SN 65 Lvds 94
SN 65 Lvds 94
DESCRIPTION
The SN65LVDS94 LVDS serdes (serializer/deserializer) receiver contains four serial-in 7-bit parallel-out shift
registers, a 7× clock synthesizer, and five low-voltage differential signaling (LVDS) line receivers in a single
integrated circuit. These functions allow receipt of synchronous data from a compatible transmitter, such as the
SN65LVDS93 and SN65LVDS95, over five balanced-pair conductors and expansion to 28 bits of single-ended
LVTTL synchronous data at a lower transfer rate.
When receiving, the high-speed LVDS data is received and loaded into registers at the rate seven times the
LVDS input clock (CLKIN). The data is then unloaded to a 28-bit wide LVTTL parallel bus at the CLKIN rate. A
phase-locked loop clock synthesizer circuit generates a 7× clock for internal clocking and an output clock for the
expanded data. The SN65LVDS94 presents valid data on the rising edge of the output clock (CLKOUT).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Copyright © 1998–2006, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
SN65LVDS94
www.ti.com
SLLS298F – MAY 1998 – REVISED JANUARY 2006
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION (CONTINUED)
The SN65LVDS94 requires only five line termination resistors for the differential inputs and little or no control.
The data bus appears the same at the input to the transmitter and output of the receiver with the data
transmission transparent to the user(s). The only user intervention is the possible use of the shutdown/clear
(SHTDN) active-low input to inhibit the clock and shut off the LVDS receivers for lower power consumption. A low
level on this signal clears all internal registers to a low level.
The SN65LVDS94 is characterized for operation over ambient air temperatures of -40°C to 85°C.
Serial-In/Parallel-Out
Shift Register
A0P D0
Serial In A,B, ...G
A0M D1
CLK D2
D3
D4
D6
D7
Serial-In/Parallel-Out
Shift Register
A1P
Serial In A,B, ...G D8
A1M D9
CLK D12
D13
D14
D15
D18
Serial-In/Parallel-Out
Shift Register
A2P
Serial In A,B, ...G D19
A2M D20
CLK D21
D22
D24
D25
D26
Serial-In/Parallel-Out
Shift Register
A3P
Serial In A,B, ...G D27
A3M D5
CLK D10
D11
D16
D17
Control Logic
D23
SHTDN
7× Clock/PLL
CLK
CLKINP
Clock In Clock Out CLKOUT
CLKINM
CLKIN
A0 D7 D6 D4 D3 D2 D1 D0 D7+1
D0-1
D86-1
D19-1
D27-1
CLKOUT
Dn Dn-1 Dn Dn+1
300 kΩ 300 kΩ
50 Ω 50 Ω
D Output
AnP AnM SHTDN
7V 7V
7V 7V
300 kΩ
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to the GND terminals unless otherwise noted.
(3) This rating is measured using MIL-STD-883C Method, 3015.7.
(1) This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.
VIC, see V V
Figure 2 and Common-mode input voltage ID 2.4 ID
Figure 3 2 2
VCC-0.8
TA Operating free-air temperature -40 85 °C
TIMING REQUIREMENTS
MIN NOM MAX UNIT
tc (1) Input clock period 14.7 tc 50 ns
ELECTRICAL CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT
VIT+ Positive-going differential input voltage threshold 100
Negative-going differential input voltage mV
VIT- -100
threshold (2)
VOH High-level output voltage IOH = -4 mA 2.4 V
VOL Low-level output voltage IOL = 4 mA 0.4 V
Disabled, all inputs open 280 µA
Enabled, AnP at 1 V and AnM at 1.4
V, 62 84 mA
ICC Quiescent current (average) tc = 15.38 ns
Enabled, CL = 8 pF (5 places),
Worst-case pattern, see Figure 4, 107 mA
tc = 15.38 ns
IIH High-level input current (SHTDN) VIH = VCC ±20 µA
IIL Low-level input current (SHTDN) VIL = 0 V ±20 µA
IIN Input current (A and CLKIN inputs) 0 V ≤ VI≤ 2.4 V ±20 µA
IOZ High-impedance output current VO = 0 V or VCC ±10 µA
SWITCHING CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP (1) MAX UNIT
Data setup time, D0 through D27 to
tsu 4 6
CLKOUT
CL = 8 pF See Figure 5 ns
Data hold time, CLKOUT to D0 through
th 4 6
D27
Receiver input skew margin (1), see tc = 15.38 ns (±0.2%), TA = 0°C to 85°C 490 800
tRSKM ps
Figure 6 |Input clock jitter| <50 ps (2) TA = -40°C to 0°C 390
Delay time, input clock to output clock, see
td tc = 15.38 ns (±0.2%) 3.7 ns
Figure 6
tc = 15.38 + 0.75 sin (2π500E3t)±0.05 ns,
±80
Change in output clock period from cycle to See Figure 7
∆tC(O) ps
cycle (3) tc = 15.38 + 0.75 sin (2≠3E6t) ±0.05 ns,
±300
See Figure 7
ten Enable time, SHTDN to phase lock See Figure 8 1 ms
tdis Disable time, SHTDN to Off state See Figure 9 400 ns
tt Output transition time (tr or tf) CL = 8 pF 3 ns
tw Output clock pulse duration 0.43 tc ns
tc
–tsh.
(1) tRSKM is the timing margin available to allocate to the transmitter and interconnection skews and clock jitter. It is defined by 14
(2) |Input clock jitter| is the magnitude of the change in the input clock period.
(3) ∆tC(O) is the change in the output clock period from one cycle to the next cycle observed over 15,000 cycles.
VID
AM
MAX at 3 V
2
1.5
0.5
MIN
0
0 0.1 0.2 0.3 0.4 0.5 0.6
|VID|– Differential Input Voltage and VCC – V
CLKIN/
CLKOUT
EVEN Dn
ODD Dn
tsu
VOH
70%
D0–27
30%
VOL
th
VOH
70%
CLKOUT
30%
VOL
CLKIN is advanced or delayed with respect to data until errors are observed at the receiver outputs.
The magnitude of the advance or delay is tRSKM.
tc
4/7 tc ± tRSKM
ts
3/7 tc ± tRSKM
th
AnP
and AnM
CLKIN
7×CLK
(Internal)
td
CLKOUT
tr < 1 ns
≅ 300 mV
90%
CLKIN or An
0V
10%
≅ −300 mV
VOH
CLKOUT 1.4 V
VOL
Device
+
Reference Σ VCO Under
Test
+
Modulation
v(t) = A sin(2πfmodt)
CLKIN
An
ten
SHTDN
Dn Invalid Valid
CLKIN
tdis
SHTDN
CLKOUT
TYPICAL CHARACTERISTICS
WORST-CASE SUPPLY CURRENT
vs
FREQUENCY
140
120
I CC − Supply Current − mA
100
VCC = 3.6 V
80
VCC = 3 V VCC = 3.3 V
60
40
20
0
30 40 50 60 70
f − Frequency − MHz
Figure 10.
APPLICATION INFORMATION
D0–D7 8 8 D0–D7
SN74FB2032 SN74FB2032
D8–D15 8 8 D8–D15
SN74FB2032 SN74FB2032
LVDS
16-Bit TTL Interface TTL 16-Bit
BTL Bus TTL Interface 0 To 10 Meters Interface TTL BTL Bus
Interface Interface W/Parity (Media Dependent) W/Parity Interface Interface
SN75LVDS93 SN75LVDS94
D0–D7 8 8 D0–D7
SN74FB2032 9 Bit Latchable 9 Bit Latchable SN74FB2032
Transceiver/ With Parity Parity Transceiver/ With
Parity Generator Parity Generator
D8–D15 8 8 D8–D15
SN74FB2032 9 Bit Latchable 9 Bit Latchable SN74FB2032
Transceiver/ With Parity Parity Transceiver/ With
Parity Generator Parity Generator
Parity
Error
CLK XMIT Clock RCV Clock CLK
Backplane Backplane
Bus Bus
PACKAGING INFORMATION
Orderable Device Status (1) Package Package Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)
Type Drawing Qty
SN65LVDS94DGG ACTIVE TSSOP DGG 56 35 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
SN65LVDS94DGGG4 ACTIVE TSSOP DGG 56 35 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
SN65LVDS94DGGR ACTIVE TSSOP DGG 56 2000 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
SN65LVDS94DGGRG4 ACTIVE TSSOP DGG 56 2000 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR
no Sb/Br)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
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In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Jul-2012
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com 14-Jul-2012
Pack Materials-Page 2
MECHANICAL DATA
0,27
0,50 0,08 M
0,17
48 25
6,20 8,30
6,00 7,90 0,15 NOM
Gage Plane
0,25
1 24
0°– 8°
A 0,75
0,50
Seating Plane
0,15
1,20 MAX 0,10
0,05
PINS **
48 56 64
DIM
4040078 / F 12/97
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Copyright © 2012, Texas Instruments Incorporated