS TREG TEMPERATURE
9.53kΩ 60ºC
5.23kΩ 80ºC
3.01kΩ 100ºC
Figure 7-6. CMPIN_TR Pin Voltage vs Temperature Under Different Regulation Target (60°C/80°C/100°C)
PRCHOT#
removal detected
VSYS_TH1 VSYS_TH2
Start discharging CBUS + +
VBUS_VAP_TH
+
IDCHG_TH2
IDCHG_TH1
0A
/PROCHOT
A maximum 100-pF capacitor is recommended to connect on the output for decoupling high-frequency noise. An
additional RC filter is optional. Note that RC filtering has additional response delay. The IADPT and IBAT output
voltages are clamped at 3.2 V.
7.3.20.2 High-Accuracy Power Sense Amplifier (PSYS)
The charger monitors total system power. During forward mode, the input adapter powers the system. During
reverse OTG mode and battery only discharge scenario, the battery powers the system and VBUS output. The
ratio of PSYS pin output current and total system power, KPSYS, can be programmed in PSYS_RATIO register bit
with default 1 μA/W. The input and charge sense resistors (RAC and RSR) are selected in RSNS_RAC bit and
RSNS_RSR bit. If PSYS_CONFIG=00b then PSYS voltage can be calculated with Equation 2, where IIN_A/IIN_B
>0 when the charger is in forward charging and IIN_A/IIN_B <0 when charger is in OTG operation; where IBAT<0
when the battery is in charging and IBAT>0 when battery is discharging.
For proper PSYS functionality, RAC practical value is limited to 10 mΩ or 5 mΩ and should be consistent with
RSNS_RAC register setting; RSR practical value is limited to 5 mΩ or 2 mΩ and should be consistent with
RSNS_RSR register setting.
Charger can block IBAT contribution to above equation by setting PSYS_CONFIG =01b in forward mode and
block IBUS contribution to above equation by setting PSYS_OTG_IDCHG=1b.
To minimize the quiescent current, the PSYS function is disabled by default PSYS_CONFIG = 11b.
Table 7-8. PSYS Configuration Table
OTG
PSYS_OTG_IDCHG FORWARD MODE PSYS
CASE # PSYS_CONFIG BITS MODE PSYS
BITS CONFIGURATION
CONFIGURATION
1 00b 0b PSYS=PBUS+PBAT PSYS=PBUS+PBAT
2 00b 1b PSYS=PBUS+PBAT PSYS=PBAT
3 01b 0b PSYS=PBUS PSYS=0
4 01b 1b PSYS=PBUS PSYS=0
5 11b Xb PSYS=0(Disabled) PSYS=0(Disabled)
in ADCOption registers [7:0] bits. The device will immediately reset ADC_EN to 0b when all ADC channels are
disabled.
The ADC is allowed to operate if either the VBUS>VVBUS_CONVEN or VBAT>VVBAT_UVLOZ is valid. If no adapter
is present (VBUS<VVBUS_CONVENZ), and the VBAT is less than VVBAT_UVLO, the device will not perform an ADC
measurement, nor update the ADC read-back values. Additionally, the device will immediately reset ADC_EN to
0b. If the charger changes mode (for example, if adapter is connected) while an ADC conversion is running, the
conversion is interrupted. Once the mode change is complete, the ADC resumes conversion, starting with the
channel where it was interrupted.
The ADC_SAMPLE bits control the resolution of the ADC, and also determine conversion time of tADC_CONV
based on resolution. The total conversion time of one cycle ADC of all channels enabled can be estimated
using channel counts multiplied by the corresponding tADC_CONV determined by ADC_SAMPLE setting. If an
ADC channel is disabled by setting the corresponding bit, then the read-back value in the corresponding register
will be from the last valid ADC conversion or the default POR value (all zeros if no conversions have taken
place). If an ADC parameter is disabled in the middle of an ADC measurement cycle, the device will finish the
conversion of that parameter, but will not convert the parameter starting the next conversion cycle. Even though
no conversion takes place when all ADC measurement parameters are disabled, the ADC circuitry is active and
ready to begin conversion as soon as one of the bits in ADCOption register[7:0] is set to ‘1’.
ADC conversion operates independently of the faults present in the device. ADC conversion will continue even
after a fault has occurred (such as one that causes the power stage to be disabled), and the host must set
ADC_EN to ‘0b’ in order to disable the ADC. ADC conversion is interrupted upon adapter plug-in, and will
only resume after REGN regulator is enabled from the input. ADC readings are only valid for DC states and
not for transients. When host disables ADC by setting ADC_EN to 0b, the ADC stops immediately, and ADC
measurement values correspond to last valid ADC reading.
If the host wants to exit continuous ADC more gracefully, it is possible to do either of the following:
1. Write ADC_RATE to one-shot, and the ADC will stop at the end of a complete cycle of conversions, or
2. Disable all ADC conversion channels, and the ADC will stop at the end of the current measurement.
When system load is powered from the battery (input source is removed, or device in HIZ mode), enabling the
ADC automatically powers up REGN and increases the quiescent current. To keep the battery leakage low, it is
recommended to duty cycle or completely disable the ADC.
7.3.23 Input Current Optimizer (ICO)
Even though the IINDPM and VINDPM features are useful to keep the system load running when reaching the
adapter limit. However, the adapter will overheat when keeping it running at its current and voltage limit for a
long period of time. Thus it is preferred to operate the adapter under its current rating is preferred.
The charger includes innovative automatic Input Current Optimizer (ICO) to maximize the power of input source
with input current limit higher than 500 mA. Below is the steps to execute ICO function:
• Make sure system can power up by the adapter and battery can be charged in CC phase
• Set VINDPM() register value to slightly below the adapter voltage with full load specification
• Set IIN_HOST() register value to the maximum amount of input current limit the user would like to sink on
VBUS
• Disable external ILIM_HIZ by setting EN_EXTILIM=0b. When ICO is disabled, IIN_DPM register value should
be the same as IIN_HOST.
• Set charge current in CHARGE_CURRENT register to design specification which should be high enough to
support ICO evaluation
• Enable ICO test by setting EN_ICO_MODE=1b, and wait for approximately 2sec, and check the ICO_DONE
status bit. If this bit goes to 1, ICO is completed
• After ICO_DONE=1b, read back ICO result in IIN_DPM register for current adapter. Value in IIN_HOST
register is not changed by ICO. If the host sets EN_ICO_MODE bit back to zero, the IIN_DPM returns to the
setting in IIN_HOST. To continue use the optimal input current limit identified by ICO, it is recommended to
read IIN_DPM register after ICO is done and write this value back to IIN_HOST.
ILIM2
INOM
ILIM1
TOVLD
TOVLD
TMAX TMAX
IBUS
ISYS
IBAT 0A
Baery Discharge
PROCHOT PROCHOT_WIDTH
is asserted if the system power is too high. Once CPU receives PROCHOT pulse from charger, it slows down to
reduce system power. The events monitored by the processor hot function include:
• ICRIT: adapter peak current, as 110% of ILIM2
• INOM: adapter average current (110% of IIN_DPM)
• IDCHG1: battery discharge current level 1
• IDCHG2: battery discharge current level 2. Note that IDCHG2 threshold is always larger than IDCHG1
threshold, determined by IDCHG_TH2 register setting.
• VBUS_VAP: VBUS threshold to trigger PROCHOT in VAP mode
• VSYS: system voltage on VSYS.
• Adapter Removal: upon adapter removal (PROCHOT pin is one time falling edge trigger when VBUS falls
below VVBUS_CONVENZ threshold and deglitch time is within 1 μs. If triggered, STAT_ADAPTER_REMOVAL bit
will be set to 1b, it will be high until clear through host read or REG_RESET bit. The status bit is level trigger
which means if VBUS is still below VVBUS_CONVENZ when status bit gets cleared, then the status bit should be
triggered again immediately)
• Battery Removal: upon battery removal (PROCHOT pin is one time falling edge trigger when
CELL_BATPRES pin voltage falls below VCELL_BATPRES_FALL and deglitch time is within 1 μs. If triggered
STAT_BATTERY_REMOVAL bit will be set to 1b, it will be locked until clear through host read or
REG_RESET bit. The status bit is also falling edge trigger which means if CELL_BATPRES pin is still below
VCELL_BATPRES_FALL when status bit gets cleared, the status bit will still be cleared to 0b)
• CMPOUT: Independent comparator output (CMPOUT pin HIGH to LOW)
• VINDPM: VBUS lower than 83%/91%/100% of VINDPM setting. The effective threshold PROCHOT_VINDPM
is determined by combination of register PROCHOT_VINDPM_80_90 bit and LOWER_PROCHOT_VINDPM
bit:
– PROCHOT_VINDPM=VINDPM register setting: LOWER_PROCHOT_VINDPM=0b;
– PROCHOT_VINDPM=83% VINDPM register setting:
LOWER_PROCHOT_VINDPM=1b;PROCHOT_VINDPM_80_90=0b;
– PROCHOT_VINDPM=91% VINDPM register setting:
LOWER_PROCHOT_VINDPM=1b;PROCHOT_VINDPM_80_90=1b;
• EXIT_VAP: Every time when the charger exits VAP mode.
• THERMAL: If enabled (PP_THERMAL=1b), then when the CMPIN_TR pin voltage is lower than VTREG_PP for
1s/100ms (THERMAL_DEG bit configurable) deglitch time. Then STAT_THERMAL will be latched until clear
through host read or REG_RESET bit.
The thresholds of ICRIT, IDCHG1,IDCHG2,VSYS or VINDPM, and the deglitch times of ICRIT, INOM, IDCHG1,
IDCHG2, or CMPOUT are programmable. Except for the PROCHOT_EXIT_VAP which is always enabled, the
other triggering events can be individually enabled in ProchotOption1[7:0], PP_IDCHG2 and PP_VBUS_VAP.
When any enabled event in PROCHOT profile is triggered, PROCHOT is asserted low for a single pulse
with minimal width programmable in PROCHOT_WIDTH register bits. At the end of the single pulse, if the
PROCHOT event is still active, the pulse gets extended until the event is removed.
If the PROCHOT pulse extension mode is enabled by setting EN_PROCHOT_EXT= 1b, the PROCHOT pin will
be kept as low until host writes PROCHOT_CLEAR= 1b, even if the triggering event has been removed.
If the PROCHOT_VINDPM or PROCHOT_EXIT_VAP is triggered, PROCHOT pin will always stay low until
the host clears it, no matter the PROCHOT is in one pulse mode or in extended mode. In order to clear
PROCHOT_VINDPM, host needs to write 0 to STAT_VINDPM. In order to clear PROCHOT_EXIT_VAP, host
needs to write 0 to STAT_EXIT_VAP.
PP_ICRIT
IADPT
+
Adjustable Deglitch
ICRIT ICRIT_DEG
Low Pass
Filter PP_INOM
+
Adjustable Deglitch EXIT_VAP
INOM INOM_DEG (triggered by IN_VAP 1.05V
falling edge)
PP_IDCHG2
IDCHG2
+
IDCHG_VTH2 Adjustable Deglitch
IDCHG_DEG2
PROCHOT
PP_IDCHG1
IDCHG1
+
IDCHG_VTH1 Adjustable Deglitch
IDCHG_DEG1 PROCHOT_WIDTH
Debounce
PP_VSYS
VSYS_VTH2 +
VSYS
PROCHOT_WIDTH
bits setting
PP_VINDPM
Adjustable Deglitch
A*VINDPM + THERMAL_DEG
VBUS
Fixed Deglitch
727ns(min)/
PP_VBUS_VAP 800ns(typical)/
889ns(max)
VBUS_VAP_TH +
PP_TREG + PP_ACOK
+
PP_BATPRES PP_CMP
Fixed Deglitch
727ns(min)/800ns(typical)/889ns(max) VTREG_PP VVBUS_CONVENZ
• Set EN_LWPWR_CMP = 1b, CMP_POL=1b and PP_CMP=1b, charger monitors system voltage. Connect
CMPIN to voltage proportional to system voltage. PROCHOT triggers from HIGH to LOW when comparator
triggers low effective with VSYS falls below certain threshold .
1.2 V PROCHOT
Independent
Comparator
CMPIN
Voltage v VSYS
When the charge current is higher than the threshold after 1-μs deglitch time, BATCOC fault is triggered,
CHARGE_CURRENT() register is reset back to 0A and BATFET should be turned off accordingly. Status bit
FAULT_BATCOC is set and it can only be cleared by host read after 1 second latch time. The above actions
are only executed one time after triggered. During this 1 second latch time, non-zero value cannot be written
into CHARGE_CURRENT(). In order to recover charging, host need to re-write non-zero CHARGE_CURRENT()
register value after it triggers for 1 second. Note this protection only turns off BATFET to disable charge it should
not influence BATFET supplement mode turn on state machine. Also the CHRG_OK pin is not influenced under
BATCOC fault to avoid unnecessary interference to customer system.
When charger LDO mode is disabled (EN_LDO=0b), then BATFET will be either fully on or fully off status. When
charge is disabled the system voltage is regulated at 5 V (VBAT< 5 V) or VBAT+160 mV (VBAT>5 V); however
when charge is enabled then VSYS will be regulated close to VBAT to implement target charging current and
VSYS_MIN regulation is not effective.
7.3.26.9 Sleep Comparator Protection Between VBUS and ACP_A (SC_VBUSACP)
Under forward mode, it is allowed to add an optional PFET or efuse between VBUS and ACP_A pin which can
help shut off converter when there is dead short on Q1_A or Q1_B. Since the turn on delay on PFETs and eFuse
is not fixed, sleep comparator protection is employed to ensure PFETs or eFuse is turned on when converter
starts up. This sleep comparator is enabled by default (EN_SC_VBUS_ACP=1b) and can be disabled through
EN_SC_VBUS_ACP=0b. When it is enabled, charger monitors delta voltage between VBUS and ACP_A and
triggers to shuts off converter if VBUS-ACP_A is larger than VSC_VBUSACP_rising. It is non-latch fault and in order
to resume switching VBUS-ACP_A has to be smaller than VSC_VBUSACP_falling. The comparator deglitch time is
tSC_VBUSACP_DEG for both rising trigger and falling return. After protection is triggered converter shuts off and
FAULT_SC_VBUSACP bit is set accordingly and can be cleared by a host read, note CHRG_OK pin is not
pulled down during this fault, because the CHRG_OK pin needs to be high to turn on PFET or eFuse.
7.3.26.10 High Duty Buck Exit Comparator Protection (HDBCP)
Under HIGH_DUTY_BUCK=1b configuration, in order to prevent reverse boosting operation when VBUS is
unplugged or reduced lower than VSYS, a dedicated comparator will force converter to exit high duty buck
mode by forcing HIGH_DUTY_BUCK=0b. If VSYS is higher than 97.5% of VBUS, after 15-μs deglitch time the
charger force HIGH_DUTY_BUCK back to 0b. As long as the comparator is triggered the charger should prevent
HIGH_DUTY_BUCK bit from being set to 1b. HDBCP is an non-latch protection, if VSYS drops below 97.5% of
VBUS minus hysteresis (80 mV), after 15-μs deglitch time HIGH_DUTY_BUCK bit is released and can be written
to 1b to enter high duty buck operation.
7.3.26.11 REGN Power Good Protection (REGN_PG)
There is a dedicated REGN power good protection to guarantee converter switching under preferred gate drive
voltage range. When REGN voltage is below VREGN_OK_FALL or above VREGN_OV_RISE, after 100-μs deglitch time
FAULT_REGN status bit will be set from 0b to 1b, converter shuts off and CHRG_OK pin is pulled down to
inform host. When REGN is re-qualified above VREGN_OK_RISE and below VREGN_OV_FALL for more than 100 μs,
CHRG_OK pin should also be released and converter resume switching automatically. The FAULT_REGN status
bit can be cleared after host read as long as the fault condition is removed.
7.3.26.12 System Under Voltage Lockout (VSYS_UVP) and Hiccup Mode
The charger VSYS_UVP is enabled by default (VSYS_UVP_ENZ=0b) and can be disabled by writing
VSYS_UVP_ENZ=1b. This protection is mainly defined to protect converter from system short circuit under
both startup and steady state process. VSYS pin is used to monitor the system voltage, system under voltage
lockout threshold is configurable through VSYS_UVP register bits (2.4 V upon POR), there is 2-ms deglitch
time and the IIN_DPM is clamped to 0.5 A (VBUS<14.4V)/0.3A(VBUS>14.4V) to limit short circuit current. Detail
protection process is slightly different based on whether hiccup mode is enabled:
If hiccup mode is enabled VSYS_UVP_NO_HICCUP = 0b, after 2-ms deglitch time, the charger should shut
down for 500 ms.The charger will restart for 10 ms if VSYS is still lower than 2.4 V, the charger should shut down
again. This hiccup mode will be tried continuously, if the charger restart is failed for 7 times in 90 second, the
charger will be latched off. FAULT_VSYS_UVP bit will be set to 1 to report a system short fault and CHRG_OK
pin is pulled accordingly. The charger only can be enabled again by writing FAULT_VSYS_UVP bit to 0b, then
CHRG_OK pin can be released. Note as long as system voltage is below VSYS_UVP threshold, then IIN_DPM
is also internally clamped to 0.5 A (VBUS<14.4V)/0.3A(VBUS>14.4V) to limit short circuit.
If hiccup mode is disabled VSYS_UVP_NO_HICCUP = 1b. After 2-ms deglitch time, the charger should shut
down and latched off. FAULT_VSYS_UVP bit will be set to 1 to report a system short fault and CHRG_OK pin
is pulled accordingly. The charger only can be enabled again once the host writes FAULT_VSYS_UVP bit to 0b,
then CHRG_OK pin can be released.
7.3.26.13 OTG Mode Over Voltage Protection (OTG_OVP)
While operating in reverse direction, the device monitors the VBUS voltage. When VBUS exceeds VVBUS_OTG_OV
there is 20-mA discharge current flow through VBUS pin. After VBUS exceeds VVBUS_OTG_OV for 10-ms
deglitch time, the device stops switching, and and clear EN_OTG bit to 0b and exit OTG mode. When
the event is triggered, the FAULT_OTG_OVP read only bit is triggered and CHRG_OK pin is pulled low if
OTG_ON_CHRGOK=1b. The FAULT_OTG_OVP bit can be cleared through EC host read. In order to re-start
OTG mode, EC host has to re-enable OTG mode by setting EN_OTG bit to 1b.
state changes only while SCL is low, except for the start and stop conditions. Data is transmitted in 8-bit bytes
and is sampled on the rising edge of SCL. Nine clock cycles are required to transfer each byte in or out of the
device because either the host or the target acknowledges the receipt of the correct byte during the ninth clock
cycle. The BQ25770G supports the charger commands listed in Table 7-10.
SCL
SDA
B = MSB of address clocked into target I = Target pulls SMBDATA line low
E = Target pulls SMBDATA line low L = Stop condition, data executed by target
SCL
SDA
B = MSB of address clocked into target H = LSB of data clocked into controller
Complex bit access types are encoded to fit into small table cells. Table 7-13 shows the codes that are used for
access types in this section.
Table 7-13. BQ25770G Access Type Codes
Access Type Code Description
Read Type
R R Read
Write Type
W W Write
Reset or Default Value
-n Value after reset or the default
value
7 6 5 4 3 2 1 0
EN_CMP_LATC VSYS_UVP_EN EN_LEARN IADPT_GAIN IBAT_GAIN EN_LDO EN_IIN_DPM CHRG_INHIBIT
H Z
R/W-0h R/W-0h R/W-0h R/W-0h R/W-1h R/W-1h R/W-1h R/W-0h
7 6 5 4 3 2 1 0
CHARGE_CURRENT RESERVED
R/W-0h R-0h
7 6 5 4 3 2 1 0
CHARGE_VOLTAGE RESERVED
R/W-0h R-0h
7 6 5 4 3 2 1 0
ITERM
R/W-20h
7 6 5 4 3 2 1 0
HIDRV2_STAT LODRV2_STAT VSYS_REG_SL RESERVED
OW
R/W-3h R/W-3h R/W-0h R-0h
7 6 5 4 3 2 1 0
SINGLE_DUAL_TRANS_TH FORCE_SINGL PH_ADD_DEG PH_DROP_DEG
E
R/W-4h R/W-0h R/W-1h R/W-1h
7 6 5 4 3 2 1 0
EN_TMR2X EN_CHG_TMR EN_TREG PP_THERMAL STAT_THERMA THERMAL_DE ACOV_ADJ
L G
R/W-1h R/W-1h R/W-0h R/W-0h R-0h R/W-0h R/W-2h
7 6 5 4 3 2 1 0
FAULT_BATOV RESERVED FAULT_OCP RESERVED FAULT_REGN RESERVED
P
R-0h R-0h R-0h R-0h R-0h R-0h
7 6 5 4 3 2 1 0
FAULT_ACOV FAULT_BATDO FAULT_ACOC FAULT_SYSOV FAULT_VSYS_ FAULT_FRC_C FAULT_OTG_O FAULT_OTG_U
C P UVP ONV_OFF VP VP
R-0h R-0h R-0h R/W-0h R/W-0h R-0h R-0h R-0h
7 6 5 4 3 2 1 0
STAT_VINDPM STAT_COMP STAT_ICRIT STAT_INOM STAT_IDCHG1 STAT_VSYS STAT_BATTER STAT_ADAPTE
Y_REMOVAL R_REMOVAL
R/W-0h R-0h R-0h R-0h R-0h R-0h R-0h R-0h
7 6 5 4 3 2 1 0
IIN_DPM RESERVED
R-C8h R-0h
7 6 5 4 3 2 1 0
ADC_VBUS
R-0h
7 6 5 4 3 2 1 0
ADC_IBAT
R-0h
7 6 5 4 3 2 1 0
ADC_IIN
R-0h
7 6 5 4 3 2 1 0
ADC_VSYS
R-0h
7 6 5 4 3 2 1 0
ADC_VBAT
R-0h
7 6 5 4 3 2 1 0
ADC_PSYS
R-0h
7 6 5 4 3 2 1 0
ADC_CMPIN_TR
R-0h
7 6 5 4 3 2 1 0
SYSOVP_MAX CMP_POL CMP_DEG FRC_CONV_O EN_PTM EN_SHIP_DCH EN_SC_VBUS
FF G ACP
R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h R/W-1h
7 6 5 4 3 2 1 0
EN_EXTILIM EN_ICHG_IDC OCP_SW2_HIG OCP_SW1X_HI EN_ACOC ACOC_VTH EN_BATDOC BATDOC_VTH
HG H_RANGE GH_RANGE
R/W-1h R/W-0h R/W-1h R/W-1h R/W-0h R/W-1h R/W-1h R/W-1h
7 6 5 4 3 2 1 0
BATFET_ENZ RESERVED OTG_VAP_MO IL_AVG CMP_EN BATFETOFF_H PSYS_OTG_ID
DE IZ CHG
R/W-0h R-0h R/W-1h R/W-2h R/W-1h R/W-0h R/W-0h
7 6 5 4 3 2 1 0
VSYS_TH1 INOM_DEG LOWER_PROC
HOT_VINDPM
R/W-Eh R/W-0h R/W-1h
7 6 5 4 3 2 1 0
PP_VINDPM PP_CMP PP_ICRIT PP_INOM PP_IDCHG1 PP_VSYS PP_BATPRES PP_ACOK
R/W-1h R/W-0h R/W-1h R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h
7 6 5 4 3 2 1 0
EN_ADC_CMPI EN_ADC_VBU EN_ADC_PSY EN_ADC_IIN RESERVED EN_ADC_IBAT EN_ADC_VSY EN_ADC_VBAT
N S S S
R/W-0h R/W-0h R/W-0h R/W-0h R-0h R/W-0h R/W-0h R/W-0h
7 6 5 4 3 2 1 0
IDCHG_DEG2 IDCHG_TH2 PP_IDCHG2 STAT_IDCHG2 STAT_PTM
R/W-1h R/W-1h R/W-0h R-0h R-0h
7 6 5 4 3 2 1 0
VSYS_TH2 EN_VSYSTH2_ EN_FRS
FOLLOW_VSY
STH1
R/W-9h R/W-0h R/W-0h
7 6 5 4 3 2 1 0
OTG_VOLTAGE RESERVED
R/W-FAh R-0h
7 6 5 4 3 2 1 0
OTG_CURRENT RESERVED
R/W-78h R-0h
7 6 5 4 3 2 1 0
VINDPM RESERVED
R/W-A0h R-0h
7 6 5 4 3 2 1 0
VSYS_MIN
R/W-528h
7 6 5 4 3 2 1 0
IIN_HOST RESERVED
R/W-C8h R-0h
7 6 5 4 3 2 1 0
AUTOTUNE_B
R-0h
7 6 5 4 3 2 1 0
FORCE_AUTOTUNE_B
R/W-A8h
7 6 5 4 3 2 1 0
FORCE_GM_ADJUST FORCE_GM_A FORCE_AUTO
DJUST_EN TUNE_EN
R/W-31h R/W-1h R/W-1h
7 6 5 4 3 2 1 0
REG_RESET RESERVED EN_EXTILIM RESERVED WD_RST WDTMR_ADJ
R/W-0h R-0h R/W-1h R-0h R/W-0h R/W-3h
7 6 5 4 3 2 1 0
MANUFACTURE_ID
R-40h
7 6 5 4 3 2 1 0
DEVICE_ID
R-Ah
10nF+1nF
1x10uF Q1_B Q4
4x10uF RAC_B=10m 5m E-GAN
1uF 9x10uF 2x10uF
10nF+1nF 3.3uH 0.1uF
1x10uF Q1_A 1.0uF
1x33uF~2x33uF 4x10uF E-GAN
(POSCAP Optional)
Schoky
3.3uH 100nF Q2_B diode Q3 10 10
33nF 33nF
Schoky 2.2uF
100nF
Q2_A
100nF diode REGN
BTST2
SW1_B
LODRV2
HIDRV2
BTST1_B
REGN_B
HIDRV1_B
LODRV1_B
SW2
33nF VSYS
33nF
LODRV1_A
2.2uF BATDRV
REGN_A
REGN SRP
BTST1_A
SRN
HIDRV1_A
REGN
SW1_A
350k
CELL_BATPRES Indicate baery BATT
250k removal
100nF
ACN_A BQ25770G 300k
ACP_A
1 PGND CMPIN_TR REGN
RS
ACN_B
100nF RTH
ACP_B
CMPOUT
VBUS
470nF
SCL
PROCHOT
CHRG_OK
ILIM_HIZ
EN_OTG
REGN Host
IADPT
MODE
SDA
PSYS
IBAT
200k (SMBus)
1uF
300k 1.05V
50
100pF 100pF 3.57k 15k
To CPU
<=10uF
CAC MLCC
RACP_A RACN_A
4.99ohm 4.99ohm
10nF(0402)1nF(0402)
CACP_A CACN_A
100nF
33nF 33nF
ACP_A ACN_A
ACP_B ACN_B
CACP_B CACN_B
33nF 100nF 33nF
RACP_B RACN_B
4.99ohm RAC_B 4.99ohm Q1_B
<=10uF
MLCC
10nF(0402)1nF(0402)
The inductor ripple current in buck operation depends on input voltage (VIN), duty cycle (DBUCK = VOUT/VIN),
switching frequency (fS) and inductance (L):
Low ESR ceramic capacitor such as X7R or X5R is preferred for input decoupling capacitor and should be
placed in front of RAC current sensing and as close as possible to the power stage half bridge MOSFETs.
Capacitance after RAC before power stage half bridge should be limited to10μF+10nF+1nF referring to Figure
8-2 diagram. Voltage rating of the capacitor must be higher than normal input voltage level, 35 V rating or
higher capacitor is preferred for 28 V input voltage. Minimum 10 pieces of 10-µF 0603 size capacitors are
suggested for 28V/140 W adapter design. 50-V rating or higher capacitor is preferred for 36-V input voltage.
Minimum 10*10μF 0805 capacitors are needed when power reaches 36 V/180 W. Under different input voltage
the minimum input capacitance requirement is summarized in Table 8-2, Table 8-3 and Table 8-4. For quasi dual
phase it is recommended to spread the MLCC caps before RAC_A and RAC_B. 1*10nF+1nF 0402 package
MLCC capacitors (EMI filter purpose) are recommended to be placed as close as possible to both phase A and
phase B half bridge MOSFETs.
Ceramic capacitors show a dc-bias effect. This effect reduces the effective capacitance when a dc-bias voltage
is applied across a ceramic capacitor, as on the input capacitor of a charger. The effect may lead to a significant
capacitance drop, especially for high input voltages and small capacitor packages. See the manufacturer's data
sheet about the derating performance with a dc bias voltage applied. It may be necessary to choose a higher
voltage rating or nominal capacitance value in order to get the required capacitance value at the operating point.
Tantalum capacitors (POSCAP) can avoid dc-bias effect and temperature variation effect which is recommended
especially for 28-V and 36-V higher power application.
Table 8-2. Input Capacitance Requirement for 20-V/100-W System
20-V/100-W SYSTEM MINIMUM TYPICAL MAXIMUM
Effective input capacitance 4 μF (MLCC) OTG is not needed 4 μF (MLCC) + 15 μF (POSCAP) 4 μF (MLCC) + 2*33 μF
8 μF (MLCC) OTG is needed (POSCAP)
Practical input capacitors 10*10 μF OTG is not needed 10*10 μF (0603 35 V MLCC 10*10 μF (0603 35 V MLCC
configuration (0603 35 V MLCC derating to derating to around 6% under 28- derating to around 6% under 28-
around 6% under 28-V bias V bias voltage ) V bias voltage )
voltage) 1*15 μF (2917 35 V POSCAP) 2*33 μF (2917 35 V POSCAP)
It is common under higher system power the total next stage (Vcore) input capacitance could be increased
accordingly. These capacitance are also counted as charger system output capacitance. When these
capacitance is too large it could also influence controller stability and maximum effective output capacitance
are listed below for reference.
Table 8-6. Maximum Output Capacitance Requirement
OUTPUT CAPACITORS vs TOTAL INPUT
100 W 140 W 180 W
POWER
Maximum Effective Output Capacitance 500 μF 800 μF 800 μF
Maximum output capacitors along VSYS 5*100 μF (2917 35 V 8*100 μF (2917 35 V 8*100 μF (2917 35 V
distribution line, input cap of next stage POSCAP with <100 mΩ ESR POSCAP with <100 mΩ ESR POSCAP with <100 mΩ ESR
converter can also be counted. for each) for each)
for each) VBUS<=28 V
8*100 μF (2917 50 V
POSCAP with <100 mΩ ESR
for each) VBUS=36 V
Buck Half bridge (Q1_A,Q2_A,Q1_B,Q2_B) BVDSS=30 V or higher BVDSS=40 V or higher BVDSS=60 V or higher
Boost Half bridge (Q3,Q4) and BATFET (Q5) BVDSS=30 V or higher BVDSS=30 V or higher BVDSS=40 V or higher (for
Buck HS short fault condition
safety)
Figure-of-merit (FOM) is usually used for selecting proper MOSFET based on a tradeoff between the conduction
loss and switching loss. For the top side MOSFET, FOM is defined as the product of a MOSFET's on-resistance,
RDS(ON), and the gate-to-drain charge, QGD. For the bottom side MOSFET, FOM is defined as the product of the
MOSFET's on-resistance, RDS(ON), and the total gate charge, QG.
The lower the FOM value, the lower the total power loss. Usually lower RDS(ON) has higher cost with the same
package size.
The top-side MOSFET loss includes conduction loss and switching loss. Taking buck mode operation as
an example the power loss is a function of duty cycle (D=VOUT/VIN), charging current (ICHG), MOSFET's on-
resistance (RDS(ON)_top), input voltage (VIN), switching frequency (fS), turn-on time (ton) and turn-off time (toff):
The first item Pcon_top represents the conduction loss which is straight forward. The second term Psw_top
represents the multiple switching loss items in top MOSFET including voltage and current overlap losses
(PIV_top), MOSFET parasitic output capacitance loss (PQoss_top) and gate drive loss (PGate_top). To calculate
voltage and current overlap losses (PIV_top):
PIV_top =0.5x VIN · Ivalley · ton· fS+0.5x VIN · Ipeak · toff · fS (11)
• ton is the MOSFET turn-on time that VDS falling time from VIN to almost zero (MOSFET turn on conduction
voltage);
• toff is the MOSFET turn-off time that IDS falling time from Ipeak to zero;
The MOSFET turn-on and turn-off times are given by:
QSW Q
t on = , t off = SW
Ion Ioff (14)
where Qsw is the switching charge, Ion is the turn-on gate driving current, and Ioff is the turn-off gate driving
current. If the switching charge is not given in MOSFET datasheet, it can be estimated by gate-to-drain charge
(QGD) and gate-to-source charge (QGS):
Gate driving current can be estimated by REGN voltage (VREGN), MOSFET plateau voltage (Vplt), total turn-on
gate resistance (Ron), and turn-off gate resistance (Roff) of the gate driver:
• Qoss is the MOSFET parasitic output charge which can be found in MOSFET data sheet;
To calculate top MOSFET gate drive loss (PGate_top):
• QGate_top is the top MOSFET gate charge which can be found in MOSFET data sheet;
• Note here VIN is used instead of real gate drive voltage 6 V because, the gate drive 6 V is generated based
on LDO from VIN under buck mode, the total gate drive related loss are all considered when VIN is used for
gate drive loss calculation .
The bottom-side MOSFET loss also includes conduction loss and switching loss:
The first item Pcon_bottom represents the conduction loss which is straight forward. The second term Psw_bottom
represents the multiple switching loss items in bottom MOSFET including reverse recovery losses (PRR_bottom),
Dead time body diode conduction loss (PDead_bottom) and gate drive loss (PGate_bottom). The detail calculation can
be found below:
• Qrr is the bottom MOSFET reverse recovery charge which can be found in MOSFET data sheet;
Figure 8-9. Switching During Boost Mode Figure 8-10. Switching During Buck Boost Mode
Figure 8-11. System Regulation in Buck Mode Figure 8-12. System Regulation in Buck Boost
Mode
Figure 8-13. System Regulation in Boost Mode Figure 8-14. Input Current Regulation in Buck
Mode
Figure 8-15. Input Current in Buck Boost Mode Figure 8-16. Input Current in Boost Mode
Figure 8-17. OTG Voltage Ramp Up After Enable Figure 8-18. OTG Voltage Power Off After Disable
Figure 8-19. OTG Load Transient Figure 8-20. Dual Phase Current Balance at 36 V
180 W
Figure 8-21. Automatic Second Phase Adding and Figure 8-22. Automatic Second Phase Adding and
Dropping Under 36-V VBUS Dropping Under 28-V VBUS
Figure 8-23. Peak Power Mode VSYS Trigger Figure 8-24. Peak Power Mode IBUS Trigger
10 Layout
10.1 Layout Guidelines
Proper layout of the components to minimize high frequency current path loop (see Section 10.2) is important
to prevent electrical and magnetic field radiation and high frequency resonant problems. Here is a PCB layout
priority list for proper layout.
Table 10-1. PCB Layout Guidelines
RULES COMPONENTS FUNCTION IMPACT GUIDELINES
1 PCB layer stack up Thermal, efficiency, Multi- layer PCB is suggested. Allocate at least one ground layer.
signal integrity The BQ2577xG EVM uses a 6-layer PCB (top layer, ground
layer, signal layer and bottom layer).
2 CBUS, RAC_A, Input loop High frequency VBUS capacitors, RAC_A, RAC_B, Q1_A, Q1_B and Q2_A,
RAC_B, Q1_A, noise, ripple Q2_B form two small loops 1 and 2. It is best to put them
Q1_B, Q2_A, on the same side. Connect them with large copper to reduce
Q2_B the parasitic resistance. Move part of CBUS to the other
side of PCB for high density design. After RAC_A, RAC_B
before Q1_A, Q1_B and Q2_A, Q2_B power stage recommend
to put 10uF(0603/0805 package)+10nF+1nF(0402 package)
decoupling capacitors as close as possible to IC to decoupling
switching loop high frequency noise.
3 RAC_A, RAC_B, Current path Efficiency The current path from VBUS to VSYS, through RAC_A, RAC_B,
Q1_A, Q1_B, L1, Q1_A, Q1_B, L1, Q4, has low impedance. Pay attention to via
Q4 resistance if they are not on the same side. The number of vias
can be estimated as 1~2A/via for a 10mil via with 1 oz copper
thickness.
4 CSYS, Q3, Q4 Output loop High frequency VSYS capacitors, Q3 and Q4 form a small loop 3. It is best to
noise, ripple put them on the same side. Connect them with large copper to
reduce the parasitic resistance. Move part of CSYS to the other
side of PCB for high density design.
5 QBAT, RSR Current path Efficiency, battery Place QBAT and RSR near the battery terminal. The current
voltage detection path from VBAT to VSYS, through RSR and QBAT, has low
impedance. Pay attention to via resistance if they are not on the
same side. The device detects the battery voltage through SRN
near battery terminal.
6 Q1_A, Q1_B, Power stage Thermal, efficiency Place Q1_A and Q2_A, Q1_B and Q2_B, L1, Q3 and Q4 next to
Q2_A, Q2_B, L1, each other. Allow enough copper area for thermal dissipation.
Q3, Q4 The copper area is suggested to be 2x~4x of the pad size.
Multiple thermal vias can be used to connect more copper layers
together and dissipate more heat.
7 RAC_A, RAC_B, Current sense Regulation accuracy Use Kelvin-sensing technique for RAC_A, RAC_B and RSR
RSR current sense resistors. Connect the current sense RAC_A,
RAC_B to the center of the pads, and run current sense traces
as differential pairs.
8 Small capacitors IC bypass caps Noise, jittering, Place VBUS cap, VCC cap, REGN caps near IC.
ripple
9 BTST capacitors HS gate drive High frequency Place HS MOSFET boost strap circuit capacitor close to IC and
noise, ripple on the same side of PCB board. Capacitors SW1_A/SW1_B/2
nodes are recommended to use wide copper polygon to connect
to power stage and capacitors BTST1_A/BTST1_B/BTST2 node
are recommended to use at least 8mil trace to connected to IC
BTST1_A/BTST1_B/BTST2 pins.
Figure 10-1. Quasi Dual Phase Buck-Boost Charger Layout Reference Example Top View
Figure 10-2. Quasi Dual Phase Buck-Boost Charger Top Layer PCB Overview
11.7 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
12 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
DATE REVISION NOTES
April 2024 * Initial Release
www.ti.com 15-May-2024
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
BQ25770GREER ACTIVE WQFN REE 36 3000 RoHS & Green NIPDAU Level-1-260C-UNLIM -40 to 125 Q25770G Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 16-May-2024
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Sprocket Holes
Q1 Q2 Q1 Q2
Pocket Quadrants
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 16-May-2024
Width (mm)
H
W
Pack Materials-Page 2
PACKAGE OUTLINE
REE0036A WQFN - 0.8 mm max height
SCALE 3.300
4.1 B
A
3.9
5.1
4.9
C
0.8 MAX
SEATING PLANE
0.05
0.00 0.08
2X 2.8
2.8
2.6 (0.1) TYP
11 18
4X (0.41)
32X 0.4
10 19
2X SYMM 3.8
3.6
3.6
1 28 0.25
36X
0.15
PIN 1 ID 36 29
SYMM 0.1 C A B
0.5 0.05
36X
0.3
4226725/A 04/2021
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
www.ti.com
EXAMPLE BOARD LAYOUT
REE0036A WQFN - 0.8 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
(3.8)
2X (2.8)
(2.7)
36 29
36X (0.6)
32X (0.2)
1 28
32X (0.4)
37 SYMM (4.8)
(3.7)
2X (0.625) 2X (3.6)
2X (0.975)
10
19
(R0.05) TYP
11 18 ( 0.2) TYP
2X (1.1)
SYMM
4226725/A 04/2021
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
www.ti.com
EXAMPLE STENCIL DESIGN
REE0036A WQFN - 0.8 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
(3.8)
2X (2.8)
6X (1.19)
36 29
36X (0.6)
1
28
36X (0.2) 6X
(1.05)
32X (0.4)
2X (3.6)
SYMM
(4.8)
2X (1.25)
10
19
(R0.05)
TYP
11 18
2X (0.7)
SYMM
EXPOSED PAD
75% PRINTED SOLDER COVERAGE BY AREA
SCALE:20X
4226725/A 04/2021
NOTES: (continued)
5. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
www.ti.com
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