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IET Computers & Digital Techniques, Volume 1
Volume 1, Number 1, January 2007
- Nan Wang, Magdy A. Bayoumi:
System-on-chip communication architecture: dynamic parallel fraction control bus design and test methodologies. 1-8 - Shuli Gao, Noureddine Chabini, Dhamin Al-Khalili, J. M. Pierre Langlois:
Optimised realisations of large integer multipliers and squarers using embedded blocks. 9-16 - Gareth W. Morris, George A. Constantinides, Peter Y. K. Cheung:
ROM to DSP block transfer for resource constrained synthesis. 17-26 - Erik Larsson, Stina Edbom:
Test data truncation for test quality maximisation under ATE memory depth constraint. 27-37 - D. Adamidis, Haridimos T. Vergos:
RNS multiplication/sum-of-squares units. 38-48 - Haridimos T. Vergos, Costas Efstathiou:
Design of efficient modulo 2n+1 multipliers. 49-57
Volume 1, Number 2, March 2007
- Sohini Dasgupta, Alex Yakovle:
Comparative analysis of GALS clocking schemes. 59-69 - Peeter Ellervee, Jaan Raik, Kalle Tammemäe, Raimund Ubar:
FPGA-based fault emulation of synchronous sequential circuits. 70-76 - M. Amir Abas, Gordon Russell, David Kinniment:
Embedded high-resolution delay measurement system using time amplification. 77-86 - M. Amir Abas, Gordon Russell, David Kinniment:
Built-in time measurement circuits - a comparative design study. 87-97 - Dmitri Maslov, D. Michael Miller:
Comparison of the cost metrics through investigation of the relation between optimal NCV and optimal NCT three-qubit reversible circuits. 98-104 - Zhen Liu, Kai Zheng, Bin Liu:
Hybrid cache architecture for high-speed packet processing. 105-112 - Guadalupe Miñana, José Ignacio Hidalgo, Juan Lanchares, José Manuel Colmenar, Oscar Garnica, Sonia López:
Reducing power of functional units in high-performance processors by checking instruction codes and resizing adders. 113-119 - Chantal Ykman-Couvreur, Vincent Nollet, Théodore Marescaux, Erik Brockmeyer, Francky Catthoor, Henk Corporaal:
Design-time application mapping and platform exploration for MP-SoC customised run-time management. 120-128 - Shiann-Rong Kuang, Jiun-Ping Wang:
Design of power-efficient pipelined truncated multipliers with various output precision. 129-136 - Simone Smorfa, Mauro Olivieri:
HW-SW optimisation of JPEG2000 wavelet transform for dedicated multimedia processor architectures. 137-143
Volume 1, Number 3, May 2007
- Christian Landrault, Erik Jan Marinissen:
Editorial. 145 - Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. 146-153 - Bernd Laquai, Michael Braun, S. Walther, Guido Schulze:
Flexible and scalable methodology for testing high-speed source synchronous interfaces on automated test equipment (ATE) with multiple fixed phase capture and compare. 154-158 - Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Predicting mixed-signal dynamic performance using optimised signature-based alternate test. 159-169 - Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee:
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. 170-179 - Valentin Gherman, Hans-Joachim Wunderlich, Jürgen Schlöffel, Michael Garbers:
Deterministic logic BIST for transition fault testing. 180-186 - Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli:
Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM. 187-196 - Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes:
Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism. 197-206 - Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel:
On-chip evaluation, compensation and storage of scan diagnosis data. 207-212 - Gefu Xu, Adit D. Singh:
Scan cell design for launch-on-shift delay tests with slow scan enable. 213-219 - Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Bashir M. Al-Hashimi:
Enhancing delay fault coverage through low-power segmented scan. 220-229 - Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez:
Efficient testing and diagnosis of faulty power switches in SOCs. 230-236 - Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto:
March AB, a state-of-the-art march test for realistic static linked faults and dynamic faults in SRAMs. 237-245 - Yu-Jen Huang, Jin-Fu Li:
Testing ternary content addressable memories with active neighbourhood pattern-sensitive faults. 246-255 - Qiang Xu, Baosheng Wang, André Ivanov, Fung Yu Young:
Test scheduling for built-in self-tested embedded SRAMs with data retention faults. 256-264
Volume 1, Number 4, July 2007
- Philip Heng Wai Leong, Andreas Koch, Eduardo I. Boemo:
Editorial - Field-programmable logic and applications. 265-266 - Yan Lin, Mike Hutton, Lei He:
Statistical placement for FPGAs considering. 267-275 - Love Singhal, Elaheh Bozorgzadeh:
Multi-layer floorplanning for reconfigurable designs. 276-294 - Klaus Danne, Roland Mühlenbernd, Marco Platzner:
Server-based execution of periodic tasks on dynamically reconfigurable hardware. 295-302 - Nastaran Baradaran, Pedro C. Diniz:
Exploiting parallelism in configurable architectures through custom array mapping. 303-311 - David B. Thomas, Wayne Luk:
Non-uniform random number generation through piecewise linear approximations. 312-321 - Mohammad Hosseinabady, Pejman Lotfi-Kamran, Fabrizio Lombardi, Zainalabedin Navabi:
Low overhead DFT using CDFG by modifying controller. 322-333 - Jie S. Hu, Narayanan Vijaykrishnan, Mary Jane Irwin, Mahmut T. Kandemir:
Optimising power efficiency in trace cache fetch unit. 334-348 - Kuen Hung Tsoi, Ka Hei Leung, Philip Heng Wai Leong:
High performance physical random number generator. 349-352 - Irith Pomeranz, Sudhakar M. Reddy:
Worst-case and average-case analysis of n-detection test sets and test generation strategies. 353-363 - Aiman El-Maleh, S. Saqib Khursheed:
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering. 364-368 - Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang:
Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. 369-376 - Ghassem Jaberipur, Amir Kaivani:
Binary-coded decimal digit multipliers. 377-381 - Guowu Yang, Xiaoyu Song, Marek A. Perkowski, William N. N. Hung, Jacob D. Biamonte, Zhiwei Tang:
Four-level realisation of 3-qubit reversible functions. 382-388 - Adnan Abdul-Aziz Gutub:
High speed hardware architecture to compute galois fields GF(p) montgomery inversion with scalability features. 389-396 - Bidyut Gupta, Shahram Rahimi, Ziping Liu:
Novel low-overhead roll-forward recovery scheme for distributed systems. 397-404 - Frank P. Burns, Julian P. Murphy, Delong Shang, Albert Koelmans, A. Yakorlev:
Dynamic global security-aware synthesis using SystemC. 405-413 - K.-J. Cho, J.-G. Chung:
Low error fixed-width two's complement squarer design using Booth-folding technique. 414-422 - Bhaskar Pal, Arnab Sinha, Pallab Dasgupta, P. P. Chakrabarti, Kaushik De:
Hardware accelerated constrained random test generation. 423-433 - J. H. Park, Y. Chu:
Finite state machine-based DRAM power management with early resynchronisation. 434-442
Volume 1, Number 5, September 2007
- Eduardo Peña, Eduardo de la Torre, Angel de Castro, Teresa Riesgo:
A digital system to emulate wireless networks. 444-450 - Luz García, Gustavo M. Callicó, Dácil Barreto, Víctor Reyes, Tomás Bautista, Antonio Núñez:
Towards a configurable SoC MPEG-4 advanced simple profile decoder. 451-460 - Miguel Lino Silva, João Canas Ferreira:
Generation of hardware modules for run-time reconfigurable hybrid CPU/FPGA systems. 461-471 - Ricardo Chaves, Leonel Sousa:
Improving residue number system multiplication with more balanced moduli sets and enhanced modular arithmetic structures. 472-480 - Bartomeu Alorda, Ivan de Paúl, Jaume Segura:
Charge-based testing BIST for embedded memories. 481-490 - Marcelino B. Santos, João Paulo Teixeira:
Functional-oriented mask-based built-in self-test. 491-498 - Peter R. Wilson, H. Alan Mantooth, P. Schwartz:
Editorial Advances in Electronics Systems Simulation. 499-500 - Won-Jong Lee, Woo-Chan Park, Vason P. Srini, Tack-Don Han:
Simulation and development environment for mobile 3D graphics architectures. 501-507 - Khalil Arshak, Essa Jafer, Declan McDonagh, Christian Ibala:
Modelling and simulation of wireless sensor system for health monitoring using HDL and Simulinkw mixed environment. 508-518 - H. Alan Mantooth, A. Francis, W. Zheng, Yucheng Feng:
Modelling tools built upon the hardware description language foundation. 519-527 - Brian Otis, Simone Gambini, Rahul C. Shah, Dan Steingart, E. Quevy, Jan M. Rabaey, Alberto L. Sangiovanni-Vincentelli, Paul K. Wright:
Modelling and simulation techniques for highly integrated, low-power wireless sensor networks. 528-536 - Irith Pomeranz, Sudhakar M. Reddy:
Effectiveness of scan-based delay fault tests in diagnosis of transition faults. 537-545 - Zhonghai Lu, Axel Jantsch:
Admitting and ejecting flits in wormhole-switched networks on chip. 546-556 - Rafael A. Arce-Nazario, Manuel Jiménez, Domingo Rodríguez:
Algorithmic-level exploration of discrete signal transforms for partitioning to distributed hardware architectures. 557-564 - Elena Perez Ramo, Javier Resano, Daniel Mozos, Francky Catthoor:
Memory hierarchy for high-performance and energyaware reconfigurable systems. 565-571 - Derek Chi-Wai Pao, Peng Zhou, Bin Liu, Xin Zhang:
Enhanced prefix inclusion coding filter-encoding algorithm for packet classification with ternary content addressable memory. 572-580 - Tze-Yun Sung, Hsi-Chin Hsin:
Design and simulation of reusable IP CORDIC core for special-purpose processors. 581-589 - Feng Wang, Michael DeBole, Xiaoxia Wu, Yuan Xie, Narayanan Vijaykrishnan, Mary Jane Irwin:
On-chip bus thermal analysis and optimisation. 590-599 - Saraju P. Mohanty, Elias Kougianos, Nagarajan Ranganathan:
VLSI architecture and chip for combined invisible robust and fragile watermarking. 600-611 - Chong-Fatt Law, Bah-Hwee Gwee, Joseph Sylvester Chang:
Fast and memory-efficient invariant computation of ordinary Petri nets. 612-624 - Hadi Parandeh-Afshar, Mohsen Saneei, Ali Afzali-Kusha, Massoud Pedram:
Fast INC-XOR codec for low-power address buses. 625-626 - Abdurazzag Sulaiman Almiladi, M. K. Ibrahim, M. Al Akidi, Amar Aggoun:
High-performance scalable bidirectional mixed radix-2 n serial-serial multipliers. 632-639 - Lasse Harju, Jari Nurmi:
Hardware platform for software-defined WCDMA/OFDM baseband receiver implementation. 640-652 - Ahmad A. Al-Yamani:
Energy-delay efficient test. 653-658
Volume 1, Number 6, November 2007
- Erik Jan Marinissen, Nicola Nicolici:
Editorial Silicon Debug and Diagnosis. 659-660 - Nikolaos G. Bartzoudis, Andrew B. T. Hopkins, Klaus D. McDonald-Maier:
Monitoring field-programmable gate array-based processing engines of dependable computer systems. 661-668 - Marc Boule, Jean-Samuel Chenard, Zeljko Zilic:
Debug enhancements in assertion-checker generation. 669-677 - Bart Vermeulen, Sjaak Bakker:
Debug architecture for the En-II system chip. 678-684 - Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud:
Extending gate-level diagnosis tools to CMOS intra-gate faults. 685-693 - Yassine Hariri, Claude Thibeault:
Bridging fault diagnostic tool based on DIDDQ probabilistic signatures, circuit layout parasitics and logic errors. 694-705 - Chao-Wen Tzeng, J.-J. Hsu, Shi-Yu Huang:
Robust paradigm for diagnosing hold-time faults in scan chains. 706-715 - Yen-Lin Peng, Cheng-Wen Wu, Jing-Jia Liou, Chih-Tsun Huang:
BIST-based diagnosis scheme for field programmable gate array interconnect delay faults. 716-723
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