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Compound Field Effect Power Transistor: N-Channel Power Mos Fet Array Switching Industrial Use

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0% found this document useful (0 votes)
229 views4 pages

Compound Field Effect Power Transistor: N-Channel Power Mos Fet Array Switching Industrial Use

Uploaded by

katty cumbe
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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DATA SHEET

COMPOUND FIELD EFFECT POWER TRANSISTOR

µ PA1560
N-CHANNEL POWER MOS FET ARRAY
SWITCHING
INDUSTRIAL USE

DESCRIPTION PACKAGE DRAWING (Unit : mm)


The µPA1560 is N-Channel Power MOS FET Array 26.8 MAX. 4.0
that built in 4 circuits designed for solenoid, motor and

10
lamp driver.

10 MIN.
2.5
FEATURES
• Full mold package with 4 circuits 1.4
2.54
• 4 V driving is possible 1.4 0.6±0.1 0.5±0.1

• Low on-state resistance


RDS(on)1 = 165 mΩ MAX. (VGS = 10 V, ID = 1.5 A)
1 2 3 4 5 6 7 8 910
RDS(on)2 = 200 mΩ MAX. (VGS = 4 V, ID = 1.5 A)
• Low input capacitance EQUIVALENT CIRCUIT
Ciss = 600 pF TYP.
3 5 7 9
ORDERING INFORMATION
PART NUMBER PACKAGE 2 4 6 8

1 10
µ PA1560H 10-pin SIP
ELECTRODE CONNECTION
2, 4, 6, 8 : Gate
3, 5, 7, 9 : Drain
1, 10 : Source

ABSOLUTE MAXIMUM RATINGS (TA = 25°C)


Drain to Source Voltage (VGS = 0 V) VDSS 120 V
Gate to Source Voltage (VDS = 0 V) VGSS(AC) ±20 V
Gate to Source Voltage (VDS = 0 V) VGSS(DC) + 20, –10 V
Drain Current (DC) ID(DC) ±3.0 A
Note1
Drain Current (pulse) ID(pulse) ±12 A
Total Power Dissipation (TC = 25°C) PT1 28 W
Total Power Dissipation (TA = 25°C) PT2 3.7 W
Channel Temperature Tch 150 °C
Storage Temperature Tstg –55 to + 150 °C
Note2
Single Avalanche Current IAS 3.0 A
Note2
Single Avalanche Energy EAS 0.9 mJ
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1 %
2. Starting Tch = 25 °C, VDD = 60 V, RG = 25 Ω, VGS = 20 V → 0 V

Remark The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.

Document No. G14283EJ1V0DS00 (1st edition)


Date Published April 1999 NS CP(K)
Printed in Japan
© 1999
µ PA1560

ELECTRICAL CHARACTERISTICS (TA = 25 °C)


CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT

Drain to Source On-state Resistance RDS(on)1 VGS = 10 V, ID = 1.5 A 130 165 mΩ

RDS(on)2 VGS = 4.0 V, ID = 1.5 A 145 200 mΩ

Gate to Source Cut-off Voltage VGS(off) VDS = 10 V, ID = 1.0 mA 1.0 1.8 2.5 V

Forward Transfer Admittance | yfs | VDS = 10 V, ID = 1.5 A 2 4.5 S

Drain Leakage Current IDSS VDS = 120 V, VGS = 0 V 10 µA

Gate to Source Leakage Current IGSS VGS = ±20 V, VDS = 0 V ±10 µA

Input Capacitance Ciss VDS = 10 V 600 pF

Output Capacitance Coss VGS = 0 V 160 pF

Reverse Transfer Capacitance Crss f = 1.0 MHz 70 pF

Turn-on Delay Time t d(on) ID = 1.5 A 35 ns

Rise Time tr VGS(on) = 10 V 80 ns

Turn-off Delay Time td(off) VDD = 60 V 700 ns

Fall Time tf RL = 30 Ω 250 ns

Total Gate Charge QG ID = 3.0 A 28 nC

Gate to Source Charge QGS VDD = 96 V 2.5 nC

Gate to Drain Charge QGD VGS = 10 V 9 nC

Body Diode Forward Voltage VF(S-D) IF = 3.0 A, VGS = 0 V 0.9 V

Reverse Recovery Time trr IF = 3.0 A, VGS = 0 V 160 ns

Reverse Recovery Charge Qrr di/dt = 50 A/ µs 280 nC

TEST CIRCUIT 1 AVALANCHE CAPABILITY TEST CIRCUIT 2 SWITCHING TIME

D.U.T. D.U.T.
RG = 25 Ω L
RL VGS
VGS 90 %
10 % VGS(on)
PG Wave Form
0
50 Ω VDD RG
PG. RG = 10 Ω VDD
VGS = 20 → 0 V
ID 90 %
90 %
ID
BVDSS VGS 10 %
IAS ID 0 10 %
0 Wave Form
VDS
ID τ td(on) tr td(off) tf
VDD
ton toff
τ = 1µ s
Duty Cycle ≤ 1 %
Starting Tch

TEST CIRCUIT 3 GATE CHARGE

D.U.T.
IG = 2 mA RL

PG. 50 Ω VDD

2 Data Sheet G14283EJ1V0DS00


µ PA1560

[MEMO]

Data Sheet G14283EJ1V0DS00 3


µ PA1560

• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
• While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
• NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98. 8

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