SEL-2:
. .
Test Object - Device Settings
.. . .
Substation/Bay:
Substation: Benin Substation address: Onitsha Line - 1
Bay: Onitsha Line-1 Bay address:
. . .
Device:
Name/description: Benin /Onitsha Line-2 Manufacturer:
Device type: SEL421 Device address: F211
Serial/model number: 2010088256
Additional info 1:
Additional info 2:
. . .
Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 110.0 V V primary: 330.0 kV
I nom (secondary): 1.000 A I primary: 1.600 kA
. . .
Residual Voltage/Current Factors:
VLN / VN: 1.732 IN / I nom: 1.000
. . .
Limits:
V max: 120.0 V I max: 10.00 A
. . .
Debounce/Deglitch Filters:
Debounce time: 5.000 ms Deglitch time: 0.000 s
. . .
Overload Detection:
Suppression time: 50.00 ms
Test Object - Other RIO Functions
.
CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
52a/b % 52a/b % 20.00 %
Test Object - Distance Settings
. . . .
System parameters:
Line length: 23.44 Ω Line angle: 83.00 °
PT connection: at line CT starpoint: Dir. line
Impedance correction no
1A/I nom:
Impedances in primary no
values:
. . . .
Tolerances:
Tol. T rel.: 1.000 %
Tol. T abs. +: 100.0 ms Tol. T abs. -: 100.0 ms
Tol. Z rel.: 5.000 % Tol. Z abs.: 100.0 mΩ
. . . .
Grounding factor:
kL mag.: 0.700239 kL angle: -13.689322°
Separate arc resistance: no
Zone Settings:
Label Type Fault loop Trip time Tol.T rel Tol.T abs+ Tol.T abs- Tol.Z rel. Tol.Z abs
Z1 Tripping L-L 0.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z1 Tripping L-E 0.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z2 Tripping L-L 350.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z2 Tripping L-E 350.0 ms 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z3 Tripping L-L 1.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z3 Tripping L-E 1.000 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
Z4 Tripping L-L 1.200 s 1.000 % 100.0 ms 100.0 ms 5.000 % 100.0 mΩ
X/Ω
100
80
60
40
20
-20
-40
-60
-80
0 25 50 75 100 125 150 175 200
R/Ω
Linked XRIO References
Reference Name Unit Value XRIO Path
RIO.DEVICE.NOMINALVALUES.INO In 1.00 A RIO/Device/Nominal Values/In
M
Comment
. .
Test Module
Name: OMICRON Advanced Distance Version: 2.30
Test Start: 27-Jan-2013 01:04:19 Test End: 27-Jan-2013 01:08:06
User Name: Manager:
Company:
Test Settings
.
Test model:
Test model: constant test current ITest 500.0 mIn
Allow reduction of no kS = kL: no
ITest/VTest:
ZS mag.: 0.000 Ω ZS angle: 0.00 °
kS mag.: 1.000 kS angle: 0.00 °
.
Fault Inception:
Mode: Maximum offset
DC-offset: no
.
Times:
Prefault: 500.0 ms Max. fault: 1.200 s
Postfault: 100.0 ms Time reference: fault inception
.
Other:
Extended zones: not active Switch off at zero crossing: no
Load current enabled: no Load current:: n/a
.
Search Settings:
Search res. rel.: 1.000 % Search res. abs.: 50.00 mΩ
Ignore nominal no
characteristics:
Search interval: 200.0 mΩ
.
Auxiliary Binary Outputs:
Name Fault inception Slope Trip Delay time Slope
Delay time
Ext. zones active n/a Open n/a Open
Test Results
Shot Test: Fault Type L1-E
|Z| Phi % % of t nom t act. Dev. ITest Result
21.09 Ω 40.00 ° n/a 0.000 s 31.00 ms 31.00 ms 500.0 mIn Passed
34.05 Ω 20.00 ° n/a 0.000 s 32.30 ms 32.30 ms 500.0 mIn Passed
15.31 Ω 83.00 ° n/a 0.000 s 31.80 ms 31.80 ms 500.0 mIn Passed
25.65 Ω 93.03 ° n/a 350.0 ms 393.5 ms 12.43 % 500.0 mIn Passed
31.50 Ω 50.00 ° n/a 350.0 ms 391.5 ms 11.86 % 500.0 mIn Passed
55.00 Ω 24.62 ° n/a 350.0 ms 392.0 ms 12 % 500.0 mIn Passed
72.80 Ω 15.95 ° n/a 350.0 ms 391.7 ms 11.91 % 500.0 mIn Passed
42.65 Ω 95.18 ° n/a 1.000 s 1.033 s 3.32 % 500.0 mIn Passed
45.55 Ω 70.00 ° n/a 1.000 s 1.033 s 3.26 % 500.0 mIn Passed
55.30 Ω 46.33 ° n/a 1.000 s 1.032 s 3.15 % 500.0 mIn Passed
72.11 Ω 33.69 ° n/a 1.000 s 1.032 s 3.16 % 500.0 mIn Passed
58.11 Ω 8.05 ° n/a 350.0 ms 386.7 ms 10.49 % 500.0 mIn Passed
60.00 Ω 14.65 ° n/a 350.0 ms 390.7 ms 11.63 % 500.0 mIn Passed
62.99 Ω 2.10 ° n/a 350.0 ms 385.3 ms 10.09 % 500.0 mIn Passed
20.62 Ω 14.07 ° n/a 0.000 s 31.30 ms 31.30 ms 500.0 mIn Passed
40.00 Ω 6.32 ° n/a 0.000 s 30.80 ms 30.80 ms 500.0 mIn Passed
40.00 Ω 6.32 ° n/a 0.000 s 29.80 ms 29.80 ms 500.0 mIn Passed
X/Ω
50
40
30
20
10
-10
-20
-30
-40
-50
-10 0 10 20 30 40 50 60 70 80 90 100
R/Ω
Shot Test: Fault Type L2-E
|Z| Phi % % of t nom t act. Dev. ITest Result
21.09 Ω 40.00 ° n/a 0.000 s 32.30 ms 32.30 ms 500.0 mIn Passed
34.05 Ω 20.00 ° n/a 0.000 s 32.50 ms 32.50 ms 500.0 mIn Passed
15.31 Ω 83.00 ° n/a 0.000 s 31.70 ms 31.70 ms 500.0 mIn Passed
40.00 Ω 6.32 ° n/a 0.000 s 30.60 ms 30.60 ms 500.0 mIn Passed
40.00 Ω 6.32 ° n/a 0.000 s 29.20 ms 29.20 ms 500.0 mIn Passed
43.83 Ω 106.27 ° n/a 1.000 s 1.033 s 3.26 % 500.0 mIn Passed
41.38 Ω 75.15 ° n/a 1.000 s 1.031 s 3.14 % 500.0 mIn Passed
50.00 Ω 50.00 ° n/a 1.000 s 1.032 s 3.17 % 500.0 mIn Passed
66.94 Ω 30.00 ° n/a 1.000 s 1.029 s 2.94 % 500.0 mIn Passed
25.00 Ω 100.00 ° n/a 350.0 ms 393.1 ms 12.31 % 500.0 mIn Passed
25.00 Ω 60.00 ° n/a 350.0 ms 392.2 ms 12.06 % 500.0 mIn Passed
44.31 Ω 30.00 ° n/a 350.0 ms 394.5 ms 12.71 % 500.0 mIn Passed
61.69 Ω 20.00 ° n/a 350.0 ms 395.4 ms 12.97 % 500.0 mIn Passed
58.17 Ω 10.00 ° n/a 350.0 ms 390.7 ms 11.63 % 500.0 mIn Passed
56.91 Ω 3.39 ° n/a 350.0 ms 388.2 ms 10.91 % 500.0 mIn Passed
X/Ω
50
40
30
20
10
-10
-20
-30
-40
-50
-10 0 10 20 30 40 50 60 70 80 90 100
R/Ω
Shot Test: Fault Type L3-E
|Z| Phi % % of t nom t act. Dev. ITest Result
21.09 Ω 40.00 ° n/a 0.000 s 33.90 ms 33.90 ms 500.0 mIn Passed
34.05 Ω 20.00 ° n/a 0.000 s 32.00 ms 32.00 ms 500.0 mIn Passed
15.31 Ω 83.00 ° n/a 0.000 s 31.40 ms 31.40 ms 500.0 mIn Passed
40.00 Ω 6.32 ° n/a 0.000 s 26.80 ms 26.80 ms 500.0 mIn Passed
40.00 Ω 6.32 ° n/a 0.000 s 27.30 ms 27.30 ms 500.0 mIn Passed
43.83 Ω 106.27 ° n/a 1.000 s 1.032 s 3.15 % 500.0 mIn Passed
41.38 Ω 75.15 ° n/a 1.000 s 1.032 s 3.16 % 500.0 mIn Passed
50.00 Ω 50.00 ° n/a 1.000 s 1.034 s 3.38 % 500.0 mIn Passed
66.94 Ω 30.00 ° n/a 1.000 s 1.033 s 3.26 % 500.0 mIn Passed
25.00 Ω 100.00 ° n/a 350.0 ms 391.3 ms 11.8 % 500.0 mIn Passed
25.00 Ω 60.00 ° n/a 350.0 ms 392.7 ms 12.2 % 500.0 mIn Passed
44.31 Ω 30.00 ° n/a 350.0 ms 393.4 ms 12.4 % 500.0 mIn Passed
61.69 Ω 20.00 ° n/a 350.0 ms 394.1 ms 12.6 % 500.0 mIn Passed
58.17 Ω 10.00 ° n/a 350.0 ms 387.3 ms 10.66 % 500.0 mIn Passed
56.91 Ω 3.39 ° n/a 350.0 ms 387.6 ms 10.74 % 500.0 mIn Passed
X/Ω
50
40
30
20
10
-10
-20
-30
-40
-50
-10 0 10 20 30 40 50 60 70 80 90 100
R/Ω
Shot Test: Fault Type L1-L2
|Z| Phi % % of t nom t act. Dev. ITest Result
14.53 Ω 80.00 ° n/a 0.000 s 17.30 ms 17.30 ms 500.0 mIn Passed
12.41 Ω 100.00 ° n/a 0.000 s 17.70 ms 17.70 ms 500.0 mIn Passed
10.00 Ω 50.00 ° n/a 0.000 s 19.00 ms 19.00 ms 500.0 mIn Passed
22.44 Ω 110.00 ° n/a 350.0 ms 380.2 ms 8.629 % 500.0 mIn Passed
25.02 Ω 100.00 ° n/a 350.0 ms 379.4 ms 8.4 % 500.0 mIn Passed
25.67 Ω 83.00 ° n/a 350.0 ms 378.3 ms 8.086 % 500.0 mIn Passed
24.66 Ω 70.00 ° n/a 350.0 ms 376.5 ms 7.571 % 500.0 mIn Passed
22.27 Ω 60.00 ° n/a 350.0 ms 377.4 ms 7.829 % 500.0 mIn Passed
7.820 Ω 130.00 ° n/a 0.000 s 20.50 ms 20.50 ms 500.0 mIn Passed
18.33 Ω 44.81 ° n/a 350.0 ms 378.2 ms 8.057 % 500.0 mIn Passed
30.00 Ω 44.03 ° n/a 1.000 s 1.032 s 3.23 % 500.0 mIn Passed
36.13 Ω 60.00 ° n/a 1.000 s 1.033 s 3.25 % 500.0 mIn Passed
42.12 Ω 70.00 ° n/a 1.000 s 1.034 s 3.35 % 500.0 mIn Passed
43.15 Ω 81.54 ° n/a 1.000 s 1.032 s 3.21 % 500.0 mIn Passed
43.15 Ω 92.91 ° n/a 1.000 s 1.033 s 3.29 % 500.0 mIn Passed
38.35 Ω 108.18 ° n/a 1.000 s 1.031 s 3.14 % 500.0 mIn Passed
30.70 Ω 120.00 ° n/a 1.000 s 1.033 s 3.28 % 500.0 mIn Passed
18.81 Ω 120.00 ° n/a 350.0 ms 378.5 ms 8.143 % 500.0 mIn Passed
X/Ω
50
40
30
20
10
-10
-20
-30
-40
-50
-10 0 10 20 30 40 50 60 70 80 90 100
R/Ω
Shot Test: Fault Type L2-L3
|Z| Phi % % of t nom t act. Dev. ITest Result
14.53 Ω 80.00 ° n/a 0.000 s 18.40 ms 18.40 ms 500.0 mIn Passed
12.41 Ω 100.00 ° n/a 0.000 s 17.60 ms 17.60 ms 500.0 mIn Passed
10.00 Ω 50.00 ° n/a 0.000 s 19.20 ms 19.20 ms 500.0 mIn Passed
22.44 Ω 110.00 ° n/a 350.0 ms 378.7 ms 8.2 % 500.0 mIn Passed
25.02 Ω 100.00 ° n/a 350.0 ms 378.8 ms 8.229 % 500.0 mIn Passed
25.67 Ω 83.00 ° n/a 350.0 ms 376.6 ms 7.6 % 500.0 mIn Passed
24.66 Ω 70.00 ° n/a 350.0 ms 378.1 ms 8.029 % 500.0 mIn Passed
22.27 Ω 60.00 ° n/a 350.0 ms 376.3 ms 7.514 % 500.0 mIn Passed
7.820 Ω 130.00 ° n/a 0.000 s 19.00 ms 19.00 ms 500.0 mIn Passed
18.33 Ω 44.81 ° n/a 350.0 ms 378.0 ms 8% 500.0 mIn Passed
30.00 Ω 44.03 ° n/a 1.000 s 1.032 s 3.19 % 500.0 mIn Passed
36.13 Ω 60.00 ° n/a 1.000 s 1.031 s 3.14 % 500.0 mIn Passed
42.12 Ω 70.00 ° n/a 1.000 s 1.032 s 3.21 % 500.0 mIn Passed
43.15 Ω 81.54 ° n/a 1.000 s 1.033 s 3.3 % 500.0 mIn Passed
43.15 Ω 92.91 ° n/a 1.000 s 1.033 s 3.26 % 500.0 mIn Passed
38.35 Ω 108.18 ° n/a 1.000 s 1.033 s 3.31 % 500.0 mIn Passed
30.70 Ω 120.00 ° n/a 1.000 s 1.031 s 3.13 % 500.0 mIn Passed
18.81 Ω 120.00 ° n/a 350.0 ms 379.2 ms 8.343 % 500.0 mIn Passed
X/Ω
50
40
30
20
10
-10
-20
-30
-40
-50
-10 0 10 20 30 40 50 60 70 80 90 100
R/Ω
Shot Test: Fault Type L3-L1
|Z| Phi % % of t nom t act. Dev. ITest Result
14.53 Ω 80.00 ° n/a 0.000 s 18.20 ms 18.20 ms 500.0 mIn Passed
12.41 Ω 100.00 ° n/a 0.000 s 18.50 ms 18.50 ms 500.0 mIn Passed
10.00 Ω 50.00 ° n/a 0.000 s 17.40 ms 17.40 ms 500.0 mIn Passed
22.44 Ω 110.00 ° n/a 350.0 ms 379.0 ms 8.286 % 500.0 mIn Passed
25.02 Ω 100.00 ° n/a 350.0 ms 378.5 ms 8.143 % 500.0 mIn Passed
25.67 Ω 83.00 ° n/a 350.0 ms 378.3 ms 8.086 % 500.0 mIn Passed
24.66 Ω 70.00 ° n/a 350.0 ms 378.2 ms 8.057 % 500.0 mIn Passed
22.27 Ω 60.00 ° n/a 350.0 ms 376.8 ms 7.657 % 500.0 mIn Passed
7.820 Ω 130.00 ° n/a 0.000 s 19.40 ms 19.40 ms 500.0 mIn Passed
18.33 Ω 44.81 ° n/a 350.0 ms 377.1 ms 7.743 % 500.0 mIn Passed
30.00 Ω 44.03 ° n/a 1.000 s 1.034 s 3.36 % 500.0 mIn Passed
36.13 Ω 60.00 ° n/a 1.000 s 1.033 s 3.27 % 500.0 mIn Passed
42.12 Ω 70.00 ° n/a 1.000 s 1.032 s 3.17 % 500.0 mIn Passed
43.15 Ω 81.54 ° n/a 1.000 s 1.033 s 3.32 % 500.0 mIn Passed
43.15 Ω 92.91 ° n/a 1.000 s 1.032 s 3.18 % 500.0 mIn Passed
38.35 Ω 108.18 ° n/a 1.000 s 1.032 s 3.18 % 500.0 mIn Passed
30.70 Ω 120.00 ° n/a 1.000 s 1.031 s 3.12 % 500.0 mIn Passed
18.81 Ω 120.00 ° n/a 350.0 ms 379.2 ms 8.343 % 500.0 mIn Passed
X/Ω
50
40
30
20
10
-10
-20
-30
-40
-50
-10 0 10 20 30 40 50 60 70 80 90 100
R/Ω
Shot Test: Fault Type L1-L2-L3
|Z| Phi % % of t nom t act. Dev. ITest Result
14.53 Ω 80.00 ° n/a 0.000 s 19.50 ms 19.50 ms 500.0 mIn Passed
12.41 Ω 100.00 ° n/a 0.000 s 19.10 ms 19.10 ms 500.0 mIn Passed
10.00 Ω 50.00 ° n/a 0.000 s 17.00 ms 17.00 ms 500.0 mIn Passed
776.3 mΩ -97.00 ° n/a 1.200 s 17.40 ms -98.55 % 500.0 mIn Passed
6.942 Ω 30.00 ° n/a 0.000 s 18.70 ms 18.70 ms 500.0 mIn Passed
14.58 Ω 59.04 ° n/a 0.000 s 32.10 ms 32.10 ms 500.0 mIn Passed
9.921 Ω 120.00 ° n/a 0.000 s 18.80 ms 18.80 ms 500.0 mIn Passed
18.04 Ω 41.69 ° n/a 350.0 ms 376.9 ms 7.686 % 500.0 mIn Passed
23.04 Ω 60.00 ° n/a 350.0 ms 377.7 ms 7.914 % 500.0 mIn Passed
25.46 Ω 75.69 ° n/a 350.0 ms 377.2 ms 7.771 % 500.0 mIn Passed
26.60 Ω 93.70 ° n/a 350.0 ms 378.0 ms 8% 500.0 mIn Passed
23.45 Ω 102.43 ° n/a 350.0 ms 376.5 ms 7.571 % 500.0 mIn Passed
32.16 Ω 50.00 ° n/a 1.000 s 1.028 s 2.81 % 500.0 mIn Passed
40.00 Ω 64.92 ° n/a 1.000 s 1.033 s 3.25 % 500.0 mIn Passed
43.03 Ω 76.56 ° n/a 1.000 s 1.032 s 3.18 % 500.0 mIn Passed
44.35 Ω 90.00 ° n/a 1.000 s 1.032 s 3.23 % 500.0 mIn Passed
42.33 Ω 100.00 ° n/a 1.000 s 1.032 s 3.2 % 500.0 mIn Passed
36.77 Ω 107.97 ° n/a 1.000 s 1.033 s 3.29 % 500.0 mIn Passed
X/Ω
50
40
30
20
10
-10
-20
-30
-40
-50
-10 0 10 20 30 40 50 60 70 80 90 100
R/Ω
Check Test: Fault Type L2-L3
| Z |: 0.000 Ω Phi: 0.00 ° Angle: 75.00 ° Result: Passed
Length: 0.000 Ω %: n/a % of:
|Z| Phi t nom t act. Dev. ITest Result
2.000 μΩ 75.00 ° 0.000 s 17.10 ms 17.10 ms 500.0 mIn Passed
X/Ω
50
40
30
20
10
-10
-20
-30
-40
-50
-10 0 10 20 30 40 50 60 70 80 90 100
R/Ω
Check Test: Fault Type L2-L3
| Z |: 0.000 Ω Phi: 0.00 ° Angle: 75.00 ° Result: Passed
Length: 0.000 Ω %: n/a % of:
t/s
1.4
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1 Z/Ω
5 10 15 20 25 30 35 40 45 50
0.0
Shot Details:
.
Parameters:
Fault Type: L2-L3
| Z |: 2.000 μΩ Phi: 75.00 °
R: 0.5176 μΩ X: 1.932 μΩ
%: n/a % of:
ITest 500.0 mIn
.
Results:
t act.: 17.10 ms Assessment: Passed
t nom: 0.000 s Dev.: 17.10 ms
t min: -100.0 ms t max: no trip
. .
Fault Quantities (natural): Fault Quantities (symmetrical):
VL1: 1.000 Vn 0.00 ° V0: 0.5249 μVn 180.00 °
VL2: 500.0 mVn -180.00 ° V1: 500.0 mVn 0.00 °
VL3: 500.0 mVn 180.00 ° V2: 500.0 mVn 0.00 °
IL1: 0.000 In n/a I0: 0.000 In n/a
IL2: 500.0 mIn -165.00 ° I1: 288.7 mIn -75.00 °
IL3: 500.0 mIn 15.00 ° I2: 288.7 mIn 105.00 °
VFault: 0.03149 μVn -90.00 °
IFault: 500.0 mIn -165.00 °
Prefault Fault
Trip Postfault
V/Vn
1.25
1.00
0.75
0.50
0.25
0.00
-0.25 -0.40 -0.30 -0.20 -0.10 0.00 0.10 t/s
-0.50
-0.75
-1.00
-1.25
-1.50
VL1 VL2 VL3
I/mIn
600
400
200 t/s
-0.40 -0.30 -0.20 -0.10 0.00 0.10
-0
-200
-400
-600
IL1 IL2 IL3
Trip
Start
-0.40 -0.30 -0.20 -0.10 0.00 0.10 t/s
.
Cursor Data
Time Signal Value
Cursor 1 0.000 s <none> n/a
Cursor 2 17.10 ms <none> n/a
C2 - C1 17.10 ms n/a
.
Test State:
